This application claims priority to French Patent Application No. 1357291, filed Jul. 24, 2013, the entire content of which is incorporated herein by reference in its entirety.
The technical field of the invention is that of charge source sensors. The present invention relates to a charge preamplifier for converting an electric charge generated in a charge source sensor into a voltage signal.
A sensor is generally followed by a conditioner ensuring the conversion of an electrical magnitude at the output of the sensor into an exploitable electrical magnitude, generally a voltage. In the case of physical measurements using a sensor delivering an electric charge under the effect of a signal to be measured, also called “charge source sensor”, such as a piezoelectric sensor, the suitable conditioner is a charge preamplifier.
In reference to
Discharging, also called “reset”, of the storage capacitor storing the electric charge delivered by the sensor, can be made permanently or in a pulse way, periodic or not, using a reset system placed in a feedback loop of the charge amplifier. It is noted that it is important to avoid the saturation of the operational amplifier and to keep a sufficient dynamic range.
In the case of a permanent reset, it is known to use a reset system including a resistance placed in parallel with the storage capacitor, enabling the storage capacitor to be discharged. The value of the resistance should be selected very high to reduce the noise it supplies. Indeed, the sensor has generally a leakage current Idet depending on parameters such as temperature, electric bias conditions of the sensor, irradiation doses received, etc. This leakage current generates a shot noise of variance 2qIdet, where q is the elementary charge of an electron. If the resistance has a value equal to 2 kT/(q·Idet), that is 52 MOhms for 1 nA, the power of the shot noise is doubled.
But, a resistance of this order of magnitude is not feasible as a pure passive resistance for reasons of a size unsuitable for integrated circuits. In reference to
However, the active element adds noises to the measure. Indeed, the noise of an active element directly depends on the current passing through it. In static operation, that is in the absence of a signal, these noises depend on active element bias currents, which are minimized to restrict the noise source. But in dynamic operation, that is after the arrival of a signal, as soon as the electric charge corresponding to the signal has started to be stored in the storage capacitor, the active component is activated and the discharging current it provides at the input of the charge preamplifier increases. This discharging current reaches a maximum value substantially at the same time as the charge stored in the storage capacitor, possibly slightly later if the corresponding electrical path is slower than the charging circuit of the storage capacitor. The current passing through the active element thus changes from a low rest value to a much higher value required for discharging the storage capacitor. This transient current is a noise source the variance of which increases with the amplitude of said current. A low noise reset system can thus be made in the absence of a signal, but it is not possible to hold this property upon measuring a signal.
But, this noise induces a further fluctuation in the signal measurement and this fluctuation is all the more important that the discharging current maximum is close to the time of arrival of the signal at the input of the charge amplifier.
An aspect of the invention provides a charge preamplifier enabling this noise to be restricted.
According to a first aspect, the invention substantially relates to a charge preamplifier for converting an electric charge generated in a charge source sensor into a voltage signal, including:
Further, the charge preamplifier includes a control element connected between the reset system and the output of the phase inverting amplifier, and suitable for providing the control signal to the reset system, said control signal being proportional to the deviation between the output voltage of the phase inverting amplifier and a reference voltage, said proportionality coefficient being lower that one for high frequencies.
In other words, the control element includes:
By “the control signal is proportional to the deviation between the voltage signal and the reference voltage, said proportionality coefficient being lower than one in a high frequency band”, it is meant that the control signal is such that:
Sg=α(VsPAC−Vref)
Where:
In other words, the control element behaves as an attenuator of the difference between the voltage signal and the reference voltage in a high frequency band.
Besides the mains characteristics just mentioned in the preceding paragraph, the device according to an embodiment of the invention can have one or more further characteristics among the following ones, considered singly or according to the technically possible combinations:
By “type” of transistor, it is meant a N-channel or P-channel transistor. A N-channel transistor and a P-channel transistor are said to be of a complementary type.
The invention and its different applications will be better understood upon reading the following description and examining the accompanying figures.
The figures are only presented by way of indicating and in no way limiting purposes for the invention.
The figures show:
in
in
in
in
in
in
in
The charge preamplifier PAC includes:
As previously described, the phase inverting amplifier AI is of the operational type (see
The control element CTL includes a set of components configured and arranged to generate a control signal Sg which is proportional to the deviation between the voltage signal VsPAC and the reference voltage, the proportionality coefficient being dependent on the frequency and being lower than one in a high frequency band. Beneficially, the proportionality coefficient is further higher than one at low frequencies.
The reset system SRZ is in the present case a P-channel MOSFET transistor, connected as a common gate. In another embodiment, the reset system SRZ is a P-channel or N-channel MOSFET transistor connected as a common source. In another embodiment, the reset system SRZ is a NPN or PNP bipolar transistor, connected as a common emitter. In another embodiment, the reset system SRZ is a NPN or PNP bipolar transistor, connected as a common base.
In a described embodiment, the reset system SRZ is biased by the leakage current of the sensor CAP, present at the input of the charge preamplifier PAC. In another embodiment, the reset system SRZ is biased by a dedicated current source.
The reset system SRZ provides a discharging current id controlled by a control signal Sg provided by the control element CTL.
In the embodiment of
It will be appreciated that the operation would not be modified if transistors were differently chosen. Indeed, the first transistor MP1 and the second transistor MP2 could be of the N-channel type; the third transistor MN3 and the fourth transistor MN4 would then be of the P-channel type. Indeed, it is sufficient that both groups of transistors be of a complementary type.
The first transistor MP1 and the second transistor MP2 are connected as a modified current mirror:
More precisely:
Further:
Thus, the voltage at the output of the transconductance amplifier is proportional to the deviation between the output voltage VsPAC of the phase inverting amplifier AI, and the reference voltage Vref. The voltage at the output of the transconductance amplifier is the control signal Sg applied to the reset system SRZ. But the proportionality coefficient varies as a function of the frequency, as shown in the Bode gain diagram of the control element CTL, represented in
At low frequencies, that is in static mode, that is in the absence of detection, the gain gdB of the control element is high. In the present case, it is 36 decibels. Then, from a certain frequency f0, the gain gdB drops before being restored to a value lower than one, in the present case −12 decibels. The control element CTL thus behaves as a low frequency amplifier, and as an attenuator in a higher frequency band.
Indeed, at low frequencies, the capacitor C is equivalent to an open circuit, whereas at high frequencies, the capacitor C is equivalent to a closed circuit. At high frequencies, the gate and the drain of the second transistor MP2 are thus at the same potential. The second transistor MP2 thus behaves as a charge resistance having a known and controllable value by setting the current I0 output from the current source.
It is noted that from a certain frequency, the gain drops again: this is due to the presence of stray capacitances not represented in the figure and to the mobility limits of the charge carriers in the materials of the transistors.
The amplifier and attenuator behaviour as a function of the frequencies is advantageous. Indeed, a high gain gdB allows a better accuracy for regulating the voltage VsPAC at the output of the phase inverting amplifier AI. Further, a low gain gdB enables the current id peak to be restricted at the output of the reset system SRZ.
More precisely, after the arrival of a signal from the sensor CAP, to ensure a discharge of the storage capacitor Cm, which restricts the transient noise, the control element CTL provides the reset system SRZ with a fraction of the deviation between the output voltage VsPAC of the phase inverting amplifier AI and the reference voltage Vref. The control element CTL thus acts as a voltage attenuator, which restricts the maximum value reached by the discharging current id with respect to the situation of prior art wherein the deviation between the output voltage VsPAC of the inverting amplifier and the reference voltage Vref is directly applied with a gain equal to or higher than one. Further, to ensure a sufficient accuracy for statically regulating the voltage at the output VsPAC of the phase inverting amplifier AI, that is to make sure that the output voltage VsPAC of the phase inverting amplifier AI is close to the reference voltage Vref in the absence of detection, the gain of the control element CTL at low frequencies increases when the frequency decreases.
The control element CTL thus allows:
The control element CTL thus enables the output voltage VsPAC of the phase inverting amplifier AI to be regulated to a reference voltage Vref which, after the arrival of the signal, ensures the return to the reference voltage Vref by reducing the noise inseparable from this operation.
It will be appreciated that there are a vast number of electronic connections enabling a control element CTL to be made including:
The control element CTL presented in
A second exemplary embodiment is given in
The transfer function, in the Laplace domain, associated with the control element CTL presented in
The transfer function includes a pole Tp and a zero Tz, such that:
This ratio can assume high values as a function of the values of the resistances. For example, if R1=1Ω, R0=R2=200Ω, then:
At low frequencies, the gain of this transfer function tends to the static gain:
At high frequencies, the gain of this transfer function tends to:
The Bode gain diagram of the control element CTL of
Number | Date | Country | Kind |
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13 57291 | Jul 2013 | FR | national |
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Entry |
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Search Report and Written Opinion issued for French Patent Application No. 1357291, dated Mar. 14, 2014. |
Number | Date | Country | |
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20150028950 A1 | Jan 2015 | US |