Number | Date | Country | Kind |
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197 38 438 | Sep 1997 | DE | |
198 17 709 | Apr 1998 | DE |
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5240684 | Baba et al. | Aug 1993 | A |
5378900 | Hirano et al. | Jan 1995 | A |
5653799 | Fuerhoff | Aug 1997 | A |
5665159 | Fuerhoff | Sep 1997 | A |
5838434 | Skramsted et al. | Nov 1998 | A |
5853479 | Aufreiter et al. | Dec 1998 | A |
5892855 | Kakinami et al. | Apr 1999 | A |
5918196 | Jacobson | Jun 1999 | A |
5961716 | White et al. | Oct 1999 | A |
6030451 | Labrie et al. | Feb 2000 | A |
6226032 | Lees et al. | May 2001 | B1 |
Number | Date | Country |
---|---|---|
1619967 | Jul 1970 | DE |
2513924 | Feb 1976 | DE |
145407 | Dec 1980 | DE |
3325003 | Jan 1985 | DE |
19548845 | Jul 1997 | DE |
0 472 907 | Mar 1992 | EP |
0745830 | Dec 1996 | EP |
0 774 536 | May 1997 | EP |
1457275 | Dec 1976 | GB |
Entry |
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IBM Technical Disclosure Bulletin, XP-00218456, 25:9, 4754-4755 (Feb. 1983). |
Czochralski Growth of Single-Crystal Silicon—A State-of-the-Art Overview, Anthony Bonora, Sep. 1980, Microelectronic Manufacturing and Testing, pp. 44-46. |