Patent Application
20160314813
In some embodiments, a data storage component testing system has an enclosed test deck that has an access port door covering an access port. The system tests a data storage component by presenting the enclosed test deck to an exchange assembly before exposing an interior test region of the test deck by engaging the access port door with a tool of the exchange assembly. At least one data storage component is then installed into the interior test region and subsequently the access port is closed by installing the access port door into the access port.
As data storage devices have advanced, data storage components have gotten physically smaller. Such reduced physical dimensions can be susceptible to design and process variations that jeopardize the accuracy and reliability of the data storage component. The increased potential for performance volatility has emphasized longer and more sophisticated testing procedures to qualify and certify a data storage component. However, inefficiencies in data storage component testing, such as non-testing loading and unloading times, can reduce the available testing time to maintain a minimum tested component throughput. Thus, industry has a continued goal of increasing the efficiency of a data storage component testing system, particularly to increase the amount of time available to conduct assorted tests with a data storage component.
Accordingly, a data storage component testing system has an enclosed test deck that has an access port door covering an access port to allow the exchange of a tested data storage component with an untested data storage component via removal and subsequent installation of the access port door into the access port. By configuring the test deck as a housing that encloses the data storage components and has a form factor similar to a complete hard disk drive data storage device, a testing system can efficiently transfer multiple tested and untested test decks to and from multiple different testing slots. Also, the access port portion of the test deck allows for efficient access and exchange of tested and untested data storage components without having to disassemble the test deck. Also, the sealed small volume of the test deck allows for efficient use of alternative pressures and/or alternative gas in the testing environment, such as He at subatmospheric pressures.
The loader assembly 106 can have one or more robotic or manual rails, conveyors, end effectors, and elevators that allow individual test decks 114 to be installed and subsequently removed from the respective test slots 112. It is contemplated that the loader assembly 106 can manipulate the position, pitch, and roll of a test deck 114 to allow complete electrical connection of a test slot connector 116 with a test deck connector 118. The ability to simultaneously engage and disengage multiple different test decks 114 with various test slots 112 in the rack 104 allows for efficient testing of large numbers of data storage device components.
The exchange assembly 110 can be configured with any number of manual or robotic means to engage and open an access port 120 portion of a test deck 114 before replacing one or more components housed within the test deck 114. For example, the exchange assembly 110 can remove and replace a data storage medium 122 and/or a slider assembly 124 that has a head gimbal assembly (HGA) in the test deck via the access port 120, which saves testing time and increases testing accuracy over systems that disassemble some, or all, of a testing assembly to interchange data storage device components. That is, the ability to exchange a single data storage device component via the access port 120 provides modular interchangeability that optimizes the efficiency and accuracy of the testing system 100.
Various embodiments configure each test deck 114 with a deck controller 126 that can store at least one testing pattern and/or routine that can be carried out by the test slot 112 to evaluate the quality and accuracy of at least the slider 124 and medium 122.
Configuring each test deck 114 with a controller 126 allows the rack controller 104 to more efficiently conduct simultaneous testing of multiple different test decks 114 compared to the rack controller 104 directing different test patterns and routines for various test decks 114. That is, the individual test decks 114 can operate in conjunction with the rack controller 102 to allow different test decks 114 to execute different testing conditions, such as test slot 112 temperature, vibration, data writing conditions, reading conditions, transducer fly height, test deck internal-gas composition, and test deck internal gas pressure.
It is noted that the test deck 114 is not a functioning data storage device that can be utilized in a hard drive. In accordance with some embodiments, one or more of the slider 124 and medium 122 data storage components are conditioned for testing the quality and accuracy of other data storage components. For example, the data storage medium 122 can be configured with testing parameters, such as data tracks, data density, and data patterns, which are not conducive to hard drive data storage device media that are ready for the input of consumer data. Moreover, each test deck 114 is arranged with a single data medium 122 and slider 124, which would not logically be provided in a consumer-ready data storage device. Hence, although the test deck 114 is enclosed within top and bottom covers that define a sealed or unsealed internal environment like a hard disk drive, the test deck 114 are configured specifically to test one or more data storage components without the ability to store end-user data like a commercial hard disk drive.
The test slots 148 of the test region 144 can be similar or dissimilar in structure and operation. That is, test slots 148 can have matching, or different, widths 150 and heights 152 as well as matching, or different, testing components to allow a diverse variety of testing environments for a test deck. For example, a first test slot 148 may have a larger width 150 and/or height 152 than a second test slot 148 in the test region 144 and the first test slot may have components allowing for heating and cooling a test deck while the second test slot may be configured only for cooling a test deck. The ability to configure the various test slots 148 with similar or dissimilar sizes and capabilities allows the testing system 140 to concurrently test under a wide range of different conditions, such as temperature and vibration.
The assorted test slots 148 are accessed by a loader assembly that comprises one or more locating means 154, such as, but not limited to, belts, conveyors, end effectors, paths, and tracks. In some embodiments, multiple independent locating means 154 communicate with an exchange conveyor 156 to allow a plurality of different test decks to be transported to and from the various test slots 148 simultaneously. The ability to concurrently have multiple different test decks being moved and tested maximizes the efficiency of the testing system 140 and allows the test slots 148 to conduct different testing routines that take different test times without hampering overall testing efficiency.
The exchange conveyor 156 is configured to position a test deck so that a port access mechanism 158 can efficiently open one or more port portions of the test deck. For example, the exchange conveyor 156 can orient each test deck so that access ports in the top and/or bottom covers of the test deck are each facing portions of the port access mechanism 158 to allow doors occupying the respective access ports to be removed and/or installed by the port access mechanism 158. The interaction of the test deck with the port access mechanism 158 prepares the test deck to be swapped by the exchange assembly 160. In other words, the port access mechanism 158 provides ingress into the enclosed testing region of the test deck to allow the exchange assembly to remove and replace less than all the data storage components of the test deck.
As shown, the exchange assembly 160 can be fed individual data storage components to be tested by a storage region 162. With a plurality of test decks being tested and engaging the exchange assembly 160, the storage region 162 can be configured to organize and correlate the input and output of individual data storage components. For instance, the storage region 162 can correlate the input of an untested slider component with a specific test deck while designating a tested slider component as defective or certified and ready for output to data storage device manufacturing.
The capability to process individual data storage components allows the testing system 140 to not only test the function of a data storage component, but also optimize the performance of the data storage component. As a non-limiting example, the testing system 140 can install a single data storage component into multiple different test decks that respectively test different data access conditions, like temperature, and different computing combinations, such as HGA, slider, medium combinations, to discover the optimized data storage environment for that specific data storage component. As such, the testing system 140 goes beyond merely testing for defects and allows for the optimization of computing performance for a data storage component.
The rails 176 may each be constructed of a rigid material, such as plastic, metal, and ceramics, that is shaped to aid in securing the test deck 170 into a test slot. The rails 176 can be configured to house one or more electrical interconnectors 180, such as an interposer, that are separated from the deck covers 172 and 174 to provide an electrical pathway between the test deck 170 and a test slot. In some embodiments, the covers 172 and 174 are each constructed of machined or cast aluminum material that is plated, such as with a nickel plating, while the rails 176 are each constructed of 316 stainless steel to provide mass and durability to endure repeated ingress and egress from various test slots.
The test deck 170 is configured with several different identification features that provide identification and alignment information to a testing system. As shown, a first identification feature 182 is a barcode that can be any digital and/or alpha-numeric representation of the test deck 170. It is noted that a barcode identification feature can be positioned on each deck cover 172 and 174 as well as the rails 176. Any number of partial or complete apertures 184 can serve as a second identification feature to allow engagement and alignment of the test deck 170 with portions of the loader, exchange, and testing assemblies of the testing system. The apertures 184 can be complemented by one or more guide posts that provide a third identification feature and a means for stacking and orienting adjacent test decks 170, such as by configuring the guide posts with a durable material, like 316 stainless steel, aluminum, or other non-metallic materials, to occupy the apertures 182.
The test deck 170 is configured, in some embodiments, with a plurality of feet 186 positioned along the outer boundary of the rails 176 to aid in engagement and transfer of the test deck 170 via belts and conveyors of a loader assembly. The respective feet 186 are constructed, in accordance with some embodiments, with the same material as a conveyor to promote friction and reduce test deck slippage while in transit to and from the various test slots. The feet 186 can be constructed so that heat generated by the test deck 170 and exposed to the test deck 170 by a test slot does not degrade the form and function of the respective feet 186. At least the top cover 174 can be constructed with one or more heat sink grooves 188 to handle heat generated by and exposed to the test deck 170.
The assorted heat sink grooves 188 can define the bounds of a top cover access port 190 and port door that can be selectively removed to provide access to the internal testing region of the test deck 170. It is contemplated that the port door can have one or more heat sink grooves or protrusions, but such configuration is not required. With the various materials and features of the test deck 170 that can be individually and collectively tuned, the overall weight of the test deck 170 can be maintained in a predetermined range, such as 1-2 kg.
In
The bottom cover 172 has an access panel 196 that can be selectively removed via one or more fasteners to provide access to at least one testing component, such as a test deck heater, breather, or filter. It is noted that an electrical connector 180 is positioned on the bottom side of the rails 176. The bottom electrical connector 180 can be independent or redundant with respect to an electrical connector 180 positioned on an opposite top side of the test deck 170. The ability to have multiple electrical connectors 180 on different sides of the test deck 170 allows efficient installation and removal of the test deck 170 from a test slot by eliminating the need for the test deck 170 to be rotated by a loader assembly to orient a particular side in alignment with a test slot electrical connection.
Configuring mounting and alignment features to be temporary in nature can provide the short-term operability of the test deck 200. That is, the slider 206 can be mounted to the actuator assembly 204 to allow data access operations on the data storage medium 202 via rotation of the spindle motor 210 for efficient removal and replacement. For example, the slider 206 can be mounted to endure data access operations on the order of several minutes, but not for the lifespan of a data storage device, such as a commercial data storage hard disk drive. Also, the operating parameters, such as slider fly height and medium-to-cover separation distance, within the enclosed testing region 208, can be reduced to allow accurate testing results.
The respective access ports 222 and 224 can be similarly or dissimilarly configured. For instance, the ports 222 and 224 can be vertically aligned along the Z axis with matching shapes or can be vertically offset with different shapes and sizes. The ability to tune the size, shape, and position of the access ports 222 and 224 allows a port access mechanism of a testing system to concurrently or successively engage and replace the slider assemblies 226 without delaying movement of the test deck 220 to a test slot. To position the slider and actuator assemblies directly under the respective access ports 222 and 224, one or more alignment features can be utilized.
In some embodiments, the alignment feature 242 consists of a hollow or solid post 252 that may, or may not, be padded with flexible material to prevent shock and vibrational trauma from incurring when the data access assembly 244 contacts the post 252. Although any number of posts 252 and other structures can be used to capture the data access assembly 244 at a predetermined location, the use of a single post contacting the actuator 248 and not the slider 250, as shown, allows the slider 250 to be engaged, removed, and installed without movement of the actuator 248. The position of the post 252 and data access assembly 244 when in contact with the post 252 can be tuned so that some, none, or all of the actuator 248 is over the data storage medium 254. That is, the alignment feature 242 can be tuned so that the data access assembly 244 can be interchanged via an access port without risking contact with the data storage medium 254.
The bottom cover 264 has a plurality of alignment apertures 272 configured to receive alignment pins 274 continuously extending from the top cover 276. The alignment apertures 272 and pins 274 can ensure a seal protrusion 278 of the top cover 276 is positioned in a seal recess 280 in the bottom cover 264. The seal protrusion 278 has a continuous groove 282 or notch in which a flexible gasket 284 is retained. The flexible gasket 284 can be removable and constructed of any type of material, such as foam, rubber, and cork, that protrudes from the groove 282 to engage the seal recess 280 and prevent fluid from entering or exiting the enclosed testing region 262, as illustrated in
The enclosed testing region 262 may be configured with at least one filter 286 that can equalize pressure in the testing region 262 and/or remove particulate contaminates. The top cover 276 has several protrusions that extend towards the data storage medium 266 to allow optimized airflow and vibration in during testing operations. It is contemplated that the data storage medium 266 is separated from the bottom 262 and/or top 276 covers by 0.005″ or less, which can provide optimized data component testing that is not conducive to commercial data storage device operation. It is noted that the outside dimensions of the test deck 260 can be any size, but is 180 mm×120 mm×36 mm in some embodiments with a single data storage medium and at least one transducing head.
The various electrical components of the PCBA 306 can indicate when a testing routine is finished and when a testing component is due for exchange. In the event a testing component is to be interchanged, an access port is opened by an exchange assembly, such as assembly 160 of
Although not required or limiting, the securement feature 350 can be one or more flexible protrusions 352 that extend beyond the areal extent of the underlying plate 348 to contact a port recess 354, as shown in
It is contemplated that the securement feature 350 can be configured with any number of engagement members 362, such as apertures shown in
In accordance with some embodiments, an access port can be closed with a magnetic latch.
Although it is contemplated that the first end effector 402 can retain control of the door 398 or place the door 398 in a storage area away from the test deck body 392, assorted embodiments position the removed door 398 in a piggyback region 404 on the outside of the test deck body 392. The piggyback region 404 can be recessed or protruding from the test deck body 392 and have securing features, such as magnets, screws, and hook-and-loop fasteners, which ensure the door remains connected to the test deck body 392 while a second end effector 406 at a second station 408 replaces at least one data storage component, such as a slider, in the test region 394.
With a data storage component replaced, the test deck body 392 can be moved back to the first station 400 or to a third station 410 to allow a third end effector 412, which may be the same as the first end effector 402, to remove the door 398 from the piggyback region 404 and close the port 396, as shown. The ability to utilize multiple stations and end effectors to access the test region, replace a data storage component, and prepare the test deck body 392 for subsequent testing increases efficiency compared to systems that use a single station with rotating end effectors. The use of the piggyback region 404 also increases efficiency versus systems that suspend or store the door 398 while a data storage component is exchanged.
The exchange assembly can subsequently interact with one or more portions of the enclosed testing region in step 428 to remove a first data storage component and replace it with a second data storage component. With the computing arrangement ready to be tested, step 430 proceeds to position the access door in the access port before step 432 articulates the access door to seal the access port. As illustrated in
While routine 420 can be conducted to replace and test at least one data storage component, the routine 420 is not limited to the aspects embodied in
It can be appreciated from the various data storage component test deck embodiments that having an enclosed testing region accessed via an access port allows for efficient removal of tested data storage components and installation of untested components. By replacing the disassembling of the test deck with the removal of an access door reduces the amount of non-testing test deck time, which optimizes the testing efficiency of a testing system where multiple different test decks are in various stages of pre-testing, testing, and post-testing. That is, the efficient engagement, removal, and replacement of an access door decreases the amount of time needed to prepare a test deck for data storage component testing. Additionally, the articulation of an access door, instead of disassembling top and bottom covers, reduces the risk of particulate generation and contamination in a data storage component enclosed testing region.
With a testing system configured with testing, loading, and exchange assemblies in accordance with the various embodiments, multiple test decks can be efficiently tested and individual data storage components can be modularly swapped without having to completely disassemble the test deck. The configuration and operation of the access port portion of a test deck allows an exchange assembly to efficiently access, remove, and replace a single data storage component. Configuring each test deck with a local controller allows test protocol to be independently conducted for each test deck that may involve cycling environmental parameters to determine the quality and performance of the individual data medium, slider assembly, HGA, and actuating assemblies of the test deck.
It is to be understood that even though numerous characteristics of various embodiments of the present disclosure have been set forth in the foregoing description, together with details of the structure and function of various embodiments, this detailed description is illustrative only, and changes may be made in detail, especially in matters of structure and arrangements of parts within the principles of the present technology to the full extent indicated by the broad general meaning of the terms in which the appended claims are expressed. For example, the particular elements may vary depending on the particular application without departing from the spirit and scope of the present disclosure.
