Claims
- 1. A method to determine distance z between a pixel detector and a target, the method comprising the following steps:
(a) illuminating said target with optical energy having a periodic waveform that includes a high frequency component S1(ω·t); (b) disposing said pixel detector so as to detect an optical energy signal having a high frequency component S2(ω·t)=A·S1(ω·t−Φ) reflected from said target, where A is a coefficient proportional to brightness of said target, and Φ is phase shift proportional to time-of-flight of light over said distance z; and (c) signal-processing said signal S2(ω·t) to generate a phase signal Φ proportional to said distance z.
- 2. The method of claim 1, wherein at step (a), said high frequency component S1(ω·t) is approximated by S1(ω·t)=cos(ω·t).
- 3. The method of claim 1, wherein:
step (b) includes providing an array of pixel detectors; and step (c) includes generating said phase signal Φ for a detected said signal output by each of said pixel detectors.
- 4. The method of claim 1, wherein step (c) includes homodyne-mixing said signal S2(ω·t) with a signal proportional to S1(ω·t+ψ).
- 5. The method of 4, wherein step (c) includes subjecting said input signal S1(ωt) to a variable phase delay to generate said S1(ω·t+ψ) .
- 6. The method of claim 4, wherein at steady-state, ψ=Φ±90°.
- 7. The method of claim 4, wherein step (c) further includes varying said ψ to find zero average value for a homodyne product S1·S2.
- 8. The method of claim 4, wherein step (c) further includes reducing high frequency components in S1·S2 to yield an average value for a homodyne product S1·S2.
- 9. The method of claim 4, wherein step (c) further includes integrating an average value for said homodyne product S1·S2 to produce said ψ.
- 10. The method of claim 1, further including estimating magnitude of said co-efficient A.
- 11. The method of claim 1, further including a step of estimating magnitude of said co-efficient A by homodyne mixing S2 with S1(ω·t+ψ+π/2).
- 12. The method of claim 4, wherein step (c) includes homodyne-mixing said S2 with a signal of close frequency that is phase locked onto S1 to yield an intermediate frequency signal ωc, and at least one step selected from a group consisting of (i) homodyne-mixing a resulting intermediate signal again with said ωc, and (ii) directly digitizing said intermediate frequency signal ωc and extracting Φ using digital signal processing.
- 13. The method of claim 1, wherein step (a) includes generating a plurality of discrete frequencies ωi selected to reduce aliasing.
- 14. The method of claim 1, wherein each said step is carried out by circuitry fabricated on a CMOS integrated circuit, said integrated circuit including an array of pixel detectors each identical to said pixel detector.
- 15. The method of claim 14, wherein said integrated circuit includes a microprocessor, and at least step (c) is executed by said microprocessor.
- 16. A CMOS-implementable integrated circuit (IC) time of flight (TOF) measurement system used with an optical emitter to determine distance z between said IC and a target, the IC including:
a generator coupleable to said optical emitter to cause said optical emitter to output a signal having a high frequency component representable as a high frequency component S1(ω·t); an array of pixel detectors to detect an optical energy signal having a high frequency component representable as S2i(ω·t)=A·S1(ω·t−Φi) reflected from said target, where i is an integer, A is a coefficient proportional to brightness of said target, and Φ is phase shift proportional to time-of-flight of light over said distance z; for each of said pixel detectors, an associated electronic circuit; wherein said circuit is coupled to receive and signal process said signal S2(ω·t) and to generate a phase signal Φ proportional to said distance z.
- 17. The IC of claim 16, wherein said high frequency component S1(ω·t) is approximated by S1(ω·t)=cos(ω·t).
- 18. The IC of claim 16, wherein said electronic circuit signal processes by homodyne-mixing said signal S2(ω·t) with a signal proportional to S1(ω·t+ψ), wherein at steady-state, ψ=Φ±90°.
- 19. The IC of claim 18, wherein said electronic circuit signal processes by subjecting said input signal S1(ωt) to a variable phase delay to generate said S1(ω·t+ψ) .
- 20. The IC of claim 18, wherein said electronic circuit further signal processes by carrying out at least one function selecting from a group consisting of (a) varying said ψ to find zero average value for a homodyne product S1·S2, (b) reducing high frequency components in S1·S2 to yield an average value for a homodyne product S1·S2, (c) integrating an average value for said homodyne product S1·S2 to produce said ψ, and (d) estimating magnitude of said co-efficient A.
RELATION TO PREVIOUSLY FILED APPLICATIONS
[0001] Priority is claimed from applicant's co-pending U.S. provisional patent application serial No. 60/209,948 filed on Jun. 6, 2000 entitled “3D Imaging Using Multiple Pixel Phase Detection on a CMOS Chip”. Applicant also refers to and incorporates by reference herein U.S. utility application Ser. No. 09/401,059 filed Sep. 22, 1999 entitled “CMOS-Compatible Three-Dimensional Image Sensor IC”, now U.S. Pat. No. ______ (2001).
Provisional Applications (1)
|
Number |
Date |
Country |
|
60209948 |
Jun 2000 |
US |