The broken lines in the drawing views are included to show portions of the contact wafer that form no part of the claimed design.
The broken lines in the drawing views are included to show portions of the contact wafer that form no part of the claimed design.
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D727268 | Buck | Apr 2015 | S |
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D926144 | Musser | Jul 2021 | S |
D926705 | Musser | Aug 2021 | S |
20190097357 | Mongold | Mar 2019 | A1 |
20200036138 | Mongold | Jan 2020 | A1 |
20200212631 | Buck | Jul 2020 | A1 |
20210126401 | Musser | Apr 2021 | A1 |
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D130799 | Sep 2009 | TW |
D132453 | Dec 2009 | TW |
D159828 | Apr 2014 | TW |
D163315 | Oct 2014 | TW |
D168325 | Jun 2015 | TW |
D168328 | Jun 2015 | TW |
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Entry |
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Official Communication issued in corresponding Taiwanese Patent Application No. 109301707, dated Oct. 30, 2020. |
Official Communication issued in corresponding Taiwanese Patent Application No. 107304340D01 dated Sep. 26, 2020. |
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Number | Date | Country | |
---|---|---|---|
Parent | 29652017 | Dec 2018 | US |
Child | 29725389 | US |