BRIEF DESCRIPTION OF THE DRAWINGS
FIG. 1A is a schematic representation of the components of this invention, demonstrating a contact object attached to a piezoelectric element, with an electrical connection to a device capable of making electrical measurements of the piezoelectric, such as electrical impedance. In this illustration, the contact object is shown at a distance from another solid object.
FIG. 1B is a schematic of the same invention depicted in FIG. 1A, but in this case the contact object is shown physically interacting with another solid object.
FIG. 2A is an overlay of two impedance spectra gathered from a piezoelectric attached to a contact object when that object is at a distance from a solid surface and in contact with a solid surface.
FIG. 2B is a plot of the difference between the two spectra in FIG. 2B.
FIG. 3A shows the sum of the difference in impedance at five frequencies, as a function of time, between the measured value and a previously calibrated value.
FIG. 3B shows the sum of the difference in impedance at three frequencies, under the same conditions as for FIG. 3A.
FIG. 3C shows the sum of the differences in impedance at one frequency, under the same conditions as for FIG. 3A.
FIG. 4A is an overlay of two impedance spectra gathered from a piezoelectric element attached to a hollow tube when that tube is empty and when it is full of water.
FIG. 4B is a plot of the difference between the two spectra in FIG. 4A.
FIG. 5 is a contour plot of the topography of a surface as measured by this invention when mounted on a precision positioning system.