1. Field of the Invention
The present invention relates to a current supply circuit and, more particularly, to a current supply circuit for supplying a current according to display luminance instructed to a current-driven light emitting element, and an electroluminescence (EL) display apparatus having the same.
2. Description of the Background Art
In recent years, in the field of a flat panel display in which a liquid crystal display is typically used, attention is being paid to an organic EL display. The organic EL display has advantages of higher contrast ratio, higher response, and wider angle of visibility as compared with a liquid crystal display. In the organic EL display, an organic EL element as a current-driven light emitting element is arranged for each pixel. A representative example of the organic EL element is an organic light emitting diode.
Particularly, in recent years, among such organic EL displays, from the viewpoints of higher definition of an image and lower power consumption, attention is being paid to a low-temperature polysilicon TFT display using, as a drive device of an organic light emitting diode, a thin film transistor (TFT) using low-temperature polysilicon. However, manufacture variation of transistor characteristics such as mobility and threshold voltage of the low-temperature polysilicon TFT tends to be relatively large as compared with that of a conventional TFT.
In such a background, a problem of non-uniformity of a display luminance characteristic of pixels, that is, variation in display luminance has been pointed out as one of the problems of the organic EL display. As a configuration for solving the problem, a configuration of a so-called “current-programmed pixel circuit” is disclosed in “Pixel-Driving Methods for Large-Sized Poly-Si AM-OLED Displays”, Akira Yumoto et al., Asia Display/IDW'01(2001), pp. 1395–1398.
Referring to
Although the details are not shown, in the whole organic EL display, pixel circuits shown in
N-type TFT element T1 is electrically coupled between corresponding data line DL and a node Na and its gate is coupled to corresponding scan line SL. p-type TFT elements T2 and T3 are connected in series between a power source voltage Vdd and organic light emitting diode OLED. N-type TFT element T4 is electrically coupled between a connection node of p-type TFT elements T2 and T3 and node Na. The gate of p-type TFT element T2 is connected to node Na and each of the gates of p-type TFT element T3 and n-type TFT element T4 is coupled to corresponding scan line SL. The voltage of node Na, that is, a gate-source voltage (hereinafter, also simply referred to as “gate voltage”) of p-type TFT element T2 is held by voltage holding capacitor Ca connected between node Na and power source voltage Vdd.
Organic light emitting diode OLED is connected between p-type TFT element T3 and a common electrode.
The configuration of a current supply circuit for generating data current Idat corresponding to display luminance will now be described.
Referring to
Voltage holding capacitor Cb is connected between node Nb and predetermined voltage Vss. The gate of n-type TFT element T6 is connected to node Nb. To the gate of n-type TFT element T5, a control signal Sscn is inputted. To the gate of each of n-type TFT elements T7 and T8, a control signal Sadj is inputted.
The operation of the current supply circuit of the conventional technique will now be described.
First, in an operation mode in which control signal Sscn is set to the L level and control signal Sadj is set to the H level, n-type TFT element T5 is turned off and n-type TFT elements T7 and T8 are turned on. By the operation, a current according to data voltage Vdat is passed to n-type TFT element T6 and the gate voltage of n-type TFT element T6 for passing such a current is held at node Nb by voltage holding capacitor Cb. In such a manner, data voltage Vdat is received by the current supply circuit, the gate voltage of n-type TFT element T6 is set to the level for supplying data current Idat according to data voltage Vdat and held at node Nb.
After that, in an operation mode in which control signal Sadj is set to the L level and control signal Sscn is set to the H level, n-type TFT element T5 is turned on and n-type TFT elements T7 and T8 are turned off. By the operation, n-type TFT element T6 is electrically connected between data line DL and predetermined voltage Vss in a state where the gate voltage is held at a level for supplying data current Idat corresponding to received data voltage Vdat.
Referring again to
At this time, in the pixel circuit, the drain and gate of p-type TFT element T2 are electrically connected to each other via n-type TFT element T4, so that the gate voltage at the time when data current Idat passes through p-type TFT element T2 is held at node Na by voltage holding capacitor Ca. As described above, in the activation period of scan line SL, data current Idat according to display luminance is programmed by pixel driving circuit PDC.
After that, when an object to be scanned is changed and scan line SL is inactivated to the L level, n-type TFT elements T1 and T4 are turned off and p-type TFT element T3 is turned on. Consequently, a current path of power source voltage Vdd, p-type TFT element T2, p-type TFT element T3, organic light emitting diode OLED, and common electrode (predetermined voltage Vss) is formed, and data current Idat programmed in the activation period of scan line SL can be continuously supplied to organic light emitting diode OLED also in the inactive period of scan line SL.
As described above, in the current-programmed pixel circuit, current supplied to the current-driven light emitting device (that is, OLED) is set on the basis of not a program of data voltage Vdat indicative of display luminance but a program of data current Idat obtained by converting data voltage Vdat. Therefore, even if a difference occurs in transistor characteristics of TFT elements of pixel circuits, non-uniformity of display luminance characteristic between pixels can be suppressed. In other words, at least between pixels sharing the current supply circuit shown in
However, the current supply circuit shown in
Concretely, in the current supply circuit shown in
In the current supply circuit according to the conventional technique shown in
An object of the present invention is to provide a current supply circuit having an uniform voltage-current conversion characteristic, and an EL display apparatus using the same and having a uniform display luminance characteristic among pixels.
According to the present invention, a current supply circuit for supplying an output current according to an input voltage to a signal line, includes: a current driving portion, provided to supply the output current to the signal line, in which: a passing current changes according to a voltage of a control node; a voltage holding portion for holding the voltage of the control node; a current compensating portion for setting the control node to a voltage corresponding to a reference current by passing the reference current to the current driving portion in a first operation mode in which an input node is set to a predetermined initial voltage; and an input transmitting portion, in a second operation mode which is executed after the first mode and in which the input node receives transmission of the input voltage, for changing the voltage of the control node in accordance with a change in the voltage of the input node between the first and second operation modes.
A main advantage of the present invention is therefore that by supplying an output current after compensating the characteristics of the current driving portion on the basis of the reference current, even when element characteristics vary at the time of manufacture, the voltage-current conversion characteristic can be maintained uniform.
A display apparatus according to the present invention includes: a plurality of pixels, arranged in a matrix, each having a current-driven light emitting element; a plurality of scan lines arranged in correspondence with rows of the plurality of pixels and selected sequentially in predetermined cycles; a plurality of data lines arranged in correspondence with columns of the plurality of pixels; and first and second current supply circuits, arranged in correspondence with each of the data lines, for executing first and second operation modes complementarily to each other to supply a data current according to a data voltage which is set in correspondence with display luminance in a pixel to be scanned in the plurality of pixels to the corresponding data line. Each of the first and second current supply circuits includes: a current driving portion, provided to supply the data current to the corresponding data line, in which a passing current changes according to a voltage of a control node; a first voltage holding portion for holding the voltage of the control node; an input node, set to a predetermined initial voltage in the first operation mode, to which the data voltage is transmitted in the second operation mode; a current compensating portion for setting the control node to a voltage corresponding to a reference current by passing the reference current to the current driving portion in the first operation mode; and an input transmitting portion, in the second operation mode, for changing the voltage of the control node in accordance with a change in the voltage of the input node between the first and second operation modes. Each of the pixels includes a drive circuit for supplying a current according to the data current transmitted via the corresponding data line in an active period of the corresponding scan line to the current-driven light emitting element and continuously supplying a current corresponding to the data current to the current-driven light emitting element also in an inactive period of the corresponding scan line.
In the display apparatus, in the first and second current supply circuits for supplying a data current according to a data voltage indicative of display luminance in a pixel to be scanned, the characteristics of the current driving portion are compensated on the basis of the reference current and, after that, an output current is supplied. Consequently, even when variations occur in the element characteristics at the time of manufacture, the voltage-current conversion characteristics in current supply circuits can be maintained uniform. Therefore, uniform display characteristics among pixels are achieved and the display quality can be improved.
The foregoing and other objects, features, aspects and advantages of the present invention will become more apparent from the following detailed description of the present invention when taken in conjunction with the accompanying drawings.
Embodiments of the present invention will be described in detail hereinafter with reference to the drawings. The same reference numerals in the following indicate the same or corresponding parts.
Referring to
In correspondence with each row of pixels (hereinafter, also referred to as “line”), scan line SL is arranged. In correspondence with each column of pixels (hereinafter, also referred to as “pixel column”), a data line is arranged. In
The configuration of each pixel 5 is similar to, for example, that of the pixel circuit according to the conventional technique shown in
EL display apparatus 1 further includes a vertical scan circuit 7, a horizontal scan circuit 8, data voltage lines 9R, 9G, and 9B, data current supply units 10 provided in correspondence with data lines DL, reference current supply circuits 12R, 12G, and 12B, and reference current lines 13R, 13G, and 13B.
Vertical scan circuit 7 sequentially selects a plurality of lines in predetermined cycles in response to a start pulse STV and a shift clock CLKV. Specifically, a plurality of scan lines SL provided in correspondence with the lines are activated to the H level in order in predetermined cycles. In the following, a line of which corresponding scan line is activated will be also referred to as a “line to be scanned”.
Horizontal scan circuit 8 generates a scan signal SH for sequentially selecting a plurality of pixel columns one by one in response to a start pulse STH and a shift clock CLKH. In
Data current supply unit 10 arranged in correspondence with each data line DL supplies a data current Idat according to data voltage Vdat to each of pixels 5 in a line to be scanned. As will be clarified in the following description, each data current supply unit 10 executes a device characteristic compensating operation for uniforming a conversion characteristic from data voltage Vdat to data current Idat. The circuit configuration and operation of data current supply unit 10 will be described in detail later.
Reference current supply circuits 12R, 12G, and 12B generate reference currents Iref(R), Iref(G), and Iref(B), respectively, used for the device characteristic compensating operation. Reference currents Iref(R), Iref(G), and Iref(B) are transmitted to data current supply units, 10 via reference current lines 13R, 13G, and 13B, respectively. In the following, reference currents Iref(R), Iref(G), and Iref(B) will be also generically referred to as reference current Iref, and reference current lines 13R, 13G, and 13B will be also generically referred to as reference current line 13.
In each scan period, data voltage Vdat corresponding to pixel 5 belonging to the line next to the line to be scanned is sequentially transmitted by data voltage line 9 in a time sharing manner. For example, in the scan period of the n-th line, to data voltage lines 9R, 9G, and 9B, data voltages Vdat(R), Vdat(G), and Vdat(B) corresponding to a display image in the (n+1)th line are transmitted. In the scan period, data current supply units 10 in pixel columns are sequentially selected on the display unit basis in response to scan signal SH from horizontal scan circuit 8, sequentially receive data voltage Vdat corresponding to the (n+1)th line from data voltage line 9, and supply data current Idat according to data voltage Vdat corresponding to the n-th line received in the scan period of the (n−1)th line to corresponding data line DL.
The configuration of the current supply circuit according to the first embodiment will now be described in detail by using data current supply unit 10 shown in
Referring to
In the embodiment, each TFT element is formed by using, preferably, low-temperature polysilicon. N-type TFT elements T11a and T11b operate as current driving units for supplying pass currents according to voltages of nodes N2(a) and N2(b), respectively, to data line DL. In the following, therefore, n-type TFT elements T11a and T11b will be also referred to as “drive transistors”.
The operation modes of current supply circuits 10a and 10b are set to a “compensation mode” and a “supply mode” complementarily to each other in accordance with selection signal ST. In the compensation mode, each current supply circuit receives data voltage Vdat of the next line to be scanned from data voltage line 9 and executes a device characteristic compensating operation on the basis of reference current Iref. In the supply mode, each current supply circuit supplies data current Idat in accordance with data voltage Vdat received in the compensation mode of last time and the compensated conversion characteristic.
In the H level period of selection signal ST, in each data current supply unit 10, current supply circuit 10a is set in the compensation mode and current supply circuit 10b is set in the supply mode. On the other hand, in the L level period of selection signal ST, in each data current supply unit 10, current supply circuit 10a is set in the supply mode, and current supply circuit 10b is set in the compensation mode. The setting of the level of selection signal ST is switched alternately each time the line to be scanned is switched, that is, every scan period.
The configuration and operation of each current supply circuit will now be described. As already described above, the configurations of current supply circuits 10a and 10b are similar to each other. In the following, therefore, current supply circuit 10a will be described representatively.
N-type TFT elements T10a and T11a are connected in series between data line DL and predetermined voltage Vss. As already described above, a ground voltage or a negative voltage is used as predetermined voltage Vss. N-type TFT element T12a is electrically coupled between reference current line 13 and node N1(a). N-type TFT element T13a is electrically coupled between nodes N1(a) and N2(a). N-type TFT element T14a is electrically coupled between input node Ni(a) and data node Di(a). N-type TFT element T15a is electrically coupled between input node Ni(a) and voltage supply line 14. Voltage supply line 14 supplies a predetermined initial voltage Vint. N-type TFT element T16a is electrically coupled between data node Di(a) and data voltage line 9.
Transmission capacitor C1a is connected between input node Ni(a) and node N2(a), and voltage holding capacitor C2a is connected between node N2(a) and predetermined voltage Vss. Voltage holding capacitor C3a is connected between data node Di(a) and predetermined voltage Vss.
Logic gate AND1a outputs a result of AND operation between scan signal SH(m) and selection signal ST as a control signal Sadj(a). Logic gate AND2a outputs a result of AND operation between selection signal ST inverted by logic gate NOT1a and a control signal WR as a control signal Sscn(a). Control signal WR specifies the period of supplying data current Idat in each scan period.
Therefore, in the compensation mode, in the scan period, control signal Sadj(a) is activated to the H level in accordance with an active period of scan signal SH(m). In the active period of scan signal SH(m), data voltage Vdat corresponding to the m-th column is transmitted onto data voltage line 9. On the other hand, in the supply mode, in the scan period, control signal Sscn(a) is activated to the H level in accordance with the active period of control signal WR.
Control signal Sscn(a) is inputted to the gates of n-type TFT elements T10a and T14a and control signal Sadj(a) is inputted to the gates of n-type TFT elements T12a, T13a, T15a, and T16a.
The operation of current supply circuit 10a will now be described with reference to
Referring to
Referring again to
In the compensation mode, n-type TFT elements T12a and T13a operate as current compensation portion for making reference current Iref pass through n-type TFT element T11a as a drive transistor to set the voltage of node N2(a) to the level corresponding to reference current Iref. Since the drain and gate of drive transistor T11a are connected to each other by n-type TFT element T13a which is turned on, in the compensation mode, reference current Iref is passed to the path of reference current line 13, n-type TFT element T10a, drive transistor T11a, and predetermined voltage Vss, and the gate voltage when the current (source-drain current) passing through drive transistor T11a is reference current Iref is held at node N2(a). As described above, voltage holding capacitor C2a operates as a voltage holding portion for holding the voltage of node N2. Further, in the compensation mode, the voltage at input node Ni(a) is set to initial voltage Vint by n-type TFT element T15a which is turned on.
Referring again to
In each of current supply circuits 10a in the m-th and (m+1)th columns, input node Ni(a) is set to initial voltage Vint. That is, in the compensation mode period, V(Ni(a)) is set to Vint.
Further, in each of current supply circuits 10a of the m-th and (m+1)th columns, in response to activation of corresponding control signal Sadj(a), I(T11b) as the current (source-drain current) passing through drive transistor T11a becomes reference current Iref in the active period of corresponding control signal Sadj(a), and the gate voltage of drive transistor T11a in this period is held at node N2(a).
That is, in the compensation mode, voltage V(N2(a))(m) and voltage V(N2(a))(m+1) at node N2(a) are set to the gate voltage which is set when reference current Iref passes through drive transistor T11a. Also after inactivation of corresponding control signal Sadj(a), the voltage is held by voltage holding capacitor C2a.
On the other hand, as shown in
In the following scan period, that is, in the scan period of the (n+1)th line, selection signal ST is set to the L level and current supply circuit 10a is set in the supply mode. Therefore, in the active period of control signal WR, control signal Sscn(a) is activated (to the H level) in each of current supply circuits 10a of the m-th and (m+1)th columns. On the other hand, in current supply circuit 10a of each pixel column, control signal Sadj(a) is made inactive. Therefore, in the scan period of the (n+1)th line, in each data current supply unit 10, supply of data current Idat is executed by current supply circuit 10a.
Referring again to
In response to turn-on of n-type TFT element T14a, input nodes Ni(a) and Di(a) are connected to each other. Specifically, n-type TFT element T14a operates as a switch for disconnecting input nodes Ni(a) and Di(a) in the compensation mode and connecting input nodes Ni(a) and Di(a) in the supply mode. As a result, input node Ni(a) changes from initial voltage Vint to a voltage level Vdat′ according to data voltage Vdat received in the preceding compensation mode.
A voltage change ΔVdat of input node Ni(a) between the compensation mode and the supply mode is expressed as ΔVdat=Vdat′−Vint. Transmission capacitor C1a operates as an input transmitting portion for changing the voltage at node N2(a) in accordance with a voltage change in input node Ni(a) by capacitive coupling.
Accordingly, as shown in
Further, a current according to the voltage at node N2(a) is supplied to corresponding data line DL by drive transistor T11a. To be specific, currents I(DL(m)) and I(DL(m+1)) supplied to data line DL in the (n+1)th line scan period become at the levels Idat(m) and Idat(m+1) corresponding to data voltages Vdat(m)(n+1) and Vdat(m+1)(n+1), respectively.
As a result, data current Idat according to data voltage Vdat can be supplied from current supply circuit 10a to data line DL. Therefore, display luminance of a pixel to which data current Idat is supplied can be controlled by data voltage Vdat. That is, with respect to data voltage Vdat, the above-described voltage difference ΔVdat is set in accordance with the difference between the set value (target value) of the data current corresponding to display luminance and reference current Iref.
In
With reference to
Referring to
The operation of current supply circuit 10b in the compensation mode is similar to that in the n-th line scan period of current supply circuit 10a described above with reference to
In the n-th line scan period as the next scan period, selection signal ST is set to the H level, and current supply circuit 10b is set in the supply mode complementarily to the mode of current supply circuit 10a. Therefore, in the active period of control signal WR, control signal Sscn(b) is activated (to the H level) in each of current supply circuits 10a in the m-th and (m+1)th columns. On the other hand, in current supply circuit 10b in each pixel column, control signal Sadj(b) is made inactive.
Since the operation of current supply circuit 10b in the supply mode is similar to that in the (n+1)th line scan period of current supply circuit 10a described above with reference to
Particularly, the operation in each of scan periods of two current supply circuits 10a and 10b which are complementarily set in the compensation mode and the supply mode will be understood from the operation waveforms in the n-the line scan period in
As described above, in each data current supply unit 10, each of current supply circuits 10a and 10b executes device characteristic compensation using common reference current Iref in the compensation mode, after that, is set in the supply mode, and starts supplying data current Idat. As a result, transistor characteristic variations in drive transistors T11a and T11b between data current supply units 10 are compensated.
Referring to
Device characteristic lines 15 and 16 correspond to drive transistors included in different current supply circuits. At a design stage, it is considered so that transistor characteristics of drive transistors in the different current supply circuits are the same. However, due to manufacture variations which occur in actual process, the device characteristic lines of the drive transistors do not always coincide with each other. Particularly, in a TFT using low-temperature polysilicon, manufacture variations tend to occur and mismatch between the device characteristic lines easily occurs.
When data current Idat is generated by using drive transistors of different characteristics, the voltage-current conversion characteristic from data voltage Vdat to data current Idat varies in the current supply circuits. That is, display luminance corresponding to data voltage Vdat at the same level varies among groups of pixels corresponding to the same current supply circuit. As a result, uniformity of the display luminance characteristic in the whole EL display apparatus deteriorates.
For example, as shown in
In contrast, in each of the current supply circuits according to the first embodiment, the compensation mode based on common reference current Iref is executed. In each data current supply unit 10, the gate voltage for supplying reference current Iref is obtained. For example, in drive transistors corresponding to device characteristic lines 15 and 16, gate voltages Vg1 and Vg2 for passing reference current Iref are obtained and held, respectively.
Further, in the supply mode, data voltage Vdat is reflected as a voltage change from the compensation mode in the gate voltage of each drive transistor. Therefore, data current Idat supplied by the drive transistors corresponding to device characteristic lines 15 and 16 according to voltage change ΔVdat which is caused by the data voltage at the same level can be set to the same level by compensating variations in the transistor characteristic.
It is desirable that reference current Iref be set within a change range of data current Idat corresponding to the display luminance range in each pixel.
As described above, in the current supply circuit according to the first embodiment, also in the case where the characteristics of drive transistors vary, the voltage-current conversion characteristic can be maintained to be uniform. Therefore, in the EL display apparatus using such a current supply circuit, the display characteristics of pixels are made uniform and display quality can be improved.
In a second embodiment, as a variation of the configuration of the first embodiment, a configuration obtained by changing the polarities of TFT elements will be described.
Referring to
Each of the operation modes of current supply circuits 10#a and 10#b is set to the “compensation mode” or the “supply mode” in accordance with selection signal ST. Since the configurations of current supply circuits 10#a and 10#b are similar to each other, in the following, current supply circuit 10#a will be representatively described.
P-type TFT elements T20a and T21a are connected in series between data line DL and power source voltage Vdd. P-type TFT element T22a is electrically coupled between reference current line 13 and node N21(a). P-type TFT element T23a is electrically coupled between nodes N21(a) and N22(a). P-type TFT element T24a is electrically coupled between input node Ni(a) and data node Di(a). P-type TFT element T25a is electrically coupled between input node Ni(a) and voltage supply line 14 for supplying initial voltage Vint. P-type TFT element T26a is electrically coupled between data node Di(a) and data voltage line 9.
Transmission capacitor C21a is connected between input node Ni(a) and node N22(a), and voltage holding capacitor C22a is connected between node N22(a) and power source voltage Vdd. Voltage holding capacitor C23a is connected between data node Di(a) and power source voltage Vdd.
Logic gate NAND1a outputs, as a control signal /Sadj(a), a result of NAND operation between scan signal SH(m) and selection signal ST. Logic gate NAND2a outputs, as a control signal /Sscn(a), a result of NAND operation between selection signal ST inverted by logic gate NOT21a and control signal WR. That is, in current supply circuit 10#a, in the compensation mode, control signal /Sadj(a) is activated to the L level. In the supply mode, control signal /Sscn(a) is activated to the L level. To each of gates of p-type TFT elements T20a and T24a, control signal /Sscn(a) is inputted. To each of the gates of p-type TFT elements T22a, T23a, T25a, and T26a, control signal Sadj(a) is inputted.
As described above, in current supply circuit 10#a according to the second embodiment, p-type TFT elements T20a to T26a are arranged in place of n-type TFT elements T10a to T16b shown in
Further, data line DL is driven by power source voltage Vdd by current supply circuits 10#a and 10#b. In the configuration according to the second embodiment, therefore, the configuration of each pixel is also different from that in the first embodiment.
Referring to
P-type TFT elements T32 and T33 are connected in series between power source voltage Vdd and organic light emitting diode OLED. P-type TFT element T31 is electrically coupled between corresponding data line DL and a connection node of p-type TFT elements T32 and T33, and p-type TFT element T34 is electrically coupled between a node Na′ and the anode of organic light emitting diode OLED. The gates of p-type TFT elements T31 and T34 are coupled to corresponding scan line /SL. Scan line /SL is activated to the L level in a selected scan line, and is inactivated to the H level in the other lines. The gate of p-type TFT element 32 receives the inversion level of corresponding scan line /SL. The gate of p-type TFT element T33 is coupled to node Na′. Voltage holding capacitor Ca is connected between a connection node of p-type TFT elements T32 and T33 and node Na′. The voltage of node Na′, that is, the gate voltage of p-type TFT element T33 is held by voltage holding capacitor Ca.
Organic light emitting diode OLED is arranged between p-type TFT element T33 and a common electrode in a manner similar to the pixel circuit of
The operation of the current supply circuit according to the second embodiment will now be described.
Referring again to
In the supply mode, in current supply circuit 10#a, p-type TFT elements T22a, T23a, T25a, and T26a are turned off whereas p-type TFT elements T20a and T24a are turned on. Therefore, p-type TFT element T21a is electrically connected between power source voltage Vdd and data line DL in a state where the gate voltage (voltage at node N22(a)) is held at the level for supplying data current Idat corresponding to data voltage Vdat received in the compensation mode. The operation of current supply circuit 10#a in the supply mode is also similar to that of current supply circuit 10a in the operation waveform chart of
Referring again to
At this time, since the drain and gate of p-type TFT element T33 are electrically connected to each other via p-type TFT element T34, the gate voltage for passing data current Idat to p-type TFT element T33 is held at node Na′ by voltage holding capacitor Ca. In such a manner, in the active period of scan line /SL, data current Idat according to display luminance is programmed by pixel driving circuit PDC#.
After that, when an object to be scanned is switched and scan line /SL is inactivated to the H level, p-type TFT elements T31 and T34 are turned off and p-type TFT element T32 is turned on. By the operation, a current path of power source voltage Vdd, p-type TFT element T32, p-type TFT element T33, organic light emitting diode OLED, and common electrode (predetermined voltage Vss) is formed. Data current Idat programmed in the active period of scan line /SL can be continuously supplied to organic light emitting diode OLED also in the inactive period of scan line SL.
The operation mode of current supply circuit 10#b is set complementarily to that of current supply circuit 10#a. The circuit operation in each operation mode is similar to that in current supply circuit 10#a. Also in the configuration according to the second embodiment, current supply circuits 10#a and 10#b constructing each data current supply unit are alternately set in the compensation mode and the supply mode every scan period and supply of data current to pixels in a line to be scanned is executed.
As described above, even when the polarity of a TFT element is changed from the n type to the p type in the current supply circuit and pixel driving circuit, effects similar to those of the first embodiment can be enjoyed.
In a third embodiment, the configuration of setting reference current Iref used in the compensation mode of data current supply unit 10 in finer stages and more effectively uniforming the display characteristics in pixels will be described.
Referring to
Referring to
In the device characteristic curve, in the zone where the gradient of a tangent largely changes, that is, in a drive transistor, the level of data current Idat is divided into, for example, four zones 41 to 44 so as to divide the zone in which the ratio of a change in pass current (source-drain current) to a change in gate voltage largely changes. Further, constant currents Ir1 to Ir4 generated by current generating circuits 36a to 36d are determined so as to correspond to center points in zones 41 to 44, respectively.
For example, when a data current set value belongs to zone 42, it is proper to set reference current Iref to Ir2, so that switch 38b is selectively turned on. Data voltage Vdat is set on the basis of the gate voltage of a drive transistor when corresponding reference current Iref (Ir2) is supplied in accordance with the difference between the data current set value and corresponding reference current Iref in each of zones 41 to 44.
With such a configuration, the transistor characteristics of a drive transistor in the current supply circuit are compensated more finely in the compensation mode, thereby enabling uniformity of the voltage-current conversion characteristic to be improved. As a result, the display quality of the EL display apparatus can be further improved.
The configuration according to the third embodiment can be similarly applied to the configuration of a current supply circuit and a pixel according to the second embodiment. Since reference current Iref is unconditionally determined for operation at the post stage of data current supply unit 10, it is unnecessary to distinguish the operation at the post stage.
Although a pixel with the cathode common configuration is described in the embodiment, the present invention can be also applied to a pixel with an anode common configuration. In this case, in each pixel and each current supply circuit, the position of predetermined voltage Vss and that of power source voltage Vdd are replaced with each other and, as necessary, the polarity of a TFT element and the polarity of gate voltage are changed.
Although the present invention has been described and illustrated in detail, it is clearly understood that the same is by way of illustration and example only and is not to be taken by way of limitation, the spirit and scope of the present invention being limited only by the terms of the appended claims.
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2002-182868 | Jun 2002 | JP | national |
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