This patent application claims priority to Japanese Patent Application No. 2007-064565, filed on Mar. 14, 2007 in the Japan Patent Office, the entire contents of which are incorporated by reference herein.
This patent specification relates to a constant current circuit, and more particularly, to a constant current circuit and a light emitting diode drive circuit.
Recently, light emitting diodes (LED) have come to be widely used in a variety of fields, for example, display devices, optical disk apparatuses, and the like, because of their low power requirements and long life. The light emitting diode emits light by supplying an electrical current to the light emitting diode.
The light emitting diode for the display device is generally driven by a constant current circuit to reduce variation in brightness. To adjust the brightness to a specific use, a setting condition for the current of the constant current circuit is generally adjusted. However, a voltage drop at the light emitting diode changes in accordance with the current of the light emitting diode, and accordingly, voltage at a terminal of an output transistor changes dramatically. The terminal of an output transistor is configured to be an output terminal of the constant current circuit, and generally a drain electrode of a MOS transistor is used as the output terminal of the constant current circuit. When the voltage of the output terminal changes by a large amount, the brightness of the light emitting diode varies because the output current changes due to a channel length modulation effect of the MOS transistor.
To solve such a problem, a constant current circuit shown in
An output circuit comprised of the NMOS transistor M111, M112, M141, and M142 forms a cascode-current-mirror circuit. A drain voltage of the NMOS transistor M112 is always equal to a drain voltage of the NMOS transistor M111 and independent of a voltage at the output terminal OUT. Accordingly, the output current iout may not be affected by voltage fluctuation at the output terminal OUT. However, since an output transistor is that is a two transistors by connecting the NMOS transistors M112 and M142 in series, a large output voltage is required for the output transistor to work in a saturation operation region in which a desired constant current is output even if the output circuit is formed of a low-voltage-cascade-current-mirror circuit.
A drain-source voltage Vds1 of the NMOS transistor M112 between a drain and a source of the NMOS transistor M112 is expressed by a formula (a):
Vds1=Vbias−Vgs2 (a),
where, for example, the NMOS transistors M111, M112, M141, and M142 have an equal transistor size and an equal conductivity, each threshold voltage of the transistors is Vthn, a gate-source voltage of the NMOS transistor M142 is Vgs2, a bias voltage generated by the bias voltage generator 108 is Vbias, and an overdrive voltage is Vov.
When the bias voltage Vbias is set to be a formula Vbias=Vgs2+Vov so that the NMOS transistor M112 works at a boundary operation region between the saturation and linear operation regions, the formula (a) becomes a formula (b):
Vds1=Vov (b)
When the NMOS transistor M142 also works at a boundary operation region between the saturation and linear operation regions, a drain-source voltage Vds2 of the NMOS transistor M142 between drain and source of the NMOS transistor M142 is expressed by a formula (c):
Vds2=Vov (c)
Therefore, a minimum output voltage Vomin at the output terminal OUT is expressed by a formula (d):
Vomin=Vds1+Vds2=2×Vov (d)
In common CMOS processes, the minimum voltage Vomin is 0.6 v to 1.0 v. When the output voltage at the output terminal OUT increases, power consumption by the output transistor of the constant current circuit also increases.
An output transistor having a large size is generally employed to output a large current to drive the light emitting device. Accordingly, a chip size increases and causes a cost penalty, especially when the output transistor is formed of two transistors by connecting the NMOS transistors M112 and M142 in series. Further, the drain-source voltage of the NMOS transistor M142 changes in accordance with the output voltage at the output terminal OUT. Meanwhile, the drain-source voltage of the NMOS transistor M141 becomes (Vthn+Vov)−Vov=Vthn. Because the drain-source voltages of the NMOS transistors M141 and M142 differ from each other, the gate-source voltages differ from each other. Consequently, the drain-source voltages of the NMOS transistors M111 and M112 differ from each other. Thus, a systematic error occurs in the output current iout.
To solve the problem described above, another constant current circuit 290 shown in
However, a drain voltage of the NMOS transistor NT1 is adjusted only in a voltage range from a voltage at which the NMOS transistor NT2 works in the saturation operation region to a gate-source voltage of the NMOS transistor NT2. An overdrive voltage Vo2 is expressed by a formula, Vov2≦Vo≦Vthn+Vov2, where the threshold voltage of the NMOS transistor NT2 is Vthn. In other words, the voltage range of the output voltage Vo at the output terminal OUT for supplying a constant current without a systematic error is very narrow.
This patent specification describes a novel constant current generator which includes a first transistor to supply current in accordance with a control signal, and a second transistor formed of a MOS transistor having an equal impurity type to the first transistor. To supply current to a load in accordance with the control signal, gate and source of the second transistor are connected to gate and source of the first transistor, respectively, and there is a voltage adjustor to adjust drain voltage of the first transistor in accordance with drain voltage of the second transistor, a constant current generation circuit including a first current source to supply first current to the first transistor through the voltage adjustor, and a level shifter to shift a voltage at a connection node of the voltage adjustor and the constant current generation circuit, and output a shifted voltage to each gate of the first and second transistors.
This patent specification further describes a novel light emitting diode drive circuit which employs a constant current generator including a first transistor to supply current in accordance with a control signal, a second transistor formed of MOS transistor having an equal impurity type to the first transistor, and to supply current to a load in accordance with the control signal, gate and source of the second transistor are connected to gate and source of the first transistor, respectively, a voltage adjustor to adjust drain voltage of the first transistor in accordance with drain voltage of the second transistor, a constant current generation circuit including a first current source to supply first current to the first transistor through the voltage adjustor, and a level shifter to shift a voltage at a connection node of the voltage adjustor and the constant current generation circuit, output a shifted voltage to each gate of the first and second transistors.
A more complete appreciation of the disclosure and many of the attendant advantages thereof will be readily obtained as the same becomes better understood by reference to the following detailed description when considered in connection with the accompanying drawings, wherein:
In describing preferred embodiments illustrated in the drawings, specific terminology is employed for the sake of clarity. However, the disclosure of this patent specification is not intended to be limited to the specific terminology so selected and it is to be understood that each specific element includes all technical equivalents that operate in a similar manner and achieve similar results.
Referring now to the drawings, wherein like reference numerals designate identical or corresponding parts throughout the several views, switching regulators according to example embodiments are described.
The external load 10 is connected between the power supply Vdd2 and the output terminal OUT. A drain of the NMOS transistor M2 is connected to the output terminal OUT. Each source of the NMOS transistors M1 and M2 is connected to ground. Gates of the NMOS transistors M1 and M2 are commonly connected and a connection node of the gates of the NMOS transistors M1 and M2 is controlled by the level shifter 3. To a drain of the NMOS transistor M1, a current is supplied from the constant current source 2 through the voltage adjustor 4. The power supply Vdd1 supplies power to the constant current source 2.
The voltage adjustor 4 adjusts the drain voltage of the NMOS transistor M1 based on the drain voltage of the NMOS transistor M2 so that the drain voltage of the NMOS transistor M1 becomes the drain voltage of the NMOS transistor M2. Further, the level shifter 3 controls each gate voltage of the NMOS transistors M1 and M2 so that a voltage at a connection node of the constant current source 2 and the voltage adjustor 4 shifts by a predetermined voltage. That is, the level shifter 3 shifts a voltage at the connection node of the constant current source 2 and the voltage adjustor 4 by the predetermined voltage, and outputs the shifted voltage to each gate the NMOS transistors M1 and M2.
The NMOS transistor M13 and the constant current source 11 are connected in series between the power supply Vdd1 and ground. A connection node of the NMOS transistor M13 and the constant current source 11 is connected to each gate of the NMOS transistors M1 and M2. Further, the constant current source 15 and the NMOS transistor M15 are connected in series between the power supply Vdd1 and a drain of the NMOS transistor M2. Each gate of the NMOS transistors M14 and M15 is commonly connected, and a connection node of the gates of the NMOS transistors M14 and M15 is connected to the drain of the NMOS transistor M15.
As can be seen in
In this circuit configuration, the NMOS transistor M13 and the constant current source 11 form a source-follower circuit. A drain voltage of the NMOS transistor M14 is a voltage at a connection node of the constant current source 2 and the NMOS transistor M14. A shifted voltage shifted by a gate-source voltage of the NMOS transistor M13 from the drain voltage of the NMOS transistor M14 is output to each gate of the NMOS transistors M1 and M2.
In the following description, each gate-source voltage of the NMOS transistors M1, M2, M13, M14, and M15 is defined as Vgs1, Vgs2, Vgs13, Vgs14 and Vgs15, respectively. Similarly, each drain-source voltage of the NMOS transistors M1 and M2 is defined as Vds1 and Vds2, respectively.
Since the source voltage of the NMOS transistor M15 is the drain voltage of the NMOS transistor M2, the gate voltage of the NMOS transistor M15 is expressed by a formula (1):
Vg15=Vds2+Vgs15 (1)
Since each gate of the NMOS transistors M14 and M15 is commonly connected, a drain voltage Vd1 of the NMOS transistor M1 becomes a voltage that is dropped by the gate-source voltage Vgs14 of the NMOS transistors M14 from the gate voltage Vg15 of the NMOS transistor M15, and is expressed by a formula (2) referring to the formula (1):
The constant currents are expressed by formulas (3) and (4), respectively,
i1=β14×(Vgs14−Vthn)2 (3)
i3=β15×(Vgs15−Vthn)2 (4)
where the NMOS transistors M14 and M15 are formed of NMOS transistors having equal conductivity and threshold, and β14 and β15 are current gains of the NMOS transistors M14 and M15, respectively.
Based on the formulas (3) and (4), a formula (5) is obtained:
i1/i3=β14/β15×(Vgs14−Vthn)2/(Vgs15−Vthn)2 (5)
Based on the formula (5), a formula “Vd1=Vd2” becomes true based on the formula (2) if a following formula (6) is made true:
i1/β14=i3/β15 (6)
Gate, drain, and source voltages become equal when each transistor size of the NMOS transistors M14 and M15 and each amount of the constant current i1 and i3 is determined to realize the formula (6). Accordingly, the NMOS transistor M2 can output a current determined by a transistor size ratio of the NMOS transistors M1 and M2 accurately without being affected by λ characteristic.
A drain voltage Vd14 of the NMOS transistor M14 becomes
Vd14=Vgs1+Vgs13,
and when a drain-source voltage of the NMOS transistor M14 is Vds14, the following formula is obtained:
Vd1+Vds14=Vd14=Vgs1+Vgs13
Further, a formula (7) is obtained because of “Vd1=Vd2”:
Vds14=Vgs1+Vgs13−Vd2 (7)
When an overdrive voltage of the NMOS transistor M14 is defined as Vov14, the following formula is established based on the formula (7) because “Vds14≧Vov14” is a necessary condition for the NMOS transistor M14 to work in a saturation operation region:
Vgs1+Vgs13≧Vd2≧Vov14
When each transistor size of the NMOS transistors M1 and M14 have equal transistor size and equal conductivity, each threshold voltage of the transistors M1 and M14 is Vthn, and an overdrive voltage is Vov1, the above formula becomes:
Vthn+Vov1+Vgs3−Vd2≧Vov14
Since Vov1=Vov14, the following formulas are obtained:
Vthn+Vgs3−Vd2≧0
Vthn+Vgs3≧Vd2
When the threshold voltage of the NMOS transistor M13 is Vthn, and an overdrive voltage is Vov13, the following formula is then obtained:
Vthn+(Vthn+Vov13)≧Vd2
Further, a formula (8) is obtained:
Vds2=Vd2≦Vthn×2+Vov13 (8)
A threshold value Vthn is generally determined by a manufacturing process, and the overdrive voltage Vov13 can be set arbitrarily with the transistor size of the NMOS transistor M13 and the constant current i2 flowing through the NMOS transistor M13. Accordingly, an operational voltage condition of the circuit can be determined so as to adjust to a change of the drain voltage Vd2 of the NMOS transistor M2.
Next, a minimum drain voltage necessary for the NMOS transistor M2 to work in a saturation operation region is now described.
A condition under which the NMOS transistor M2 works in a saturation operation region is expressed by the following formula,
Vds2≧Vgs2−Vthn=Vov2 (9)
where the threshold voltage of the NMOS transistor M2 is Vthn and an overdrive voltage is Vov2. Therefore, a minimum voltage of the output voltage Vo at the output terminal becomes Vov2, and the minimum voltage can be decreased to half the minimum voltage of the conventional constant current circuit.
For example, where each condition is determined to be Vthn=0.8v, Vov2=0.3v, Vov13=0.3v, a condition under which the drain voltages of the NMOS transistors M11 and M2 are equal is a range of Vds2≦1.9 v based on the formula (8). Further, based on the formula (9), a condition under which the NMOS transistor M2 works in a saturation operation region is a range of Vds2≧0.3v. That is, output current accuracy can be maintained within a range of
0.3v≦Vds2≦1.9v (10)
On the other hand, in the conventional constant current circuit shown in
0.3v≦Vo≦1.1v (11)
In other words, the range within which output current accuracy can be maintained is narrower in the conventional constant current circuit shown in
Referring to
It is to be noted that the circuit shown in
In
In the NMOS transistors M1 and M2, all the gate, drain, and source voltages are equal. Accordingly, the NMOS transistor M2 can output a current determined by a transistor size ratio of the NMOS transistors M1 and M2 accurately without being affected by the λ characteristic of the MOS transistor. Owing to this negative feedback loop of the error amplifier 17, each drain voltage of the NMOS transistors M1 and M2 can be adjusted to equal every other accurately.
Thus, in the constant current circuit according to the first example embodiment, the NMOS transistors M141 and M142 shown in
Overshoot and undershoot in the output current iout may occur when a gate voltage of the NMOS transistor M13 changes abruptly at a start-up operation and an operational condition change. A constant current circuit according to a second example embodiment which can prevent such overshoot and undershoot in the output current iout is now described.
The capacitor C11 contributes to stable operation by preventing overshoot and undershoot in the output current iout by reducing an abrupt change in the gate voltage of the NMOS transistor M13, especially at the start-up operation and at a setting mode change of the constant current i1.
The constant current circuit according to the second example embodiment can obtain an effect similar to that of the constant current circuit according to the first example embodiment, and can prevent overshoot and undershoot in the output current iout. Therefore, it is possible to avoid improper operation without supplying excessive current to an external load 10.
A gate voltage of the NMOS transistor M1 may increase drastically to supply the constant current i1 to the NMOS transistor M1 in the first example embodiment when the drain voltage of the NMOS transistor M2 drops, and the NMOS transistor M1 works in a liner operation region under a condition in which the drain voltage of the NMOS transistor M1 is lower than the drain voltage of the NMOS transistor M2 due to variation during the manufacturing processes. Further, if the drain voltage of the NMOS transistor M2 is larger than the drain voltage of the NMOS transistor M1, and the NMOS transistor M2 works in a saturation operation region, improper operation may occur, possibly resulting in output of a large output current that is larger than a setting current.
In
In
In the first, second, and third example embodiments, power supply voltages Vdd1 and Vdd2 may be equal voltages or they may be different voltages. The constant current circuit 1, a power supply circuit that generates the power supply voltage Vdd1, and a power supply circuit that generates the power supply voltage Vdd2 are integrated in one IC. Further, the external load and the constant current circuit 1 may be integrated in one IC.
Although in the first, second, and third example embodiments NMOS transistors are employed, alternatively PMOS transistors may be employed for the output transistor.
Numerous additional modifications and variations are possible in light of the above teachings. It is therefore to be understood that within the scope of the appended claims, the disclosure of this patent specification may be practiced otherwise than as specifically described herein.
Number | Date | Country | Kind |
---|---|---|---|
2007-064565 | Mar 2007 | JP | national |
Number | Name | Date | Kind |
---|---|---|---|
5894236 | Mizoguchi et al. | Apr 1999 | A |
6724235 | Costa et al. | Apr 2004 | B2 |
7161412 | Manganaro | Jan 2007 | B1 |
20050068066 | Yamashita et al. | Mar 2005 | A1 |
20070108958 | Minakuchi | May 2007 | A1 |
Number | Date | Country |
---|---|---|
9-319323 | Dec 1997 | JP |
2004-180007 | Jun 2004 | JP |
Number | Date | Country | |
---|---|---|---|
20080224632 A1 | Sep 2008 | US |