Claims
- 1. A method for performing congestion mitigation in an IC design, comprising the steps of:
measuring the congestion in the IC design; and performing localized area reallocation from adjacent circuit blocks and linear overlap removal for those portions of the IC design having congestion that exceeds a target value.
- 2. A method for performing congestion mitigation in an IC design, comprising the steps of:
carrying out circuit block placement; measuring the congestion for each circuit block to determine if it exceeds a target value; reallocating area to circuit blocks that exceed said target value of congestion solely from adjacent circuit blocks, and removing overlap.
- 3. A computer-implemented method for performing congestion mitigation in an IC design while preserving global logic order, comprising the steps of:
carrying out circuit block placement; measuring the congestion for each circuit block to determine if it exceeds a target value; reallocating area to circuit blocks that exceed said target value of congestion solely from adjacent circuit blocks, and removing overlap.
- 4. A program storage device readable by a computer, tangibly embodying a program of instructions executable by the computer for performing congestion mitigation in an IC design while preserving global logic order, comprising the steps of:
carrying out circuit block placement; measuring the congestion for each circuit block to determine if it exceeds a target value; reallocating area to circuit blocks that exceed said target value of congestion solely from adjacent circuit blocks, and removing overlap.
- 5. The method of claim 2, wherein prior to said step of measuring the congestion in the IC design said method further comprises the steps of:
entering said design in a technology-independent format; and optimizing said entered design into a particular technology.
- 6. The method of claim 5, wherein said step of optimizing said entered design further comprises the steps of:
optimizing said entered design for timing; and insertion of test structures.
- 7. The method of claim 2, wherein said placement step is carried out without any contemporaneous congestion mitigation.
- 8. The method of claim 7, wherein said step of measuring the congestion for each circuit block indicates both absolute and relative congestion.
- 9. The method of claim 2, wherein said target value may be independently set at a value to minimize congestion beyond that absolutely necessary to wire up the design.
- 10. The method of claim 2, wherein said step of reallocating area to circuit blocks that exceed said target value comprises comparing congestion values for those circuit blocks having values that exceed said target value with congestion values for immediately adjacent circuit blocks.
- 11. The method of claim 10, wherein a circuit block that has the highest congestion value is allocated enough extra space so that its congestion value falls below the target value.
- 12. The method of claim 11, wherein said allocated space is taken from an adjacent circuit block with the lowest congestion value.
- 13. The method of claim 12, wherein said step of reallocating area to circuit blocks that exceed said target value is repeated until all of said circuit blocks with congestion values initially exceeding said target value are below said target value.
- 14. The method of claim 13, wherein space is allocated from empty blocks or underutilized blocks.
- 15. The method of claim 12, wherein said step of removing overlap comprises moving circuit blocks relative to one another to eliminate overlap.
- 16. The method of claim 15, wherein said step of removing overlap carries out peak leveling.
- 17. The method of claim 16, wherein said peak leveling comprises spreading out circuit blocks having a highest degree of overlap with adjacent blocks, then spreading out circuit blocks that have a next highest degree of overlap.
- 18. The method of claim 15, wherein an amount of overlap removal is linear with congestion.
- 19. The method of claim 3, further comprising the step of post-placement and route processing.
- 20. The method of claim 19, wherein said step of post-placement and route processing comprises the steps of groundrule checking and shapes generation.
- 21. The method of claim 19, further comprising the step of providing said design data to a manufacturer of photolithographic masks.
- 22. The method of claim 21, wherein said design data is provided in GDSII format.
- 23. The method of claim 21, further comprising the step of fabrication of photolithographic masks.
- 24. The method of claim 23, further comprising the step of fabrication of integrated circuit chips embodying said design.
- 25. The method of claim 1, wherein said localized area reallocation is set to allow only a maximum amount of reallocation before design re-placement.
- 26. The method of claim 1, wherein said linear overlap removal is set to allow only a maximum amount of reallocation before design re-placement.
- 27. The method of claim 3, wherein said step of measuring congestion further comprises displaying an indication of congestion for the entire design.
CROSS REFERENCE TO RELATED APPLICATIONS
[0001] Reference is made to co-pending U.S. patent application entitled, “Method and Systems for Placing Logic Nodes Based on An Estimated Wiring Congestion”, IBM Docket BUR920010145US1.