1. Field of the Invention
The present invention relates generally to a copper/indium/gallium/selenium (CIGS) solar cell structure and a method for fabricating the same, and more particularly, to a CIGS solar cell structure including an alloy thin film layer disposed between a molybdenum thin film layer and a CIGS thin film layer, and a method for fabricating the same.
2. The Prior Arts
CIGS thin film solar cells are being expected as one type of the most potentially low cost solar cells. Comparing with the other current thin film battery technologies, a CIGS thin film solar cell has higher efficiency. Currently, a small size CIGS thin film solar cell unit may achieve an efficiency of up to 19%, and a large size one may achieve an efficiency of up to 13%. Further, the CIGS thin film solar cell can be fabricated by a chemical vapor deposition (CVD) process which is adapted for low cost and large size processing. Furthermore, the CIGS thin film solar cell is radiation resistible and light weighted.
However, the CIGS thin film layer 80 directly deposited upon the molybdenum thin film layer 20 often peels off therefrom and is featured with unsatisfactory conductivity and resistance coefficient.
A primary objective of the present invention is to provide a CIGS solar cell structure. The CIGS solar cell structure includes a substrate, a molybdenum thin film layer, an alloy thin film layer, and a CIGS thin film layer. According to the present invention, the alloy thin film layer is provided between the molybdenum thin film layer and the CIGS thin film layer, serving as a conductive layer of the CIGS solar cell structure. The alloy thin film layer is composed of a variety of high electrically conductive materials (such as molybdenum, copper, aluminum, and silver) in different atomic proportions.
A further objective of the present invention is to provide a method for fabricating a CIGS solar cell structure. The method includes sputtering a molybdenum thin film layer upon a substrate, and then continuously depositing an alloy thin film layer onto the molybdenum thin film layer by bombarding targets toward the molybdenum thin film layer with a sputtering machine. The sputtering machine is adapted for precisely performing the thin film deposition and improving the uniformity of the alloy mixed by different metals for preparing the alloy thin film layer. The targets include high electrically conductive materials, such as molybdenum, copper, aluminum, and silver. Thereafter, a CIGS thin film layer is then deposited on the alloy thin film layer.
Accordingly, the present invention is adapted for solving the problems of the conventional technologies as discussed above, so as to improve the electrical conductivity, reduce the resistance coefficient of the molybdenum thin film layer, thus reducing the thickness thereof so as to avoid the peeling off of the CIGS thin film layer.
The present invention will be apparent to those skilled in the art by reading the following detailed description of a preferred embodiment thereof, with reference to the attached drawings, in which:
The accompanying drawings are included to provide a further understanding of the invention, and are incorporated in and constitute a part of this specification. The drawings illustrate embodiments of the invention and, together with the description, serve to explain the principles of the invention.
According to an aspect of the current embodiment, the alloy thin film layer 110 for example includes molybdenum and aluminum, in which the atomic proportion of molybdenum to aluminum is about 6˜9:1˜2. When the alloy thin film layer 50 has a thickness ranging from 0.1 to 0.25 μm, the electrical conductivity of the alloy thin film layer 50 ranges from 20×106/mΩ to 25×106/mΩ.
According to another aspect of the current embodiment, the alloy thin film layer 110 for example includes molybdenum and copper, in which the atomic proportion of molybdenum to copper is about 5˜8:1˜4. When the alloy thin film layer 50 has a thickness ranging from 0.1 to 0.25 μm, the electrical conductivity of the alloy thin film layer 50 ranges from 30×106/mΩ to 35×106/mΩ.
According to a further aspect of the current embodiment, the alloy thin film layer 50 for example includes molybdenum, copper and aluminum, in which the atomic proportion of molybdenum, copper, and aluminum is about 5˜7:3˜5:1˜2.
When the alloy thin film layer 50 has a thickness ranging from 0.1 to 0.25 μm, the electrical conductivity of the alloy thin film layer 50 ranges from 30×106/mΩ to 35×106/mΩ.
According to still another aspect of the current embodiment, the alloy thin film layer 50 for example includes molybdenum, copper, aluminum, and silver, in which the atomic proportion of molybdenum, copper, aluminum, and silver is about 5˜7:3˜4:1˜1.5:2˜2.5. When the alloy thin film layer 50 has a thickness ranging from 0.1 to 0.25 μm, the electrical conductivity of the alloy thin film layer 50 ranges from 35×106/mΩ to 40×106/mΩ.
It should be noted that the CIGS thin film layer 80 of the CIGS solar cell structure is configured on the alloy thin film layer by a synchronizing evaporation deposition and selenylation process.
Although the present invention has been described with reference to the preferred embodiments thereof, it is apparent to those skilled in the art that a variety of modifications and changes may be made without departing from the scope of the present invention which is intended to be defined by the appended claims.
This is a continuation-in-part application for the application Ser. No. 12/407,780 filed on Mar. 19, 2009, which is incorporated herewith by reference.
Number | Date | Country | |
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Parent | 12407780 | Mar 2009 | US |
Child | 13089281 | US |