The present invention is in the field of testing solid, elongate, preferably textile formations such as card sliver, roving, yarn or fabric, with capacitive means. It relates to a device and a method for examining a solid, elongate product to be tested, according to the preambles of the independent patent claims. Such an examination may for example have the aim of detecting foreign matter or recognizing changes of the mass per unit length.
In the textile industry, there exists the requirement of a reliable recognition of foreign matter such as polypropylene in elongate, textile formations such as yarn. Optical means are often applied for this purpose. These however have the disadvantage that they do not recognize foreign matter which is transparent, has the same color as the product to be tested or is hidden in the inside of the product to be tested and is not visible from the outside.
The inadequacy of optical testing methods may be circumvented by way of the application of electrical, in particular capacitive means. A method and a device for the capacitive recognition of foreign matter in a textile product to be tested is known from EP-0'924'513 A1. Thereby, the product to be tested is moved through a plate capacitor and is subjected to an alternating electrical field. Dielectric properties of the product to be tested are evaluated. Two electrical values are evaluated from the dielectric properties and combined, wherein a characteristic value arises which is independent of the mass of the product to be tested. The characteristic value is compared to a previously evaluated characteristic value for the material concerned, and the portion of foreign matter is determined from this.
In a preferred embodiment of the device disclosed in EP-0'924'513 A1, a reference capacitor is applied simultaneously with the actual measurement capacitor, in order to eliminate unwanted signals caused by external influences, such as air temperature or air humidity. This reference capacitor may be formed by way of adding a third capacitor plate parallel to the two measurement capacitor plates, wherein the three capacitor plates are connected together into a capacitive bridge. Typical dimensions of the capacitor plates are approx. 7 mm×7 mm, typical plate distances approx. 2 mm.
With the above-described device, one may observe the fact that the signal noise increases with an increased electrode distance. Furthermore, the output signal changes when the product to be tested is displaced in the transverse direction, i.e., from one capacitor electrode to the other. The consequences of this are artifacts and a likewise high noise due to the transverse oscillation of the product to be tested on running through the measurement capacitor.
These undesired observations are mainly to be led back to edge effects in the measurement capacitor. It is e.g. known from the publications U.S. Pat. No. 2,950,436, U.S. Pat. No. 3,523,246, GB-1,373,922 or GB-2,102,958, to provide so-called guard electrodes on the edges of the measurement capacitor for reducing the edge effects. By way of this, the effective measurement region is limited to the middle region of the measurement capacitor, where the electric field is homogeneous. The guard electrodes are connected to earth or another constant potential, and shield the actual measurement part-electrode, which is located in the middle region of the measurement capacitor, from disturbing edge effects. Despite this measure, the described, undesired observations could not be completely alleviated.
Specifically, differences in potential exist between the measurement part-electrode and the guard electrodes, so that inherently present parasitical capacitances between the electrodes have a disadvantageous effect on the measurement. The distances between the measurement part-electrode and the guard electrodes must be increased in order to reduce the influence of the parasitical capacitances. This however prevents the desired guard effect of the guard electrodes, since the electrical field at the edges of the measurement part-electrodes becomes inhomogeneous by way of this. Furthermore, a measurement head with electrodes enlarged in such a manner takes up more space, which is disadvantageous with regard to the application.
It is therefore an object of the present invention to indicate a device and a method for examining solid, elongate, preferably textile formations which do not have the above disadvantages and which improve the known devices and methods. Signal noise is to be particularly reduced. The output signal should be largely independent of the position of the product to be tested in the transverse direction. The space requirement should be kept low.
These and other objects are achieved by the device and the method as are defined in the independent patent claims. Advantageous embodiments are specified in the dependent patent claims.
The invention is based on the idea of operating with an active guarding at least one of the guard electrodes, i.e., of applying a temporally changing voltage to the at least one guard electrode.
Accordingly, the device according to the invention, for examining a solid, elongate product to be tested, comprises a measurement capacitor with a measurement part-electrode and at least one guard electrode electrically insulated from the measurement part-electrode, means for applying an alternating (AC) voltage to the measurement capacitor for the purpose of generating an alternating electrical field in the measurement capacitor, and a through-opening for the product to be tested, in the measurement capacitor, said through-opening capable of being subjected to the alternating electrical field. At least one of the at least one guard electrodes is set up for active guarding. Preferably, an alternating (AC) voltage may be applied to the at least one guard electrode, in a manner such that the at least one guard electrode, at least with regard to the alternating (AC) voltage, lies at approximately the same potential as the measurement part-electrode.
The invention also includes the use of active guarding by way of at least one guard electrode with the capacitive examination of a solid, elongate product to be tested.
In the method according to the invention, for examining a solid, elongate product to be tested, the product to be tested is subjected to an electric alternating field in a measurement capacitor with a measurement part-electrode and at least one guard electrode which is electrically insulated from the measurement part-electrode. Active guarding is carried out with at least one of the at least one guard electrodes. Preferably, an alternating (AC) voltage is applied to the at least one guard electrode, in a manner such that the at least one guard electrode, at least with regard to the alternating (AC) voltages, lies at approximately the same potential as the measurement part-electrode.
The active guarding according to the invention prevents the undesired effects of the parasitical capacitances between the measurement part-electrode and the guard electrodes. It allows significantly smaller construction shapes of the measurement head.
Preferred embodiments of the invention are hereinafter described in detail by way of the attached drawings. Thereby, in a schematic manner there are shown in:
A first embodiment of a measurement head 1 for the device according to the invention is represented in
The measurement capacitor 2 contains at least one guard electrode 24.1, 24.2 for reducing the influence of edge effects of the alternating electrical field 29 on an output signal of the measurement capacitor 2. In the embodiment of
The first capacitor plate 21 and the three part-electrodes 23, 24.1, 24.2 of the second capacitor plate 22 are contacted by separate electrical leads 27.1-27.4, so that an individual electrical voltage may be applied to them or may be tapped from them. The electrical connection diagram will be dealt with in more detail with reference to
A further development of the embodiment of
Alternatives to the embodiments described with reference to
A fourth embodiment of a measurement head 1 for the device according to the invention is shown in
An electrical-circuit diagram of a first embodiment of the device according to the invention with a measurement capacitor 2 and a reference capacitor 3 (cf.
The demodulated output signal is led on the output lead 69 to an evaluation circuit 7. The evaluation circuit 7 evaluates from the demodulated output signal the actual result of the examination and emits an output signal at an output lead 79 of the device. The result may for example lie in measuring changes of the mass per unit length, or in recognizing foreign matter in examined yarn 9. It is even possible with suitable evaluation methods to also determine the quantitative portion of the foreign matter, and as the case may be, the material of the foreign matter. The evaluation circuit 7 may be designed as an analog electrical circuit or as a digital circuit with a processor. Methods and devices for the capacitive recognition and quantification of solid, foreign matter in textile product to be tested 9 are known from EP-0'924'513 A1 and may be adopted also by the present invention. EP-0'924'513 A1, and in particular the paragraphs [0022]-[0034] thereof, are incorporated by reference into the present document.
Here, a detailed description of the evaluation methods becomes superfluous on account of the above reference to EP-0'924'513 A1. With regard to this, it is merely to be stated that at least two measurement modes are possible. In a first measurement mode, one measures with two different excitation frequencies. The two equal-type output signals, e.g., the measured voltages, are firstly detected separately for each of the excitation frequencies, and are then combined or linked to one another in a suitable manner for the evaluation. In a second measurement mode, one measures with a single excitation frequency, but the output voltage and output current are used as output signals. The phase shift between the voltage signal and the current signal, after a suitable evaluation, provides the sought information with regard to the yarn 9. A combination of the two measurement modes, i.e., the measurement at several frequencies and the measurement of the respective phase shifts between the voltage signal and the current signal, is also possible.
In the preferred embodiment of
An active guarding is applied according to the present invention, i.e., an alternating voltage is applied to the guard electrodes 24.1, 24.2, and specifically in a manner such that at least with regard to the alternating voltage, they lie at approximately the same potential as the measurement part-electrode 23. With the embodiment example of
The invention is of course not limited to the above-described embodiments. It is for instance possible to provide more than two guard electrodes in the measurement capacitor 2. One may increase the local resolution of the measurement by way of subdividing the second capacitor plate 22 into several measurement part-electrodes and a corresponding multitude of guard electrodes. One may also provide more than one capacitor plate with one or more guard electrodes. It is also not necessary to use measurement capacitors with plane capacitor plates for the invention, and other capacitor shapes may also be considered. The above-described embodiments may also be combined with one another.
1 measurement head
2 measurement capacitor
21 first capacitor plate
22 second capacitor plate
23 measurement part-electrode
24, 24.1, 24.2 guard electrodes
25, 25.1, 25.2 insulation material
26 through-opening
27.-1-27.4 electrical leads
28 measurement region
29 alternating electrical field
2′ measurement capacitor according to the prior art
21′, 22′ capacitor plates according to the prior art
28′ measurement region according to the prior art
29′ alternating electrical field according to the prior art
3 reference capacitor
32 capacitor plate
37 electrical lead
4 alternating voltage generator
5 collector circuit
51 input lead
52 bipolar transistor
53 base
54 collector
55 emitter
56-58 resistors
59 output lead of the collector circuit
6 detector circuit
69 output lead of the detector circuit
7 evaluation circuit
79 output lead of the device
8 transimpedance amplifier circuit
81 input lead
82 operational amplifier
83 feedback lead
89 output lead of the transimpedance amplifier circuit
Number | Date | Country | Kind |
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00621/05 | Apr 2005 | CH | national |
This application claims priority under any and all applicable statutes, acts, treaties, and agreements on international application PCT/CH2006/000138 filed Mar. 6, 2006 and Swiss application 00621/05 filed Apr. 5, 2005.
Filing Document | Filing Date | Country | Kind | 371c Date |
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PCT/CH06/00138 | 3/6/2006 | WO | 00 | 10/3/2007 |