Controller for an electron microscope

Information

  • Patent Grant
  • D638045
  • Patent Number
    D638,045
  • Date Filed
    Thursday, July 29, 2010
    14 years ago
  • Date Issued
    Tuesday, May 17, 2011
    13 years ago
  • US Classifications
    Field of Search
    • US
    • D16 130
    • D16 131
    • D10 46
    • D10 75
    • D10 104
    • D10 106
    • D14 338
    • D14 397
    • D14 398
    • D14 362
    • D14 406
    • D14 407
    • D14 408
    • D14 415
    • D14 417
    • D14 455
    • D14 188
    • D14 218
    • D14 1408
    • D14 388
    • D18 11
    • D18 122
    • 359 393000
    • 359 368000
    • 359 381000
    • 359 392000
    • 386 291000
    • D21 333
    • D21 324
  • International Classifications
    • 1699
    • Term of Grant
      14Years
Abstract
Description


FIG. 1 is a front, top and right side perspective view of a controller for an electron microscope showing our new design;



FIG. 2 is a front elevational view thereof;



FIG. 3 is a rear elevational view thereof;



FIG. 4 is a top plan view thereof;



FIG. 5 is a bottom plan view thereof;



FIG. 6 is a left side elevational view thereof; and,



FIG. 7 is a right side elevational view thereof.


Claims
  • We claim the ornamental design for a controller for an electron microscope, as shown.
Priority Claims (1)
Number Date Country Kind
2010-004041 Feb 2010 JP national
US Referenced Citations (13)
Number Name Date Kind
4422105 Rodesch et al. Dec 1983 A
D291318 Kim Aug 1987 S
D292927 Burnstein et al. Nov 1987 S
4824229 Narita et al. Apr 1989 A
D320197 Weber Sep 1991 S
D325728 Mayo et al. Apr 1992 S
D330522 Mokhtarian Oct 1992 S
5237327 Saitoh et al. Aug 1993 A
D362695 Waldhelm Sep 1995 S
D377320 McGuire Jan 1997 S
5946131 Wells et al. Aug 1999 A
6118581 Domanik et al. Sep 2000 A
6148096 Pressman et al. Nov 2000 A
Foreign Referenced Citations (1)
Number Date Country
D978141 Mar 1997 JP