The present invention generally relates to a system and method for mitigating failure of a cooling system for electronic components contained in an enclosure.
Various high power electronic components are often housed within an enclosure.
Due to their high power consumption, these electronic components generate heat, which if let unabated, can quickly lead to component failure and/or system shutdown.
To cool the electronic components, a cooling system is integrated within the enclosure. A typical cooling system includes a fan which generates a recirculating airflow over the electronic components. The airflow absorbs heat from, and cools, the electronic components. A fluidic circuit recirculates fluid through a heat exchanger positioned within the airflow, cooling the heated air. The heated fluid exiting the heat exchanger can be directed to, and cooled at, a location external to the enclosure.
Because of the very high power dissipation in the enclosure, any failure in the cooling system causes an instantaneous temperature rise within the enclosure. As a result, a system shutdown or failure may occur without sufficient time for an orderly shutdown. Consequently, critical data that is not stored in memory is often lost. This is particularly relevant in systems that handle large amount of data, and thus require several minutes for storage of data prior to shutdown.
In accordance with one aspect of the invention, a system for permitting orderly shutdown of electronic components in the event of a cooling failure is presented. The system includes an enclosure populated with one or more electronic components. At least one fan positioned within the enclosure generates an airflow across the one or more electronic components. The airflow is cooled by a heat exchanger. A phase change material positioned within the enclosure absorbs heat from the airflow upon a failure associated with the heat exchanger.
In accordance with another aspect of the invention, a method for cooling one or more electronic components positioned in an enclosure includes providing an air cooling element within the enclosure. An airflow is generated across the air cooling element and the one or more electronic components. Upon a failure in the cooling element, a phase change material positioned within the enclosure cools the airflow.
In accordance with yet another aspect of the invention, a cooling system includes an enclosure that houses one or more electronic components. The enclosure includes a means for generating an airflow across the one or more electronic components, and a cooling means for cooling the airflow. A phase change material is positioned in the airflow. The phase change material absorbs heat from the airflow upon a failure in the cooling means.
The foregoing features of the invention will be more readily understood by reference to the following detailed description, taken with reference to the accompanying drawings, in which:
In illustrative embodiments of the invention, a system and method is presented that allows for orderly shutdown of electronic components in an enclosure in the event of a cooling failure. To those ends, the system includes a phase change material which, upon a failure in a cooling element, maintains a predetermined temperature until an orderly shutdown can be performed. Details of various embodiments are discussed below.
The enclosure 103 may be of varying size and shape and include one or more doors for easy accessibility into the enclosure 103. In preferred embodiments, the enclosure 103 is kept substantially air-tight to maximize the efficiency of the cooling system 100. However, the enclosure may allow for limited flow of ambient air through the enclosure 103. In various embodiments, the enclosure 103 may initially take the form of a rack with one or more open sides, the rack becoming substantially enclosed after being populated with various panels, electronics and other modules.
The enclosure 103 is populated with various electronic components 105. Electronic components 105 include electronic devices whose operation involves the motion of electrical charge carriers, such as an integrated circuit. The electronic components 105 generate heat, and typically require some level of cooling to prevent component and/or system failure.
Electronic components 105 may include, without limitation, any number of power supplies, circuit boards, memory modules such as RAM, ROM, and various disks, and/or audio and video hardware. All or some of the electronic components 105 may be housed in at least one rack contained within the enclosure, such as a VME card rack. In various embodiments, the rack may support any number of blade servers, each blade server being an independent server module that typically includes one or more processors, memory, storage, network controllers, an operating system and/or various applications.
To generate airflow within the system 100, the system includes one or more fans 107. As used in this description and the accompanying claims, the term “fan” shall mean any device capable of moving air, unless the context otherwise requires. Fan 107 may be, for example, and without limitation, a blower.
The fans 107 generate an airflow that passes across and removes heat generated by the electronic components 105. To properly direct the airflow across the electronic components, any number of air deflectors 109, shrouds, and/or manifolds may be utilized.
The airflow generated by the fans 107 is substantially recirculated within the enclosure 103. In the exemplary embodiment illustrated in
Positioned within the airflow is at least one heat exchanger 108, which serves to remove heat from the recirculating airflow. In embodiments having limited recirculation of airflow, the heat exchanger 108 may be positioned in close proximity to the fan output 105, such that the ambient portion of the airflow can be cooled by the heat exchanger 108 prior to passing over the electronic components 105.
The heat exchanger 108 may be, without limitation, a fluid to air heat exchanger that is coupled to a closed-loop fluidic circuit.
Various elements of the fluidic circuit 202, may be external to the enclosure 103, such as a pump, and a second heat exchanger for cooling the heated fluid exiting the heat exchanger 108. As such, the enclosure 103 may include at least one fluidic input 220 for receiving cooled fluid from the fluidic circuit, and at least one output 222 for the fluid exiting the heat exchanger 108. In alternative embodiments, the entire fluidic circuit 202 may be contained within the enclosure 103. Elements of the fluidic circuit tending to add heat to the airflow may be partitioned off within the enclosure 103, so as to be isolated from the airflow.
In other embodiments, the heat exchanger 108 may be, for example, a thermoelectric device. The thermoelectric device may be, without limitation, a Peltier Effect cooling device. Peltier Effect cooling devices typically include a cooling surface and a heat dissipation surface, which are typically made of ceramic. P-type and n-type semiconductor material, connected electrically in series by electrical conductor, is coupled between the two surfaces. When a DC voltage is applied to the semiconductor material, electrons pass from the p-type material to the n-type material and heat is transferred from the cooling surface to the heat dissipation surface. The rate of heat transfer is proportional to the current and the number of p-n junctions. The cooling surface of the Peltier Effect cooling device is positioned within the enclosure 103 such that the airflow passes across it. In contrast, the heat dissipation surface is isolated, and positioned away, from the airflow. The heat dissipation surface may be further attached to a heat conductor, such as a metal pipe, that advantageously transfers the heat to a position in which it can be conveniently dissipated, such as a position external to the enclosure 103.
In accordance with illustrative embodiments of the invention, the enclosure 103 includes a phase change material 130 positioned in the airflow. Phase change materials are materials which change state (e.g., from solid to liquid and vice versa) as the temperature changes. A characteristic of a phase change material is that as the phase material is changing state, the phase change material remains at substantially constant temperature, referred herein as the phase change temperature. For example, a solid phase change material positioned in an enclosure will begin to change from solid to liquid when the temperature within the enclosure rises to reach the phase change temperature. While the phase change is occurring, the phase change material continues to absorb heat while remaining at nearly a constant temperature. After changing phase (e.g. from a solid to a liquid), the temperature of the phase material will begin to rise again. Upon subsequent cooling to the phase change temperature, the phase change material will give off heat to the surrounding environment, and return back to its solid phase. Phase change materials include, without limitation, various paraffins, hydrated salts, metals, alloys, and organic acids, such as: linear crystalline alkyl hydrocarbons; fatty acids and esters; polyethylene glycols; long alkyl side chain polymers; the solid state series of pentaerythritol, pentaglycerine, and neopentyl glycol; gallium; cesium; rubidium; and quaternary ammonium clathrates and semi-clathrates.
The phase change material 330 may be enclosed in at least one container 332 positioned within the enclosure, as shown in
The chamber in the container 332 may be larger than the volume of the phase change material 330 when in solid form, as the volume of the phase change material 330 typically increases when the phase change material 330 turns to liquid. In various embodiments, the container 332 may be, for example, a bladder made of an elastic material that is capable of expanding as the phase change material turns to liquid.
In other embodiments, one or more surfaces 402 within the enclosure may be coated with phase change material 430 followed by an encapsulating sealing coat 434, as shown in
Referring back to
Thus, the amount of time required to reach the maximum operating temperature the one or more electronic components 105, in the event of a failure in the cooling system, is increased. This additional time can be advantageously used to complete an orderly shut-down of the one or more electronic components. For example, the additional time may be used to ensure that any critical data is saved to a disk/hard drive prior to shut-down.
Referring back to
Although various exemplary embodiments of the invention have been disclosed, it should be apparent to those skilled in the art that various changes and modifications can be made which will achieve some of the advantages of the invention without departing from the true scope of the invention. These and other obvious modifications are intended to be covered by the appended claims.
Number | Name | Date | Kind |
---|---|---|---|
2012527 | Batchelder | Aug 1935 | A |
2675228 | Baird | Apr 1954 | A |
3571677 | Oeschger | Mar 1971 | A |
4138692 | Meeker | Feb 1979 | A |
4259401 | Chahroudi et al. | Mar 1981 | A |
4495545 | Dufresne et al. | Jan 1985 | A |
4558395 | Yamada | Dec 1985 | A |
4665466 | Green | May 1987 | A |
4721996 | Tustaniwskyj | Jan 1988 | A |
4729424 | Mizuno | Mar 1988 | A |
4733331 | Chauvet | Mar 1988 | A |
4791983 | Nicol | Dec 1988 | A |
4809134 | Tustaniwskyj | Feb 1989 | A |
4870477 | Nakanishi | Sep 1989 | A |
4882654 | Nelson | Nov 1989 | A |
4977444 | Nakajima | Dec 1990 | A |
5115225 | Dao et al. | May 1992 | A |
5144531 | Go | Sep 1992 | A |
5166863 | Shmunis | Nov 1992 | A |
5177667 | Graham | Jan 1993 | A |
5183104 | Novotny | Feb 1993 | A |
5323847 | Koizumi | Jun 1994 | A |
5406807 | Ashiwake | Apr 1995 | A |
5465192 | Yoshikawa | Nov 1995 | A |
5535094 | Nelson | Jul 1996 | A |
5675473 | McDunn | Oct 1997 | A |
5701045 | Yokozawa | Dec 1997 | A |
5706668 | Hilpert | Jan 1998 | A |
5714938 | Schwabl | Feb 1998 | A |
5912802 | Nelson | Jun 1999 | A |
5940269 | Ko | Aug 1999 | A |
6024164 | Sorbel | Feb 2000 | A |
6029742 | Burward-Hoy | Feb 2000 | A |
6042348 | Aakalu et al. | Mar 2000 | A |
6050327 | Gates | Apr 2000 | A |
6115251 | Patel et al. | Sep 2000 | A |
6125924 | Lin | Oct 2000 | A |
6130820 | Konstad | Oct 2000 | A |
6135200 | Okochi | Oct 2000 | A |
6137680 | Kodaira | Oct 2000 | A |
6170561 | O'Grady | Jan 2001 | B1 |
6205803 | Scaringe | Mar 2001 | B1 |
6213194 | Chrysler | Apr 2001 | B1 |
6313990 | Cheon | Nov 2001 | B1 |
6317321 | Fitch et al. | Nov 2001 | B1 |
6364761 | Steinbrecher | Apr 2002 | B1 |
6396697 | Chen | May 2002 | B1 |
6397618 | Chu | Jun 2002 | B1 |
6421240 | Patel | Jul 2002 | B1 |
6438984 | Novotny | Aug 2002 | B1 |
6526768 | Wall | Mar 2003 | B2 |
6538881 | Jeakins et al. | Mar 2003 | B1 |
6542360 | Koizumi | Apr 2003 | B2 |
6587343 | Novotny | Jul 2003 | B2 |
20020173267 | Sharp | Nov 2002 | A1 |
20020191430 | Meir | Dec 2002 | A1 |
20030147216 | Patel et al. | Aug 2003 | A1 |
20030209023 | Spinazzola | Nov 2003 | A1 |
20040264124 | Patel et al. | Dec 2004 | A1 |
Number | Date | Country |
---|---|---|
0 746 192 | Dec 1996 | EP |
2 568 712 | Feb 1986 | FR |
Number | Date | Country | |
---|---|---|---|
20050174733 A1 | Aug 2005 | US |