The present invention contains subject matter related to Japanese Patent Application No. 2006-221252 filed in the Japan Patent Office on Aug. 14, 2006, the entire contents of which being incorporated herein by reference.
1. Field of the Invention
The present invention relates to a control system of a multichannel optical switch utilizing an electro-optical effect (EO effect), more particularly relates to a control system of a multichannel optical switch preventing heat generation of the optical switch devices due to a leakage current between electrodes of the optical switch devices and the ground or between wires.
2. Description of the Related Art
Optical switches using devices (PLZT etc.) having the Pockels effect, Kerr effect, or another EO effect have various merits compared with mechanical optical switches (MEMS) such as a faster operating speed and a longer life than mechanical switches and are promising for application to systems for switching large capacity optical circuits at a high speed (for example, optical routers etc.) (below, such optical switches having such an EO effect being referred to as “EO-SWs” or simply “optical switches”).
An EO-SW is characterized by changing the deflection angle in accordance with the magnitude of the electric field given or its change (relating to electrode area or applied voltage).
In this way, due in part to its being in the initial stage of R&D, the conventional EO-SW had few carried channels (in the illustration, two channels). It still did not target being built in larger systems. The drive unit was comprised of a plurality of power sources controlled individually for each electrode of the optical switch devices.
For example, if the optical switch devices 213, 214, 218, and 219 are supplied with the voltage V1-1, the optical signal input from the OptIN1 of the first channel is output to OptOUT1 whereby the path 1-1 is established, while if the optical switch devices 213, 214, 215, and 216 are supplied with the voltage V1-2, it is output to OptOUT2 whereby the path 1-2 is established.
If connection is allowed, the system applies a desired voltage to predetermined electrodes at step 306, then waits for a certain time at step 307 and monitors the status at step 308. In the monitoring, at step 309, it compares the error and judges whether the error between the input data and connection data is within a certain range. If within a certain range, at step 310, it finely adjusts the electrode voltage, then, at step 311, waits for the next input of switching data. The judgment in the comparison of error at step 309 corrects for aging of the EO-SW, fluctuations in temperature, and other factors behind fluctuation so that the applied voltage becomes always optimal.
Related art include Japanese Patent Publication (A) No. 5-292030, International Publication WO94/09575 Pamphlet, and Japanese Patent Publication (A) No. 4-194824.
Summarizing the problems to be solved by the invention, to build the switch into larger systems, a multichannel, highly integrated EO-SW has been developed. Making this operate to switch paths continuously at a high speed is now being targeted. In the related art, there was no problem since there were few channels and the switching was performed intermittently at a slow speed, but the following problems arose when making a newly developed multichannel, highly integrated EO-SW operate to switch paths continuously at a high speed.
Problem 1. Due to the capacity components present between the electrodes of the optical switch devices and the ground, if switching paths continuously at a high speed, a continuous leakage current is generated between the electrodes and ground (leakage current in working channel circuit).
Problem 2. In the multichannel, highly integrated EO-SW, since there are capacity components present between the adjoining channels (electrodes and pattern parts), if switching paths continuously at a high speed, a continuous leakage current is generated between adjoining channels (leakage current between adjoining channels).
Due to the generation of the leakage current, not only does noise occur at the electrodes, but also the phenomenon of a rise in temperature around the leakage part occurs and in the worst case causes the optical switch devices to break.
As shown in (A) of
However, if the period being applying and stopping the voltage becomes short, the problem of heat generation due to the leakage current occurs.
An object of the present invention, in considering the problems of the above stated related art, is to provide a control system of an optical switch controlling the switching operation in a multichannel, highly integrated EO-SW so as to suppress the generation of leakage current and enable stable operation.
To achieve the above object, according to a first aspect of the invention, there is provided a control system of optical switch devices of a multichannel optical switch using devices having an electro-optical effect, the control system of a multichannel optical switch provided with a switching data input device for inputting switching data of the optical switch devices from a path switching instruction device, an elapsed time recording device for recording an elapsed time EL_T from which the switching data starts to be output from the path switching instruction device, a judgment data recording device for recording judgment data for judging whether switching of the optical switch devices is possible based on the switching data, an elapsed time judgment device for determining whether the elapsed time EL_T has exceeded a predetermined counted time threshold Am_T, a switching judgment processing device for judging switching based on an output of the elapsed time judgment device and an output of the judgment data recording device, and an electrode voltage application device, the electrode voltage application device applying voltage for switching the optical switch devices based on the switching data when the elapsed time judgment device has judged that the elapsed time EL_T is shorter than the predetermined counted time threshold Am_T, the electrode voltage application device applying voltage for switching the optical switch devices based on the switching data to the optical switch devices when the elapsed time judgment device has judged that the elapsed time EL_T has exceeded the predetermined counted time threshold Am_T only when the switching judgment processing device judges that predetermined switching conditions have been met and the electrode voltage application device not applying voltage for switching the optical switch devices to the optical switch devices and sending a switching failure notice from the switching judgment processing device to the path switching instruction device when the switching judgment processing device judges that predetermined switching conditions have not been met.
According to a second aspect of the present invention, there is provided the first aspect of the invention wherein the switching data input device is provided with a Vt1 register for recording a voltage Vt1 applied by a path connection of before switching of the optical switch devices and a Vt2 register for recording a voltage Vt2 applied by a path connection of after switching of the optical switches, the judgment data recording device is provided with a Vts register for recording an absolute value Vts of a difference of the voltage Vt1 and voltage Vt2 and a Vtsm register for adding a value stored in the Vts register to a switching channel difference sum Vtsm to update the switching channel difference sum Vtsm, the elapsed time recording device is an EL_T register for recording the elapsed time EL_T, the switching judgment processing device is provided with a VtsmA register for storing a value VtsmA obtained by dividing the Vtsm value by the elapsed time EL_T when the elapsed time judgment device has judged that the predetermined counted time threshold Am_T has been exceeded and a comparison device for comparing the VtsmA value and a predetermined electrode voltage application judgment threshold VtsmA_TH, the values of the EL_T register and the Vtsm register are cleared to a predetermined initial value when the division ends, and the electrode voltage application device applies voltage for switching the optical switch devices based on the switching data to the optical switch devices when the VtsmA value is smaller than the predetermined electrode voltage application judgment threshold VtsmA_Th and sends a switching failure notice to the path data switching instruction device when the VtsmA value is the predetermined electrode voltage application judgment threshold VtsmA_TH or more.
According to a third aspect of the present invention, there is provided the first aspect of the invention wherein the switching data input device and judgment data recording device are provided with an Sw register for recording the switching count Sw of the optical switch devices, the elapsed time recording device is an EL_T register for recording the elapsed time EL_T, the switching judgment processing device is provided with an SwA register for storing an SwA value obtained by dividing the switching count Sw by the elapsed time EL_T when the elapsed time judgment device has judged that the predetermined counted time threshold Am_T has been exceeded and a comparison device for comparing the SwA value with a predetermined electrode voltage application judgment threshold SwA_TH, the value of the Sw register and the value of the EL_T register are cleared to a predetermined initial value when the division is ended, and the electrode voltage application device applies voltage for switching the optical switch devices based on the switching data to switch the optical switch devices when the SwA value is smaller than the predetermined electrode voltage application judgment threshold SwA_TH and sends a switching failure notice to the path data switching instruction device when the SwA value is the predetermined electrode voltage application judgment threshold SwA_TH or more.
According to a fourth aspect of the present invention, there is provided the first aspect of the invention wherein the switching data input device is provided with a Vt1 register for recording a voltage Vt1 applied by a path connection of before switching of the optical switch devices and a Vt2 register for recording a voltage Vt2 applied by a path connection of after switching of the optical switches, the judgment data recording device is provided with a Vts register for recording an absolute value Vts of a difference between the voltage Vt1 and the voltage Vt2 and a Vtsm register for adding a value stored in the Vts register to a switching channel difference sum Vtsm to update the switching channel difference sum Vtsm, the elapsed time recording device is an EL_T register for recording the elapsed time EL_T, the switching judgment processing device is provided with a WvtsmA register for storing a channel switching heat generation calculated value (WvtsmA value) obtained by subtracting from a product of the switching channel difference sum Vtsm and a coefficient Wvt for deriving the natural heat discharge envisioned from the switching channel difference sum Vtsm the product of the elapsed time EL_T and a coefficient Wvt_loss for deriving the amount of natural heat discharge envisioned from the elapsed time EL_T when the elapsed time judgment device has judged that the predetermined counted time threshold Am_T has been exceeded and a comparison device for comparing the WvtsmA value with a predetermined WvtsmA threshold WvtsmA_TH, the value of the Vtsm register and the value of the EL_T register are cleared to a predetermined initial value when the subtraction ends, and the electrode voltage application device applies voltage for switching the optical switch devices based on the switching data to the optical switch devices when the WvtsmA value is smaller than the predetermined electrode voltage application judgment WvtsmA threshold WvtsmA_TH and sends a switching failure notice to the path data switching instruction device when the WvtsmA value is the WvtsmA threshold WvtsmA_TH or more.
According to a fifth aspect of the present invention, there is provided the first aspect of the invention wherein the switching data input device and judgment data recording device are provided with an Sw register for recording the switching count Sw of the optical switch devices, the elapsed time recording device is an EL_T register for recording the elapsed time EL_T, the switching judgment processing device is provided with a WswA register for storing a WswA value obtained by subtracting from a product of the switching count Sw and a coefficient Wsw for deriving the amount of heat generation envisioned from the switching count Sw the product of the elapsed time EL_T and a coefficient Wsw_loss for deriving the amount of natural heat generation envisioned from the elapsed time EL_T when the elapsed time judgment device has judged that the predetermined counted time threshold Am_T has been exceeded and a comparison device for comparing the WswA value with a predetermined WswA threshold WswA_TH, the value of the Sw register and the value of the EL_T register respectively are cleared to a predetermined initial value when the subtraction ends, and the electrode voltage application device applies voltage for switching the optical switch devices based on the switching data to the optical switch devices when the WswA value is smaller than the predetermined WswA threshold WswA_TH and sends a switching failure notice to the path data switching instruction device when the WswA value is the WswA threshold WswA_TH or more.
According to a sixth aspect of the present invention, there is provided the first aspect of the invention wherein the switching data input device is provided with an applied voltage register for recording a working channel applied voltage V1 for the optical switch device of a working channel, a preceding channel applied voltage V1− for the optical switch device of the preceding channel adjoining the working channel, and a succeeding channel applied voltage V1+ for the optical switch device of the succeeding channel adjoining the working channel, the judgment data recording device is provided with a register for storing a preceding adjoining channel voltage difference Vtc1 between the working channel applied voltage V1 and the preceding channel applied voltage V1− and a succeeding adjoining channel voltage difference Vtc2 between the applied voltage V1 and the applied voltage V1+, a comparison device for comparing the absolute value of the preceding adjoining channel voltage difference Vtc1 and the absolute value of the succeeding adjoining channel voltage difference Vtc2, a conversion device for converting the greater adjoining channel voltage difference among the absolute value of the preceding adjoining channel voltage difference Vtc1 and the absolute value of the succeeding adjoining channel voltage difference Vtc2 into an adjoining channel voltage difference value Vtc, and a Vtcm register for adding the adjoining channel voltage difference value Vtc to the adjoining channel difference sum Vtcm to update the adjoining channel difference sum, the elapsed time recording device is an EL_T register for recording the elapsed time EL_T, and the electrode voltage application device applies voltage for switching the optical switch devices based on the switching data to the optical switch devices when the VtcmA value is smaller than the predetermined electrode voltage application judgment threshold VtcmA_TH and sends a switching failure notice to the path data switching instruction device when the VtcmA value is the predetermined electrode voltage application judgment threshold VtcmA_TH or more.
According to a seventh aspect of the present invention, there is provided the first aspect of the invention wherein the switching data input device is provided with an applied voltage register for recording a working channel applied voltage V1 for the optical switch device of a working channel, a preceding channel applied voltage V1− for the optical switch device of the preceding channel adjoining the working channel, and a succeeding channel applied voltage V1+ for the optical switch device of the succeeding channel adjoining the working channel, the judgment data recording device is provided with a register for storing a preceding adjoining channel voltage difference Vtc1 between the working channel applied voltage V1 and the preceding channel applied voltage V1− and a succeeding adjoining channel voltage difference Vtc2 between the applied voltage V1 and the applied voltage V1+, a first comparison device for comparing the absolute value of the preceding adjoining channel voltage difference Vtc1 and an adjoining channel difference judgment threshold Vtc_TH, a second comparison device for comparing the absolute value of the succeeding adjoining channel voltage difference Vtc2 and the adjoining channel difference judgment threshold Vtc_TH, and a switch count counter for incrementing a switch count Sw by “1” to update Sw when the absolute value of the preceding adjoining channel voltage difference Vtc1 is the adjoining channel difference threshold Vtc_TH or more and the absolute value of the succeeding adjoining channel voltage difference Vtc2 is the adjoining channel difference threshold Vtc_TH or more, the elapsed time recording device is an EL_T register for recording the elapsed time EL_T, the switching judgment processing device is provided with an SwcA register for storing a unit time inter-channel leak processing value SwcA obtained by dividing the value Sw of the switch count counter by the elapsed time EL_T when the elapsed time judgment device has judged that the predetermined counted time threshold Am_T has been exceeded and a third comparison device for comparing the inter-channel leak processing value SwcA and a predetermined channel leak processing electrode voltage application judgment threshold SwcA_TH, the values of the EL_T register and the switch count counter are cleared to a predetermined initial value when the division ends, and the electrode voltage application device applies voltage for switching the optical switch devices based on the switching data to the optical switch devices when the inter-channel leak processing value SwcA is smaller than the predetermined channel leak processing electrode voltage application judgment threshold SwcA_TH and sends a switching failure notice to the path data switching instruction device when the inter-channel leak processing value SwcA is the predetermined channel leak processing electrode voltage application judgment threshold SwcA_TH or more.
According to an eighth aspect of the present invention, there is provided the first aspect of the invention wherein the switching data input device is provided with an applied voltage register for recording a working channel applied voltage V1 for the optical switch device of a working channel, a preceding channel applied voltage V1− for the optical switch device of the preceding channel adjoining the working channel, and a succeeding channel applied voltage V1+ for the optical switch device of the succeeding channel adjoining the working channel, the judgment data recording device is provided with a register for storing a preceding adjoining channel voltage difference Vtc1 between the working channel applied voltage V1 and the preceding channel applied voltage V1− and a succeeding adjoining channel voltage difference Vtc2 between the applied voltage V1 and the applied voltage V1+, a comparison device for comparing the absolute value of the preceding adjoining channel voltage difference Vtc1 and the absolute value of the succeeding adjoining channel voltage difference Vtc2, a conversion device for converting the greater adjoining channel voltage difference among the absolute value of the preceding adjoining channel voltage difference Vtc1 and the absolute value of the succeeding adjoining channel voltage difference Vtc2 into an adjoining channel voltage difference value Vtc, and a Vtcm register for adding the adjoining channel voltage difference value Vtc to the adjoining channel difference sum Vtcm to update the adjoining channel difference sum, the elapsed time recording device is an EL_T register for recording the elapsed time EL_T, the switching judgment processing device is provided with a WvtcmA register for a channel leak channel switching heat generation calculated value (WvtcmA value) obtained by subtracting from a product of the adjoining channel voltage difference Vtc and a coefficient Wvtc for deriving the amount of heat generation envisioned from the adjoining channel difference voltage difference Vtc the product of the elapsed time EL_T and a coefficient Wswc_loss for deriving the amount of natural heat generation envisioned from the elapsed time EL_T when the elapsed time judgment device judges that the predetermined counted time threshold Am_T has been exceeded and a comparison device for comparing the WvtcmA value with a predetermined WvtcmA threshold WvtcmA_TH, the value of the Vtcm register and the value of the EL_T register are cleared to a predetermined initial value when the subtraction ends, and the electrode voltage application device applies voltage for switching the optical switch devices based on the switching data to the optical switch devices when the WvtcmA value is smaller than the predetermined WvtcmA threshold WvtcmA_TH and sends a switching failure notice to the path data switching instruction device when the WvtcmA value is the predetermined WvtcmA threshold WvtcmA_TH or more.
According to a ninth aspect of the present invention, there is provided the first aspect of the invention wherein the switching data input device is provided with an applied voltage register for recording a working channel applied voltage V1 for the optical switch device of a working channel, a preceding channel applied voltage V1− for the optical switch device of the preceding channel adjoining the working channel, and a succeeding channel applied voltage V1+ for the optical switch device of the succeeding channel adjoining the working channel, the judgment data recording device is provided with a register for storing a preceding adjoining channel voltage difference Vtc1 between the working channel applied voltage V1 and the preceding channel applied voltage V1− and a succeeding adjoining channel voltage difference Vtc2 between the applied voltage V1 and the applied voltage V1+, a first comparison device for comparing the absolute value of the preceding adjoining channel voltage difference Vtc1 and an adjoining channel difference judgment threshold Vtc_TH, a second comparison device for comparing the absolute value of the succeeding adjoining channel voltage difference Vtc2 and the adjoining channel difference judgment threshold Vtc_TH, and a switch count counter for incrementing a switch count Sw by “1” to update Sw when the absolute value of the preceding adjoining channel voltage difference Vtc1 is the adjoining channel difference threshold Vtc_TH or more and the absolute value of the succeeding adjoining channel voltage difference Vtc2 is the adjoining channel difference threshold Vtc_TH or more, the elapsed time recording device is an EL_T register for recording the elapsed time EL_T, the switching judgment processing device is provided with a WawcA register for storing a channel leak channel switching heat generation calculated value (WawcA value) obtained by subtracting from a product of the switching count Sw and a coefficient Wswc for deriving the amount of heat generation envisioned from the switching count Sw the product of the elapsed time EL_T and a coefficient Wswc_loss for deriving the amount of natural heat generation envisioned from the elapsed time EL_T when the elapsed time judgment device has judged that the predetermined counted time threshold Am_T has been exceeded and a comparison device for comparing the WswcA value with a predetermined WswcA threshold WswcA_TH, the values of the Sw register and the EL_T register are cleared when the subtraction ends, and the electrode voltage application device applies voltage for switching the optical switch devices based on the switching data to the optical switch devices when the WswcA value is smaller than the predetermined WswcA threshold WswcA_TH and sends a switching failure notice to the path data switching instruction device when the WswcA value is the predetermined WswcA threshold WswcA_TH or more.
According to the present invention, by rejecting continuous high speed requests for switching by certain criteria, it is possible to keep down the frequency of occurrence of leakage current, so it is possible to keep down a rise in temperature of the optical switches and stably control and operate EO-SWs.
These and other objects and features of the present invention will become clearer from the following description of the preferred embodiments given with reference to the attached drawings, wherein:
Below, embodiments of the present invention will be explained in more detail with reference to the drawings. Throughout the drawings, the same reference numbers indicate the same content.
Next, at step 115, the elapsed time judgment device 104 judges whether the elapsed time EL_T has exceeded the predetermined counted time threshold Am_T. When the elapsed time EL_T has exceeded the counted time threshold Am_T, at step 116, the switching judgment processing device 105 performs the switching judgment processing. At this step 116, at step 1161, the switching judgment processing device 105 accesses the switching judgment table 1162 inside the judgment data recording device 103 to refer to the switching judgment data and, at step 1163, judges whether switching is allowed based on this switching judgment data. When not, at step 1164, it sends a switching failure notice to the response input port 123 of the path switching instruction device 801.
When switching is allowed at step 1163 and when the elapsed time EL_T does not exceed the counted time threshold Am_T at step 115, at step 117, the control unit supplies voltage to the electrodes of the correspondingly optical switch devices. After this, in a similar manner, at step 118, it waits for a certain time, then, at step 119, performs monitoring. At 1191, it compares the error to determine if the error between the connection data and the actually connected electrodes is within a certain range. If this error is within a certain range, at step 1192, it waits for the input of the next switching data. If outside the certain range, at step 1193, it finely adjusts the voltage applied to the corresponding electrodes, then at step 121 waits for the input of the next switching data.
In the comparison of error at step 1191, the control unit performs correction processing to correct for aging of the EO-SW, fluctuations in temperature, and other factors causing fluctuation so that the applied voltage becomes constantly optimal.
The judgment data recording device 103 of
The elapsed time recording device 104 of
The electrode voltage application device 106 of
Next, at step 143, the system records the absolute value of the difference of VT1 and VT2 in the Vts register 133, while at step 144, it performs the operation Vts+Vtsm=Vtsm to update the value of the Vtsm register 134. The initial value of Vtsm is for example 0. Next, at step 145, it records the elapsed time EL_T from the time after the switching data starts to be output from the path switching instruction device 801 in the elapsed time recording device (EI_T register) 102.
Next, at step 146, the system uses the elapsed time judgment device 136 to judge whether the elapsed time EL_T has exceeded the predetermined counted time threshold Am_T. When the elapsed time EL_T has exceeded the counted time threshold Am_T, at step 147, it divides the Vtsm by EI_T and records the resultant VtsmA in the VtsmA register 137. Next, at step 148, it for example clears the values of the ET_T register 145 and Vtsm register 144 to 0 to initialize them.
Next, at step 149, the system uses the comparison device 138 to compare the VtsmA value with the connection voltage difference threshold VtsmA_TH. If VtsmA<VtsmA_TH, then at step 1491, the system supplies voltage to the electrodes of the corresponding optical switch devices. If VtsmA≧VtsmA_TH, then at step 1492, the system stops the application of electrode voltage and, at step 1493, notifies switching failure to the response input port 123 of the path switching instruction device 801.
The values of the Sw register 151 and the EL_T register 152 are for example cleared to 0 to be initialized when the division at the SwA register 154 ends. The electrode voltage application device 156 applies voltage for switching the optical switch devices based on the switching data to the optical switch devices when the SwA value is smaller than the predetermined switching channel count threshold SwA_TH and sends a switching failure notice to the path switching instruction device when the SwA value is the predetermined switching channel count threshold SwA_TH or more.
Next, at step 164, the system uses the judgment device 153 to judge whether the elapsed time EL_T has exceeded the predetermined counted time threshold Am_T. When the elapsed time EL_T has exceeded the counted time threshold Am_T, at step 165, the system divides the switching count Sw by the EI_T and records the result SwA in the unit time switching count storage register (SwA register) 154. Next, at step 166, it for example clears the values of the ET_T register 152 and the Sw register 151 to 0 to initialize them.
Next, at step 167, the system compares the SwA value with the connection voltage difference threshold SwA_TH. If SwA<SwA_TH, then at step 168, it supplies voltage to the electrodes of the corresponding optical switch devices. If SwA≧SwA_TH, then at step 169, the system stops the application of the electrode voltage, then at step 1691 it notifies switching failure to the response input port 123 of the path switching instruction device 801.
The switching judgment processing device 1053 in Example 3 is provided with a unit time wattage storage register (WvtsmA register) 177 for storing a WvtsmA value obtained by subtracting from a product of a switching channel difference sum Vtsm and a coefficient Wvt for deriving the natural heat discharge envisioned from that switching channel difference sum Vtsm (coefficient for conversion of wattage generated there based on Vtsm) the product of the elapsed time EL_T and a coefficient Wvt_loss for deriving the amount of natural heat discharge envisioned from the elapsed time EL_T (coefficient for conversion of wattage discharged there based on EL_T) when the elapsed time judgment device 176 judges that a predetermined counted time threshold Am_T has been exceeded and a comparison device 178 for comparing the WvtsmA value with a predetermined WvtsmA threshold WvtsmA_TH.
The value of the Vtsm register 174 and the value of the EL_T register 175 are for example cleared to 0 to be initialized when the subtraction for obtaining WvtsmA ends. The electrode voltage application device 179 applies voltage for switching the optical switch devices based on switching data to the optical switch devices when the WvtsmA value is smaller than a predetermined electrode voltage application judgment WvtsmA threshold WvtsmA_TH and sends a switching failure notice to the path switching instruction device when the WvtsmA value is the WvtsmA threshold WvtsmA_TH or more.
In Example 3, at step 187, the switching judgment processing device 1053 subtracts from a product of a switching channel difference sum Vtsm and a coefficient Wvt for deriving the natural heat discharge envisioned from that switching channel difference sum Vtsm the product of the elapsed time EL_T and a coefficient Wvt_loss for deriving the amount of natural heat discharge envisioned from the elapsed time EL_T when the elapsed time judgment device 176 judges that a predetermined counted time threshold Am_T has been exceeded and stores this WvtsmA value of the result of subtraction in the WvtsmA register 177.
When the subtraction for obtaining the WvtsmA value ends, at step 188, the system for example clears the value of the Vtsm register 184 and the value of EL_T register 185 to 0 to initialize them. Next, at step 189, it compares the WvtsmA value and the predetermined electrode voltage application judgment WvtsmA threshold WvtsmA_TH by the comparison device 178. When the WvtsmA value is smaller than the predetermined electrode voltage application judgment WvtsmA threshold WvtsmA_TH, at step 1891, it applies voltage for switching the optical switch devices based on the switching data to the optical switch devices, while when the WvtsmA value is the WvtsmA threshold WvtsmA_TH or more, at step 1892, it stops the application of electrode voltage, then, at step 1893, sends a switching failure notice to the response input port 123 of the path switching instruction device 801.
The switching judgment processing device 1054 in Example 4 is provided with a unit time wattage storage register (WswA register) 194 for storing a WswA value obtained by subtracting from a product of a switching count Sw and a coefficient Wsw for deriving the amount of heat generation envisioned from that switching count Sw (coefficient for conversion of wattage generated there based on Sw) the product of the elapsed time EL_T and a coefficient Wsw_loss for deriving the amount of natural heat generation envisioned from the elapsed time EL_T (coefficient for conversion of wattage discharged there based on EL_T) when the elapsed time judgment device 193 judges that a predetermined counted time threshold Am_T has been exceeded and a comparison device 195 for comparing the WswA value with a predetermined WswA threshold WswA_TH.
In Example 4, at step 205, the WswA register 194 inside the switching judgment processing device 1054 subtracts from a product of a switching count Sw and a coefficient Wsw for deriving the amount of heat generation envisioned from that switching count Sw the product of the elapsed time EL_T and a coefficient Wsw_loss for deriving the amount of natural heat generation envisioned from the elapsed time EL_T when the elapsed time judgment device 193 judges that a predetermined counted time threshold Am_T has been exceeded. Further, the control system records the obtained WSwA value in the WswA register 194. Next, at step 206, it for example clears the value of the Sw register 191 and the value of the EL_T register 192 to 0 to initialize them when the above subtraction ends. Next, at step 207, it compares the WSwA value and the predetermined WswA threshold WswA_TH by the comparison device 195. When the WSwA value is smaller than the predetermined WswA threshold WswA_TH, at step 208, it applies voltage for switching the optical switch devices based on the switching data to the optical switch devices. When the WSwA value is the predetermined WswA threshold WswA_TH or more, at step 209, it stops the application of the electrode voltage and, at step 210, sends a switching failure notice to the response input port 123 inside the path switching instruction device 801.
Further, the judgment data recording device 103 of
Further, the elapsed time recording device 102 of
The values of the EL_T register 2114 and Vtcm register 2113 are cleared to 0 to be initialized when the division for obtaining the VtcmA value ends. The electrode voltage application device 106 applies voltage for switching the optical switch devices based on switching data to the optical switch devices of the optical switches. When the VtcmA value is the predetermined electrode voltage application judgment threshold VtcmA_TH or more, it sends a switching failure notice to the path switching instruction device 801.
Next, at step 2213, the system uses the comparison device 2111 to compare the absolute value of the preceding adjoining channel voltage difference Vtc1 and the absolute value of the succeeding adjoining channel voltage difference Vtc2. If the result of the comparison is |Vtc1|>|Vtc2|, at step 2214, it uses the conversion device 2112 to convert this to Vtc1=Vtc, while if the result is |Vtc1|≦|Vtc|, at step 2215, it uses the conversion device 2112 to convert this to Vtc2=Vtc. Based on the thus obtained Vtc, at step 2216, the system performs the operation of Vtc+Vtcm=Vtcm and updates the value of the Vtcm register 2113. The starting value of Vtcm is for example 0. Next, at step 2217, the system records the elapsed time EL_T from when the switching data starts to be output from the path switching instruction device 801 in the EI_T register 2114.
Next, at step 2218, the system uses the elapsed time judgment device 2115 to compare the elapsed time EL_T and the predetermined threshold Am_TH. If EL_TH<Am_TH, then at step 2219, it supplies voltage to the electrodes of the corresponding optical switch devices. If EL_TH≧Am_TH, then at step 2220, it records the value VtcmA obtained by dividing Vtcm by the elapsed time EL_T in the unit time adjoining channel potential difference storage register (VtcmA) 2116. Next, at step 2221, it for example clears the values of the ET_T register 2114 and the Vtcm register 2113 to 0 to initialize them.
Next, at step 2222, the system uses the comparison device 2117 to compare the VtcmA value and the electrode voltage application judgment threshold VtcmA_TH. If VtcmA<VtcmA_TH, at step 2219, it supplies voltage to the electrodes of the corresponding optical switch devices. If VtcmA≧VtcmA_TH, at step 2223, it stops application of the electrode voltage and, at step 2224, notifies switching failure to the response input port 123 of the path switching instruction device 801.
Furthermore, the elapsed time recording device 102 in
Furthermore, the switching judgment processing device 105 in
The values of the EL_T register 2314 and Sw register 2313 are for example cleared to 0 to be initialized when the above division for obtaining the SwcA value ends. The electrode voltage application device 106 applies voltage for switching the optical switch devices based on the switching data to the optical switch devices when the SwcA value is smaller than a predetermined electrode voltage application judgment threshold SwcA_TH and sends a switching failure notice to the path switching instruction device 801 when the SwcA value is the predetermined electrode voltage application judgment threshold SwcA_TH or more.
Next, at step 244, the system uses the comparison device 2310 to compare the absolute value of the preceding adjoining channel voltage difference Vtc1 and the adjoining channel difference judgment threshold Vtc_TH. If the result of this comparison is |Vtc1|<Vtc_TH, at step 245, it compares the absolute value of the succeeding adjoining channel voltage difference Vtc2 and the adjoining channel difference judgment threshold Vtc_TH. If the result of this comparison is also |Vtc2|<Vtc_TH, the system does nothing, then at step 246, the system records the elapsed time EL_T from when the switching data started to be output from the path switching instruction device 801 in the elapsed time recording device (EI_T register) 102.
If, at step 244, |Vtc1|≦Vtc_TH and, at step 245, |Vtc2|≦Vtc_TH, then at step 247, the system increments by 1 the Sw register 247 serving as the counter and executes step 246. Next, at step 248, it uses the elapsed time judgment device 104 to judge if EI_T<Am_TH. If the elapsed time EI_T is less than the predetermined threshold Am_TH, at step 2493, the system applies the electrode voltage, while if EI_T≧Am_TH, at step 2494, it stops the application of the electrode voltage and, at step 2495, sends a switching failure notice to the response input port 123 of the path switching instruction device 801.
In Example 7, a switching judgment processing device 1057 is provided with a unit time wattage storage register (WvtcmA register) 2516 for storing a WvtcmA value obtained by subtracting from a product of an adjoining channel voltage difference Vtcm and a coefficient Wvtc for deriving the amount of heat generation envisioned from that adjoining channel difference voltage difference Vtcm (coefficient for conversion of wattage generated there based on Vtcm) the product of the elapsed time EL_T and a coefficient Wvtc_loss for deriving the amount of natural heat generation envisioned from the elapsed time EL_T (coefficient for conversion of wattage not generating heat there based on EL_T) when the elapsed time judgment device 2515 judges that the predetermined counted time threshold Am_T has been exceeded and a comparison device 2517 for comparing the WvtcmA value with a predetermined WvtcmA threshold WvtcmA_TH. The system for example clears the value of the Vtcm register 2113 and the value of the EL_T register 2514 to the initial value of 0 when the subtraction for obtaining WvtcmA ends. An electrode voltage application device 2519 applies voltage for switching the optical switch devices based on the switching data to the optical switch devices when the WvtcmA value is smaller than a predetermined electrode voltage application judgment WvtcmA threshold WvtcmA_TH and sends a switching failure notice to the path switching instruction device 801 when the WvtcmA value is the predetermined WvtcmA threshold WvtcmA_TH or more.
In Example 7, at step 2691, the system subtracts from a product of an adjoining channel voltage difference Vtcm and a coefficient Wvtc for deriving the amount of heat generation envisioned from that adjoining channel difference voltage difference Vtcm the product of the elapsed time EL_T and a coefficient Wvtc_loss for deriving the amount of natural heat generation envisioned from the elapsed time EL_T. Next, at step 2692, it for example clears the contents of the Vtcm register 2113 and the EI_T register 2114 to 0 to initialize them. Next, at step 2693, it uses the comparison device 2517 to compare WcmA and WcmA_TH. If WcmA<WcmA_TH, then at step 2694, the system applies the electrode voltage. If WcmA≧WcmA_TH, then at step 2695, the system stops the application of the electrode voltage and, at step 2697, sends a switching failure notice to the response input port 123 of the path switching instruction device 801.
In Example 8, the switching judgment processing device 105 in
In Example 8, at step 289, the system stores the WswcA value, obtained by subtracting from the product of a switching count Sw and a coefficient Wswc for deriving an amount of heat generation envisioned from the switching count Sw a product of an elapsed time EL_T and a coefficient Wswc_loss for deriving an amount of natural heat generation envisioned from the elapsed time EL_T when the elapsed time judgment device 275 judges that a predetermined counted time threshold Am_T has been exceeded, in the WawcA register 276. Next, at step 2891, the system clears the values of the Sw register 273 and the EI_T register 274 to 0 and, at step 2893, judges if WxwcA<WswcA_TH by the comparison device 277. If WxwcA<WswcA_TH, then at step 2893, the system applies the electrode voltage, while if Wxwc≧WswcA_TH, then at step 2894, it stops the application of the electrode voltage and, at step 2895, sends a switching failure notice to the response input port 123 of the path switching instruction device 801.
In the above explained Examples 1 to 8, instead of clearing the registers to 0, it is also possible to clear them to predetermined initial values.
Further, as shown in
In addition, in Examples 5 to 8, as shown in
In the processing of Examples 1, 3, and 5 to 11, if using the unit voltage shown in
Summarizing the industrial applicability of the invention, by having the multichannel, highly integrated EO-SW judge switching when switching data is input from the outside and, when judging switching must not be performed, not allowing switching and notifying switching failure to a path switching instruction device at the outside, it is possible to reject long, continuous, high speed switching requests by t number of criteria and thereby suppress the frequency of occurrence of leakage current and, as a result, keep down the rise in temperature of the optical switch devices and stably control and operate the EO-SW.
While the invention has been described with reference to specific embodiments chosen for purpose of illustration, it should be apparent that numerous conversions could be made thereto by those skilled in the art without departing from the basic concept and scope of the invention.
Number | Date | Country | Kind |
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2006-221252 | Aug 2006 | JP | national |