Claims
- 1. A method of cleaning a residue from a surface, comprising:(a) cleaning the surface with a cleaning composition which contains a detectable substance which is stable in the cleaning composition, the detectable substance includes a surfactant, the surfactant being one which is detectable at a concentration of 10 ppm or below to serve as an indicator of whether the cleaning composition has been removed from the surface; (b) rinsing the surface to remove the cleaning composition to produce a rinsate; and (c) analyzing the rinsate for the detectable substance using high performance liquid chromatography to provide an indication of whether the cleaning composition has been removed from the surface to at least a preselected acceptable level.
- 2. The method of claim 1, wherein the detectable substance is detectable at a concentration of about 10 ppm or below in the rinsate and the step of analyzing includes measuring the concentration of the detectable substance in the rinsate.
- 3. The method of claim 2, wherein the detectable substance is detectable at a concentration of about 1-2 ppm in the rinsate.
- 4. The method of claim 1, further including:repeating the steps of rinsing the surface and analyzing the rinsate if the analysis of the detectable substance in the rinsate indicates that the cleaning composition has not been removed from the surface to at least the maximum acceptable level.
- 5. The method of claim 1, wherein the surfactant is selected from the group consisting of phosphate esters, aryl sulfonates, and aryl disulfonates.
- 6. A method of cleaning a residue from a surface, comprising:(a) cleaning the surface with a cleaning composition which contains a detectable substance which is stable in the cleaning composition, the detectable substance includes a surfactant, the surfactant being one which is detectable at a concentration of 10 ppm or below; (b) rinsing the surface to remove the cleaning composition to produce a rinsate; and (c) analyzing the rinsate for the detectable substance by an analytical method selected from the group consisting of high performance liquid chromatography, UV/visible spectroscopy, electrochemical methods, fluorescence, and combinations thereof.
- 7. The method of claim 6, wherein the analytical method includes high performance liquid chromatography.
- 8. The method of claim 6, wherein the detectable substance is more difficult to remove from the surface than other components of the cleaning composition.
- 9. The method of claim 6, wherein the surfactant is selected from the group consisting of phosphate esters, aryl sulfonates, and aryl disulfonates.
- 10. The method of claim 6, wherein the cleaning composition further includes 9-50% by weight of one of phosphoric acid and a strong alkali selected from the group consisting of sodium hydroxide and potassium hydroxide.
- 11. The method of claim 6, further including, after step (c):(d) repeating step (b) if the residual detectable substance is above a maximum preselected amount.
- 12. A method of cleaning a residue from a surface, comprising:(a) cleaning the surface with a cleaning composition which contains stable surfactant, the stable surfactant including a phosphate ester of the general formula: where x is RO(CH2CH2O)n or OM, M is an alkali metal, R includes an alkyl or phenyl group, and n is from 2 to 10; (b) rinsing the surface to remove the cleaning composition to produce a rinsate; and (c) analyzing the rinsate for the phosphate ester by an analytical method selected from the group consisting of high performance liquid chromatography, UV/visible spectroscopy, electrochemical methods, fluorescence, and combinations thereof.
- 13. The method of claim 12, wherein the phosphate ester is selected from the group consisting of poly (oxy-1,2-ethanediyl)alpha-phenyl-omega-hydroxy phosphate, and polyethoxylated polyarylphenol phosphate.
- 14. A method of cleaning a residue from a surface, comprising:(a) cleaning the surface with a cleaning composition which includes, in terms of weight percent: sodium gluconate 3-8;potassium hydroxide 18-25;sodium EDTA 2-5;polyacrylic acid0.1-2;an aromatic phosphate ester0.2-1; andwaterQ.S.(b) rinsing the surface to remove the cleaning composition to produce a rinsate; and (c) analyzing the rinsate for residual aromatic phosphate ester by a method which is capable of detecting the surfactant at concentration of 10 ppm or less to determine whether the residual aromatic phosphate ester is above a preselected level.
- 15. The method of claim 14, wherein the aromatic phosphate ester has the general formula: whereX is RO(CH2CH2O)n or OM, M is an alkali metal, R includes an alkyl or phenyl group, and n is from 2 to 10.
- 16. The method of claim 15, wherein the aromatic phosphate ester is selected from the group consisting of poly (oxy-1,2-ethanediyl)alpha-phenyl-omega-hydroxy phosphate, and polyethoxylated polyarylphenol phosphate.
- 17. A method of cleaning a residue from a surface, comprising:(a) cleaning the surface with a cleaning composition which contains a spectroscopically detectable substance which is stable in the cleaning composition, the spectroscopically detectable substance including a surfactant; (b) rinsing the surface to produce at least one rinsate; and (c) spectroscopically analyzing a rinsate from the surface at a first selected wavelength to determine whether a preselected component of the residue is above a minimum preselected level; and (d) spectroscopically analyzing the rinsate at a second selected wavelength to determine whether the spectroscopically detectable substance in the cleaning composition is above a minimum preselected level.
- 18. The method of claim 17, wherein the surfactant is detectable by high performance liquid chromatography and step (c) includes analyzing the rinsate by high performance liquid chromatography.
- 19. The method of claim 18, wherein the surfactant is detectable at a concentration of below about 1 ppm.
- 20. A method of cleaning a residue from a surface, comprising:(a) contacting the surface with a cleaning composition comprising a surfactant, the surfactant being one which is stable in the cleaning composition and which is detectable at a concentration of 10 ppm or less by high performance liquid chromatography (HPLC); (b) rinsing the surface to remove the cleaning composition to produce a rinsate; and (c) analyzing the surfactant in the rinsate by HPLC to determine whether the cleaning composition has been removed from the surface to at least a preselected acceptable level.
Parent Case Info
This application claims the benefit as a divisional of U.S. application Ser. No. 09/310,421, filed on May 12, 1999, now U.S. Pat. No. 6,232,280.
US Referenced Citations (5)
Non-Patent Literature Citations (4)
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