The present invention relates to a circuit system for a micromechanical sensor element having a capacitor array and a downstream amplifier for the useful signal of the capacitor array.
A wide variety of implementations of micromechanical capacitor arrays within the scope of sensor elements are available. The component structure of such a capacitor array is generally determined by the intended use and the location of the particular sensor element. Diaphragm structures are mostly used in the case of pressure sensors and sound transducers. The one electrode of the capacitor array is formed here by a micromechanically manufactured diaphragm, with a stationary counterelectrode being situated on the opposite side. The diaphragm is deformed in the event of a pressure or sound impact, thereby changing the distance to the counterelectrode and thus the capacitance of the capacitor array formed by the diaphragm and the counterelectrode.
Micromechanical sensor elements are mass-produced by appropriately processing wafers. The mechanical properties of the layers, which are deposited and structured during manufacturing, have a direct effect on the sensor characteristics of the produced components. The distance between the electrode and the counterelectrode in diaphragm sensors “identical in construction” may thus vary greatly, by applying stress in the manufacturing process, for example, which results in differences in the base capacitance and thus also in the sensitivity.
Various measures for avoiding such manufacturing-related quality variations in the mass production of micromechanical sensor elements having a capacitor array are used.
A still stricter monitoring of the micromechanical manufacturing process is initially strived for. In addition to this, a uniform quality standard may be achieved by a quality check at the end of the manufacturing process where those components which do not meet the quality requirements are identified and rejected. The quality variations of micromechanical sensor elements are compensated in some cases by an electrical calibration of the whole product. For this purpose, the sensitivity of a sensor element is determined once and set to a predefined value with respect to its circuitry.
All three measures cited above are relatively cost-intensive and are difficult to be reconciled with the requirements of mass production.
An object of the present invention is to provide a circuit system using which setpoint deviations of the base capacitance of a capacitor array may easily be compensated and which, in addition, may easily be integrated on a micromechanical sensor element.
This is achieved according to the present invention by a circuit using which a control signal is generated which is decoupled from the useful signal of the capacitor array, but is a function of the base capacitance of the capacitor array.
This control signal is then conveyed to the amplifier for the useful signal for controlling the gain.
According to example embodiments of the present invention, the working point of the sensor element is intrinsically adjusted by suitable signal processing. It has been found according to the present invention that, parallel to detecting the useful signal, the base capacitance of the capacitor array may also be determined using simple circuitry. Furthermore, it has been found that, on the basis of the actual base capacitance of the capacitor array, the sensitivity of the sensor element may be adjusted—at least within certain limits—using simple circuitry by appropriately amplifying the useful signal. This makes it possible to substantially reduce the sensor element rejects as well as the costs for a quality check and/or the expenditure for an electrical calibration of the whole product.
There are basically different options for implementing a circuit system according to the example embodiment of the present invention, both analogously and digitally; the integratability on a micromechanical component is to be particularly emphasized.
A circuit block, which converts the capacitance of the capacitor array into a proportional voltage, is frequently situated downstream from the capacitor array of a sensor element. In one specific example embodiment of the present invention, a signal branching having at least two output paths is situated downstream from this signal block. In applications using a relatively high-frequency useful signal, e.g., in a sound transducer, the useful signal is obtained from the voltage signal in a first output path with the aid of a high-pass filter and fed into an amplifier. A control signal for this amplifier is generated in a second output path by determining the DC voltage component of the voltage signal which is a function of the base capacitance of the capacitor array. The voltage signal is conducted via a low-pass filter for this purpose.
In another specific example embodiment of the present invention, which is also suitable for applications using useful signals in a lower frequency range, e.g., for a dynamic pressure sensor, an arrangement provided for applying an AC voltage to the capacitor array, this AC voltage being used as a test voltage for determining the base capacitance. The frequency range of the test voltage should differ from that of the useful signal, so that both the test voltage component and the useful signal may be extracted from the output signal of the capacitor array using suitable filters. A control signal for the amplifier of the useful signal is subsequently generated from the test voltage component.
As discussed above, there are different options to configure and refine the present invention in an advantageous manner. For this purpose, reference is made to the description below of two exemplary embodiments of the present invention depicted in the figures.
The circuit system shown in
The circuit system shown in
Finally is should be pointed out that, with the aid of the example circuit systems according to the present invention, not only the sensitivity of a micromechanical sensor element having a capacitor array may be adjusted in a targeted manner, but also other variables may be controlled, such as the offset of the sensor element, for example.
Number | Date | Country | Kind |
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10 2006 046 403.6 | Sep 2006 | DE | national |
Filing Document | Filing Date | Country | Kind | 371c Date |
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PCT/EP07/57865 | 7/31/2007 | WO | 00 | 5/4/2009 |