1. Field of the Invention
Embodiments of the present invention generally relate to voltage regulator circuits, and more specifically to a configurable low drop out regulator circuit.
2. Description of the Related Art
Many electronic systems include sets of circuitry that require one or more regulated voltage sources configured to generate specific respective voltages. For example, an electronic system may include a set of circuitry that requires a regulated voltage source of 1.2V, another set of circuitry that requires a regulated voltage source of 3.3V, and yet another set of circuitry that requires a regulated 5V voltage source. An electronic system may also require two distinct voltages sources of 1.2V in order to isolate sensitive circuits from noisy circuits. Each set of circuitry that requires a specific voltage may operate from a common voltage source, or from independent voltage sources that are configured to supply a nominally equivalent voltage. Each voltage source is also configured to source (or sink) a specific maximum current. For example, the 1.2V voltage source may be configured to source up to one ampere, while the 3.3V voltage source may be configured to source up to only 50 milliamps.
One popular type of voltage supply is a low drop out (LDO) regulator circuit or simply “LDO.” An LDO typically includes a voltage drop element disposed between a voltage source and an LDO output node, which supplies a system element with a specified voltage. Control circuitry within the LDO adjusts the voltage drop element in response to dynamic loading of the LDO output node to generate a constant voltage on the LDO output node. A conventional LDO is designed to use a specific voltage drop element that is disposed either on chip or off chip.
As electronic systems become more complex, each integrated circuit within a given system is typically designed to incorporate an increasing number of different system functions, including circuits that function as regulated voltage sources. LDOs are commonly used in this setting for low to moderate current applications. A multi-function integrated circuit typically includes a plurality of such voltage sources, wherein each voltage source is separately designed assuming a specific overall system configuration. For example, a system may require a certain number of low current voltage supplies and one or more high current voltage supplies. In this scenario, a multi-function integrated circuit may include a set of on-chip LDOs specifically configured to act as direct output regulators, capable of supplying low to modest current at a regulated voltage. The multi-function integrated circuit may also include one or more LDOs specifically configured to act as control regulators for an associated external transistor capable of supplying relatively high current. Each specifically optimized LDO represents a costly engineering effort and is conventionally designed to only operate in a specific mode. If the LDOs need to operate in a different mode than originally envisioned, then either a different multi-function integrated circuit needs to be developed and manufactured to implement the required set of LDOs or external power supplies need to be added to the system. Either option may add significant expense to the system.
As the foregoing illustrates, what is needed in the art is a configurable LDO circuit capable of adapting to changing system requirements without requiring a re-design.
One embodiment of the present invention sets forth a voltage regulator circuit operable in a direct output mode and a control mode. The regulator circuit comprises an operational amplifier configured to amplify a differential voltage input, a bias generator configured to generate at least one bias voltage and transmit the at least one bias voltage to the operational amplifier, and a compensation network configured to introduce a pole and a zero in a frequency response for the operational amplifier. The regulator circuit further comprises a follower gain stage configured to amplify voltage swing and generate a control output.
In a first operating mode, the voltage regulator circuit provides a direct regulated output voltage. In a second operating mode, the voltage regulator circuit controls an off chip PNP bipolar junction transistor or p-channel MOSFET transistor to generate a regulated output voltage.
One advantage of the disclosed invention is that a single design for a voltage regulator circuit may be configured at a circuit board level to adapt to changing system needs, thereby saving cost and engineering effort.
The configurable LDO 100 comprises an operational amplifier 120, a follower gain stage 130, a bias generator 122, and a feedback circuit 124. The follower gain stage 130 comprises a p-channel metal-oxide semiconductor (P-MOS) transistor M1134 and a compensation network 132.
The operational amplifier 120 amplifies a differential voltage applied to two inputs, labeled “+” for positive input and “−” for negative input. A positive differential voltage is present when a difference voltage between a voltage applied to the positive input negative a voltage applied to the negative input is a positive value. A negative differential voltage is present when the difference voltage between the voltage applied to the positive input minus the voltage applied to the negative input is a negative value. A bias generator 122 provides at least one bias voltage to the operational amplifier 120 to establish an operational bias point within the operational amplifier 120. Persons skilled in the art will understand that a trade-off relationship exists between the bias point of the operational amplifier 120 and an associated transconductance for the operational amplifier 120. In one embodiment, the bias generator 122 is referenced to VREF 110.
The output of the operational amplifier 120 drives the compensation network 132, and the PMOS transistor 134. The compensation network 132 includes at least one pole and at least one zero selected to enable a stable negative feedback loop from CRTL 114, through feedback circuit 124 to the positive input of operational amplifier 120 (which completes the feedback loop). In one embodiment, the feedback circuit 124 may comprise a resistor. This feedback loop is configured to operate in a negative-feedback mode because transistor 134 provides a negative magnitude gain within the feedback loop. The compensation network 132 may include resistor elements and capacitor elements selected to nominally place the at least one pole and the at least one zero in the frequency response of the feedback loop for stable operation of the feedback loop. Stable operation is conventionally achieved when a phase of the feedback signal is negative for all frequencies lower than a characteristic unity gain frequency of the feedback signal. The unity gain frequency defines a frequency above which an amplifier imparts a loss in feedback signal magnitude rather than a gain in feedback signal magnitude. Additional positive phase shift phase shift comprises “phase margin,” which generally implies greater feedback loop stability.
Conventional resistor and capacitor elements typically vary with temperature and process, thereby moving the at least one pole and the at least one zero in frequency. This movement may create an unstable feedback loop, wherein a pole located below the unity gain frequency may cause the phase of the feedback loop to pass through zero phase. To mitigate potential unstable operation of the feedback loop, the at least one zero is included within the compensation network 132 to introduce a positive phase shift, which adds positive phase margin. Furthermore, the bias generator 122 and compensation network 132 are configured to establish a relatively constant relationship between the input stage transconductance and the inverse of the resistance in the compensation network 132 to reduce the effect of process and temperature variations on the unity gain bandwidth and phase margin of the feedback loop.
In this configuration, CTRL node 112 is connected to a base node of the PNP BJT 150. An emitter pin of the PNP BJT 150 is connected to the positive supply (VDD). A collector pin of the PNP BJT 150 is connected to the CTRL node 114, which comprises an output node for a regulated output voltage VOUT. Capacitor 116 serves as both a source and sink of high frequency current that may be required by a load operating from VOUT. In this mode, capacitor 116 should be selected to achieve stable operation of the amplifier with the desired unity gain feedback using the compensation network 132 configured to compensate the LDO in the direct configuration. The value of capacitor 116 can be significantly higher when PNP BJT 150 is used because the resulting Darlington stage typically increases the total gain of the amplifier. In one embodiment, capacitor 116 is generally in a range of 10 microfarads to 33 microfarads.
In both the direct output mode illustrated in
The bias generator 220 includes two p-channel metal-oxide semiconductor (P-MOS) transistors M3, M4, five n-channel metal-oxide semiconductor (N-MOS) transistors M1, M2, M5, M6, M7, and two resistors R3 and R1.
Resistor R3 serves to start current flow within transistor M6 to establish current i1 on power up. As resistor R3 pulls up the drain node of transistor M6 and current i1 to begins to increase, transistor M7 begins conducting and serves as a primary path from positive supply VDD through transistor M6 to negative supply VSS. In one embodiment, resistor R3 comprises a poly-silicon resistor. Current i1 is mirrored through bias voltage VBN to determine a drain current i2 for transistor M5. Current i2 is split between a first path that includes transistors M1 and M3, and a second path through transistors M2 and M4. P-MOS transistors M3 and M4 form a bias structure that generates bias voltage VBP1 and VBP2. This arrangement causes the current i2 through transistor M5 to vary such that the transconductance in transistor M1 is inversely proportional to the resistor R1.
The operational amplifier 222 comprises a differential amplifier structure including input transistors M10 and M11, paired with transistors M12, M13, respectively, and transistor M8, which is used to determine an operating current i3a for the differential amplifier structure. In one embodiment, the transistor M12 to M13 size ratio is 1:n, and the transistor M8 to M9 size ratio is 1:n−1, where n>1. Current i3a is determined by mirroring i1 through bias voltage VBN to control transistor M8. Current i3a is split between a first path that includes transistors M10 and M12, and a second path that includes transistors M11 and M13. Node VINN corresponds to a negative input of the operational amplifier 222 and is connected to input reference voltage VREF 110. Node VINP corresponds to a positive input of the operational amplifier 222 and is connected to feedback resistor R4, which provides a feedback path from CTRL node 114. In addition to providing a feedback path for normal operation of the configurable LDO 200, resistor R4 also serves to mitigate current spikes, for example due to electrostatic discharge during manufacturing and handling, from damaging on chip circuit elements such as M10.
Current i3b is determined by mirroring i1 through bias voltage VBN to control transistor M9. Transistors M14 and M9 form an output stage that enables the operational amplifier 222 to drive a wider output voltage swing.
The follower gain stage 224 comprises P-MOS transistor M15, and resistor R5. In one embodiment, the resistor R5 may be replaced with a transistor current source. The compensation network 132 of
Persons skilled in the art will recognize that the small signal transfer function of the operational amplifier 222 in a range of frequencies higher than the compensation zero but lower than any subsequent parasitic poles is a function of the values of resistors R1 and R2; specifically, the ratio of resistance values of resistors R1 and R2. By fabricating resistors R1 and R2 from the same material, for example poly-silicon, the ratio of resistors R1 to R2 is held relatively constant over temperature and process variation.
Although illustrative embodiments of the invention have been described in detail herein with reference to the accompanying figures, it is to be understood that the invention is not limited to those precise embodiments. They are not intended to be exhaustive or to limit the invention to the precise forms disclosed. As such, many modifications and variations will be apparent. Accordingly, it is intended that the scope of the invention be defined by the following Claims and their equivalents.
Number | Name | Date | Kind |
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7863969 | Furuya et al. | Jan 2011 | B2 |