Number | Name | Date | Kind |
---|---|---|---|
4121003 | Williams | Oct 1978 | |
4190315 | Brettle et al. | Feb 1980 | |
4469725 | Fischer et al. | Sep 1984 | |
4787158 | Vitol | Nov 1988 | |
4837061 | Smits et al. | Jun 1989 | |
4994314 | Rosenfeld et al. | Feb 1991 | |
5015318 | Smits et al. | May 1991 |
Number | Date | Country |
---|---|---|
817099 | Mar 1981 | SUX |
Entry |
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R. E. Pawel et al, Submicron Sectioning Technique, Journal of Applied Physics, vol. 35, No. 2, Feb. 1964, pp. 435-438. |
R. E. Pawel et al, Impurity Distributions in Anodic Films or Tantalum, J. Electrochem. Soc., vol. 119, No. 1, Jan. 1972, pp. 24-29. |