60/254,432 filed Dec. 8, 2000.* |
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“Flat Panel Display Measurement Standard Version 2.0 VESA (Video Electronic Standards Association Display Metrology Committee”. pp. 27, 28, 188-190 and 205 (Jun. 2001). |
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A New Uniformity Measurement Method for LCDs Panels. Part of the IS&T/SPIE Conference on Display Metrology, San Jose, CA, Jan., 1999. SPIE vol. 3636. Thierry R. Leroux, pp. 191-198. |
Stray Light Elimination in Making Projection Display Measurements. Paul A. Boynton and Edward F. Kelly Part of the IS&T/SPIE Conference on Display Metrology, San Jose, CA, Jan., 1999. SPIE vol. 3636, pp. 232-239. |
Colorimetric Characterization of There Computer Displays (LCD and CRT). Jason E. Gibson and Mark D. Fairchild. Jan., 2000. Munsell Color Science Laboratory, Center for Imaging Science, Rochester Institute of Technology, 54 Lomb Memorial Drive, Rochester, NY. |
Colorimetric Tolerances of Various Digital Image Displays. Jason E. Gibson, Mark D. Fairchild and Steven L. Wright, Munsell Color Science Laboratory, Center for Imaging Science, Rochester Institute of Technology, 54 Lomb Memorial Drive, Rochester, NY. IBM T.J. Watson Research ) Center, Yorktown Heights, New York, pp. 295-300 (Jan. 2000). |
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LCD Visual Performance: Characterization and Evaluation. Part of the IS&T/SPIE Conference on Display Metrology, San Jose, CA, Jan., 1999, SPIE vol. 3636. Michael E. Becker, pp. 170-183. |