The present invention relates to the field of instrumentation, and more particularly to compensating for inaccuracies in current transformers used in performing measurements for power monitoring.
In many industrial applications (and others), instruments collect data or information from an environment or unit under test (UUT), and may also analyze and process acquired data. Some instruments provide test stimuli to a UUT. Examples of instruments include oscilloscopes, digital multimeters, pressure sensors, arbitrary waveform generators, digital waveform generators, etc. The information that may be collected by respective instruments includes information describing voltage, resistance, distance, velocity, pressure, oscillation frequency, humidity, and/or temperature, among others. Computer-based instrumentation systems typically include transducers for capturing a physical phenomenon and generating a representative electrical signal, signal conditioning logic to perform amplification on the electrical signal, isolation, and/or filtering, and analog-to-digital (A/D) conversion logic for receiving analog signals and providing corresponding digital signals to the host computer system.
In a computer-based system, the instrumentation hardware or device is typically an expansion board plugged into one of the I/O slots of the computer system. In another common instrumentation system configuration, the instrumentation hardware is coupled to the computer system via other means such as through a VXI (VME extensions for Instrumentation) bus, a GPIB (General Purpose Interface Bus), a PXI (PCI extensions for Instrumentation) bus, Ethernet, a serial port or bus, or parallel port of the computer system. The instrumentation hardware may include a DAQ (Data Acquisition) board, a computer-based instrument such as a multimeter, or another type of instrumentation device. In another common system configuration, a chassis and boards inserted in the chassis may operate as a standalone instrument or instrument suite, although in some cases a host computer may be used to configure or program the boards prior to, or during operation.
The instrumentation hardware may be configured and controlled by software executing on a host computer system coupled to the system, or by a controller card installed in the chassis. The software for configuring and controlling the instrumentation system typically includes driver software and the instrumentation application software, or the application. The driver software serves to interface the instrumentation hardware to the application and is typically supplied by the manufacturer of the instrumentation hardware or by a third party software vendor. The application is typically developed by the user of the instrumentation system and is tailored to the particular function that the user intends the instrumentation system to perform. The instrumentation hardware manufacturer or third party software vendor sometimes supplies application software for applications that are common, generic, or straightforward. Instrumentation driver software provides a high-level interface to the operations of the instrumentation device. The instrumentation driver software may operate to configure the instrumentation device for communication with the host system and to initialize hardware and software to a known state. The instrumentation driver software may also maintain a soft copy of the state of the instrument and initiated operations. Further, the instrumentation driver software communicates over the bus to move the device from state to state and to respond to device requests.
The accuracy of the electronic components used in common measurement devices or instruments, for example current transformers in current-monitoring circuits, can vary. Current Transformers are commonly used in measuring circuits for monitoring power line currents. They provide a level of isolation, present a low burden to the circuit being measured, tolerate high fault currents, and present a higher signal level to the rest of the measurement system than a simple shunt resistor would. In a typical current transformer circuit, the signal being measured (the transformer primary current, IP) provides the power needed to drive a stepped-down secondary current (IS) through a winding resistance of the current transformer and a sense resistor (RS). The power transfers through the magnetic flux of the core of the current transformer, which unfortunately does not provide a 100% efficient and error free transfer. The inaccuracies of current transformers can manifest themselves in bandwidth, dynamic range, phase shift, and gain errors depending on the transformer design and materials used. Consequently, modern power measurement devices often come in a family of options, each tailored for particular measurement challenges. Even within these options, physically large current transformers, and sometimes multiple current transformers, are used to minimize the errors of the power transfer.
Other corresponding issues related to the prior art will become apparent to one skilled in the art after comparing such prior art with the present invention as described herein.
In one set of embodiments, an improved measurement circuit—used for monitoring power line currents, for example—may include a current transformer, and may also include an active feedback circuit that simulates a negative resistance, in lieu of including a simple shunt resistance. The feedback circuit may operate as a negative resistance matching the value of the winding resistance of the current transformer, and may include an amplifier to provide power to drive a secondary current through a sense resistor and the transformer winding resistance. This eliminates the reliance on the lossy, error prone power transfer that would otherwise have to be provided by the current transformer during measurements performed using the current transformer. Various embodiments of an improved measurement circuit may thereby reduce the most significant error source in a current transformer circuit by presenting a negative impedance to the current transformer, which, combined with the positive resistance of the transformer's winding, results in a net burden of zero on the current transformer, eliminating the need for the transformer having to provide power to drive the secondary current. This facilitates the use of smaller transformers while achieving a smaller measurement error than would typically be present in conventional designs. Thus, a single, compact measurement device may be used in a wide range of applications with high measurement performance.
Therefore, in one embodiment, a feedback circuit includes a first terminal for coupling to a first end of two ends of a conductor winding, and also includes a second terminal for coupling to a second end of the two ends of the conductor winding. The feedback circuit may be operated to develop a negative resistance across the two ends of the conductor winding by driving a secondary current in the conductor winding, with the absolute value of the negative resistance matching the value of the resistance of the conductor winding. The conductor winding may be wound around a magnetic core to operate as a current transformer, with the feedback circuit driving the secondary current in the conductor winding responsive to changes in the magnetic flux developed in the magnetic core in response to a primary current flowing in a conductor passed through the magnetic core.
In some embodiments, the feedback circuit includes an amplifier having an input coupled to the second terminal and an output coupled to the first terminal, with the amplifier operated to force a derivative of the magnetic flux to zero by forcing an inductance voltage of the conductor winding to zero while driving the secondary current in the conductor winding. The feedback circuit may also include an AC coupling network coupled between the second terminal and the first input of the amplifier to force a DC current in the conductor winding to zero. In addition, a sense resistor may be coupled to the second terminal to develop an input voltage at the second terminal by conducting the sense current, with the amplifier amplifying the input voltage, and driving the amplified version of the input voltage at the first terminal. This results in a transformer voltage developed across the first terminal and the second terminal, with the transformer voltage having a value equivalent to a value of the secondary current multiplied by the value of the resistance of the conductor winding.
In addition, the gain of the amplifier may be set with a resistor circuit coupled between a second input of the amplifier and the output of the amplifier. A first resistance in the resistance circuit may have its first terminal coupled to the second input of the amplifier, and its second terminal coupled to the output of the amplifier, and may have a value equivalent to a multiple of the value of the resistance of the conductor winding. A second resistor in the resistance circuit may have a first terminal coupled to the second input of the amplifier, and a second terminal coupled to a voltage reference, and may have a value equivalent to a multiple of the value of the sense resistor. The feedback circuit may also include a programmable digital potentiometer for reducing a baseline (i.e. not temperature dependent) uncertainty of the conductor winding, and/or a thermistor for reducing or compensating for an uncertainty caused by a temperature change of the conductor winding.
Accordingly, a method may be developed for performing measurements using a circuit with a current transformer having a magnetic core and a conductor winding around the magnetic core. The method includes driving a secondary current in the conductor winding through a feedback circuit (which has a first terminal of two terminals coupled to a first end of two ends of the conductor winding, and a second terminal of the two terminals coupled to a second end of the two ends of the conductor winding), developing a negative resistance across the two ends of the conductor winding responsive to driving the secondary current, with an absolute value of the negative resistance matching the value of the resistance of the conductor winding. The method may also include driving a primary current in a conductor passed through the magnetic core, in which case the secondary current in the conductor winding is driven in response to changes in the magnetic flux developed in the magnetic core in response to the conductor conducting the primary current.
In some embodiments, developing the negative resistance may include forcing a derivative of a magnetic flux developed in the magnetic core to zero, by forcing an inductance voltage of the conductor winding to zero while driving the secondary current in the conductor winding. In addition, a DC current in the conductor winding may also be forced to zero, to eliminate DC error effects. In addition, developing the negative resistance may include developing an input voltage at the second terminal by having a sense resistor conduct the sense current, and developing a transformer voltage across the first terminal and the second terminal by amplifying the input voltage, and driving the amplified version of the input voltage at the first terminal, with the transformer voltage having a value equivalent to the value of the secondary current multiplied by the value of the resistance of the conductor winding. The amplification may be performed using an amplifier circuit that includes
an amplifier having a first input to receive the input voltage, also having a second input, and having an output coupled to the first terminal. The amplifier circuit may include a resistor circuit coupled between the second input of the amplifier and the output of the amplifier, to set a gain of the amplifier. The method may also include reducing a temperature uncertainty of the conductor winding through a programmable digital potentiometer coupled in the resistor circuit, and/or reducing a temperature change of the conductor winding through a thermistor coupled in the resistor circuit.
Other aspects of the present invention will become apparent with reference to the drawings and detailed description of the drawings that follow.
A better understanding of the present invention can be obtained when the following detailed description of the preferred embodiment is considered in conjunction with the following drawings, in which:
While the invention is susceptible to various modifications and alternative forms, specific embodiments thereof are shown by way of example in the drawings and are herein described in detail. It should be understood, however, that the drawings and detailed description thereto are not intended to limit the invention to the particular form disclosed, but on the contrary, the intention is to cover all modifications, equivalents and alternatives falling within the spirit and scope of the present invention as defined by the appended claims.
Embodiments of the present invention may be used in systems configured to perform test and/or measurement functions, to control and/or model instrumentation or industrial automation hardware, or to model and simulate functions, e.g., modeling or simulating a device or product being developed or tested, etc. More specifically, it may be used in various instances where input protection for instrumentation equipment is required, without degrading the performance of the protected instrumentation equipment. However, it is noted that the present invention may equally be used for a variety of applications, and is not limited to the applications enumerated above. In other words, applications discussed in the present description are exemplary only, and the present invention may be used in any of various types of systems. Thus, the system and method of the present invention may be used in any number of different applications. It is noted that the various terms or designations for circuits/components as they appear herein, such as “feedback circuit”, “measurement circuit”, etc. are merely names or identifiers used to distinguish among the different circuits/components, and these terms are not intended to connote any specific, narrowly construed meaning.
The computer system may couple to and operate with one or more of these instruments. In some embodiments, the computer system may be coupled to one or more of these instruments via a network connection, such as an Ethernet connection, for example, which may facilitate running a high-level synchronization protocol between the computer system and the coupled instruments. The instruments may be coupled to the unit under test (UUT) or process 150, or may be coupled to receive field signals, typically generated by transducers. System 100 may be used in a data acquisition and control applications, in a test and measurement application, an image processing or machine vision application, a process control application, a man-machine interface application, a simulation application, or a hardware-in-the-loop validation application, among others.
The one or more devices may include a data acquisition board 114 inserted into or otherwise coupled with chassis 124 with associated signal conditioning circuitry 126, a PXI instrument 118, a video device 132 and associated image acquisition card 134, a motion control device 136 and associated motion control interface card 138, a field bus device 170 and associated field bus interface card 172, a PLC (Programmable Logic Controller) 176, a serial instrument 182 and associated serial interface card 184, or a distributed data acquisition system, such as the Compact FieldPoint or CompactRIO systems available from National Instruments, among other types of devices. In some embodiments, similar to the system shown in
In some embodiments, measurement or measuring instruments and devices, such as those shown in
As illustrated in
A typical measurement circuit that uses a current transformer is shown in
I
L
=I
S(RL+RS)/jωL.
The inductor current (IL) represents the error in the secondary current (IS) as a measure of the primary current (IP). For a fixed value of inductance 214, the error manifests itself as a first order high-pass filter. However, inductance 214 is proportional to the permeability μ of the core, and is nonlinear with respect to either frequency or amplitude. As a result, the secondary current IS is prone to gain error and phase error, which can vary with both signal level and frequency.
Furthermore, a given core may only sustain a certain amount of magnetic flux before it saturates and ceases to operate as a transformer. According to the selection of core geometry, material, and windings, a current transformer typically exhibits characteristics that represent a balance, to varying degrees, between at least the following limitations: large size, non-linear errors, gain errors and phase shifts, limited signal range, and intolerance to DC currents. As illustrated in
In one set of embodiments, a novel measurement circuit featuring a transformer may be designed with a circuit implementing a negative sense resistance having a(n absolute) value commensurate with the effective value of the winding resistance of the current transformer. Referring to circuit 250, the novel circuit may be characterized as circuit 250 including a sense resistor 206 such that RS=−RL. Such a configuration keeps the voltage across the inductance 214 at approximately zero (0) volts, resulting in the flux (and the error current IL that it represents) also becoming approximately zero:
I
L
=I
S(RL+RS)/jωL=IS(RL−RL)/jωL≈0.
In practice, the error current may not be reduced to exactly zero, but rather it may be reduced to at least a specified (maximum) level according to (or dependent on) how well the negative sense resistance is matched to the winding resistance 216 (RL). One embodiment of a proposed measurement circuit 300 that includes a circuit 219 implementing a negative sense resistance having a(n absolute) value matching the value of winding resistance 216 is shown in
Referring now to
In other words, unlike closed-loop magnetic sensor designs, which directly measure the magnetic field and use feedback to force the flux to zero, circuit 350—through matching-negative-resistance circuit 219—uses amplifier 228 as a feedback to force the inductance voltage and therefore the flux derivative to zero. Accordingly, the voltage across inductance 214 may be expressed as:
V
L
=NΦ′=jωNΦ=0,
from which it follows that ΦAC=0.
As detailed above, circuit 219 may be considered to be an active negative resistance intended to match the resistance of RL 216 in value, to force the inductance voltage VL to zero, which in turn forces the AC component of the flux to zero. However, there is also a need to control the DC component of the flux, which may be accomplished by an AC coupling network that includes capacitance CAC 230 and resistance RAC 224, which ensures that there is no DC flux from the feedback circuit, or feedback at low frequency, by forcing the DC current to zero. That is, the AC coupling network (CAC and RAC) is used to force the DC voltage across L 214 to be zero, which forces the DC current to zero, and also stabilizes amplifier 228. Because this technique nulls (or eliminates) the derivative of the flux, and not the flux directly—the latter being the case for closed loop magnetic sensor designs—circuit 350 may be primarily used to perform AC current measurements, much like simple current transformers. Overall, circuit 350 has the benefit of not carrying the burden of magnetic sensors or an additional winding.
Using a Measurement Circuit with a Current Transformer and Active Negative Resistance
As a means of comparison, the performance of a 6.8 cm3 current transformer used in a power quality measurement circuit of a leading vendor may be compared to the performance of a smaller, 2.6 cm3 transformer. The comparison results are presented in the graphs shown in
A gain error plot 1200 in
The set of plots in
As mentioned above, the circuit technique described herein is based on the negative impedance of a feedback circuit being equal in magnitude to the winding resistance of the current transformer. Simply designing the circuit (e.g. circuit 219) based on the nominal values of the current transformer may reduce the flux to one-tenth the value that the flux may have in a traditional shunt configuration. However, this reduction in flux may be further improved with calibration and temperature compensation. Various embodiments of improved CT measurement circuits using the active negative resistance feedback circuit may be implemented with a smaller current transformer having a core that was designed for saturation immunity rather than measurement accuracy, while still achieving the measurement performance of a larger current transformer. Therefore, various embodiments of such circuits may be smaller, with a wider input range, and with much better DC immunity than present day traditional CT measurement circuits.
It should be noted that a potential cost of the benefits conferred by various embodiments of an active negative resistance feedback circuit in a CT measurement circuit may be power. In a traditional CT measurement circuit design with a simple shunt resistor, the primary current provides the power (through the flux of the core) to drive the sense current through the winding and shunt resistances. In the embodiments disclosed herein, that power is provided from the amplifier (e.g. amplifier 228). With the example small CT described previously, there were 1500 secondary turns with a 38 Amp input current range, which might reasonably call for a ±40 mA range of secondary currents.
Although the embodiments above have been described in considerable detail, numerous variations and modifications will become apparent to those skilled in the art once the above disclosure is fully appreciated. It is intended that the following claims be interpreted to embrace all such variations and modifications.