Claims
- 1. A charge coupled line transfer image sensor having improved resolution comprising:
- a semiconductor body;
- a plurality of adjacent parallel charge coupled devices formed at a surface of said body, each device of said plurality of devices forming a line of spaced-apart photo-sensitive elements;
- a plurality of electrodes, each electrode associated with one of n-phases at a time, each photo-sensitive element lying at least partially under electrodes associated with a first phase and another phase;
- means for selectively biasing the electrodes associated with said first phase during recording of a radiation image in a first mode selectively to create potential barriers in the body under said electrodes associated with the first phase between adjacent photo-sensitive elements in said line or in a second mode to create potential barriers in the body between said electrodes associated with said first phase whereby adjacent photosensitive elements can be selectively laterally shifted to improve the resolution of the image sensor.
- 2. The image sensor of claim 1 wherein said means for biasing said electrodes comprises means for biasing electrodes associated with adjacent lines of photosensitive elements in said first and said second modes respectively.
- 3. The image sensor of claim 2 comprising means operative during sequentially recording and reading a series of images for reversing the biasing of the electrodes associated with adjacent lines of photosensitive elements when recording successive images.
- 4. The image sensor of any claims 1, 2 or 3 wherein said means for selectively biasing said electrodes comprises a shift register.
- 5. The image sensor of claim 4 comprising means for reading two adjacent lines of photosensitive elements simultaneously in time division multiplex fashion.
Priority Claims (1)
Number |
Date |
Country |
Kind |
8500337 |
Feb 1985 |
NLX |
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Parent Case Info
This is a continuation of co-pending application Ser. No. 824,029 filed on Jan. 10, 1986, now abandoned.
US Referenced Citations (11)
Foreign Referenced Citations (1)
Number |
Date |
Country |
59-45721 |
Mar 1984 |
JPX |
Continuations (1)
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Number |
Date |
Country |
Parent |
824029 |
Jan 1986 |
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