The invention relates to an image sensor, and particularly relates to a column analog-to-digital converter (column ADC) and its local counting method.
A conventional CMOS image sensor (CMOS Image sensor, CIS) generally adopts a column analog-to-digital converter (CADC). CADC is usually composed of multiple successive-approximation register analog-to-digital converters (SAR ADC) or multiple single-slope analog-to-digital converters (single-slope ADC). Each single-slope ADC receives a column signal corresponding to a row of pixels, and the multiple single-slope ADCs share a digital-to-analog converter (DAC), a high-speed clock generator and a sense amplifier.
The single-slope ADC uses a counter to calculate an output length of the signal generated by comparing a ramp voltage and the column signal as the output of the ADC. Therefore, the resolution of the ADC depends on available counting time and a counting frequency. Nevertheless, the counting frequency is often limited by a loading of the clock tree, which increases the counting time at high resolution of ADC. In addition, the CADC counter is faced with a serious challenge of power consumption due to high counting frequency.
Since Correlated Double Sampling (CDS) and High Dynamic Range Imaging (HDR) are widely spread in the applications such as touch control, image sensing, and fingerprint recognition, it results in reduced available counting time. Moreover, the frame rate is limited by conversion time of ADC.
A conventional technology adopts phase delays to increase the resolution of ADC without raising the counting frequency. For example, 3 phase delays are added to the Least Significant Bit (LSB) of the high-speed clock. That is, the half cycle of bit[0] is cut into four equal parts, so as to add 2 bits to the resolution of ADC. However, the phase delay of the LSB is usually generated by a delay-locked loop (DLL) or a phase-locked loop (PLL), which would enlarge the layout area and the power consumption. Besides, different phase delays require a path balance in the layout to avoid increasing the differential nonlinearity (DNL) of the ADC, yet it will step up the difficulty of layout design.
Another conventional technology uses a local delay line to generate multiple phases in LSB, and a logic circuit determines which phase the transition time of an input signal locates in, so as to output the corresponding binary code according to the determination result. Nevertheless, it requires additional trim circuits to eliminate the PVT variation.
The invention provides a column analog-to-digital converter (CADC) with a local counting method which enables a local counting based on a comparator output signal, so as to raise the counting resolution and perform a self-compensation without trim circuits.
An embodiment of the invention provides a column analog-to-digital converter. The column analog-to-digital converter includes a plurality of analog-to-digital converters in parallel. Each of the analog-to-digital converters receives a ramp voltage, one of a plurality of column signals, and a base clock to generate a counting output. Each of the analog-to-digital converters includes a comparator and a counting circuit. The comparator is configured to compare the ramp voltage with one of the plurality of column signals to generate a comparator output signal. The counting circuit is configured to generate a local clock by means of a voltage-controlled oscillator of the counting circuit according to the base clock and the comparator output signal, count the base clock and the local clock respectively to generate a first counting output and a second counting output, and combine the first counting output with the second counting output to generate the counting output.
An embodiment of the invention provides a local counting method. A column analog-to-digital converter includes a plurality of analog-to-digital converters in parallel. The local counting method of the each analog-to-digital converter comprises as below. Each analog-to-digital converter compares a ramp voltage with one of column signals to generate a comparator output signal. A voltage-controlled oscillator of each analog-to-digital converter generates a local clock according to a base clock and the comparator output signal. Each analog-to-digital converter counts the base clock and the local clock respectively to generate a first counting output and a second counting output. Each analog-to-digital converter combines the first counting output with the second counting output to generate the counting output.
Based on the above, in the embodiments of the invention, in order to cope with the frequency limit caused by a timing violation and a long wire and to reduce a system complexity, the embodiments of the invention provide a column analog-to-digital converter (CADC) with a local counting method which enables a local counting based on a comparator output signal, so as to raise the counting resolution and perform a self-compensation without trim circuits.
To make the above features and advantages of the invention more comprehensible, embodiments accompanied with drawings are described in detail as follows.
The accompanying drawings are included to provide a further understanding of the invention, and are incorporated in and constitute a part of this specification. The drawings illustrate embodiments of the invention and, together with the description, serve to explain the principles of the invention.
Reference will now be made in detail to the embodiments of the invention, examples of which are illustrated in the accompanying drawings. Wherever possible, the same reference numbers are used in the drawings and the description to refer to the same or like parts.
Referring to
Giving the analog-to-digital converters 110_1 as an example, the analog-to-digital converters 110_1 includes a comparators 140_1 and a counting circuits 150_1, and the counting circuits 150_1 includes a built-in voltage-controlled oscillator 160_1. The comparators 140_1 compares the ramp voltage VRAMP with the column signals CS1 to generate the comparator output signals CMP1. Thereafter, the counting circuits 1501 generates the local clocks CLKL1 by means of the voltage-controlled oscillator 160_1 according to the base clock CLKB and the comparator output signals CMP1, counts the base clock CLKB to generate a first counting output CO1A, counts the local clocks CLKL1 to generate a second counting output CO1B, and combines the first counting output CO1A with the second counting output CO1B to generate the counting output CO1. The implementation of the comparator 140_1 is not limited.
In addition, since the analog-to-digital converters 110_2-110_N are column repeats and similar with analog-to-digital converters 110_1, details thereof with corresponding comparator output signals CMP2-CMPN, local clocks CLKL2-CLKLN, first counting outputs CO2A-CONA, and second counting outputs CO2B-CONB are not repeatedly again.
The local counting circuit 220 includes an edge detector 230, the voltage-controlled oscillator 160_1, and a counter 240. The edge detector 230 detects the transition of the base clock CLKB and the comparator output signal COMP1 to generate a duty cycle enabling signal DCEN and a count enabling signal CNTEN. Specifically, the edge detector 230 may generate the duty cycle enabling signal DCEN and the count enabling signal CNTEN based on the rising edge or falling edge of the base clock CLKB and the comparator output signal COMP1 depending on the design requirement. The voltage-controlled oscillator 160_1 generates the local clock CLKL1 when the voltage-controlled oscillator 160_1 is enabled according to the duty cycle enabling signal DCEN and the counting enabling signal CNTEN. The counter 240 counts the local clock CLKL to generate the second counting output CO1B when the counter 240 is enabled according to the count enabling signal CNTEN.
During a first period T1 of the basic clock CLKB and when the basic clock CLKB and the comparator output signal CMP1 are both enabled, the voltage-controlled oscillator 160_1 provides the local clock CLKL1 having a first frequency f1 to the counter 240, as 1X local frequency within a duration TCMP1 shown in
During a second period T2 of the basic clock CLKB and when the basic clock CLKB and the comparator output signal CMP1 are both enabled, the voltage-controlled oscillator 160_1 provides the local clock CLKL1 having a second frequency f2 to the counter 240, as 0.5× local frequency shown in
Next, the counter 240 compares the final value VF of the local counting value VLC with the initial value VI of the local counting value VLC to generate the second counting output CO1B. In the embodiment, when the final value VF is greater than the initial value VI as shown in
As such, the timing of enabling the comparator output signals CMP1 whether before the half of duty of the first period T1 or after the half of duty of the first period T1 would be certainly determined. For example, the timing of enabling the comparator output signals CMP1 is before the half of duty of the first period T1 as shown in
It is noted that in this embodiment, the basic clock CLKB is enabled in positive duty as shown in
During a first period T1 of the basic clock CLKB and when the basic clock CLKB and the comparator output signal CMP1 are both enabled, the voltage-controlled oscillator 160_1 provides the local clock CLKL1 having a first frequency f1 to the counter 240, as 1X local frequency within a duration TCMP1 shown in
When the basic clock CLKB is disabled, the voltage-controlled oscillator 160_1 immediately provides the local clock CLK1 having a second frequency f2 to the counter 240, as 0.5× local frequency shown in
Next, the counter 240 compares the final value VF of the local counting value VLC with the initial value VI of the local counting value VLC to generate the second counting output CO1B. In the embodiment, when the final value VF is less than the initial value VI as shown in
During a first period T1 of the basic clock CLKB and when the basic clock CLKB and the comparator output signal CMP1 are both enabled, the voltage-controlled oscillator 160_1 provides the local clock CLKL1 having a first frequency f1 to the counter 240, as 1X local frequency within a duration TCMP1 shown in
During the second periods T21, T22 and T23 after the first period T1 of the basic clock CLKB and when the basic clock CLKB and the comparator output signal CMP1 are both enabled, the voltage-controlled oscillator 160_1 provides the local clock CLKL1 having a third frequency f3 to the counter 240, as 0.25× local frequency shown in
Next, the counter 240 takes a logic value when the local counting value VLC is just less than or equal to the initial value VI as the second counting output CO1B. For example, in this embodiment, when the local counting value VLC is just less than the initial value VI within the second period T23 which corresponds to logic 01 as shown in
As such, the timing of enabling the comparator output signals CMP1 would be certainly determined. It is noted that the duty of the first period T1 is split to four parts, which corresponds to logics 00, 01, 10 and 11, respectively. In this embodiment, the timing of enabling the comparator output signals CMP1 in the first part of the duty of the first period T1 corresponds to logic 00 shown in
During a first period T1 of the basic clock CLKB and when the basic clock CLKB and the comparator output signal CMP1 are both enabled, the voltage-controlled oscillator 160_1 provides the local clock CLKL1 having a first frequency f1 to the counter 240, as 1× local frequency within a duration TCMP1 shown in
Afterwards, the counter 240 complements the intermediate value VM of the local count value VLC to obtain a one's complement of the intermediate value VM of the local count value VLC before the second periods T21, T22 and T23 of the basic clock CLKB.
During the second periods T21, T22 and T23 after the first period T1 of the basic clock CLKB and when the basic clock CLKB and the comparator output signal CMP1 are both enabled, the voltage-controlled oscillator 160_1 provides the local clock CLKL1 having a third frequency f3 to the counter 240, as 0.25× local frequency shown in
Next, the counter 240 takes a logic value when the local counting value VLC is just greater than or equal to the initial value VI as the second counting output CO1B. Similar with
During a first period T1 of the basic clock CLKB and when the basic clock CLKB and the comparator output signal CMP1 are both enabled, the voltage-controlled oscillator 160_1 provides the local clock CLKL1 having a first frequency f1 to the counter 240, as 1× local frequency within a duration TCMP1 shown in
During the second periods T21, T22 and T23 after the first period T1 of the basic clock CLKB and when the basic clock CLKB and the comparator output signal CMP1 are both enabled, the voltage-controlled oscillator 160_1 provides the local clock CLKL1 having a third frequency f3 to the counter 240, as 0.25× local frequency shown in
During the third periods T31, T32 and T33 after the second periods T21, T22 and T23 of the basic clock CLKB and when the basic clock CLKB and the comparator output signal CMP1 are both enabled, the voltage-controlled oscillator 160_1 provides the local clock CLKL1 having a third frequency f to the counter 240, as 0.25× local frequency shown in
Next, the counter 240 takes a logic value when the local counting value VLC is just greater than or equal to the initial value VI as the second counting output CO1B. Similar with
Based on the above, in the embodiments of the invention, in order to cope with the frequency limit caused by timing violation and long wire and to reduce the system complexity, the embodiments of the invention provide a column analog-to-digital converter (CADC) with a local counting method which enables a local counting based on a comparator output signal without an trim circuits, so as to raise the counting resolution, perform the self-compensation and improve the PVT variation.
It will be apparent to those skilled in the art that various modifications and variations can be made to the structure of the invention without departing from the scope or spirit of the invention. In view of the foregoing, it is intended that the invention cover modifications and variations of this invention provided they fall within the scope of the following claims and their equivalents.
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