The disclosure of Japanese Patent Application No. 2010-254967 filed on Nov. 15, 2010 including the specification, drawings and abstract is incorporated herein by reference in its entirety.
The present invention relates to a connection terminal that is conductive and that has a flat joint surface to be joined to a joint target surface by a brazing material interposed between the joint surface and the joint target surface, and to a circuit component including the connection terminal.
An example of the connection terminal described above according to the related art is described in Japanese Patent Application Publication No. 2010-103222 (JP 2010-103222 A) (paragraph 0031, FIG. 1, etc.) mentioned below, for example. In the following description in the BACKGROUND ART section, reference numerals used in JP 2010-103222 A are used. FIG. 1 of JP 2010-103222 A shows a connection terminal (terminal blocks 62a and 62b) including a flat joint surface to be joined to a joint target surface (upper surface of an insulating substrate 20). The connection terminal includes three parts, specifically a joint portion including the joint surface to be joined to the insulating substrate 20, an upper portion provided above the joint portion, and a coupling portion that couples the joint portion and the upper portion to each other.
As described in paragraph 0031 of JP 2010-103222 A, the connection terminal is occasionally joined to the joint target surface by solder (an example of a brazing material). In the case where the connection terminal is joined to the joint target surface by the brazing material, it is desirable that the brazing material melted by heating should be spread over the entire joint surface, and that an excessive brazing material should not concentrate on a part of the joint surface. This is because the connection terminal may be tilted, for example, to reduce the reliability of joint between the connection terminal and the joint target surface in the case where the brazing material is not spread over the entire joint surface or in the case where an excessive brazing material concentrates on a part of the joint surface.
In order to address the issue described above, there is known a technology for supplying a brazing material to the entire joint surface and suppressing local concentration of an excessive brazing material by executing a process (scrubbing process) in which the connection terminal is swung in a plane parallel to the joint target surface with the brazing material fused. In order to execute the scrubbing process, it is necessary to provide a swing space for swinging the connection terminal in a joint region to which the connection terminal is to be joined. In order to suppress an increase in size of a circuit component including the connection terminal, it is desirable that the swing space should be reduced as much as possible.
However, JP 2010-103222 A does not mention the scrubbing process. Japanese Patent Application Publication No. 2005-228898 (JP 2005-228898 A) (FIG. 1 etc.) mentioned below describes a technology for forming a through hole in a joint portion in order to enhance the reliability of soldering (an example of brazing). However, JP 2005-228898 A does not mention the scrubbing process, either. Therefore, as a matter of course, none of JP 2010-103222 A and JP 2005-228898 A suggests a configuration of a connection terminal that is suitable from the viewpoint of reducing the swing space, and such a configuration has not been revealed yet.
In view of the foregoing, it is desirable to provide a connection terminal having a configuration that is suitable from the viewpoint of reducing a swing space necessary to execute a scrubbing process.
A connection terminal according to a first aspect of the present invention is conductive and has a flat joint surface to be joined to a joint target surface by a brazing material interposed between the joint surface and the joint target surface. The joint surface includes recesses provided on both sides across a predetermined reference line passing through a center of gravity of the joint surface and extending along the joint surface, the recesses being dented from an outer edge portion of the joint surface toward the reference line.
According to the first aspect, the outer edge of the joint surface can be formed so as to have portions that intersect a line parallel to a direction parallel to the reference line (hereinafter referred to as “reference direction”) not only on both sides in the reference direction but also on both sides across the reference line, irrespective of the shape of the joint surface. Hence, in the case where a scrubbing process is executed, the brazing material can be appropriately spread by the outer edge portion of the joint surface not only on both sides in the reference direction but also on both sides across the reference line just by swinging the connection terminal in the reference direction. Consequently, it is possible to supply the brazing material to the entire joint surface, and to suppress local concentration of an excessive brazing material.
As described above, according to the first aspect, in the case where a scrubbing process is executed in order to appropriately secure the reliability of joint between the connection terminal and the joint target surface, it is only necessary to swing the connection terminal in the reference direction, that is, swing the connection terminal in one direction. That is, it is only necessary that the swing space necessary to execute a scrubbing process should be provided on the outer side with respect to the joint surface in the reference direction, thereby suppressing an increase in size of a circuit component including the connection terminal by reducing the swing space to be small.
The connection terminal may include: a joint portion that is flat and that includes the joint surface on a lower surface, and an extension portion provided to extend upward from a region of the outer edge portion of the joint portion, the region being interposed between the adjacent recesses.
The term “extend” in a certain direction as used herein for the shape of a member is not limited to extension of the member in a direction parallel to a reference direction defined by the certain direction, and also includes extension of the member in a direction intersecting the reference direction and even extension of the member in a direction intersecting the reference direction at an intersection angle of less than 90 degrees.
According to the configuration, the recesses are formed at positions of the outer edge portion of the joint surface at which the extension portion is not provided, thereby simplifying the manufacturing process of the connection terminal. In the configuration described above, meanwhile, the connection terminal may be easily tilted depending on the shape of the extension portion. However, such tilt of the connection terminal can be suppressed by executing a scrubbing process.
The recess provided on one side with respect to the reference line and the recess provided on the other side with respect to the reference line may be shaped to be symmetric with respect to the reference line.
According to the configuration, in the case where a scrubbing process is executed by swinging the connection terminal in the reference direction, the brazing material may be spread approximately equally on both sides across the reference line. Hence, in the case where a scrubbing process is executed, non-uniform application of the brazing material on both sides of the reference line may be suppressed to more reliably secure the reliability of joint between the connection terminal and the joint target surface.
A scooping portion may be formed at least a part of portions of the recesses that intersect a line parallel to the reference line, the scooping portion being projected toward a recess center along a direction parallel to the reference line as the recesses extend toward the joint surface.
According to the configuration, the scooping portion is formed on a surface of the recesses to allow the scooping portion to scoop up excessive solder in the scrubbing process discussed above. Therefore, the amount of excessive solder that overflows around the joint surface may be reduced to suppress an increase in size of a fillet.
If there is much excessive solder, and in the case where the center of gravity of the connection terminal is eccentric, the excessive solder provided on the side of the center of gravity of the connection terminal may easily overflow around the joint surface to tilt the connection terminal. According to the configuration described above, the amount of excessive solder may be reduced. Therefore, such tilt of the connection terminal may be suppressed even in the case where the center of gravity of the connection terminal is eccentric.
The recesses may be each formed such that a width of the recess in a direction parallel to the reference line becomes larger from a side of the reference line toward the outer edge portion of the joint surface.
According to the configuration, in the case where a scrubbing process is executed by swinging the connection terminal in the reference direction, it is possible to more reliably spread the brazing material as the recesses are swung. By appropriately setting the width of the recesses in the reference direction, in addition, formation of a fillet on both sides of the reference line may be suppressed, and a clearance provided on the outer side with respect to the joint region in a direction orthogonal to the reference direction may be reduced to be small.
A plated layer having wettability to the brazing material may be formed on a surface of the recesses.
According to the configuration, in the case where a scrubbing process is executed by swinging the connection terminal in the reference direction, it is possible to more reliably spread the brazing material as the recesses are swung.
A circuit component according to a second aspect of the present invention includes: the connection terminal configured as discussed above; and a substrate having an element arrangement surface serving as the joint target surface for arrangement of a circuit element. The connection terminal is joined in a joint region set on the element arrangement surface; and the joint region has a margin region in which the circuit element or the joint portion is not to be disposed and which is provided on an outer side of the joint surface along a reference direction which is a direction parallel to the reference line.
According to the second aspect, the connection terminal may be swung in the reference direction utilizing the margin region in the case where the connection terminal is joined on the substrate on which the circuit element is disposed. Therefore, the connection terminal having each configuration discussed above may be appropriately joined to the element arrangement surface through a scrubbing process.
A connection terminal and a circuit component according to an embodiment of the present invention will be described with reference to the drawings. Here, the connection terminal according to the present invention is applied to a connection terminal for use in a semiconductor device (an example of an electrical circuit device) including a semiconductor device (an example of a circuit element), and the circuit component according to the present invention is a circuit component for a semiconductor device including the connection terminal, a semiconductor element, and a substrate. In a circuit component 1 according to the embodiment, as shown in
In the following description, the term “upper” denotes a direction (+H direction, which corresponds to the upper direction in
The overall configuration of the circuit component will be described with reference to
The switching element 2 and the diode element 3 serving as circuit elements are disposed on the element arrangement surface 11. In the example, the switching element 2 and the diode element 3 are disposed side by side in the reference direction S. That is, the direction of arrangement of the circuit elements (in the example, the switching element 2 and the diode element 3) on the element arrangement surface 11 coincides with the reference direction S. The switching element 2 includes an emitter electrode on the upper surface and a collector electrode on the lower surface. The switching element 2 is fixed to the element arrangement surface 11 by solder to bring the collector electrode on the lower surface into continuity with the substrate 10. The diode element 3 includes an anode electrode on the upper surface and a cathode electrode on the lower surface. The diode element 3 is fixed to the element arrangement surface 11 by solder to bring the cathode electrode on the lower surface into continuity with the substrate 10. That is, the substrate 10 is at the same potential as the collector electrode of the switching element 2 and the cathode electrode of the diode element 3. In the embodiment, both the switching element 2 and the diode element 3 correspond to the “circuit element” according to the present invention. That is, in the embodiment, the circuit element is a semiconductor element (electronic element).
The circuit component 1 according to the embodiment is a circuit component that forms a semiconductor device (not shown) including an inverter circuit that controls a rotary electric machine (not shown). The semiconductor device includes a plurality of (in the example, six) circuit components 1 shown in
In order to electrically connect the switching element 2 and the diode element 3 and the connection member, the circuit component 1 includes the first connection terminal 20 and the second connection terminal 30. Both the first connection terminal 20 and the second connection terminal 30 are formed from a conductive material (for example, a metal material such as copper or aluminum). In the example, both the first connection terminal 20 and the second connection terminal 30 are formed by bending a belt-like member (plate-like member) with a constant width.
The first connection terminal 20 is fixed by solder on the element arrangement surface 11 of the substrate 10. The first connection terminal 20 is brought into continuity with the lower surface (collector electrode) of the switching element and the lower surface (cathode electrode) of the diode element 3 via the substrate 10 formed from a conductive material. The upper surface of the first connection terminal 20 forms a joint surface to be joined (for example, joined by laser welding) to the connection member. In the embodiment, the first connection terminal 20 has been subjected to a scrubbing process executed when joining the first connection terminal 20 to the element arrangement surface 11 by solder. The configuration of the first connection terminal 20 will be described in detail later in Section 2. In the embodiment, the first connection terminal 20 corresponds to the “connection terminal” according to the present invention. In the embodiment, the element arrangement surface 11 corresponds to the “joint target surface” according to the present invention.
The second connection terminal 30 is fixed to the upper surfaces of the semiconductor elements (the switching element 2 and the diode element 3) by solder. That is, in the example, the second connection terminal 30 is disposed on the substrate 10 with the semiconductor elements (circuit elements) interposed therebetween. As shown in
Next, the configuration of the first connection terminal 20 will be described in detail. As shown in
The first joint portion 21 is a portion to be joined to the element arrangement surface 11. The lower surface of the first joint portion 21 serves as the flat joint surface 24 to be joined to the element arrangement surface 11. In the example, as shown in
The second joint portion 22 is a portion, on the upper surface of which a joint surface to be joined to the connection member is formed. The second joint portion 22 is provided apart from the first joint portion 21 in the height direction H. In the example, the first joint portion 21 and the second joint portion 22 are disposed in parallel with each other. In the embodiment, in addition, the first joint portion 21 and the second joint portion 22 are formed to have a rectangular shape of the same size, and disposed so as to overlap each other as seen along the height direction H. More specifically, in the embodiment, the first joint portion 21 and the second joint portion 22 are disposed such that one of the first joint portion 21 and the second joint portion 22 is hidden behind the other, except for portions that are viewable through recesses 60 to be discussed later, in the case where the first joint portion 21 and the second joint portion 22 are seen from either side along the height direction H. The first joint portion 21 and the second joint portion 22 may be formed to have a rectangular shape of different sizes.
In the example, the coupling portion 23 couples respective end portions, in the reference direction S, of the first joint portion 21 and the second joint portion 22 to each other. In the example, further, the coupling portion 23 couples respective end portions, which are on the same side in the reference direction S (in the example shown in
As shown in
By providing such recesses 60, the outer edge of the joint surface 24 is formed so as to have portions that intersect a line parallel to the reference direction S not only on both sides in the reference direction S but also on both sides across the reference line L as shown in
In the example, the joint surface 24 includes one recess 60 provided on each of both sides across the reference line L, and includes a total of two recesses 60. The coupling portion 23 is provided to extend upward (in the +H direction) (in the example, along the height direction H) from a region of the outer edge portion 21a of the first joint portion 21 that is interposed between the adjacent recesses 60.
In the embodiment, as shown in
In the embodiment, in addition, as shown in
In the embodiment, further, as shown in
The first connection terminal 20 configured as described above is joined in the joint region A set on the element arrangement surface 11. As shown in
The joint region A has a joint surface arrangement region C1 in which the joint surface 24 is to be disposed, and a margin region B positioned on the outer side (in the example, both outer sides) of the joint surface arrangement region C1 in the reference direction S. Here, the margin region B means a region in which a circuit element (in the example, the switching element 2 and the diode element 3) or the joint surface 24 is not to be disposed. That is, in the example, the joint region A has the margin region B in which a circuit element or the joint surface 24 is not to be disposed and which is provided on the outer side (in the example, both outer sides) of the joint surface 24 along the reference direction S.
The joint surface arrangement region C1 has the same size as the joint surface 24. The length of each of the margin regions B in a direction orthogonal to the reference direction S is equal to or more than (in the example, the same as) the length of the joint surface 24 in the same direction. The length of each of the margin regions B in the reference direction S is preferably equal to or more than half of the length of the joint surface 24 in the reference direction S, and more preferably equal to or more than the length of the joint surface 24 in the reference direction S. In the example shown in
Here, as described above, in the case where a scrubbing process is executed when joining the first connection terminal 20 and the element arrangement surface 11 to each other, the solder 50 can be appropriately spread by portions of the outer edge portion 24a that correspond to the recesses 60 of the joint surface 24 not only on both sides in the reference direction S but also on both sides across the reference line L just by swinging the first connection terminal 20 in the reference direction S. That is, in the case where a scrubbing process is executed when joining the first connection terminal 20 and the element arrangement surface 11 to each other, it is only necessary that the first connection terminal 20 should be swung in a direction along the reference direction S. Hence, even in a configuration in which the joint region A does not have a region that is large enough to allow the first connection terminal 20 to swing on the outer side of the joint surface 24 along a direction orthogonal to the reference direction S as in the example, it is possible to appropriately execute a scrubbing process utilizing the margin region B on the outer side in the reference direction S to supply solder to the entire joint surface 24 and suppress concentration of excessive solder on a part of the joint surface 24. Thus, according to the present invention, it is possible to appropriately secure the reliability of joint between the first connection terminal 20 and the element arrangement surface 11 while suppressing an increase in size of the circuit component 1 by reducing the swing space necessary for a scrubbing process to be small.
In the embodiment, in addition, a plated layer having wettability to solder (solder wettability) is formed on a surface of the recesses 60. The term “surface of the recesses 60” is used to include a surface extending in the +H direction (upward in the height direction H) from a portion of the outer edge portion 24a of the joint surface 24 corresponding to the recesses 60. The plated layer is formed from metal such as gold or nickel, for example. Consequently, in the case where a scrubbing process is executed by swinging the first connection terminal 20 in the reference direction S, it is possible to more reliably spread the solder 50 as the recesses 60 are swung. A plated layer having solder wettability may also be formed on surfaces of other portions of the first connection terminal 20 (for example, the lower surface of the first joint portion 21 and the upper surface of the second joint portion 22) in addition to the surface of the recesses 60, or a plated layer having solder wettability may be formed on the entire surface of the first connection terminal 20.
Lastly, other embodiments of the present invention will be described. The characteristics disclosed in each of the following embodiments are not only applicable to that particular embodiment but also to any other embodiment unless any contradiction occurs.
In the example shown in
In the following description, in the height direction H which is a direction orthogonal to the joint surface 24, a direction from the joint surface 24 toward a non-joint surface 29 which is a surface opposite to the joint surface 24 is set to a first height direction H1, and a direction opposite to the first height direction H1 from the non-joint surface 29 toward the joint surface 24 is set to a second height direction H2. In addition, in the reference direction S which is a direction parallel to the reference line L, a direction away from the recess center 27 is set to a separating reference direction S3, and a direction toward the recess center 27 is set to an approaching reference direction S4.
The surface 25 of the scooping portion 28 of the recesses 60 includes a first-step orthogonal surface 25a that extends in the first height direction H1 from the joint surface 24 and that has a height X2 smaller than a height X1 of the first joint portion 21, a solder holding surface 25b that extends by a width Y1 in the separating reference direction S3 from an end portion of the first-step orthogonal surface 25a in the first height direction H1, and a second-step orthogonal surface 25c that extends in the first height direction H1 from an end portion of the solder holding surface 25b in the separating reference direction S3 and that has a height H3 smaller than the height X1 of the first joint portion 21. Here, the total of the height X2 of the first-step orthogonal surface 25a and the height X3 of the second-step orthogonal surface 25c matches the height X1 of the first joint portion 21.
The first-step orthogonal surface 25a has a function of spreading the solder 50 toward both sides across the reference line L through a scrubbing process. The solder holding surface 25b and the second-step orthogonal surface 25c have a function of holding an excessive portion of the solder 50. If the height X2 of the first-step orthogonal surface 25a is reduced, the function of spreading the solder 50 is degraded, and excessive solder is easily scooped up by the solder holding surface 25b. If the height X2 of the first-step orthogonal surface 25a is increased, conversely, the function of spreading the solder 50 is improved, and excessive solder is not easily scooped up by the solder holding surface 25b. Meanwhile, if the width Y1 of the solder holding surface 25b is increased, an increased amount of excessive solder may be scooped up to be held. If the width Y1 of the solder holding surface 25b is reduced, conversely, a reduced amount of excessive solder may be scooped up to be held. Hence, the function of spreading the solder 50 and the function of holding excessive solder may be adjusted by adjusting the height X2 of the first-step orthogonal surface 25a and the width Y1 of the solder holding surface 25b.
A portion (first-step orthogonal surface 25a) of the scooping portion 28 on the joint surface 24 side projects toward the recess center 27 (in the approaching reference direction S4) along the reference direction 5, which is the swinging direction, with respect to a portion (second-step orthogonal surface 25c) of the scooping portion 28 on the non-joint surface 29 side. Therefore, the scooping portion 28 is shaped so as to easily scoop up the solder 50 by being swung in the reference direction S.
A plated layer having solder wettability is formed on the solder holding surfaces 25b so that excessive solder is easily held thereon. A plated layer having solder wettability is also formed on the first-step orthogonal surfaces 25a and the second-step orthogonal surfaces 25e.
<Function and Effect of Scooping Portions 28>
Next, the function and the effect of the scooping portions 28 will be described in detail.
If an excessive portion of the solder 50 is increased, an increased amount of the solder 50 overflows around the joint surface 24, which may increase the size of a fillet 41 of the solder 50 to be formed around the joint surface 24. If the fillet 41 becomes large, the fillet 41 may be unintentionally joined to components disposed around the joint surface 24 such as the switching element 2 and the diode element 3, which may reduce the reliability of soldering. By forming the scooping portion 28 on the surface 25 of the recesses 60, in contrast, excessive solder may be scooped up and held by the scooping portion 28, which makes it possible to control excessive solder such that the fillet does not become too large.
For example, in the case where the first connection terminal 20 is swung in a scrubbing process by holding the second joint portion 22 of the first connection terminal 20 using a holder 40 and swinging the holder 40 as shown in
<Case where Scooping Portions 28 are not Formed>
First, a case where the scooping portions 28 are not formed will be described with reference to
As shown in
As shown in
<Case where Scooping Portions 28 are Formed>
Next, a case where the scooping portions 28 are formed will be described with reference to
As shown in
As shown in
The height X2 of the first-step orthogonal surface 25a and the width Y1 of the solder holding surface 25b may be adjusted in consideration of variations (tolerance) in length of the coupling portion 23 due to manufacturing variability.
<Variations of Scooping Portions 28>
The scooping portion 28 may be formed on a part of the surface 25 of the recesses 60. For example, as shown in the example of
As shown in the cross-sectional view of
The present invention may be suitably applied to a connection terminal that is conductive and that has a flat joint surface to be joined to a joint target surface by a brazing material interposed between the joint surface and the joint target surface.
Number | Date | Country | Kind |
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2010-254967 | Nov 2010 | JP | national |
Filing Document | Filing Date | Country | Kind | 371c Date |
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PCT/JP2011/076299 | 11/15/2011 | WO | 00 | 3/13/2013 |