Claims
- 1. A method of sampling aggregate behavior to determine progress by the aggregate toward a desired result, comprising:
sampling at least one of aggregate nano and aggregate micro behavior by a transducer; and measuring the aggregate behavior through use of the sample by a macro level control apparatus; if the measured aggregate behavior is identified as diverging from progress toward a desired result, an effector is activated by the macro level control apparatus to influence the aggregate behavior toward progress toward the desired result.
- 2. The method as described in claim 1, wherein the macro level control apparatus implements control functions for interpretation of the aggregate behavior.
- 3. The method as described in claim 2, wherein the control functions are implemented through use of a control algorithm.
- 4. The method as described in claim 2, wherein the macro level control apparatus includes semiconductor processors.
- 5. The method as described in claim 1, wherein measuring includes at least one of measuring light, capturing images, titrating reagents, modulating fields, modulating currents, measuring fields, measuring currents, detecting reaction byproducts and sampling forces.
- 6. The method as described in claim 1, wherein a bidirectional interface is provided between the at least one of nano and micro behavior and the macro level control apparatus through use of the transducer and effector.
- 7. The method as described in claim 1, wherein the effector is operable to at least one of govern, alter and influence a course of aggregate level behavior.
- 8. The method as described in claim 1, wherein the effector operates to alter aggregate level behavior by at least one of electronic, chemical, photonic, thermal and mechanical processes.
- 9. A system for sampling aggregate behavior to determine progress by the aggregate toward a desired result, comprising:
an aggregation of structures, the structures of the aggregation sized as at least one of a nano and micro level; a transducer suitable for sampling behavior of the aggregation of structures; a macro level control apparatus coupled to the transducer; the macro level control apparatus suitable for providing formalisms for influencing aggregate behavior; and an effector coupled to the macro level control apparatus, the effector operable to influence the aggregate behavior upon activation by the macro level control apparatus.
- 10. The system as described in claim 9, wherein the macro level control apparatus implements control functions for interpretation of the aggregate behavior.
- 11. The system as described in claim 10, wherein the control functions are implemented through use of a control algorithm.
- 12. The system as described in claim 10, wherein the macro level control apparatus includes semiconductor processors.
- 13. The system as described in claim 9, wherein the transducer measures the aggregation of structures through at least one of measuring light, capturing images, titrating reagents, modulating fields, modulating currents, measuring fields, measuring currents, detecting reaction byproducts and sampling forces.
- 14. The system as described in claim 9, wherein the effector operates to influence aggregate level behavior by at least one of electronic, chemical, photonic, thermal and mechanical processes.
- 15. A system for sampling aggregate behavior to determine progress by the aggregate toward a desired result, comprising:
an aggregation of structures, the structures of the aggregation sized as at least one of a nano and micro level; a means for sampling behavior of the aggregation of structures; a means for controlling, the controlling means operable at a macro level, wherein the controlling means is coupled to the sampling means; the controlling means providing formalisms for influencing aggregate behavior; and a means for effecting coupled to the macro level control apparatus, the effecting means operable to influence the aggregate behavior.
- 16. The system as described in claim 15, wherein the controlling means implements control functions for interpretation of the aggregate behavior.
- 17. The system as described in claim 16, wherein the control functions are implemented through use of a control algorithm.
- 18. The system as described in claim 16, wherein the controlling means includes semiconductor processors.
- 19. The system as described in claim 15, wherein the sampling means measures the aggregation of structures through at least one of measuring light, capturing images, titrating reagents, modulating fields, modulating currents, measuring fields, measuring currents, detecting reaction byproducts and sampling forces.
- 20. The system as described in claim 15, wherein the effecting means operates to influence aggregate level behavior by at least one of electronic, chemical, photonic, thermal and mechanical processes.
CROSS REFERENCE TO RELATED APPLICATIONS
[0001] The present application hereby incorporates the following United Stated patent applications by reference in their entirety:
1AttorneyExpress MailDocket NumberL.N./U.S.P.N.Filing DateLSI 01-39010/015,194Nov. 20, 2001LSI 01-48810/021,414Oct. 30, 2001LSI 01-48910/021,619Oct. 30, 2001LSI 01-49010/021,696Oct. 30, 2001LSI 01-524B10/044,781Jan. 10, 2002LSI 01-543EV 087 433 356 USApr. 30, 2002LSI 01-69509/842,335Apr. 25, 2001LSI 01-82710/034,839Dec. 27, 2001LSI 01-828B10/061,660Feb. 1, 2002,