Embodiments of the invention relate to a coaxial microstrip line conversion circuit.
When a coaxial line and a microstrip line are connected, high frequency signals are reflected because the propagation mode is discontinuous.
For example, the discontinuity of the propagation mode increases when the distance in the vertical plane between the ground outer conductor part of the coaxial line and the back surface ground conductive part of the microstrip line substrate increases. Also, such an effect increases as the signal frequency increases.
[Patent Literature 1]
To provide a coaxial microstrip line conversion circuit in which reflections of high frequency signals of not less than several GHz can be reduced.
A coaxial microstrip line conversion circuit of an embodiment includes a housing part, a microstrip line substrate, a coaxial line, and a solder layer. The housing part includes a bottom surface, and a first side surface in which an opening is provided. The bottom surface includes a protrusion protruding upward. The microstrip line substrate includes a dielectric body, a microstrip line provided at the upper surface of the dielectric body, and a ground conductive part provided at the lower surface of the dielectric body. The coaxial line includes a central conductor part that is mounted to the first side surface and includes one end portion extending in a horizontal direction through the opening toward an interior of the housing, and a ground conductor part that includes an inner surface facing the central conductor part. The solder layer bonds the one end portion of the central conductor part and one end portion of the microstrip line. A recess is provided in the lower surface of the dielectric body by cutting a prescribed region at the side adjacent to the protrusion; and the ground conductive part is provided to be bent at the cut surface. The microstrip line substrate is mounted to the bottom surface of the housing part so that the recess and the protrusion fit together with the ground conductive part interposed. A vertical distance between a ground surface of the ground conductive part adjacent to the cut surface and a lowest position of the inner surface of the ground conductor part in a vertical cross section including a center line of the central conductor part is less than a vertical distance between the lowest position and a ground surface of the ground conductive part adjacent to a region of the lower surface of the dielectric body at which the recess is not provided.
Embodiments of the invention will now be described with reference to the drawings.
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The solder layer 40 bonds the one end portion 32a of the central conductor part 32 and one end portion of the microstrip line 24.
A recess 28 is provided in the lower surface of the dielectric body 22 by cutting a prescribed region at the side adjacent to the protrusion 16; and a portion of the ground conductive part 26 is provided to be bent at the cut surface. The thickness of the dielectric body 22 at the thinned region is taken as T3. The microstrip line substrate 20 is fixed to the bottom surface 18 of the housing part 10 by using, for example, screws, etc., so that the recess 28 and the protrusion 16 fit together.
A line width W1 of the microstrip line 24 at the side opposite to the recess 28 is set to be less than a line width W2 of the microstrip line 24 at the region of the dielectric body 22 at which the recess 28 is not provided. The line widths W1 and W2 can be determined to provide the prescribed characteristic impedance (e.g., 50Ω).
As shown in
For example, the recess 28 has an opening width of 1.4 mm in a direction parallel to the outer side surface of the dielectric body 22. Also, for example, the recess 28 has a depth of 0.6 mm in a direction perpendicular to the outer side surface of the dielectric body 22.
In a vertical cross section including a center line 32c of the central conductor part 32, a vertical distance TG1 is set to be less than a vertical distance TG2. The vertical distance TG1 is between a ground surface 26a of the ground conductive part 26 adjacent to the cut surface and a lowest position 34a of the inner surface of the ground conductor part 34 facing the central conductor part 32. The vertical distance TG2 is between the lowest position 34a and a ground surface 26b of the ground conductive part 26 adjacent to a region of the lower surface of the dielectric body 22 at which the recess 28 is not provided.
In the coaxial line 30, the diameter of the central conductor part 32 is taken as d (mm); and the diameter of the inner surface of the ground conductor part 34 is taken as D (mm). A characteristic impedance Z0 of the coaxial line 30 is represented by Formula (1), in which εr is the relative dielectric constant.
The characteristic impedance Z0 is 50Ω for a hollow coaxial line for which the relative dielectric constant εr=1.
Also, a cutoff frequency fc of the coaxial line 30 is represented by Formula (2), in which c is the speed of light (=3×1011 mm/s), and π is pi.
When D=0.92 mm, d=0.4 mm, and the relative dielectric constant εr=1, the cutoff frequency fc can be sufficiently high, i.e., about 145 GHz. On the other hand, for example, when D=3 mm, d=1.07 mm, and εr=1.52, the high frequency propagation characteristics degrade because the cutoff frequency fc degrades to about 38.1 GHz.
According to the first embodiment, the discontinuity of the propagation mode is reduced by reducing the vertical distance TG1 between the lowest position 34a in the vertical cross section of the ground conductor part 34 of the coaxial line 30 and the ground surface 26a of the ground conductive part 26 of the microstrip line substrate 20 at which the recess 28 is provided.
For example, when setting D=0.92 mm, d=0.4 mm, and the like to increase the cutoff frequency fc, the distance (the spacing) between the ground conductor part 34 and the central conductor part 32 of the coaxial line 30 becomes small, i.e., 0.26 mm. When the dielectric body 22 is made thin accordingly, warp easily occurs in the microstrip line substrate 20 when fixing to the bottom surface 18 of the housing part 10. According to the first embodiment, the warp of the dielectric body 22 is suppressed by reducing the thickness T2 of the microstrip line substrate 20 only at the vicinity of the connection position between the coaxial line 30 and the microstrip line substrate 20. In other words, it becomes easy to make the distance between the central conductor part 32 and the ground conductor part 34 less than the thickness of the region of the dielectric body 22 at which the recess 28 is not provided (0.4 mm).
Also, the thickness of the ground conductive part 26 and the thickness of the microstrip line 24 each are taken as a. Furthermore, the vertical distance between the stripe-shaped conductive part 24 and the lower end of the central conductor part 32 is taken as β. The ground conductive part 26 and the microstrip line 24 can include, for example, Cu foils.
Here, a first specific example of the first embodiment will be described. T3=0.2 mm and α=0.02 mm are set. To set vertical distance TG1=0, it is sufficient to set T1=0.2 mm and β=0.04 mm. Also, as a second specific example, T1=0.2 mm and β=0.08 mm are set, and the vertical distance TG1 is equal to 0.04 mm when providing the microstrip line substrate 20 lower by cutting the bottom surface 18 of the housing part 10.
In the second specific example, the total separation distance is 0.28 mm, i.e., includes 0.06 mm perpendicularly downward, 0.2 mm in the horizontal direction and 0.02 mm perpendicularly upward between a grounding point PV and a grounding point PH. The grounding point PV is provided at the lowest position 34a in the end portion of the inner surface of the ground conductor part 34 in the end portion of the coaxial line 30. The grounding point PH is provided at the end portion of the ground surface 26a (at the grounding point PV side) in the ground conductive part 26 of the microstrip line 20. In other words, when the vertical distance TG1 is nonzero but is, for example, within a range of about plus or minus 0.05 mm, the vertical distance TG1 between the lowest position 34a of the ground conductor part 34 of the coaxial line 30 and the ground surface 26a of the ground conductor part 26 of the microstrip line substrate 20 can be reduced, and the distance between the grounding point PH and the grounding point PV can be small, i.e., 0.28 mm, etc. Therefore, the discontinuity of the propagation mode in the coaxial microstrip line conversion circuit can be suppressed.
The vertical axis is the voltage standing wave ratio (VSWR: Voltage Standing Wave Ratio), and the horizontal axis is the frequency (GHz). For example, the microstrip line 24 is terminated with a 50Ω load; and the load impedance viewed from the coaxial line 30 is measured. The voltage standing wave ratio VSWR is low and is maintained within about 1.08 up to a frequency of 40 GHz.
The size and the structure of the coaxial line 130 are similar to those of the first embodiment. A recess is not provided in the backside of a microstrip line substrate 120; and the thickness of a dielectric body 112 is set to 0.4 mm. Also, the microstrip line substrate 120 is mounted to the surface of a bottom surface 118 of a flat housing part 110.
The thickness of a ground conductive part 126 and the thickness of a microstrip line 124 are taken as α; α is set to 0.02 mm; the vertical distance between the microstrip line 124 and the lower end of a central conductor part 132 is taken as β; and the value of β is set to 0.06 mm. A vertical distance TTG between a lowest position 134a of a ground conductor part 134 of the coaxial line 130 and a ground surface 126c of the ground conductor part 126 of the microstrip line substrate 120 is 0.22 mm.
In such a case, the total separation distance is large, i.e., 0.46 mm, i.e., includes 0.24 mm perpendicularly downward, 0.2 mm in the horizontal direction, and 0.02 mm perpendicularly upward between the grounding point PV and the grounding point PH. The grounding point PV is provided at the lowest position 134a in the end portion of the inner surface of the ground conductor part 134 in the coaxial line 130. The grounding point PH is provided at the end portion of the ground conductive part 126 (at the grounding point PV side) in the microstrip line substrate. That is, the distance between the central conductor part 132 and the ground conductor part 134 is 0.26 mm, but the thickness of the microstrip line substrate 120 is large, i.e., 0.4 mm; therefore, it is difficult to provide the vertical distance TTG close to zero; and the distance between the grounding points PV and PH increases to 0.46 mm. Thus, the discontinuity of the propagation mode at the vicinity of the connection region increases, and the reflections of the high frequency signals increase.
The voltage standing wave ratio VSWR is about 1.2 at 24 GHz, and degrades to about 1.43 at 40 GHz.
In contrast, according to the first embodiment, the protrusion 16 that has the thickness T1 is provided and fits together with the microstrip line substrate 20 in which the recess 28 is provided. As a result, the vertical distance TG1 between the lowest position 34a of the ground conductor part 34 of the coaxial line 30 and the ground surface 26a of the ground conductor part 26 of the microstrip line substrate 20 can approach zero.
A third specific example of the first embodiment will now be described. When several tens of μm of a copper plating layer and/or a Au flash layer are provided at the surfaces of the microstrip line 24 and the ground conductive part 26 of the microstrip line substrate 20, the ground surface 26a moves to be lower than the lowest position 34a of the ground conductor part 34 of the coaxial line 30. In such a case, for example, the increased portions of the thicknesses of the conductive layers can be canceled by reducing the thickness T2 or the thinned thickness T3 of the dielectric body 22; and a small vertical distance TG1 can be maintained.
A portion of the coaxial line 30 may include a SMP-compatible connector mounted to the first side surface 14 of the housing part 10.
According to the embodiment, a coaxial microstrip line conversion circuit is provided in which the reflections of high frequency signals of not less than several GHz can be reduced. The coaxial microstrip line conversion circuit can be widely used in communication devices from the microwave band to the millimeter-wave band.
While certain embodiments of the inventions have been described, these embodiments have been presented by way of example only, and are not intended to limit the scope of the inventions. These novel embodiments may be embodied in a variety of other forms; and various omissions, substitutions, and changes may be made without departing from the spirit of the inventions. Such embodiments and their modifications also are included in the scope and spirit of the inventions, and are within the scope of the inventions described in the claims and their equivalents.
Number | Date | Country | Kind |
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2019-124371 | Jul 2019 | JP | national |
Filing Document | Filing Date | Country | Kind |
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PCT/JP2020/016086 | 4/10/2020 | WO |
Publishing Document | Publishing Date | Country | Kind |
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WO2021/002077 | 1/7/2021 | WO | A |
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Number | Date | Country | |
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20220247060 A1 | Aug 2022 | US |