| Number | Date | Country | Kind |
|---|---|---|---|
| 197 42 755 | Sep 1997 | DEX |
| Number | Name | Date | Kind |
|---|---|---|---|
| 5639404 | Meier-Kaiser et al. | Jun 1997 | |
| 5960374 | Lausier | Sep 1999 |
| Number | Date | Country |
|---|---|---|
| 0 429 161 | May 1991 | EPX |
| 2 329 758 | Jan 1974 | DEX |
| 92 08 837 | Dec 1992 | DEX |
| 92 12 406 | Feb 1993 | DEX |
| Entry |
|---|
| Peter Mapleston, Modern Plastics International, vol. 26, No. 12, p. 119, "Temperature Measurement System Shortens Sheet Line Adjustment Time", Dec. 1996. |
| Patent Abstracts of Japan, vol. 014, No. 563 (M-1058), Dec. 14, 1990, JP 02 238922, Sep. 21, 1990. |
| Plast Europe, No. 3/4, p. 221, "Twin Scanner Controls Cast Film Thickness", Oct. 1993. |