Claims
- 1. A structure comprising a data layer for storing selectively retrievable data, said data layer having:
a. a first level; b. a second level substantially parallel to said first level and vertically displaced from said first level in a first direction; c. a third level substantially parallel to said second level and vertically displaced from said second level in said first direction; d. a first three-dimensional data-representing feature, at least a portion of said first feature vertically extending from said second level to said third level, said first feature having a first principal axis substantially parallel to said second level, a transverse axis substantially normal to said first principal axis and parallel to said second level, and a vertical axis substantially normal both to said first principal axis and to said second level, said first feature characterized in that:
(1) the transverse extent of said first feature is less at said third level than at said second level; (2) the transverse extent of said first feature at said second level, measured from one side of said first feature to the opposite side of said first feature, including any displacement of said first feature from said second level in a second vertical direction opposite said first direction, is microscopic; and (3) the length of said first feature from one end of said first feature to the opposite end of said first feature, along said principal axis, including any displacement of said first feature in said opposite vertical direction, is not more than approximately 4 microns; and e. a second feature, wherein:
(1) said second feature comprises an elongated, three-dimensional region extending from said first level to said second level, a portion of said elongated region having a second principal axis substantially parallel to, and approximately aligned transversely with, said first principal axis; (2) the transverse extent of said second feature is less at said second level than at said first level; and (3) the transverse extent of said second feature at said first level, measured from one side of said second feature to the opposite side of said second feature, including any displacement of said second feature in said opposite vertical direction, is not less than said transverse extent of said first feature.
- 2. The structure as recited in claim 1, wherein said transverse extent of said first feature is contained within said transverse extent of said second feature.
- 3. The structure as recited in claim 1, wherein at least a portion of said first feature is longitudinally displaced from said second feature.
- 4. The structure as recited in claim 1, wherein the ratio of the maximum displacement of said first feature, from said second level, in said first vertical direction to said displacement in said opposite vertical direction excludes a substantially zero value, a substantially infinite value, and values within the range extending from approximately 0.25 to approximately 4.0.
- 5. The structure as recited in claim 4, wherein said displacement ratio further excludes values from approximately 0.2 to approximately 5.0.
- 6. The structure as recited in claim 5, wherein said displacement ratio further excludes values from approximately 0.1 to approximately 10.0.
- 7. The structure as recited in claim 6, wherein said displacement ratio is substantially zero.
- 8. A secondary structure substantially accurately replicated from the structure recited in claim 1.
- 9. A secondary structure substantially accurately replicated from the structure recited in claim 2.
- 10. A secondary structure substantially accurately replicated from the structure recited in claim 3.
- 11. A secondary structure substantially accurately replicated from the structure recited in claim 4.
- 12. A secondary structure substantially accurately replicated from the structure recited in claim 5.
- 13. A secondary structure substantially accurately replicated from the structure recited in claim 6.
- 14. A secondary structure substantially accurately replicated from the structure recited in claim 7.
- 15. The structure as recited in claim 1, comprising an elongated data track, at least a portion of said data track being substantially longitudinal and having a third principal axis extending in a direction normal to said first direction, said first and second principal axes each being substantially parallel to, and approximately aligned transversely with, said third principal axis.
- 16. The structure as recited in claim 15, wherein said first, second and third principal axes are transversely aligned.
- 17. The structure as recited in claim 15, wherein said transverse extent of said first feature is contained within said transverse extent of said second feature.
- 18. The structure as recited in claim 15, wherein at least a portion of said first feature is longitudinally displaced from said second feature.
- 19. A secondary structure substantially accurately replicated from the structure recited in claim 15.
- 20. A secondary structure substantially accurately replicated from the structure recited in claim 16.
- 21. A secondary structure substantially accurately replicated from the structure recited in claim 17.
- 22. A secondary structure substantially accurately replicated from the structure recited in claim 18.
- 23. The structure as recited in claim 1, wherein the outer transverse profile of said first feature, from the point at which said first feature begins its displacement from said second level, at one side of said first feature, until the point at which said displacement from said second level ends at the opposite side of said first feature, including any portion thereof extending in said opposite vertical direction, displays no substantial slope discontinuity.
- 24. The structure as recited in claim 23, wherein the maximum extent of said first feature in said opposite vertical direction is more than approximately zero but is not more than approximately sixty (60) nanometers.
- 25. The structure as recited in claim 23, wherein the maximum extent of said first feature in said opposite vertical direction is more than approximately zero but is not more than approximately fifty (50) nanometers.
- 26. The structure as recited in claim 23, wherein the maximum extent of said first feature in said opposite vertical direction is more than approximately zero but is not more than approximately twenty-five (25) nanometers.
- 27. The structure as recited in claim 23, wherein the ratio of the maximum displacement of said first feature from said second level in said first direction to said displacement in said opposite vertical direction excludes values within the range extending from approximately 0.25 to approximately 4.0.
- 28. A secondary structure substantially accurately replicated from the structure recited in claim 24.
- 29. A secondary structure substantially accurately replicated from the structure recited in claim 25.
- 30. A secondary structure substantially accurately replicated from the structure recited in claim 26.
- 31. The structure as recited in claim 1, wherein the outer transverse profile of said second feature, from the point at which said second feature begins its displacement from said first level, at one side of said second feature, until the point at which said displacement from said first level ends at the opposite side of said second feature, including any portion thereof extending in said opposite vertical direction, displays no substantial slope discontinuity.
- 32. The structure as recited in claim 31, wherein the ratio of the maximum displacement of said second feature from said first level in said first direction to said displacement in said opposite vertical direction excludes values within the range extending from approximately 0.25 to approximately 4.0.
- 33. The structure as recited in claim 31, wherein the maximum extent of said first feature in said opposite vertical direction is more than approximately zero but is not more than approximately sixty (60) nanometers.
- 34. A secondary structure substantially accurately replicated from the structure recited in claim 31.
- 35. The structure as recited in claim 1, wherein the outer transverse profile of said first feature, from the point at which said first feature begins its displacement from said second level, at one side of said first feature, until the point at which said displacement from said second level ends at the opposite side of said first feature, including any portion thereof extending in said opposite vertical direction, displays no substantial surface roughness.
- 36. The structure as recited in claim 35, wherein the maximum extent of said first feature in said opposite vertical direction is more than approximately zero but is not more than approximately sixty (60) nanometers.
- 37. The structure as recited in claim 35, wherein the maximum extent of said first feature in said opposite vertical direction is more than approximately zero but is not more than approximately fifty (50) nanometers.
- 38. The structure as recited in claim 35, wherein the maximum extent of said first feature in said opposite vertical direction is more than approximately zero but is not more than approximately twenty-five (25) nanometers.
- 39. A secondary structure substantially accurately replicated from the structure recited in claim 35.
- 40. A secondary structure substantially accurately replicated from the structure recited in claim 36.
- 41. The structure as recited in claim 1, wherein the outer transverse profile of said second feature, from the point at which said second feature begins its displacement from said first level, at one side of said second feature, until the point at which said displacement from said first level ends at the opposite side of said second feature, including any portion thereof extending in said opposite vertical direction, displays no substantial surface roughness.
- 42. A secondary structure substantially accurately replicated from the structure recited in claim 41.
CROSS REFERENCE TO RELATED APPLICATION
[0001] This is a divisional of U.S. patent application Ser. No. 09/558,071, filed Apr. 26, 2000.
Divisions (1)
|
Number |
Date |
Country |
Parent |
09558071 |
Apr 2000 |
US |
Child |
10384471 |
Mar 2003 |
US |