Claims
- 1. Detector for the detection of a chemical species using an enrichment n-channel field effect transistor, said detector being connectable to an external circuit, said detector comprising:
- a field effect transistor (FET) having a semiconducting substrate in which are defined two zones forming a source and a drain of the transistor;
- an electricity conducting material transistor gate separated from the substrate by an electrically insulating layer;
- a gate electrical connection for connecting the gate of the transistor to the external circuit;
- a drain electrical connection for connecting the drain of the transistor to the external circuit;
- a source electrical connection for connecting the source of the transistor to the external circuit;
- means external to the transistor connected between the transistor gate and the source for applying a potential difference V.sub.GS ;
- means external to the transistor connected between the transistor drain and source for applying a potential difference V.sub.DS ;
- a chemical species sensing film deposited between the transistor gate connection and the transistor drain connection, said film being in electrical contact solely between said gate and drain and being electrically sensitive to chemical species to be detected; and
- means for measuring a variation of a current between the transistor drain and source, thereby detecting the presence of said chemical species.
- 2. Detector according to claim 1, wherein the sensing film is made from a material having an electrical conductance that varies in response to sensing said chemical species.
- 3. Detector according to claim 1, further comprising a 10.sup.4 to 10.sup.6 Mohms resistor associated with said means for applying a potential difference V.sub.GS, so as to apply V.sub.GS to the gate across said resistor.
- 4. Detector according to claim 1, wherein the sensing film is an organic insulating material which becomes conductive by reacting with the chemical species to be detected.
- 5. Detector according to claim 4, wherein the sensing film is formed from monomolecular layers of cobalt II paratetraphenyl-2-oxyoctadecanoic acid porphyrin or iron tetra-N-heptadecyl pyridinium.
- 6. Detector according to claim 4, wherein the sensing film is a 100 nm to 1 .mu.m phthalocyanin film.
- 7. Detector according to claim 4, wherein the sensing film is polyacetylene.
- 8. Detector according to claim 1, wherein the sensing film is an inorganic semiconductor material film.
- 9. Detector according to claim 1, wherein the sensing film is an electrically conductive material, which becomes insulating by reacting with the chemical species to be detected.
- 10. Detector according to claim 9, wherein the sensing film is a charge transfer complex doped with iodine in order to become conductive.
- 11. Detector according to claim 10, wherein the sensing film is formed from monomolecular layers of iodine-doped N-docosyl pyridinium tetracyanoquinodimethane.
- 12. Detector for the detection of a chemical species using a depletion n-channel field effect transistor, said detector being connectable to an external circuit, said detector comprising:
- a field effect transistor (FET) having a semiconducting substrate in which are defined two zones forming a source and a drain of the transistor;
- an electricity conducting material transistor gate separated from the substrate by an electrically insulating layer;
- a gate electrical connection for connecting the gate of the transistor to the external circuit;
- a drain electrical connection for connecting the drain of the transistor to the external circuit;
- a source electrical connection for connecting the source of the transistor to the external circuit;
- means external to the transistor connected between the transistor gate and the source for applying a potential difference V.sub.GS ;
- means external to the transistor connected between the transistor drain and source for applying a potential difference V.sub.DS ;
- a chemical species sensing film deposited between the transistor gate connection and the transistor source connection, said film being in electrical contact solely between said gate and source and being electrically sensitive to chemical species to be detected; and
- means for measuring a variation of a current between the transistor drain and source, thereby detecting the presence of said chemical species.
- 13. Detector according to claim 12, wherein the sensing film is made from a material having an electrical conductance that varies in response to sensing said chemical species.
- 14. Detector according to claim 12, further comprising a 10.sup.4 to 10.sup.6 Mohms resistor associated with said means for applying a potential difference V.sub.GS, so as to apply V.sub.GS to the gate across said resistor.
- 15. Detector according to claim 12, wherein the sensing film is an organic insulating material which becomes conductive by reacting with the chemical species to be detected.
- 16. Detector according to claim 15, wherein the sensing film is formed from monomolecular layers of cobalt II paratetraphenyl-2-oxyoctadecanoic acid porphyrin or iron tetra-N-heptadecyl pyridinium.
- 17. Detector according to claim 15, wherein the sensing film is a 100 nm to 1 .mu.m phthalocyanin film.
- 18. Detector according to claim 15, wherein the sensing film is polyacetylene.
- 19. Detector according to claim 12, wherein the sensing film is an inorganic semiconductor material film.
- 20. Detector according to claim 12, wherein the sensing film is an electrically conductive material, which becomes insulating by reacting with the chemical species to be detected.
- 21. Detector according to claim 20, wherein the sensing film is a charge transfer complex doped with iodine in order to become conductive.
- 22. Detector according to claim 21, wherein the sensing film is formed from monomolecular layers of iodine-doped N-docosyl pyridinium tetracyanoquinodimethane.
- 23. Detector for the detection of photons using an enrichment n-channel field effect transistor, said detector being connectable to an external circuit, said detector comprising:
- a field effect transistor (FET) having a semiconducting substrate in which are defined two zones forming a source and a drain of the transistor;
- an electricity conducting material transistor gate separated from the substrate by an electrically insulating layer;
- a gate electrical connection for connecting the gate of the transistor to the external circuit;
- a drain electrical connection for connecting the drain of the transistor to the external circuit;
- a source electrical connection for connecting the source of the transistor to the external circuit;
- means external to the transistor connected between the transistor gate and the source for applying a potential difference V.sub.GS ;
- means external to the transistor connected between the transistor drain and source for applying a potential difference V.sub.DS ;
- a photon sensing film deposited between the transistor gate connection and the transistor drain connection, said film being in electrical contact solely between said gate and drain and being electrically sensitive to photons to be detected; and
- means for measuring a variation of a current between the transistor drain and source, thereby detecting the presence of said photons.
- 24. Detector according to claim 23, wherein the sensing film is made from a material having an electrical conductance that varies in response to sensing said photons.
- 25. Detector according to claim 23, further comprising a 10.sup.4 to 10.sup.6 Mohms resistor associated with said means for applying a potential difference V.sub.GS, so as to apply V.sub.GS to the gate across said resistor.
- 26. Detector according to claim 23, wherein the sensing film is an organic insulating material which becomes conductive by reacting with the photons to be detected.
- 27. Detector according to claim 26, wherein the sensing film is a photosensitive semiconductor film.
- 28. Detector according to claim 27, wherein the sensing film is a cadmium sulphide film.
- 29. Detector for the detection of photons using a depletion n-channel field effect transistor, said detector being connectable to an external circuit, said detector comprising:
- a field effect transistor (FET) having a semiconducting substrate in which are defined two zones forming a source and a drain of the transistor;
- an electricity conducting material transistor gate separated from the substrate by an electrically insulating layer;
- a gate electrical connection for connecting the gate of the transistor to the external circuit;
- a drain electrical connection for connecting the drain of the transistor to the external circuit;
- a source electrical connection for connecting the source of the transistor to the external circuit;
- means external to the transistor connected between the transistor gate and the source for applying a potential difference V.sub.GS ;
- means external to the transistor connected between the transistor drain and source for applying a potential difference V.sub.DS ;
- a photon sensing film deposited between the transistor gate connection and the transistor source connection, said film being in electrical contact solely between said gate and source and being electrically sensitive to photons to be detected; and
- means for measuring a variation of a current between the transistor drain and source, thereby detecting the presence of said photons.
- 30. Detector according to claim 29, wherein the sensing film is made from a material having an electrical conductance that varies in response to sensing said photons.
- 31. Detector according to claim 29, further comprising a 10.sup.4 to 10.sup.6 Mohms resistor associated with said means for applying a potential difference V.sub.GS, so as to apply V.sub.GS to the gate across said resistor.
- 32. Detector according to claim 29, wherein the sensing film is an organic insulating material which becomes conductive by reacting with the photons to be detected.
- 33. Detector according to claim 32, wherein the sensing film is a photosensitive semiconductor film.
- 34. Detector according to claim 33, wherein the sensing film is a cadmium sulphide film.
Priority Claims (1)
Number |
Date |
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Kind |
91 00801 |
Jan 1991 |
FRX |
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Parent Case Info
This is a continuation of application Ser. No. 07/822,091, filed Jan. 17, 1992, now abandoned.
US Referenced Citations (7)
Foreign Referenced Citations (3)
Number |
Date |
Country |
61944 |
Sep 1986 |
JPX |
0239368 |
Mar 1987 |
JPX |
2072418 |
Mar 1980 |
GBX |
Non-Patent Literature Citations (3)
Entry |
"A Hydrogen-Sensitive Pd-Gate MOS Transistor"; Journal of Applied Physics; Lundstrom, K. I. et al.; vol. 46, No. 9, Sep. 1975 pp. 3876-3881. |
"Chemically Sensitive Field-Effect Transistor", Biomedical Engineering, Janata et al., Jul. 1976, pp. 241-245. |
"Hydrogen, Calcium, and Potassium Ion-Sensitive FET", IEE, Moss et al Jan. 1978, pp. 49-53. |
Continuations (1)
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Number |
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822091 |
Jan 1992 |
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