Current generating circuit generating a current relevant to a reference voltage

Abstract

A current generating circuit generating a current relevant to a reference voltage. The current generating circuit has a reference clock generating circuit generating a reference clock signal which has a frequency relevant to the reference voltage. The current generating circuit has a phase locked loop circuit generating a calibration clock signal. The phase clocked loop circuit regulates the calibration clock signal so that the phase difference between the calibration clock signal and the reference clock signal is reduced. The current generating circuit has also an output circuit generating an output current according to the phase difference between the calibration clock signal and the reference clock signal.

Description

CROSS-REFERENCE TO RELATED APPLICATIONS

This application claims the benefit of CN application No. 201811523462.6, filed on Dec. 13, 2018, and incorporated herein by reference.

FIELD OF THE INVENTION

The present invention relates generally to electronic circuits, more specifically but not exclusively to current generating circuits and hall circuits.

BACKGROUND OF THE INVENTION

In some applications, e.g., in some hall circuits, a current proportional to a reference voltage is desired. For a typical PTAP (Proportional to absolute temperature) current generating circuit, the PTAT current generated is often relevant to an absolute temperature but not relevant to a reference voltage. However, for a PTAT current used in some applications, for example, a PTAT current used as a bias current for some hall circuits, it is desired that the PTAT current is relevant to a reference voltage and varies with this reference voltage, for example, being proportional to the reference voltage, and further for example, being directly proportional to the reference voltage.

Thus, there's a need to address at least the above mentioned or other issues.

SUMMARY

Embodiments of the present invention are directed to a current generating circuit, comprising: a reference clock generating circuit configured to generate a reference clock signal, wherein the frequency of the reference clock signal is relevant to a reference voltage; a phase locked loop circuit configured to generate a calibration clock signal, wherein the phase locked loop circuit is configured to receive the reference clock signal and the calibration clock signal and to regulate the calibration clock signal according to the phase difference between the calibration clock signal and the reference clock signal so as to reduce the phase difference; and an output circuit coupled to the phase locked loop circuit, wherein the phase locked loop circuit is configured to control the output circuit so that the output circuit generates an output current according to the phase difference between the calibration clock signal and the reference clock signal.

Embodiments of the present invention are also directed to a hall circuit, comprising: a current generating circuit configured to generate an output current, wherein the current generating circuit is configured to comprise: a reference clock generating circuit configured to generate a reference clock signal, wherein the frequency of the reference clock signal is relevant to a reference voltage; a phase locked loop circuit configured to generate a calibration clock signal, wherein the phase locked loop circuit is configured to receive the reference clock signal and the calibration clock signal and to regulate the calibration clock signal according to the phase difference between the calibration clock signal and the reference clock signal so as to reduce the phase difference; and an output circuit coupled to the phase locked loop circuit, wherein the phase locked loop circuit is configured to control the output circuit so that the output circuit generates an output current according to the phase difference between the calibration clock signal and the reference clock signal; a hall sensor coupled to the current generating circuit to receive the output current, wherein the hall sensor is configured to generate a hall voltage according to the output current; and an amplifying system coupled to the hall sensor to receive the hall voltage and configured to generate an output voltage according to the hall voltage.

Embodiments of the present invention are further directed to a current generating circuit, comprising: a reference clock generating circuit configured to generate a reference clock signal, wherein the reference clock generating circuit comprises: a reference current source having an output terminal, wherein the reference current source is configured to provide a reference current proportional to the reference voltage at the output terminal; a first capacitor and a first switch both coupled between the output terminal of the reference current source and a reference ground, wherein across the first capacitor there exists a first capacitor voltage; a first comparator having a first input terminal, a second input terminal and an output terminal, wherein the first input terminal is configured to receive a first voltage and the second input terminal is coupled to the output terminal of the reference current source, and wherein the first comparator is configured to compare the first voltage with the first capacitor voltage and to generate a first comparison signal at the output terminal; and a first inverter having an input terminal and an output terminal, wherein the input terminal of the first inverter is coupled to the output terminal of the first comparator and the first inverter is configured to generate the reference clock signal at the output terminal, and wherein the reference clock is provided to control the on and off operations of the first switch; a phase locked loop circuit configured to generate a calibration clock signal, wherein the phase locked loop circuit is configured to receive the reference clock signal and the calibration clock signal and to regulate the calibration clock signal according to the phase difference between the calibration clock signal and the reference clock signal so as to reduce the phase difference; and an output circuit coupled to the phase locked loop circuit, wherein the phase locked loop circuit is configured to control the output circuit so that the output circuit generates an output current according to the phase difference between the calibration clock signal and the reference clock signal.

DESCRIPTION OF THE DRAWINGS

The present invention can be further understood with reference to the following detailed description and the appended drawings, wherein like elements are provided with like reference numerals.

FIG. 1 illustrates a current generating circuit 100 in accordance with an embodiment of the present invention.

FIG. 2 illustrates a reference clock generating circuit 200 implemented as the reference clock generating circuit 101 of FIG. 1 in accordance with an embodiment of the present invention.

FIG. 3 illustrates a phase locked loop circuit 300 implemented as the phase locked loop circuit 102 of FIG. 1 in accordance with an embodiment of the present invention.

FIG. 4 illustrates a voltage controlled oscillating circuit 400 implemented as the voltage controlled oscillating circuit VCO of FIG. 3 in accordance with an embodiment of the present invention.

FIG. 5 illustrates an output circuit 500 used in FIG. 4 according to an embodiment of the present invention.

FIG. 6 illustrates a current generating circuit 600 with implementation of the circuits of FIG. 2˜5.

FIG. 7 illustrates the simulation result of the current generating circuit 600 of FIG. 6.

FIG. 8 illustrates a hall circuit 800 in accordance with an embodiment of the present invention.

DESCRIPTION

The present invention is now described. While it is disclosed in its preferred form, the specific embodiments of the invention as disclosed herein and illustrated in the drawings are not to be considered in a limiting sense. Rather, these embodiments are provided so that this invention will be thorough and complete, and will fully convey the scope of the invention to those skilled in the art. Indeed, it should be readily apparent in view of the present description that the invention may be modified in numerous ways. Among other things, the present invention may be embodied as devices, methods, software, and so on. Accordingly, the present invention may take the form of an entirely hardware embodiment, an entirely software embodiment or one embodiment combining software and hardware aspects. The following detailed description is, therefore, not to be taken in a limiting sense.

Throughout the specification, the meaning of “a,” “an,” and “the” may also include plural references.

FIG. 1 illustrates a current generating circuit 100 in accordance with an embodiment of the present invention. As shown in FIG. 1, the current generating circuit 100 is configured to comprise a reference clock generating circuit 101, a phase locked loop circuit 102 and an output circuit 103. The reference clock generating circuit 101 is configured to generate a reference clock signal CLK1 with a frequency f_CLK1, wherein the frequency f_CLK1 is relevant to a reference voltage V_REF, that is, the frequency f_CLK1 varies with the reference voltage V_REF. More specifically, the frequency f_CLK1 is proportional to the reference voltage V_REF.

FIG. 2 illustrates a reference clock generating circuit 200 implemented as the reference clock generating circuit 101 of FIG. 1 in accordance with an embodiment of the present invention. As shown in FIG. 2, the reference clock generating circuit 200 is configured to comprise a reference current source CS₁, a first capacitor C₁, a first switch S₁, a first comparator CMP1 and a first inverter INV1. The reference current source CS₁ has an output terminal and the reference current source CS₁ is configured to generate a reference current I_REF at the output terminal, wherein the reference current I_REF is proportional to a reference voltage V_REF, that is, I_REF=k×V_REF, wherein k is a scale factor, and the reference current I_REF has a direction flowing out from the reference current source CS₁. Both the first capacitor C₁ and the first switch S₁ are coupled between the output terminal of the reference current source CS₁ and a reference ground GND. The first capacitor C₁ has a first capacitor voltage V_C1 thereacross. The first comparator CMP1 has a first input terminal, a second input terminal and an output terminal, wherein the first input terminal is configured to receive a first voltage V₁, and the second input terminal is coupled to the output terminal of the reference current source CS₁ to receive the first capacitor voltage V_C1 across the first capacitor C₁. In an embodiment, the first voltage V₁ is a bandgap reference voltage, and by implementing the first voltage V₁ with the bandgap reference voltage, the accuracy of the reference clock generating circuit 200 can be controlled within 2%. In an embodiment, the first input terminal of the first comparator CMP1 is a non-inverting input terminal, and the second input terminal of the first comparator CMP1 is an inverting input terminal. The first comparator CMP1 is configured to compare the first voltage V₁ with the first capacitor voltage V_C1 and to generate a first comparison signal S_CMP1 at its output terminal. The first inverter INV1 has an input terminal and an output terminal, wherein the input terminal of the first inverter INV1 is coupled to the output terminal of the first comparator CMP1 to receive the first comparison signal S_CMP1, and the first inverter INV1 is configured to generate a reference clock signal CLK1 at its output terminal, and the output terminal of the first inverter INV1 is coupled to the first switch S₁ to control the on and off operations of the first switch S₁.

When the reference clock generating circuit 200 operates, the reference current I_REF charges the first capacitor C₁, and accordingly, the first capacitor voltage V_C1 across the first capacitor C₁ increases gradually from zero and stops increasing until reaching the first voltage V₁. During this process, the first comparison signal S_CMP1 from the first comparator CMP1 keeps at the high level as the first capacitor voltage V_C1 is lower than the first voltage V₁, and in turn, through the first inverter INV1, the low level reference clock signal CLK1 is provided by the reference clock generating circuit 200. The low level reference clock signal CLK1 is provided to turn off the first switch S₁, which ensures that the first capacitor C₁ keeps being charged during this process. When the first capacitor voltage V_C1 reaches the first voltage V₁, the first comparison signal S_CMP1 from the first comparator CMP1 keeps at the low level, and in turn, through the first inverter INV1, a high level reference clock signal CLK1 is provided by the reference clock generating circuit 200. The high level reference clock signal CLK1 is provided to turn on the first switch S₁, which makes the first capacitor C₁ be discharged and the first capacitor voltage V_C1 is reset to zero. And afterwards, the reference clock generating circuit 200 enters into a new cycle. The reference current I_REF charges the first capacitor C₁ again, and accordingly, the first capacitor voltage V_C1 across the first capacitor C₁ increases gradually from zero.

From the above description, it is known that, the frequency f_CLK1 of the reference clock signal CLK1 is:

$f_{\mathrm{CLK}1}=\frac{k\times V_{\mathrm{REF}}}{V_1\times C_1}$

The phase locked loop circuit 102 is configured to generate a calibration clock signal CLK2. The phase locked loop circuit 102 is coupled to the reference clock generating circuit 101 to receive the reference clock signal CLK1, and in addition, the phase locked loop circuit 102 is configured to receive the calibration clock signal CLK2 it generates. The phase locked loop circuit 102 regulates the calibration clock signal CLK2 according to the phase difference D_PH between the calibration clock signal CLK2 and the reference clock signal CLK1, so that the phase difference D_PH decreases gradually and the phase of the calibration clock signal CLK2 aligns with the phase of the reference clock signal CLK1 and the phase locked loop circuit 102 locks the phase of the calibration clock signal CLK2 eventually.

FIG. 3 illustrates a phase locked loop circuit 300 implemented as the phase locked loop circuit 102 of FIG. 1 in accordance with an embodiment of the present invention. As shown in FIG. 3, the phase locked loop circuit 300 is configured to comprise a phase detecting circuit PD, a low-pass filtering circuit LPF and a voltage controlled oscillating circuit VCO. The phase detecting circuit PD has a first input terminal, a second input terminal and an output terminal, wherein the first input terminal of the phase detecting circuit PD is configured to receive the reference clock signal CLK1, the second input terminal of the phase detecting circuit PD is configured to receive the calibration clock signal CLK2, and the phase detecting circuit PD is configured to generate a voltage error signal S_PD, the voltage error signal S_PD has a relationship with the phase difference D_PH, wherein the relationship can be cosine function, sawtooth function, or triangle function etc. In an embodiment, the average value of the voltage error signal S_PD is in a linear relationship with the phase difference D_PH. In a further embodiment, the average value of the voltage error signal S_PD is proportional to the phase difference D_PH. Yet in another embodiment, the phase detecting circuit PD may be implemented by an XOR gate.

The low-pass filtering circuit LPF has an input terminal and an output terminal, wherein the input terminal of the low-pass filtering circuit LPF is coupled to the phase detecting circuit PD to receive the voltage error signal S_PD. The low-pass filtering circuit LPF filters the high frequency of the voltage error signal S_PD to generate a filtering signal V_LPF at it output terminal. In an embodiment, the low-pass filtering circuit LPF is a traditional LC low-pass filtering circuit.

The voltage controlled oscillating circuit VCO has an input terminal and an output terminal, wherein the input terminal of the voltage controlled oscillating circuit VCO is coupled to the low-pass filtering circuit LPF to receive the filtering signal V_LPF. The voltage controlled oscillating circuit VCO is configured to generate the calibration clock signal CLK2 at its output terminal and to regulate the calibration clock signal CLK2 according to the filtering signal V_LPF so as to adjust the frequency of the calibration clock signal CLK2 to reduce the phase difference between the calibration clock signal CLK2 and the reference clock signal CLK1.

FIG. 4 illustrates a voltage controlled oscillating circuit 400 implemented as the voltage controlled oscillating circuit VCO of FIG. 3 in accordance with an embodiment of the present invention. As shown in FIG. 4, the voltage controlled oscillating circuit 400 is configured to comprise a controlled current source CS₂ and a calibration clock generating circuit 402. The controlled current source CS₂ is configured to receive the filtering signal V_LPF and to generate a controlled current I_LPF according to the filtering signal V_LPF. In an embodiment, the controlled current I_LPF is proportional to the filtering signal V_LPF.

The calibration clock generating circuit 402 is coupled to the controlled current source CS₂ to receive the controlled current I_LPF and is configured to generate the calibration clock signal CLK2 according to the controlled current I_LPF, wherein the frequency f_CLK2 of the calibration clock signal CLK2 is proportional to the controlled current I_LPF. The calibration clock generating circuit 402 is configured to comprise a second capacitor C₂, a second switch S₂, a second comparator CMP2 and a second inverter INV2. Both the second capacitor C₂ and the second switch S₂ are coupled between the controlled current source CS₂ and the reference ground GND, and a second capacitor voltage V_C2 exists across the second capacitor C₂. The second comparator CMP2 has a first input terminal, a second input terminal and an output terminal, wherein the first input terminal is configured to receive a second voltage V₂, and the second input terminal is coupled to the output terminal of the controlled current source CS₂ to receive the second capacitor voltage V_C2 across the second capacitor C₂. In an embodiment, the second voltage V₂ is the junction voltage V_T ln 8 of a bipolar transistor of a common bandgap reference current source, wherein V_T is the thermal voltage. In an embodiment, the first input terminal of the second comparator CMP2 is a non-inverting input terminal, and the second input terminal of the second comparator CMP2 is an inverting input terminal. The second comparator CMP2 compares the second voltage V₂ with the second capacitor voltage V_C2 and generates a second comparison signal S_CMP2. The second inverter INV2 has an input terminal and an output terminal, wherein the input terminal of the second inverter INV2 is coupled to the output terminal of the second comparator CMP2, and the output terminal of the second inverter INV2 is coupled to the second switch S₂. The second inverter INV2 is configured to generate the reference clock signal CLK2 at its output terminal to control the on and off operations of the second switch S₂.

When the calibration clock generating circuit 402 operates, the controlled current I_LPF charges the second capacitor C₂, and accordingly, the second capacitor voltage V_C2 across the second capacitor C₂ increases gradually from zero and stops increasing until reaching the second voltage V₂. During this process, the second comparison signal S_CMP2 from the second comparator CMP2 keeps at the high level as the second capacitor voltage V_C2 is lower than the second voltage V₂, and in turn, through the second inverter INV2, the low level calibration clock signal CLK2 is provided by the calibration clock generating circuit 402. The low level reference clock signal CLK2 is provided to turn off the second switch S₂, which ensures that the second capacitor C₂ keeps being charged during this process. When the second capacitor voltage V_C2 reaches the second voltage V₂, the second comparison signal S_CMP2 from the second comparator CMP2 keeps at the low level, and in turn, through the second inverter INV2, the high level calibration clock signal CLK2 is provided by the calibration clock generating circuit 402. The high level calibration clock signal CLK2 is provided to turn on the second switch S₂, which makes that the second capacitor C₂ be discharged and the second capacitor voltage V_C2 is reset to zero. And afterwards, the calibration clock generating circuit 402 enters into a new cycle. The controlled current I_LPF charges the second capacitor C₂ again, and accordingly, the second capacitor voltage V_C2 across the second capacitor C₂ increases gradually from zero.

From the above description, it is known that, the frequency f_CLK2 of the calibration clock signal CLK2 is:

$f_{\mathrm{CLK}2}=\frac{I_{\mathrm{LPF}}}{V_2\times C_2}$

Persons of ordinary skill in the art will understand that, the configuration of the calibration clock generating circuit 402 is only for illustration, any appropriate configuration which has the frequency f_CLK2 of the calibration clock signal CLK2 proportional to the controlled current I_LPF may be used in the present invention.

FIG. 5 illustrates an output circuit 500 used in FIG. 4 according to an embodiment of the present invention. As shown in FIG. 5, the output circuit 500 is configured to comprise a current mirror CM. The current mirror CM has an input terminal, a first output terminal and a second output terminal. The input terminal of the current mirror CM is coupled to the controlled current source CS₂. The current mirror CM is configured to generate an output current I_OUT proportional to the controlled current I_LPF at the first output terminal according to the controlled current I_LPF and to also generate a calibration current I_CLK2 proportional to the controlled current I_LPF at the second output terminal. Combining the calibration clock generating circuit 402 of FIG. 4 and the output circuit 500 of FIG. 5, the calibration clock generating circuit 402 is coupled to the current mirror CM to receive the calibration current I_CLK2 and is configured to generate the calibration clock signal CLK2 with the frequency thereof being proportional to the calibration current I_CLK2. Further, the current mirror CM is configured to comprise a first switch M₁, a second switch M₂ and a third switch M₃, all of which have a first terminal, a second terminal and a control terminal. The first terminals of the first switch M₁, the second switch M₂ and the third switch M₃ are all coupled to a supply voltage V_CC, and the control terminals of the first switch M₁, the second switch M₂ and the third switch M₃ are all coupled together. The second terminal of the first switch M₁ operates as the input terminal of the current mirror CM and is coupled to the controlled current source CS₂ to receive the controlled current I_LPF, and the second terminals of the second switch M₂ and the third switch M₃ operate respectively as the first output terminal and the second output terminal of the current mirror CM to output currents respectively as the output current I_OUT of the output circuit 500 and the calibration current I_CLK2. According to the operation principle of a current mirror, both the calibration current I_CLK2 and the output current I_OUT are proportional to the controlled current I_LPF, and the scale factor corresponding to the calibration current I_CLK2 is relevant to the sizes of the second transistor M₂ and of the first transistor M₁ and the scale factor corresponding to the output current I_OUT is relevant to the sizes of the third transistor M₃ and of the first transistor M₁. In an embodiment, the second transistor M₂ and the third transistor M₃ have the same size. Persons of ordinary skill in the art will understand, the configuration of the output circuit 500 of FIG. 5 is only for illustration, any other appropriate configuration which makes the output current I_OUT proportional to the calibration current I_CLK2 may be also implemented in the present invention. For example, in an embodiment, an output circuit may comprise a first controlled current source which has an input terminal and an output terminal, wherein the input terminal of the first controlled current source is coupled to the low-pass filtering circuit to receive the filtering signal V_LPF and the first controlled current source is configured to generate a current proportional to the filtering signal V_LPF as an output signal under the control of the filtering signal V_LPF.

In this way, the output current I_OUT is also proportional to the calibration current I_CLK2. By implementing the output circuit 500 of FIG. 5, the voltage controlled oscillating circuit 400 of FIG. 4 and the phase locked loop 300 of FIG. 3 all in the current generating circuit 100 of FIG. 1, we can get that the output current I_OUT is directly proportional to the frequency f_CLK2 as the output current I_OUT is proportional to the calibration current I_CLK2 while the frequency f_CLK2 of the calibration current I_CLK2 is directly proportional to the controlled current I_LPF.

FIG. 6 illustrates a current generating circuit 600 with implementation of the circuits of FIG. 2˜5. From the above description of the operating principal of the reference clock generating circuit 200 of FIG. 2, we get:

$f_{\mathrm{CLK}1}=\frac{k\times V_{\mathrm{REF}}}{V_1\times C_1}$

From the above description of the operating principal of the calibration clock generating circuit 402 of FIG. 4, we get:

$f_{\mathrm{CLK}2}=\frac{I_{\mathrm{LPF}}}{V_2\times C_2}$

From the above description of the operating principal of the phase locked loop circuit 300 of FIG. 3, we get:f_CLK1=f_CLK2

We can get from the above equations about f_CLK1 and f_CLK2:

$I_{\mathrm{LPF}}=\frac{k\times V_{\mathrm{REF}}\times V_2\times C_2}{V_1\times C_1}$

In one embodiment, V₁=Vbg, V₂=V_T ln 8, wherein Vbg represents a bandgap reference voltage, V_T represents a thermal voltage, and in addition, C1=C2, we get:

$I_{\mathrm{LPF}}=\frac{k\times V_{\mathrm{REF}}\times V_T\ln 8}{V_{\mathrm{bg}}}$

In the embodiment of FIG. 5, all the transistors M1, M2 and M3 have the same size, we get:

$I_{\mathrm{OUT}}=\frac{k\times V_{\mathrm{REF}}\times V_T\ln 8}{V_{\mathrm{bg}}}$

It is known from the above description, the output current I_OUT generated from the above circuits is directly proportional to the reference voltage V_REF, which makes that the output current I_OUT can be used in applications where an output current proportional to a reference voltage is required. In particular, the output current can be used as a PTAT current which is required to be proportional to a reference voltage.

FIG. 7 illustrates the simulation result of the current generating circuit 600 of FIG. 6. The longitudinal coordinate represents the output current, and FIG. 7 shows the output currents when the reference voltage V_REF is respectively set as 3V, 3.3V and 3.6V. From FIG. 7, we know that, the output current vary with the reference voltage V_REF, in other words, the output current is relevant to the reference voltage V_REF.

FIG. 8 illustrates a hall circuit 800 in accordance with an embodiment of the present invention. As shown in FIG. 8, the hall circuit 800 is configured to comprise a current generating circuit 801 generating an output current I_OUT, wherein the output current I_OUT is proportional to a reference voltage. The current generating circuit 801 may be implemented with any combination of the circuits shown in FIG. 1˜7. The hall circuit 800 is also configured to comprise a hall sensor H coupled to the current generating circuit 801 to receive the output current I_OUT. The hall sensor H is configured to generate a hall voltage V_IN according to the output current I_OUT. In more detail, the hall sensor H has a first contact H1, a second contact H2, a third contact H3 and a fourth contact H4, wherein the first contact H1 is coupled to the current generating circuit 801 to receive the output current I_OUT, the second contact H2 is coupled to a reference ground, the third contact H3 and the fourth contact H4 respectively operate as a non-inverting output terminal and an inverting output terminal of the hall sensor H to output a two-terminal hall voltage V_IN. The hall circuit 800 is also configured to comprise an amplifying system A coupled to the hall sensor H to receive the hall voltage V_IN. The amplifying system is configured to output an output voltage V_OUT according to the hall voltage V_IN.

It will be appreciated by persons skilled in the art that the present invention is not limited to what has been particularly shown and described herein above. Rather the scope of the present invention is defined by the claims and includes both combinations and sub-combinations of the various features described hereinabove as well as variations and modifications thereof which would occur to persons skilled in the art upon reading the foregoing description and which are not in the prior art.

Claims

1. A current generating circuit, comprising: a reference clock generating circuit configured to generate a reference clock signal, wherein a frequency of the reference clock signal is relevant to a reference voltage;a phase locked loop circuit configured to generate a calibration clock signal, wherein the phase locked loop circuit is configured to receive the reference clock signal and the calibration clock signal and to regulate the calibration clock signal according to the phase difference between the calibration clock signal and the reference clock signal so as to reduce the phase difference; andan output circuit coupled to the phase locked loop circuit, wherein the phase locked loop circuit is configured to control the output circuit so that the output circuit generates an output current according to the phase difference between the calibration clock signal and the reference clock signal.

2. The current generating circuit of claim 1, wherein the frequency of the reference clock signal is proportional to the reference voltage.

3. The current generating circuit of claim 2, wherein the reference clock generating circuit comprises: a reference current source having an output terminal, wherein the reference current source is configured to provide a reference current proportional to the reference voltage at the output terminal;a first capacitor and a first switch both coupled between the output terminal of the reference current source and a reference ground, wherein across the first capacitor there exists a first capacitor voltage;a first comparator having a first input terminal, a second input terminal and an output terminal, wherein the first input terminal is configured to receive a first voltage and the second input terminal is coupled to the output terminal of the reference current source, and wherein the first comparator is configured to compare the first voltage with the first capacitor voltage and to generate a first comparison signal at the output terminal; anda first inverter having an input terminal and an output terminal, wherein the input terminal of the first inverter is coupled to the output terminal of the first comparator and the first inverter is configured to generate the reference clock signal at the output terminal, and wherein the reference clock is provided to control the on and off operations of the first switch.

4. The current generating circuit of claim 1, wherein the phase locked loop circuit comprises: a phase detecting circuit having a first input terminal, a second input terminal and an output terminal, wherein the first input terminal is coupled to the reference clock generating circuit to receive the reference clock signal, and the second input terminal is configured to receive the calibration clock signal, and wherein the phase detecting circuit is configured to generate a voltage error signal according to the phase difference between the calibration clock signal and the reference clock signal;a low-pass filtering circuit having an input terminal and an output terminal, wherein the input terminal is coupled to the phase detecting circuit to receive the voltage error signal, and wherein the low-pass filtering circuit is configured to filter the high frequency of the voltage error signal to generate a filtering signal at the output terminal; anda voltage controlled oscillating circuit having an input terminal and an output terminal, wherein the input terminal is coupled to the low-pass filtering circuit to receive the filtering signal, and wherein the voltage controlled oscillating circuit is configured to generate the calibration clock signal at the output terminal and to regulate the frequency of the calibration clock signal according to the filtering signal so as to reduce the phase difference between the calibration clock signal and the reference clock signal.

5. The current generating circuit of claim 4, wherein the average value of the voltage error signal is in a linear relationship with the phase difference between the calibration clock signal and the reference clock signal.

6. The current generating circuit of claim 4, wherein the voltage controlled oscillating circuit comprises: a controlled current source coupled to the low-pass filtering circuit to receive the filtering signal, wherein the controlled current source is configured to generate a controlled current proportional to the filtering signal under the control the filtering signal; anda calibration clock generating circuit coupled to the controlled current source and configured to generate the calibration clock signal according to the controlled current, wherein the frequency of the calibration clock signal is proportional to the controlled current.

7. The current generating circuit of claim 6, wherein the calibration clock generating circuit comprises: a second capacitor and a second switch both coupled to the controlled current source and the reference ground, wherein across the second capacitor there exists a second capacitor voltage;a second comparator having a first input terminal and a second input terminal and an output terminal, wherein the first input terminal is configured to receive a second voltage, and the second input terminal is coupled to the second capacitor to receive the second capacitor voltage, and wherein the second comparator is configured to compare the second voltage with the second capacitor voltage and to generate a second comparison signal at the output terminal; anda second inverter having an input terminal and an output terminal, wherein the input terminal of the second inverter is coupled to the output terminal of the second comparator and the second inverter is configured to generate the calibration clock signal at the output terminal, and wherein the calibration clock signal is provided to control the on and off operations of the second switch.

8. The current generating circuit of claim 6, wherein the output circuit is configured to comprise a current mirror having an input terminal, a first output terminal and a second output terminal, and wherein the input terminal is coupled to the controlled current source to receive the controlled current, the current mirror is configured to generate an output current proportional to the controlled current at the first output terminal and a calibration current proportional to the controlled current at the second output terminal, and wherein the calibration clock generating circuit is coupled to the second output terminal of the current mirror to receive the calibration current and is configured to generate the calibration clock signal according to the calibration current.

9. The current generating circuit of claim 4, wherein the output circuit is configured to comprise a first controlled current source having an input terminal and an output terminal, and wherein the input terminal of the first current source is coupled the low-pass filtering circuit to receive the filtering signal and the first controlled current source is configured to generate a current proportional to the filtering signal as the output current under the control of the filtering signal.

10. A hall circuit, comprising: a current generating circuit configured to generate an output current, wherein the current generating circuit is configured to comprise:a reference clock generating circuit configured to generate a reference clock signal, wherein the frequency of the reference clock signal is relevant to a reference voltage;a phase locked loop circuit configured to generate a calibration clock signal, wherein the phase locked loop circuit is configured to receive the reference clock signal and the calibration clock signal and to regulate the calibration clock signal according to the phase difference between the calibration clock signal and the reference clock signal so as to reduce the phase difference; andan output circuit coupled to the phase locked loop circuit, wherein the phase locked loop circuit is configured to control the output circuit so that the output circuit generates an output current according to the phase difference between the calibration clock signal and the reference clock signal;a hall sensor coupled to the current generating circuit to receive the output current, wherein the hall sensor is configured to generate a hall voltage according to the output current; andan amplifying system coupled to the hall sensor to receive the hall voltage and configured to generate an output voltage according to the hall voltage.

11. The hall circuit of claim 10, wherein the frequency of the reference clock signal is proportional to the reference voltage.

12. The hall circuit of claim 11, wherein the reference clock generating circuit comprises: a reference current source having an output terminal, wherein the reference current source is configured to provide a reference current proportional to the reference voltage at the output terminal;a first capacitor and a first switch both coupled between the output terminal of the reference current source and a reference ground, wherein across the first capacitor there exists a first capacitor voltage;a first comparator having a first input terminal, a second input terminal and an output terminal, wherein the first input terminal is configured to receive a first voltage and the second input terminal is coupled to the output terminal of the reference current source, and wherein the first comparator is configured to compare the first voltage with the first capacitor voltage and to generate a first comparison signal at the output terminal; anda first inverter having an input terminal and an output terminal, wherein the input terminal of the first inverter is coupled to the output terminal of the first comparator and the first inverter is configured to generate the reference clock signal at the output terminal, and wherein the reference clock is provided to control the on and off operations of the first switch.

13. The hall circuit of claim 10, wherein the phase locked loop circuit comprises: a phase detecting circuit having a first input terminal, a second input terminal and an output terminal, wherein the first input terminal is coupled to the reference clock generating circuit to receive the reference clock signal, and the second input terminal is configured to receive the calibration clock signal, and wherein the phase detecting circuit is configured to generate a voltage error signal according to the phase difference between the calibration clock signal and the reference clock signal;a low-pass filtering circuit having an input terminal and an output terminal, wherein the input terminal is coupled to the phase detecting circuit to receive the voltage error signal, and wherein the low-pass filtering circuit is configured to filter the high frequency of the voltage error signal to generate a filtering signal at the output terminal; anda voltage controlled oscillating circuit having an input terminal and an output terminal, wherein the input terminal is coupled to the low-pass filtering circuit to receive the filtering signal, and wherein the voltage controlled oscillating circuit is configured to generate the calibration clock signal at the output terminal and to regulate the frequency of the calibration clock signal according to the filtering signal so as to reduce the phase difference between the calibration clock signal and the reference clock signal.

14. The hall circuit of claim 13, wherein the average value of the voltage error signal is in a linear relationship with the phase difference between the calibration clock signal and the reference clock signal.

15. The hall circuit of claim 13, wherein the voltage controlled oscillating circuit comprises: a controlled current source coupled to the low-pass filtering circuit to receive the filtering signal, wherein the controlled current source is configured to generate a controlled current proportional to the filtering signal under the control the filtering signal; anda calibration clock generating circuit coupled to the controlled current source and configured to generate the calibration clock signal according to the controlled current, wherein the frequency of the calibration clock signal is proportional to the controlled current.

16. The hall circuit of claim 15, wherein the calibration clock generating circuit comprises: a second capacitor and a second switch both coupled to the controlled current source and the reference ground, wherein across the second capacitor there exists a second capacitor voltage;a second comparator having a first input terminal and a second input terminal and an output terminal, wherein the first input terminal is configured to receive a second voltage, and the second input terminal is coupled to the second capacitor to receive the second capacitor voltage, and wherein the second comparator is configured to compare the second voltage with the second capacitor voltage and to generate a second comparison signal at the output terminal; anda second inverter having an input terminal and an output terminal, wherein the input terminal of the second inverter is coupled to the output terminal of the second comparator and the second inverter is configured to generate the calibration clock signal at the output terminal, and wherein the calibration clock signal is provided to control the on and off operations of the second switch.

17. The hall circuit of claim 15, wherein the output circuit is configured to comprise a current mirror having an input terminal, a first output terminal and a second output terminal, and wherein the input terminal is coupled to the controlled current source to receive the controlled current, the current mirror is configured to generate an output current proportional to the controlled current at the first output terminal and a calibration current proportional to the controlled current at the second output terminal, and wherein the calibration clock generating circuit is coupled to the second output terminal of the current mirror to receive the calibration current and is configured to generate the calibration clock signal according to the calibration current.

18. The hall circuit of claim 13, wherein the output circuit is configured to comprise a first controlled current source having an input terminal and an output terminal, and wherein the input terminal of the first current source is coupled the low-pass filtering circuit to receive the filtering signal and the first controlled current source is configured to generate a current proportional to the filtering signal as the output current under the control of the filtering signal.

19. A current generating circuit, comprising: a reference clock generating circuit configured to generate a reference clock signal, wherein the reference clock generating circuit comprises:a reference current source having an output terminal, wherein the reference current source is configured to provide a reference current proportional to the reference voltage at the output terminal;a first capacitor and a first switch both coupled between the output terminal of the reference current source and a reference ground, wherein across the first capacitor there exists a first capacitor voltage;a first comparator having a first input terminal, a second input terminal and an output terminal, wherein the first input terminal is configured to receive a first voltage and the second input terminal is coupled to the output terminal of the reference current source, and wherein the first comparator is configured to compare the first voltage with the first capacitor voltage and to generate a first comparison signal at the output terminal; anda first inverter having an input terminal and an output terminal, wherein the input terminal of the first inverter is coupled to the output terminal of the first comparator and the first inverter is configured to generate the reference clock signal at the output terminal, and wherein the reference clock is provided to control the on and off operations of the first switch;a phase locked loop circuit configured to generate a calibration clock signal, wherein the phase locked loop circuit is configured to receive the reference clock signal and the calibration clock signal and to regulate the calibration clock signal according to the phase difference between the calibration clock signal and the reference clock signal so as to reduce the phase difference; andan output circuit coupled to the phase locked loop circuit, wherein the phase locked loop circuit is configured to control the output circuit so that the output circuit generates an output current according to the phase difference between the calibration clock signal and the reference clock signal.

20. The current generating circuit of claim 19, wherein the phase locked loop circuit comprises: a phase detecting circuit having a first input terminal, a second input terminal and an output terminal, wherein the first input terminal is coupled to the reference clock generating circuit to receive the reference clock signal, and the second input terminal is configured to receive the calibration clock signal, and wherein the phase detecting circuit is configured to generate a voltage error signal according to the phase difference between the calibration clock signal and the reference clock signal;a low-pass filtering circuit having an input terminal and an output terminal, wherein the input terminal is coupled to the phase detecting circuit to receive the voltage error signal, and wherein the low-pass filtering circuit is configured to filter the high frequency of the voltage error signal to generate a filtering signal at the output terminal; anda voltage controlled oscillating circuit having an input terminal and an output terminal, wherein the input terminal is coupled to the low-pass filtering circuit to receive the filtering signal, and wherein the voltage controlled oscillating circuit is configured to generate the calibration clock signal at the output terminal and to regulate the frequency of the calibration clock signal according to the filtering signal so as to reduce the phase difference between the calibration clock signal and the reference clock signal.