BRIEF DESCRIPTION OF THE DRAWINGS
FIG. 1 is a view of a measurement apparatus according to a first embodiment of the present invention.
FIG. 2A and FIG. 2B are flowcharts of correction procedures according to the present invention, with the first embodiment taken as an example.
FIG. 3 is a view showing a measurement error to be corrected in the first embodiment, the measurement error caused by a circular-arc movement of a pivot-type stylus.
FIG. 4 is a view showing a Z-range dividing process, which is a feature of the present invention, with the first embodiment taken as an example.
FIG. 5A to FIG. 5C are views showing, in a comparative manner, errors generated when a correction program according to the first embodiment and conventional correction programs are used.
FIG. 6A to FIG. 6C are views showing, in a comparative manner, errors generated when different division counts of the Z range are used in the correction program of the first embodiment.
FIG. 7 is a view showing, in a comparative manner, performance indexes obtained when the correction program of the first embodiment and the conventional correction programs are used.
FIG. 8 is a view showing a measurement apparatus according to a second embodiment of the present invention.
FIG. 9 is a view showing an operation of the measurement apparatus shown in FIG. 8.
FIG. 10A and FIG. 10B are views showing, in a comparative manner, correction results obtained when an improved multilayer style algorithm according to the present invention is applied and when that algorithm is not applied.