1. Field of the Invention
The present invention relates to a defect detecting method for an optical disc and system, and particularly relates to a defect detecting method for an optical disc and system that operate the detecting methods according to different situations.
2. Description of the Related Art
It should be noted that
The above-mentioned method has advantage and disadvantage. The “All Verify” method has high accuracy but low speed. Thus a method or apparatus to improve the defect detection is needed.
One embodiment of the present invention discloses a defect detecting method for an optical disc accessed by an optical pickup head, including: (a) detecting if any defect exists in a detected region of the optical disc after data is written to the detected region; (b) while writing data to the optical disc, detecting if any defect exists on the optical disc according to reflection from the optical pickup head to thereby generate a first defect detecting result; and (c) switching from one of the steps (a) and (b) to the other of the steps (a) and (b).
Another embodiment of the present invention discloses an optical disc defect detecting system, which includes: an optical pickup head arranged to access an optical disc; a data error detector arranged to read data from a detected region of the optical disc and detecting if any data error exists after the data is written to the detected region; a defect detector arranged to detect if any defect exists on the optical disc according to reflection from the optical pickup head to thereby generate a first defect detecting result, while writing data to the optical disc; and a control unit arrange to switch the optical disc defect detecting system from one of a first mode and a second mode to the other of the first mode and the second mode; wherein the optical disc defect detecting system utilizes the data error detector in the first mode and utilizes the first and the defect detector in the second mode.
According to the above-mentioned embodiments, the defect detecting method can be selected according to requirements, and thus the convenience increases accordingly.
These and other objectives of the present invention will no doubt become obvious to those of ordinary skill in the art after reading the following detailed description of the preferred embodiment that is illustrated in the various figures and drawings.
Certain terms are used throughout the description and following claims to refer to particular components. As one skilled in the art will appreciate, electronic equipment manufacturers may refer to a component by different names. This document does not intend to distinguish between components that differ in name but not function. In the following description and in the claims, the terms “include” and “comprise” are used in an open-ended fashion, and thus should be interpreted to mean “include, but not limited to . . . ”. Also, the term “couple” is intended to mean either an indirect or direct electrical connection. Accordingly, if one device is coupled to another device, that connection may be through a direct electrical connection, or through an indirect electrical connection via other devices and connections.
It should be noted that
However, the “Smart Verify” method has high speed, but the accuracy thereof depends on the quality of the signal reflected from the optical pickup head. Thus, the defect detection can be improved according to different situations.
It should be note that the “Smart Verify Mode” or the “All Verify Mode” utilized in step 305 is depended on some rules. For example, when the disc can be identified as a disc with good write quality by disc ID, the defect detecting method utilizes the “Smart Verify Mode” first, otherwise, utilizes the “All Verify Mode”. Moreover, when the disc can be identified the verify mode used last time or before, the defect detecting method utilizes the verify mode from results of the identification. Typically, if there is no special concern, the defect detecting method takes the “All Verify Mode” first to ensure the write quality.
When entering “All Verify Mode” first in step 307, a first switch criterion is determined to be met or not in a following Step 309, and switches from the “All verify Mode” to the “Smart Verify Mode” accordingly. The first switch criterion can be determined as the following description. First, counts defect amount according to the defects detected in the detected region when the “All Verify Mode” is performed, and then the method switches from the “All verify Mode” to the “Smart Verify Mode” according to the defect amount. Specifically, the defect amount is compared with a predetermined value, and the “All verify Mode” is switched to the “Smart Verify Mode” when the defect amount is less than the predetermined value. It means that the optical disc has fewer defects, and doesn't need such high accuracy verification by “All Verify” method. In other words, the first switch criterion in step 309 means that the defect amount is smaller than a predetermined value.
When entering “Smart Verify Mode” first in step 311, a second switch criterion is determined to be met or not in a following Step 313, and switches from the “Smart Verify Mode” to the “All verify Mode” accordingly. The second switch criterion can be determined as the following description. First, counts defect amount according to the defects detected in the detected region when the “Smart Verify Mode” is performed, and then the method switches from the “Smart verify Mode” to the “All Verify Mode” according to the defect amount. Specifically, the defect amount is compared with a predetermined value, and the “Smart verify Mode” is switched to the “All Verify Mode” when the defect amount is more than the predetermined value. It means that the optical disc has more defects, and needs high accuracy verification by “All Verify” method. In other words, the second switch criterion in step 313 means that the defect amount is larger than a predetermined value.
Moreover, the detected region has several ECC (error correction code) blocks, and “All Verify Mode” accumulates ECC blocks each having at least a defect to generate the defect amount.
It is noted that switching between these two modes, “Smart verify Mode” and the “All Verify Mode”, is not only depends on the criterion about the amount of error detected. The following description takes second switch criterion for example to illustrate other implement ways, and the description about first switch criterion is omitted for brevity.
The second switch criterion also can be implemented by comparing a first defect detecting result with a second defect detecting result, wherein the first defect detecting result is derived according to the reflection of the laser from the optical disc, and the second defect detecting result is derived according to the data read from the surrounding region of the error. Switch from the “Smart Verify Mode” to the “All Verify Mode” if a comparing result indicates that a difference (such as amount, amount during a specific period, or location of the defects) between the first defect detecting result and the second defect detecting result reaches a threshold value (or standard). That is, if the difference reaches a threshold value, it means that the “Smart Verify Mode” is not accurate enough and should therefore be switched back to the “All Verify Mode”.
When the “Smart Verify Mode” is performed, the switching step for switching from the “Smart Verify Mode” to the “All Verify Mode” can be determined to be performed or not according to other conditions. For example, the switching step can be determined according to the data amount written to the optical disc in the “Smart Verify Mode”. Additionally, the switching step also can be determined according to whether a region where data to be written on the optical disc exceeds a threshold value or reaches a selected region while performing the “Smart Verify Mode”. That is, it depends on whether the written track length of the optical disc exceeds a predetermined value. Additionally, the switching step can be determined according to whether the “Smart Verify Mode” is performed for a predetermined time.
Moreover, the switching step also can be determined according to writing speed (i.e. recording speed). It means that when the writing speed changes, the switching between the “Smart Verify Mode” and the “All Verify Mode” is decided accordingly.
It should be noted that the above-mentioned conditions for switching one of the “Smart Verify Mode” and the “All Verify Mode” to the other one (i.e. the second switch criterion ) are only examples and are not meant to limit the scope of the present invention. The switching step between the “Smart Verify Mode” and the “All Verify Mode” can be determined according to any other condition, which also falls within the scope of the present invention.
The control unit 407 is used for switching the optical disc defect detecting system 400 between different modes. The optical disc defect detecting system 400 utilizes the data error detector in the “All Verify Mode” and utilizes the data error detector and the defect detector in the “Smart Verify Mode”.
The data error detector 405 can be a decoder or a comparator (not shown). Besides the switching operation, the control unit 407 can further perform operations such as generating a defect amount according to defects detected in the detected region via: comparing the defect amount with a predetermined value; and comparing the first defect detecting result and the second defect detecting result to generate a comparing result, as in the above-mentioned step 313.
Additionally, the optical disc defect detecting system 400 can further include a buffer 411, which is used for buffering the data for verifying steps shown in
Other detailed operations and characteristics of the defect detecting system 400 can be easily obtained via the embodiment shown in
According to the above-mentioned embodiments, the detecting method can be selected according to different situations, and the convenience thus increases accordingly.
Those skilled in the art will readily observe that numerous modifications and alterations of the device and method may be made while retaining the teachings of the invention.