Defective pixel correction method and semiconductor device

Abstract

A defective pixel correction method selects, in place of a defective pixel within a pixel part of an image pickup device, a pixel which is of the same color as the defective pixel and is adjacent to the defective pixel, and realizes a pseudo redundancy of the pixels.

Description

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 is a plan view showing a layout of a pixel part of a first embodiment of a semiconductor device according to the present invention;

FIG. 2 is a circuit diagram showing an important part of the first embodiment of the semiconductor device according to the present invention;

FIG. 3 is a flow chart for explaining a test of the pixel part of the semiconductor device;

FIG. 4 is a plan view showing a layout of a pixel part of a second embodiment of the semiconductor device according to the present invention; and

FIG. 5 is a circuit diagram showing an important part of the second embodiment of the semiconductor device according to the present invention.

Claims

1. A defective pixel correction method comprising: selecting, in place of a defective pixel within a pixel part of an image pickup device, a pixel which is of the same color as the defective pixel and is adjacent to the defective pixel; andrealizing a pseudo redundancy of the pixels.

2. The defective pixel correction method as claimed in claim 1, wherein the pixel part includes a plurality of pixels arranged in an X-direction and in a Y-direction which is perpendicular to the X-direction, and the pixel selected in place of the defective pixel is adjacent to the defective pixel along the X-direction.

3. The defective pixel correction method as claimed in claim 1, wherein the pixel part includes a plurality of pixels arranged in an X-direction and in a Y-direction which is perpendicular to the X-direction, and the pixel selected in place of the defective pixel is adjacent to the defective pixel along the Y-direction.

4. The defective pixel correction method as claimed in claim 1, wherein minimum units of a photodetector element group comprising at least red, green and blue photodetector elements are arranged in an X-direction and in a Y-direction which is perpendicular to the X-direction, and the pixel selected in place of the defective pixel belongs to a minimum unit that is adjacent to a minimum unit to which the defective pixel belongs.

5. The defective pixel correction method as claimed in claim 1, wherein the pixel is selected in place of the defective pixel only within a region in a portion of the pixel part.

6. The defective pixel correction method as claimed in claim 5, wherein the region in the portion of the pixel part is a region in a central portion of the pixel part.

7. The defective pixel correction method as claimed in claim 1, comprising: carrying out a test to detect the defective pixel within the pixel part; andgenerating a selection signal when one of two mutually adjacent pixels of the same color, forming a pair, is detected as the defective pixel,wherein the selection signal selects the defective pixel in place of the other of the two mutually adjacent pixels.

8. The defective pixel correction method as claimed in claim 7, comprising: supplying the selection signal to the driving part of the image pickup device using a ROM or a fuse.

9. A semiconductor device comprising: a pixel part configured to pickup an image, including a plurality of pixels arranged in an X-direction and a Y-direction which is perpendicular to the X-direction; anda driving part configured to select a pixel within the pixel part,wherein the driving part drives one of two mutually adjacent pixels of the same color, forming a pair, in place of the other of the two mutually adjacent pixels, in response to a selection signal.

10. The semiconductor device as claimed in claim 9, wherein the two mutually adjacent pixels are adjacent to each other along the X-direction.

11. The semiconductor device as claimed in claim 9, wherein the two mutually adjacent pixels are adjacent to each other along the Y-direction.

12. The semiconductor device as claimed in claim 9, wherein: the pixel part includes minimum units of a photodetector element group comprising at least red, green and blue photodetector elements, arranged in the X-direction and in the Y-direction; andthe one of the two mutually adjacent pixels driven in place of the other of the two mutually adjacent pixels belongs to a minimum unit that is adjacent to a minimum unit to which the other of the two mutually adjacent pixels belongs.

13. The semiconductor device as claimed in claim 9, wherein the driving part drives the one of the two mutually adjacent pixels in response to the selection signal only within a region in a portion of the pixel part.

14. The semiconductor device as claimed in claim 13, wherein the region in the portion of the pixel part is a region in a central portion of the pixel part.

15. The semiconductor device as claimed in claim 9, wherein the selection signal indicates that the one of the two mutually adjacent pixels that is to be driven is a defective pixel.

16. The semiconductor device as claimed in claim 9, further comprising: a signal source configured to supply the selection signal to the driving part,wherein the signal source is formed by a ROM or a fuse.