FIG. 1 is a front elevation view of a connector for a microchip probe, in accordance with a first embodiment of my new design;
FIG. 2 is a rear elevation view of the connector of FIG. 1;
FIG. 3 is a left side elevational view of the connector of FIG. 1;
FIG. 4 is a right side elevational view of the connector of FIG. 1;
FIG. 5 is a top plan view of the connector of FIG. 1;
FIG. 6 is a bottom plan view of the connector of FIG. 1;
FIG. 7 is a front elevation view of a connector for a microchip probe, in accordance with a second embodiment of my new design;
FIG. 8 is a rear elevation view of the connector of FIG. 7;
FIG. 9 is a left side elevational view of the connector of FIG. 7;
FIG. 10 is a right side elevational view of the connector of FIG. 7;
FIG. 11 is a top plan view of the connector of FIG. 7; and,
FIG. 12 is a bottom plan view of the connector of FIG. 7.