The various embodiments disclosed herein relate to common-mode current suppression devices. In particular, the various embodiments disclosed herein relate to common-mode current suppression devices, such as baluns and line isolators having one or more cores formed of nanocrystalline material.
Providing common-mode current suppression devices, hereinafter referred to as CMDs, such as baluns and line isolators, which have increased levels of common-mode impedance (CMI) is highly advantageous. Such devices are highly sought after by consumers, such as those who participate in the field of HAM (i.e. amateur) radio, as well as the military and commercial industry. Currently, manufacturers increase the CMI of their CMD devices by utilizing a core with increased magnetic permeability; or by stacking multiple cores together to form a “stacked core”, whereupon multiple turns of coaxial cable, or parallel wires are wound through the entire stack. However, such techniques are still limited in the amount of increased CMI that can be achieved.
Therefore, it would be desirable to provide a common-mode current suppression device (CMD) utilizing a core material that enables further increases in CMI over currently available CMDs.
It is one aspect of the various embodiments disclosed herein to provide a core for a current suppression device that includes a core formed of nanocrystalline material.
It is another aspect of the various embodiments disclosed herein to provide a current suppression device that includes a core formed of nanocrystalline material, and a conductive wire that is at least partially wound relative to at least a portion of the core.
It is yet another aspect of the various embodiments disclosed herein to provide the nanocrystalline core, wherein the nanocrystalline material utilized includes FeCuNbSiB.
It is still another aspect of the various embodiments disclosed herein to provide the nanocrystalline core, wherein the nanocrystalline material utilized includes Fe73.5Cu1Nb3Si15.5B7.
The various embodiments disclosed herein will become better understood with regard to the following description, accompanying drawings and claims wherein:
A common-mode current suppression device (CMD), such as a balun or line isolator for example, which utilizes one or more cores of nanocrystalline material, is disclosed herein. In some embodiments, the nanocrystalline material comprises the chemical compound FeCuNbSiB, where Fe is iron; Cu is copper; Nb is niobium; Si is silicon; and B is boron. It should be appreciated that in further embodiments, the nanocrystalline material may comprise the chemical compound Fe73.5Cu1Nb3Si15.5B7, and the like.
In some embodiments, the one or more cores utilized by the CMD may comprise a toroidal core, a sleeve core, a drum core, a rod core, a double aperture (binocular) core, and the like.
Still, in further embodiments, when multiple cores are utilized, they may be arranged in a “stacked” arrangement. That is, the CMD may utilize a plurality of cores that are placed adjacent to each other, such as to be in electrical and/or magnetic communication with each other. In other embodiments, the multiple cores are separately coupled together in series by a length of a conductive wire, such as a coaxial cable. In some embodiments, the plurality of stacked cores may be arranged so that they are separated by one or more layers of other material. For example, the stacked cores may be joined together by an adhesive layer or other suitable attachment means.
The various CMD cores disclosed herein may be utilized with an electrically conductive wire, such as a coaxial cable, or other single or multiple conductor wire, which may be shielded or unshielded. This conductive wire is wrapped through, around, about or relative to one or more different portions of a single nanocrystalline core or multiple nanocrystalline cores to form one or more partial or complete wraps/turns/windings as desired. In the embodiments where the core includes apertures therethrough, the conductive wire may be wrapped through this aperture to form one or more partial or complete wraps/turns/windings, such as that shown in
In one embodiment, a multi-core CMD 10 is shown in
The cores 20A-B are formed of nanocrystalline material. In some embodiments, the nanocrystalline material may have the chemical compound FeCuNbSiB. Alternatively, the nanocrystalline material may have the chemical compound Fe73.5Cu1Nb3Si15.5B7. In addition, a coaxial cable 100 is wrapped around the stacked cores 20A-B. In some embodiments, the coaxial cable 100 includes a central conductor that is separated from a conductive outer layer by an inner dielectric material, while the conductive outer layer is covered by an outer dielectric material to shield it from the external environment. The coaxial cable 100 is wound through the openings 70 and over the cylindrical outer surfaces 50 of the stack 80 of cores 20A-B, so as to form one or more turns or windings of the coaxial cable 100. In some embodiments, the wraps/turns may be spaced uniformly relative to the stack 80 or may be arranged so that a first group 90A of turns is positioned substantially opposite to a second group 90B of turns, as shown in
The experimentally verified operating performance of various CMDs configured as baluns using one or more toroid cores formed of nanocrystalline material Fe73.5Cu1Nb3Si15.5B7 is presented as follows. A Keysight brand (formerly Agilent & Hewlett-Packard) impedance analyzer having model # E4990-120 was utilized for testing. This impedance analyzer was a 120 MHz version having a high stability time base. It was a new machine purchased from Keysight in 2018 and was calibrated by them before shipment, and the calibration was still current as of the time of the subject experimental test.
The Keysight impedance analyzer was used with an impedance test fixture compatible for use with lead-type devices, this test fixture is offered for sale under the Keysight brand having model #16047E.
In addition, a 1-meter port extension cable offered under the Keysight brand having model #16048G was also used.
The 16048G extension cable extended the 4-terminal pair configuration of the measurement ports of the impedance analyzer for attachment to the 16047E test fixture. The text fixture was coupled to the extension cable using a BNC male connector board. Such a test configuration allows a Device-Under-Test (DUT), such as balun 10, to be located away from any external electrical/magnetic influences that may be caused or induced by the impedance analyzer itself. After the 16047E test fixture was setup, and before any measurements were performed, a standard open-short-load calibration of the test fixture was conducted via the E4990-120 analyzer.
The impedance analyzer was kept in a temperature, humidity and dust controlled environment, and was mounted on an all plastic cart to remove any magnetic effects that could affect the readings if the impedance analyzer were mounted on a metal cart.
The impedance analyzer was supplied with electrical power through a high-quality UPS (uninterruptible power supply). The UPS cleans and stabilizes the power supplied to the impedance analyzer, as well as prevents the power supplied thereto from dropping, especially during the taking of test measurements.
In addition, CATS control cables and power cables utilized by the impedance analyzer were isolated from the external environment using high impedance chokes on the control cables and the power cables.
As a further step in isolating the impedance analyzer from external electrical/magnetic influences when taking readings, the impedance analyzer was always controlled from a distance of at least 4 feet from the Device-Under-Test (DUT) by using Internet Explorer through a USB (universal serial bus) port shown above. This web server is built into the impedance analyzer, allowing functions performed on the impedance analyzer itself to be performed remotely through this interface.
a. Single-Core/Single-Turn Balun:
For testing purposes, a measurement test set-up was used for evaluating a CMD having a single toroidal ferrite core and a CMD configured with a single toroidal nanocrystalline core utilizes the 160474E test fixture along with a just-long-enough piece of 14-gauge stranded wire to form the single-turn, whereby the single turn of wire was electrically coupled to the impedance analyzer via the 16047E test fixture. Continuing,
b. Multi-Core/Multi-Turn Balun:
A measurement test set up of a double stack (as shown in
Therefore, it can be seen that the objects of the various embodiments disclosed herein have been satisfied by the structure and its method for use presented above. While in accordance with the Patent Statutes, only the best mode and preferred embodiments have been presented and described in detail, with it being understood that the embodiments disclosed herein are not limited thereto or thereby. Accordingly, for an appreciation of the true scope and breadth of the embodiments, reference should be made to the following claims.
This application claims the benefit of U.S. Provisional Patent Application No. 62/841,117 filed on Apr. 30, 2019, the contents of which are incorporated herein by reference.
Number | Date | Country | |
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62841117 | Apr 2019 | US |