Contact pin for integrated circuit testing

Abstract

Description

FIG. 1 is a top front perspective view of a contact pin for integrated circuit testing showing our new design;

FIG. 2 is a bottom rear perspective view thereof;

FIG. 3 is a front elevation view thereof;

FIG. 4 is a rear elevation view thereof;

FIG. 5 is a left side elevation view thereof;

FIG. 6 is a right side elevation view thereof;

FIG. 7 is a top plan view thereof; and,

FIG. 8 is a bottom plan view thereof.

Claims

The ornamental design for a contact pin for integrated circuit testing, as shown and described.