Shin, J.H. et al., “Controlling the Quantum effects and Erbium-Carrier Interaction Using Si/SiO/sub 2/superlattices”, Rare-Earth-Doped Materials and Devices, vol. 4282, Jan. 2001, pp. 142-152. |
Orlov, L.K. et al., “Comparative Analysis of Light Emitting Properties of Si:Er and Ge/Si/sub1-x/Ge/sub x/epitaxial Structures Obtained by MBE Method”, Gettering and Defect Engineering in International Autumn Meeting, Sep. 1999, vol. 69-70, pp. 377-382. |
Favennec, P.N. et al., “Optical Activation of ER3+ Implanted in Silicon By Oxygen Impurities”, Japanese Journal of Applied Physics, vol. 29, No. 4, Apr. 1990, pp. L524-L526. |
Hak-Seung, H. et al., “Control of Location and Carrier-Interaction of Erbium Using Erbium-Doped Si/SIO/sub2/superlattic”, Thin Films for Optical Waveguide Devices and Materials for Optical Limiting Symposium, vol. 597, pp. 29-30, 2000. |
Ennen, H. et al., “1.54-MUM Luminescence of Erbium-Implanted III-V Semiconductors and Silicon”, Applied Physics Letters, vol. 43, No. 10, Nov. 1983, pp. 943-945. |
Favennec P. N. et al., “Optical Activation of Er3+ Implanted in Silicon by Oxygen Impurities ”, Jap. Journ . App. Phys. vol. 29, No. 4, Apr. 1990, pp. 524-526. |
Han, H.S. et al., “Contol of Location and Carrier-Interaction of Erbium Using Erbium-Doped Si/SiO2 Superlattice”, Dep. Phys. Korea Advanced Institute of Sci. and Techn., Nov. 30, 1999, pp. 27-32. |
Orlov, L.K. et al., “Comparative Analysis of Light Emitting Properties of Si:Erand Ge/Sil-xGel Epitaxial Structure Obtained by MBE Method”, Inst. Phys. of Microstructures, (1999) pp. 377-382. |
Schneider, J. et al., “1.54 μm Luminescence of Erbium-implanted III-V Semiconductors and Silicon”, Appl. Phys. Lett. 43 (10), Nov. 15, 1983, pp. 943-945. |
Shin, J.H. et al., “Controlling the Quantum Effects and Erbium-Carrier Interaction Using Si/SiO2 Supperlattices”, Dept. of Phys. Korea Advanced Institute, Jan. 22, 2001, pp. 142-152. |