This application claims priority to Italian Application No. 102023000015405, filed on Jul. 21, 2023, which application is hereby incorporated by reference herein in its entirety.
The description relates to high-voltage switch circuits and corresponding methods of operation.
High-voltage switches may be applied to non-volatile memories (NVM) where the state of a memory cell can be changed by applying a programming current to the cell itself, such as phase-change memories (PCM), spin-torque magnetoresistive random-access memories (ST-MRAM), and resistive random-access memories (RRAM).
For example, U.S. Pat. No. 9,219,482 B2 discloses a high-voltage switch used to transfer a high voltage in a memory device. The architecture includes a single, high-voltage NMOS transistor that controls the transmission of the high-voltage signal from an input terminal to an output terminal based on the voltage at the gate terminal of the NMOS transistor. The gate terminal of the NMOS transistor is driven using further high-voltage transistors that may be implemented with a triple well structure.
As another example, U.S. Pat. No. 7,385,377 B2 discloses a voltage-down converter used to step down an external supply voltage (e.g., 3 V) to a lower value (e.g., 1.85 V) for a memory device that operates at a much lower voltage. The transconductance between the input node and the output node of the converter can be modulated by activating one or more drivers interposed therebetween. Each driver has two transistors arranged in series between the input and output nodes. The first one is a high-voltage transistor configured to withstand the high power supply voltage, while the second one is a low-voltage transistor configured to switch on and off the driver in a relatively short time.
Other examples include U.S. Pat. No. 10,714,183 B2, US 2023/0015995 A1, US 2022/0321116 A1, and US 2021/0408891 A1.
In some memory applications, high-voltage switches may be used to toggle the voltages that are used during a memory modify operation (e.g., write operation or programming operation) to switch the column supply voltage between, for example, 2 V and 4.8 V. Thus, since the voltage domain of the circuits may be between ground voltage (e.g., 0 V) and a relatively high voltage (e.g., 4.8 V or 5 V), the high-voltage switch circuits are conventionally designed (e.g., sized) for such a voltage rating. Such sizing implies thick gate oxide or large area occupation, and the fabrication of such high-voltage transistors also requires dedicated manufacturing steps and masks that increase manufacturing costs.
Therefore, there is a need in the art to provide improved high-voltage switch circuits that do not rely on high-voltage rating transistors.
An object of one or more embodiments is to contribute to providing such improved high-voltage switch circuits that can handle high voltages (e.g., in the range of 0 V to about 5 V) without implementing high-voltage rating transistors, but implementing (only) low-voltage rating transistors (e.g., in the range of 0 V to about 2.5 V).
According to one or more embodiments, such an object can be achieved by a switch circuit having the features set forth in the claims that follow.
One or more embodiments may relate to a corresponding method of operation.
The claims are an integral part of the technical teaching provided herein in respect of the embodiments.
According to an aspect of the present description, in a switch circuit a first input node is configured to receive a first input voltage, a second input node is configured to receive a second input voltage lower than the first input voltage, and an output node is configured to produce an output voltage switchable between the first input voltage and the second input voltage. A first pass device and a second pass device are arranged in series between the first input node and the output node. A third pass device and a fourth pass device are arranged in series between the second input node and the output node. A first elevator circuit is configured to receive a first low-voltage control signal and produce a corresponding first shifted control signal to control the first pass device. The first elevator circuit is biased between the first input voltage and a shifted ground voltage. A second elevator circuit is configured to receive a second low-voltage control signal and produce a corresponding second shifted control signal to control the second pass device. The second elevator circuit is biased between the output and elevated ground voltage. A third elevator circuit is configured to receive a third low-voltage control signal and produce a corresponding third shifted control signal to control the third pass device. The third elevator circuit is biased between the second input voltage and a ground voltage. A fourth elevator circuit is configured to receive a fourth low-voltage control signal and produce a corresponding fourth shifted control signal to control the fourth pass device. The fourth elevator circuit is biased between the output and elevated ground voltage.
One or more embodiments may thus provide a switch circuit able to manage high voltages (e.g., in the range of 0 V to 5 V) without resorting to high-voltage rating devices but using (only) low-voltage rating devices (e.g., in the range of 0 V to 2.5 V).
According to another aspect of the present description, a method of operating a switch circuit includes: receiving a first input voltage at a first input node; receiving a second input voltage lower than the first input voltage at a second input node; switching an output node between the first input voltage and the second input voltage to produce the output voltage; receiving a first low-voltage control signal at a first elevator circuit and producing a corresponding first shifted control signal; biasing the first elevator circuit between the first input voltage and a shifted ground voltage; receiving a second low-voltage control signal at a second elevator circuit and producing a corresponding second shifted control signal; biasing the second elevator circuit between the output voltage and an elevated ground voltage; receiving a third low-voltage control signal at a third elevator circuit and producing a corresponding third shifted control signal; biasing the third elevator circuit between the second input voltage and a ground voltage; receiving a fourth low-voltage control signal at a fourth elevator circuit and producing a corresponding fourth shifted control signal; and biasing the fourth elevator circuit between the output voltage and the elevated ground voltage.
One or more embodiments will now be described, by way of example, with reference to the annexed figures, wherein:
In the ensuing description, one or more specific details are illustrated, aimed at providing an in-depth understanding of examples of embodiments of this description. The embodiments may be obtained without one or more of the specific details, or with other methods, components, materials, etc. In other cases, known structures, materials, or operations are not illustrated or described in detail so that certain aspects of embodiments will not be obscured.
Reference to “an embodiment” or “one embodiment” in the framework of the present description is intended to indicate that a particular configuration, structure, or characteristic described in relation to the embodiment is included in at least one embodiment. Hence, phrases such as “in an embodiment” or “in one embodiment” that may be present in one or more points of the present description do not necessarily refer to one and the same embodiment. Moreover, particular configurations, structures, or characteristics may be combined in any adequate way in one or more embodiments.
The headings/references used herein are provided merely for convenience and, hence, do not define the extent of protection or the scope of the embodiments.
Throughout the figures annexed herein, unless the context indicates otherwise, like parts or elements are indicated with like references/numerals and a corresponding description will not be repeated for the sake of brevity.
By way of introduction to the detailed description of exemplary embodiments, reference may be made to
As exemplified in
A first pass device P1 (or pass element, e.g., a transistor, particularly a p-channel MOS transistor) is arranged between the first voltage input terminal 101 and the output terminal 104, and a second pass device P2 (e.g., a transistor, particularly a p-channel MOS transistor) is arranged between the second voltage input terminal 102 and the output terminal 104.
A first elevator circuit 121 biased between Vin1 and ground GND is configured to receive the control signal LV1 and to shift (elevate) it to a higher voltage domain (e.g., in the range of 0 V to Vin1) to produce a first high-voltage control signal HV1 that controls the first pass device P1 (e.g., is received at the gate terminal of MOS transistor P1).
A second elevator circuit 122 biased between Vin1 and ground GND is configured to receive the control signal LV2 and to shift (elevate) it to a higher voltage domain (e.g., in the range of 0 V to Vin1) to produce a second high-voltage control signal HV2 that controls the second pass device P2 (e.g., is received at the gate terminal of MOS transistor P2).
Each of the elevator circuits 121 and 122 (collectively or individually referred to as elevator circuits 12x) may have the architecture exemplified in the circuit block diagram of
An elevator circuit 12x includes an input terminal 202 configured to receive a low-voltage input signal In (e.g., LV1 or LV2 with reference to
The elevator circuit 12x includes a latch including two inverters INV1 and INV2. Both inverters INV1 and INV2 are biased between Vin1 and ground GND. The output terminal of inverter INV1 is connected to the input terminal of inverter INV2 at node 20, and the output terminal of inverter INV2 is connected to the input terminal of inverter INV1 at node 22.
A transistor N1 (e.g., an n-channel MOS transistor) has a conductive channel arranged between node 20 and ground GND and is configured to receive signal In as a control signal. For instance, transistor N1 has a drain terminal coupled to node 20, a source terminal coupled to ground GND, and a gate terminal coupled to the input terminal 202 of the elevator circuit 12x.
A transistor N2 (e.g., an n-channel MOS transistor) has a conductive channel arranged between node 22 and ground GND and is configured to receive the complement In of signal In as a control signal. For instance, transistor N2 has a drain terminal coupled to node 22, a source terminal coupled to ground GND, and a gate terminal coupled to the output of a further inverter circuit 24 that has its input coupled to the input terminal 202 of the elevator circuit 12x.
Additionally, a first buffer circuit B1 biased between Vin1 and ground GND has an input terminal connected to node 20 and an output terminal connected to the output terminal 204 of the elevator circuit 12x to produce the high-voltage output signal Out.
Optionally, a second buffer circuit B2 biased between Vin1 and ground GND has an input terminal connected to node 22 and an output terminal connected to a further output terminal 206 of the elevator circuit 12x to produce the complement Out of the high-voltage output signal Out.
High-voltage switches as exemplified in
Therefore, one or more embodiments relate to an improved high-voltage switch circuit that does not rely on high-voltage rating transistors.
In detail,
As exemplified in
As exemplified in
As exemplified in
As exemplified in
As exemplified in
As exemplified in
Resorting to the architecture of
In particular, the control circuit 31 may produce the control signals (e.g., LV1a, LV1b, LV2a, LV2b as well as PRE) so that the commutation of voltage Vout from the high value Vin1 to the low value Vin2 is carried out in three steps. Initially, transistors Pia and P1b are conductive (on) and transistors P2a and P2b are non-conductive (off). In the first commutation step, transistors Pia and P1b are turned into a non-conductive state (off) and the precharge circuit 34 is activated (e.g., asserting signal PRE) to discharge node 304 and lower the output voltage Vout from Vin1 (e.g., 5 V) to a lower value (e.g., about half of Vin2, such as 2.4 V). In the second commutation step, the elevated ground voltage e_GND is adjusted so as to provide the correct voltage bias to elevator circuits 321b and 322b, e.g., voltage e_GND is set to ground voltage GND. In the third commutation step, the precharge circuit 34 is deactivated (e.g., de-asserting signal PRE) and transistors P2a and P2b are turned into a conductive state (on) so that the output voltage Vout is driven to the desired value Vin2.
Similarly, the control circuit 31 may produce the control signals (e.g., LV1a, LV1b, LV2a, LV2b, as well as PRE) so that the commutation of voltage Vout from the low-value Vin2 to the high-value Vin1 is carried out in three steps.
Initially, transistors P2a and P2b are conductive (on) and transistors Pia and P1b are non-conductive (off). In the first commutation step, transistors P2a and P2b are turned into a non-conductive state (off).
In the second commutation step, the elevated ground voltage e_GND is adjusted so as to provide the correct voltage bias to elevator circuits 321b and 322b, e.g., voltage e_GND is set to the shifted ground voltage s_GND. In this step, the value of signal HV1b driving transistor P1b remains compatible with the switching-on of transistor P1b, allowing the output voltage Vout to reach the desired value Vin1.
In the third commutation step, transistors Pia and P1b are turned into a conductive state (on) so that the output voltage Vout is driven to the desired value Vin1.
Each of the elevator circuits 321a, 321b, 322a, and 322b (also collectively or individually referred to as elevator circuits 32x) may have the architecture exemplified in the circuit block diagram of
An elevator circuit 32x includes an input terminal 402 configured to receive a low-voltage input signal In (e.g., LV1a, LV1b, LV2a or LV2b with reference to
The elevator circuit 32x includes a latch including two inverters INV3 and INV4. Inverters INV3 and INV4 are biased between a higher voltage VH and a lower voltage VL. The values of voltages VH and VL are chosen so that the elevator circuit 32x is subject to a low-voltage domain (e.g., of about 2 V or 2.5 V). For instance, in the case of elevator circuit 321a, VH may be equal to Vin1 and VL may be equal to s_GND; in the case of elevator circuits 321b and 322b, VH may be equal to Vout and VL may be equal to e_GND; in the case of elevator circuit 322a, VH may be equal to Vin2 and VL may be equal to GND. The output terminal of inverter INV3 is connected to the input terminal of inverter INV4 at a node 40 and the output terminal of inverter INV4 is connected to the input terminal of inverter INV3 at a node 42. The voltage swing of the input signal In is between ground GND and VL.
As exemplified in
As exemplified in
Additionally, a first buffer circuit B3 biased between voltage VH and voltage VL has an input terminal connected to node 40 and an output terminal connected to the output terminal 404 of the elevator circuit 32x to produce the high-voltage output signal Out.
Optionally, a second buffer circuit B4 biased between voltage VH and voltage VL has an input terminal connected to node 42 and an output terminal connected to a further output terminal 406 of the elevator circuit 32x to produce the complement Out of the high-voltage output signal Out.
As exemplified in
Resorting to the architecture of
As anticipated, high-voltage switch circuits as disclosed herein may be used in the control circuits of a memory, such as in the row decoder circuits.
One or more embodiments as exemplified herein may thus be advantageous insofar as they facilitate managing “high” voltages (e.g., in the range of 0 V to 5 V) without resorting to high-voltage rating devices but using (only) low-voltage rating devices (e.g., in the range of 0 V to 2.5 V). This reduces the thickness of the gate oxide, the area occupation, and reduces the number of manufacturing steps, thus reducing manufacturing costs (masks costs) without degrading the performance.
Without prejudice to the underlying principles, the details and embodiments may vary, even significantly, with respect to what has been described by way of example, without departing from the extent of protection.
The extent of protection is determined by the annexed claims.
Number | Date | Country | Kind |
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102023000015405 | Jul 2023 | IT | national |