Patent Application
20240262693
The present disclosure relates to a polycrystalline diamond and a tool comprising the polycrystalline diamond.
Polycrystalline diamond is widely used for tools such as cutting bits, dressers and dies, drilling bits, and the like, because it has an excellent hardness and neither directional hardness or cleavage.
Conventional polycrystalline diamond has been produced by sintering diamond powder as a raw material with a sintering aid or binder material under conditions of a high pressure and a high temperature (generally, a pressure of about 5 to 8 GPa and a temperature of about 1,300 to 2,200° C.) under which diamond is thermodynamically stable. The sintering aid to be used has been an iron group element metal such as Fe, Co or Ni, or a carbonate such as CaCO3. The binder material to be used has been a ceramic such as SiC.
The polycrystalline diamond produced by the above method contains a sintering aid or binder material. The sintering aid and binder material may cause deterioration of mechanical properties such as hardness and strength or heat resistance of the polycrystalline diamond.
A polycrystalline diamond obtained by removing a sintering aid from the diamond polycrystal by acid treatment, and a polycrystalline diamond having excellent heat resistance produced by using a heat-resistant SiC as a binder material are also known. However, such a polycrystalline diamond has a low hardness or strength and thereby insufficient mechanical properties as a material for tools.
Such a non-diamond carbon material as graphite, glassy carbon, amorphous carbon and onion-like carbon can be directly converted into diamond under ultra-high pressure and high temperature without sintering aid or the like used. Polycrystalline diamond can be produced by directly converting the non-diamond phase to the diamond phase and simultaneously performing sintering (WO 2005/065809 (PTL 1) and H. Sumiya et al., Japanese Journal of Applied Physics 48 (2009) 120206 (NPL 1)).
A polycrystalline diamond of the present disclosure is a polycrystalline diamond comprising diamond particles, wherein:
A tool of the present disclosure comprises the polycrystalline diamond described above.
In recent years, there has been a need for more efficient cutting (for example, having a higher feed rate), and further improvements in the performance of a polycrystalline diamond (for example, improvement in thermal conductivity, improvement in hardness, or the like) have been expected.
The present disclosure has been made in view of the above circumstances. An object of the present disclosure is to provide a polycrystalline diamond having an excellent thermal conductivity, and a tool comprising the polycrystalline diamond.
The present disclosure can provide a polycrystalline diamond having an excellent thermal conductivity, and a tool comprising the polycrystalline diamond.
The aspects of the present disclosure are first listed and described.
[1] A polycrystalline diamond according to one aspect of the present disclosure is a polycrystalline diamond comprising diamond particles, wherein:
The polycrystalline diamond has a low dislocation density of diamond particles, and is thereby improved in thermal conductivity. That is, the polycrystalline diamond has an excellent thermal conductivity.
[2] For the polycrystalline diamond, the dislocation density of the diamond particles is preferably 0.1×1015 m−2 or more and 1.0×1015 m−2 or less. By defining the dislocation density within such a range, the polycrystalline diamond has a superior thermal conductivity.
[3] For the polycrystalline diamond, the median diameter d50 of the diamond particles is preferably 10 nm or more and 100 nm or less. By defining the median diameter d50 within such a range, the polycrystalline diamond has an excellent thermal conductivity as well as an excellent hardness.
[4] The polycrystalline diamond preferably further comprises boron, wherein the content of boron is 0.01% by mass or more and 1% by mass or less based on the total mass of the polycrystalline diamond. By defining the polycrystalline diamond in such a manner, the polycrystalline diamond has slidability and electrical conductivity.
[5] The polycrystalline diamond preferably has a Knoop hardness at a normal temperature of 80 GPa or more. By defining the Knoop hardness of the polycrystalline diamond in such a manner, the polycrystalline diamond has an excellent thermal conductivity as well as an excellent wear resistance.
[6] In the polycrystalline diamond of the present disclosure, the content of at least one metal element selected from the group consisting of a Group 4 element, a Group 5 element and a Group 6 element in the periodic table, and iron, aluminum, silicon, cobalt and nickel is preferably less than 1% by volume. By defining the content of at least one metal element within such a range, the polycrystalline diamond has an excellent hardness.
[7] In the polycrystalline diamond of the present disclosure, the content of at least one inevitable impurity selected from the group consisting of hydrogen, oxygen, nitrogen, an alkali metal element and an alkaline earth metal element is preferably less than 0.1% by volume. By defining the content of at least one inevitable impurity within such a range, the polycrystalline diamond has a superior hardness.
[8] A tool according to one aspect of the present disclosure comprises the polycrystalline diamond described above.
The tool comprises the polycrystalline diamond having an excellent thermal conductivity, and it thereby has an excellent wear resistance during high-speed machining and the like of various materials. As used herein, the term “wear resistance” means a resistance to wear of a tool during material machining.
Details of the embodiments of the present disclosure will be described below. However, the present disclosure is not limited to these illustrative examples. As used herein, the expression in the form of “A to Z” means from the upper limit to the lower limit of the range (that is, A or more and Z or less), and when there is no description of the unit for A and the unit is described only for Z, the unit for A is the same as the unit of Z.
The polycrystalline diamond according to the present embodiment is a polycrystalline diamond comprising diamond particles, wherein:
The polycrystalline diamond comprises diamond particles. That is, the polycrystalline diamond is basically composed of the diamond particles, and comprises substantially no binder phase (binder) formed by one or both of a sintering aid and a binder material. Therefore, the polycrystalline diamond has a very high hardness and strength. In addition, the polycrystalline diamond does not suffer from deterioration of mechanical properties or shedding of grains due to a difference in coefficient of thermal expansion from that of the binder material or due to the catalytic action of the binder material even under high temperature conditions. In one aspect of the present embodiment, the diamond particles can also be understood as crystalline grains of diamond.
The polycrystalline diamond is a polycrystal composed of a plurality of diamond particles. Therefore, the polycrystalline diamond has neither directional property (anisotropy) and cleavage property exhibited by a monocrystal, and has isotropic hardness and wear resistance in all directions.
The polycrystalline diamond may contain inevitable impurities as long as the effects of the present embodiment are exhibited. Examples of the inevitable impurity include hydrogen, oxygen, nitrogen, and a metal element such as an alkali metal element (such as lithium (Li), sodium (Na) or potassium (K)) or an alkaline earth metal element (such as calcium (Ca) or magnesium (Mg)). That is, in the present embodiment, in the polycrystalline diamond, the content of at least one inevitable impurity selected from the group consisting of hydrogen, oxygen, nitrogen, an alkali metal element and an alkaline earth metal element is preferably less than 0.1% by volume. The lower limit of the content of the inevitable impurities may be, for example, 0% by volume or more. When the inevitable impurities contain two or more elements, the sum of the contents of elements is the content of the inevitable impurities.
The concentrations of hydrogen, oxygen, nitrogen and the like in the polycrystalline diamond can be measured by secondary ion mass spectrometry (SIMS). As an example of this measurement method, the impurity concentration is measured using “CAMECA IMS-7f” (available from Ametech Inc.) as a device, with a primary ion species of Cs+, a primary acceleration voltage of 15.0 kV, and a detection area of p 30 μm.
The polycrystalline diamond of the present embodiment is a sintered material, but the term “polycrystalline” is used in the present embodiment because the sintered material is usually intended to contain a binder in many cases.
In the present embodiment, the content of the diamond particles is more than 99% by volume and preferably more than 99% by volume and 100% by volume or less based on the total volume of the polycrystalline diamond.
The content (% by volume) of the diamond particles in the polycrystalline diamond can be measured by using, in combination with an X-ray diffraction method, and a method using an energy dispersive X-ray analyzer (EDX) (for example, X-MAX80 EDS system available from Oxford Instruments) equipped with a scanning electron microscope (SEM) (for example, “JSM-7800F” (trade name) available from JEOL Ltd.) (hereinafter also referred to as “SEM-EDX”). A specific measurement method is as follows.
First, a polycrystalline diamond is cut at an arbitrary position to prepare a sample including a cross section of the polycrystalline diamond. The cross section can be prepared with a focused ion beam device, a cross-section polisher device or the like. Then, the cross section is observed with an SEM to acquire a backscattered electron image. In the backscattered electron image, regions including diamond particles and non-diamond carbon are black regions, and other regions (for example, regions including elements derived from a binder material) are gray regions or white regions. The magnification at the time of observing the cross section with the SEM is appropriately adjusted so that the number of diamond particles observed in the measurement field of view is 100 or more. For example, the magnification at the time of observing the cross section with the SEM may be 10,000 times.
Next, the backscattered electron image is subjected to binarization processing with an image analysis software (“Win ROOF ver. 7.4.5”, “WinROOF2018” or the like available from MITANI CORPORATION). The above image analysis software automatically sets an appropriate binarization threshold based on the image information (a measurer does not arbitrarily set a threshold). The present inventors have confirmed that the measurement results do not vary significantly even when the brightness or the like of the image is varied. The area proportion of pixels derived from the dark field (pixels derived from diamond particles and non-diamond carbon) to the area of the measurement field of view is calculated from the binarized image. By expressing the calculated area proportion in % by volume, the sum (% by volume) of the content of diamond particles and the content of non-diamond carbon can be determined.
The area proportion of pixels derived from the bright field (pixels derived from the other regions than diamond particles and non-diamond carbon) to the area of the measurement field of view can be calculated from the binarized image to determine the content (% by volume) of the other regions.
The present inventors have confirmed that as long as the sum (% by volume) of the content of the diamond particles and the content of the non-diamond carbon in the polycrystalline diamond is measured in the same sample, little variation is observed in the measurement results even if the selected measurement field of view is changed and calculations are performed multiple times. Accordingly, the inventors have believed that even if the measurement field of view is set arbitrarily, it is not arbitrary.
It can be confirmed, by subjecting the polycrystalline diamond to elemental analysis by SEM-EDX, that the pixels derived from the dark field are derived from diamond particles and non-diamond carbon.
Next, an X-ray spectrum of the cross section of the polycrystalline diamond is obtained with an X-ray diffractometer (“MiniFlex600” (trade name) available from Rigaku Corporation). At this time, the conditions of the X-ray diffractometer are as follows.
For the obtained X-ray spectrum, the following peak intensity A and peak intensity B are measured.
Peak intensity A: the peak intensity of the non-diamond carbon after subtracting the background intensity from the peak intensity near the diffraction angle 2θ=28.5° Peak intensity B: the peak intensity of the diamond particles after subtracting the background intensity from the peak intensity near the diffraction angle 2θ=43.9°.
The content (% by volume) of the diamond particles is determined by calculating the value of {peak intensity B/(peak intensity A+peak intensity B)}×(the sum (% by volume) of the content of the diamond particles and the content of the non-diamond carbon determined by the above SEM-EDX). Since the non-diamond carbon and the diamond particles all are weighted electronically to the same degree, the X-ray peak intensity ratio can be taken as the volume ratio in the polycrystalline diamond. No peak derived from boron is detected by the present method. Therefore, even if the polycrystalline diamond contains boron, the content of the diamond particles may be sometimes 100% by volume.
The median diameter d50 of the diamond particles is 10 nm or more and 200 nm or less, and preferably 10 nm or more and 100 nm or less. The median diameter d50 of the diamond particles of 10 nm or more produces a polycrystalline diamond having an excellent strength. The median diameter d50 of the diamond particles of 200 nm or less produces a polycrystalline diamond having an excellent hardness.
In the present embodiment, the median diameter d50 of the diamond particles means a value determined by measuring the median diameter d50 of each of a plurality of diamond particles in each of the arbitrarily selected five measurement fields of view and calculating the average value of these measured median diameters. A specific method is as follows.
First, a polycrystalline diamond is cut at an arbitrary position to prepare a sample including a cross section of the polycrystalline diamond. The cross section can be prepared with a focused ion beam device, a cross-section polisher device or the like. Then, the cross section is observed with an SEM to acquire a backscattered electron image. The magnification at the time of observing the cross section with the SEM is appropriately adjusted so that the number of diamond particles observed in the measurement field of view is 100 or more. For example, the magnification at the time of observing the cross section with the SEM may be 10,000 times.
For each of the five SEM images, the equivalent circle diameter of each diamond particle is calculated with an image analysis software (“Win ROOF ver. 7.4.5”, “WinROOF2018” or the like available from MITANI CORPORATION), with the grain boundary of the diamond particle observed within the measurement field of view separated. At this time, the diamond particles partly out of the measurement field of view are not counted.
The median diameter d50 in each measurement field of view is calculated from the distribution of the calculated equivalent circle diameter of each diamond particle, and the average value thereof is calculated. The average value corresponds to the median diameter d50 of the diamond particles.
The present inventors have confirmed that as long as the median diameter d50 of the diamond particles is measured in the same sample, little variation is observed in the measurement results even if the selected measurement field of view in the polycrystalline diamond is changed and calculations are performed multiple times. Accordingly, the inventors have believed that even if the measurement field of view is set arbitrarily, it is not arbitrary.
In the present embodiment, the particle diameter d90 of the diamond particles is 15 nm or more and 300 nm or less, and preferably 15 nm or more and 150 nm or less. The particle diameter d90 of the diamond particles of 15 nm or more produces a polycrystalline diamond having an excellent strength. The particle diameter d90 of the diamond particles of 150 nm or less produces a polycrystalline diamond having an excellent hardness.
In the present embodiment, the particle diameter d90 of the diamond particles means a value determined by measuring the particle diameter d90 of each of a plurality of diamond particles in each of the arbitrarily selected five measurement fields of view and calculating the average value of these measured particle diameters d90. A specific method is the same as the method for determining the median diameter d50 described above.
The dislocation density of the diamond particles is 0.1×1015 m−2 or more and less than 2.0×1015 m−2, and preferably 0.5×1015 m−2 or more and 1.0×1015 m−2 or less. The dislocation density of the diamond particles of 0.1×1015 m−2 or more produces a polycrystalline diamond having an excellent strength. The dislocation density of the diamond particles of less than 2.0×1015 m−2 produces a polycrystalline diamond having an excellent thermal conductivity.
No attention has conventionally been focused to the correlation, in a polycrystalline diamond containing no binder phase, between the dislocation density of the diamond particles and the physical properties of the polycrystalline diamond. Accordingly, the present inventors have focused attention to the correlation therebetween, and have made diligent research on the relationship between the dislocation density of the diamond particles in the polycrystalline diamond and the thermal conductivity of the polycrystalline diamond. As a result, it has been found for the first time that lowering the dislocation density of the diamond particles compared to conventional polycrystalline diamond improves the thermal conductivity. When such a polycrystalline diamond having an excellent thermal conductivity is used for tools such as cutting tools, even at the time of performing high-speed machining wherein a cutting edge becomes hot, an excellent wear resistance can be exhibited due to rapid diffusion of the heat accumulated on the cutting edge. It has been revealed from this research that diamond particles in the conventional polycrystalline diamond (such as the polycrystalline diamond described in PTL 1) have a dislocation density of 5×1016 m−2 or more and 8×1016 m−2 or less.
The dislocation density of the polycrystalline diamond in the present specification is measured at a large synchrotron radiation facility (such as Kyushu Synchrotron Light Research Center (Saga Prefecture)). Specifically, it is measured by the following method.
A test specimen composed of a polycrystalline diamond is prepared. The size of the test specimen is 2 mm×2 mm on the observation surface and 1.0 mm in thickness. The observation surface of the test specimen is mirror polished using a diamond slurry having an average particle diameter of 3 μm.
The test specimen is subjected to X-ray diffraction measurement under the following conditions, and the line profile of the diffraction peak from each of the orientation planes of (111), (220), (311), (331), (422), (440) and (531), which are the major orientations of diamond, is obtained.
Measurement conditions: 9 or more measurement points in the full width at half maximum corresponding to each measurement peak. The peak top intensity is set to 2,000 counts or more. Since the tail of the peak is also used for analysis, the measurement range is set to about 10 times the full width at half maximum.
The line profile obtained by the above X-ray diffraction measurement has a shape that includes both a true broadening attributed to physical quantities such as non-uniform strain of the test specimen and a broadening attributed to the device. In order to determine the non-uniform strain and crystallite size, a true line profile is obtained by removing the component attributed to the device from the measured line profile. The true line profile is obtained by fitting the obtained line profile and the line profile attributed to the device with a pseudo-Voigt function and subtracting the line profile attributed to the device. LaB6 is used as a reference sample for removing the broadening of the diffraction line attributed to the device. When highly collimated synchrotron radiation is used, the broadening of the diffraction line attributed to the device may be taken as zero.
The dislocation density is determined by analyzing the obtained true line profile using the modified Williamson-Hall method and the modified Warren-Averbach method. The modified Williamson-Hall method and the modified Warren-Averbach method are known line profile analysis methods that have been used to determine the dislocation density.
The modified Williamson-Hall method is represented by the following expression (I):
wherein:
ΔK represents a half width of a line profile; D represents a crystallite size; M represents an arrangement parameter; b represents a Burgers vector. ρ represents the dislocation density; K represents a scattering vector; O(K2C) represents a higher-order term of K2C; and C represents the average value of contrast factors.
C in the above expression (I) is represented by the following expression (II):
In the above expression (II), a contrast factor Choo for each of screw dislocation and edge dislocation and a coefficient q for each contrast factor are calculated by using the computing code ANIZC with a slip system of <110>{111} and elastic stiffness C11, C12 and C44 of 1076 GPa, 125 GPa and 576 GPa, respectively. In the expression (II) above, h, k and l correspond to the Miller index (hkl) of diamond. The contrast factor Choo is 0.183 for screw dislocation and 0.204 for edge dislocation. The coefficient q for the contrast factor is 1.35 for screw dislocation and 0.30 for edge dislocation. The screw dislocation ratio is fixed at 0.5, and the edge dislocation ratio is fixed at 0.5.
Further, the relationship represented by the following expression (III) holds between the dislocation and the non-uniform strain using the contrast factor C:
wherein: Rc represents an effective radius of dislocation; and ε (L) represents non-uniform strain.
From the relationship of the above expression (III) and the Warren-Averbach expression, the following expression (IV) can be presented, and the dislocation density ρ and the crystallite size can be determined by the modified Warren-Averbach method.
wherein: A(L) represents a Fourier series; AS(L) represents a Fourier series for crystallite size; and L indicates a Fourier length.
Details of the modified Williamson-Hall method and the modified Warren-Averbach method are described in: T. Ungar and A. Borbely, “The effect of dislocation contrast on x-ray line broadening: A new approach to line profile analysis”, Appl. Phys. Lett., vol. 69, no. 21, p. 3173, 1996; and T. Ungar, S. Ott, P. Sanders, A. Borbely, J. Weertman, “Dislocations, grain size and planar faults in nanostructured copper determined by high resolution X-ray diffraction and a new procedure of peak profile analysis”, Acta Mater., vol. 46, no. 10, pp. 3693-3699, 1998.
The present inventors have confirmed that as long as the dislocation density of the diamond particles is measured in the same sample, little variation is observed in the measurement results even if the selected measurement field of view is changed and calculations are performed multiple times. Accordingly, the inventors have believed that even if the measurement field of view is set arbitrarily, it is not arbitrary.
In the present embodiment, the polycrystalline diamond further comprises boron, wherein the content of boron is preferably 0.01% by mass or more and 1% by mass or less, and more preferably 0.05% by mass or more and 0.6% by mass or less, based on the total mass of the polycrystalline diamond. By defining the polycrystalline diamond in such a manner, the polycrystalline diamond has slidability and electrical conductivity. The content of boron in the polycrystalline diamond can be measured by secondary ion mass spectrometry (SIMS) as described above.
In one aspect of the present embodiment, in the polycrystalline diamond, the content of at least one metal element selected from the group consisting of a Group 4 element, a Group 5 element and a Group 6 element in the periodic table, and iron, aluminum, silicon, cobalt and nickel is preferably less than 1% by volume, and more preferably 0% by volume or more and 0.1% by volume or less. When two or more metal elements are contained, “the content of metal elements” is the total content of the two or more metal elements. The content of the metal elements can be confirmed by subjecting the polycrystalline diamond to structure observation, elemental analysis or the like with EDX equipped with SEM.
Examples of the Group 4 element in the periodic table include titanium (Ti), zirconium (Zr) and hafnium (Hf). Examples of the Group 5 element in the periodic table include vanadium (V), niobium (Nb) and tantalum (Ta). Examples of the Group 6 element in the periodic table include chromium (Cr), molybdenum (Mo) and tungsten (W).
The polycrystalline diamond of the present embodiment preferably has a Knoop hardness at room temperature of 80 GPa or more and more preferably 100 GPa or more. There is no upper limit to the Knoop hardness, but it may be 150 GPa or less from the viewpoint of manufacturing. The Knoop hardness is determined by a Knoop hardness test that is performed under the conditions specified in JIS Z 2251:2009.
The Knoop hardness test specified in JIS Z 2251:2009 is known as one of methods for measuring the hardness of industrial materials. The Knoop hardness test is a test that determines the hardness of a material to be measured by pressing a Knoop indenter into the material to be measured at a predetermined temperature with a predetermined load (test load). In the present embodiment, the predetermined temperature is room temperature (23° C.±5° C.), and the predetermined load is 4.9 N.
The Knoop indenter is a diamond indenter having a square pyramid shape with a rhombic base.
The polycrystalline diamond of the present embodiment can be suitably used for cutting tools, wear-resistant tools, grinding tools, tools for friction stir welding, styluses and the like, because it has excellent thermal conductivity and hardness. That is, the tool of the present embodiment comprises the polycrystalline diamond. The tool has an excellent wear resistance during high-speed machining of various materials. When the tool is a cutting tool, the cutting tool is particularly suitable for turning cemented carbide, ceramics and the like.
The tool may be entirely composed of the polycrystalline diamond, or only a part of the tool (for example, in the case of a cutting tool, the cutting edge part) may be composed of the polycrystalline diamond.
Examples of the cutting tool include a drill, an end mill, an indexable cutting insert for drills, an indexable cutting insert for end mills, an indexable cutting insert for milling, an indexable cutting insert for turning, a metal saw, a gear cutting tool, a reamer, a tap and cutting bit.
Examples of the wear-resistant tool include a die, a scriber, a scribing wheel and a dresser.
Examples of the grinding tool include an abrasive wheel.
The method for manufacturing a polycrystalline diamond according to the present embodiment comprises:
In this step, a non-diamond carbon material is prepared as a starting material. The non-diamond carbon material is not limited as long as it is a carbon material. The non-diamond carbon material preferably comprises low crystalline graphite, pyrolytic graphite or amorphous carbon. These may be used alone or in combination of two or more.
The non-diamond carbon material preferably has a purity of 99% by volume or more, more preferably 99.5% by volume or more, even more preferably 99.9% by volume or more, and most preferably 100% by volume. In other words, the non-diamond carbon material has preferably no iron group element metal, which is an impurity, from the viewpoint of suppressing the growth of crystalline grains. Examples of the iron group element metal include iron (Fe), cobalt (Co) and nickel (Ni).
The non-diamond carbon material preferably has low concentrations of impurities such as hydrogen, oxygen and nitrogen, from the viewpoint of suppressing the growth of crystalline grains and promoting the direct conversion of the non-diamond carbon material to diamond. The concentration of each of hydrogen, oxygen and nitrogen in the non-diamond carbon material is preferably 0.1% by volume or less and more preferably 0.01% by volume or less. Further, the total impurity concentration in the non-diamond carbon material is preferably 0.3% by volume or less and more preferably 0.1% by volume or less.
The concentration of each of the impurities in non-diamond carbon material can be measured by secondary ion mass spectrometry (SIMS). As an example of this measurement method, the impurity concentration is measured using “CAMECA IMS-7f” (available from Ametech Inc.) as a device, with a primary ion species of Cs+, a primary acceleration voltage of 15.0 kV and a detection area of φ30 μm.
In this step, the pressure and temperature are increased from the starting pressure and starting temperature so as to pass through the graphite stable region. As used herein, the term “graphite stable region” means a region, in which graphite is thermodynamically stable, in the phase equilibrium diagram of carbon (
wherein T (° C.) is a temperature and P (GPa) is a pressure.
The dislocation density of the finally obtained polycrystalline diamond is lower by a combination of increasing the pressure and temperature from the starting pressure and starting temperature so as to pass through the graphite stable region and maintaining the pressure and temperature near the phase boundary as described later.
In the present embodiment, the starting temperature is a normal temperature (23±5° C.) and the starting pressure is the atmospheric pressure (1013.25 hPa).
In this step, the pressure and temperature are maintained near the phase boundary for 10 minutes or more and 60 minutes or less when the pressure is increased to cross the diamond region. As used herein, the term “diamond region” means a region, in which diamond is thermodynamically stable, in the phase equilibrium diagram of carbon (
As used herein, the term “phase boundary” means a boundary between the graphite stable region described above and the diamond region. The dislocation density of the polycrystalline diamond is decreased by maintaining the pressure and temperature near the phase boundary, so that the resulting polycrystalline diamond is improved in thermal conductivity.
The pressure near the phase boundary is preferably 1.5 GPa or more and 8 GPa or less, and more preferably 2 GPa or more and 7 GPa or less. Here, the relationship represented by the following expression holds between the pressure P (unit: GPa) and the temperature T (unit: ° C.) at the phase boundary:
The temperature near the phase boundary is preferably 25° C. or more and 2,300° C. or less, and more preferably 100° C. or more and 2,000° C. or less.
In one aspect of the present embodiment, the pressure P near the phase boundary is 2 GPa or more and 3 GPa or less, and the temperature T near the phase boundary is 300° C. or more and 500° C. or less. The pressure P and the temperature T preferably satisfy the relationship represented by the above expression.
The time for which the pressure and temperature are maintained near the phase boundary is preferably 10 minutes or more, and more preferably 20 minutes or more. The upper limit of the time for which the pressure and temperature are maintained near the phase boundary is preferably 60 minutes or less, from the viewpoint of manufacturing (such as the cycle time of production).
<Fourth Step: Converting into Diamond Particles and Sintering Them>
In this step, the pressure and temperature are further increased to the sintering pressure and sintering temperature to convert the non-diamond carbon material into diamond particles and sinter them at the sintering pressure and sintering temperature.
The sintering pressure is preferably 12 GPa or more, and more preferably 15 GPa or more. The upper limit of the sintering pressure is preferably 25 GPa or less from the viewpoint of manufacturing.
The sintering temperature is preferably 1,800° C. or more and 2,800° C. or less, and more preferably 2,000° C. or more and 2,600° C. or less.
The sintering time at the sintering pressure and the sintering temperature is preferably 1 minute or more and 20 minutes or less, more preferably 5 minutes or more and 20 minutes or less, and even more preferably 10 minutes or more and 20 minutes or less.
The high-pressure and high-temperature generator to be used in the method for manufacturing a polycrystalline diamond of the present embodiment is not limited as long as it is a device that provides the pressure and temperature conditions at which the diamond phase is a thermodynamically stable phase. However, the generator is preferably a high-pressure and high-temperature generator or a multi-anvil type high-pressure and high-temperature generator from the viewpoint of improving productivity and workability. The vessel for containing the non-diamond carbon material as a raw material is not limited as long as it is made from a material that is resistant to high pressures and high temperatures. For example, the material to be used is suitably Ta, Nb or the like.
In order to prevent contamination of impurities into the polycrystalline diamond, for example, the non-diamond carbon material as a raw material is first placed in a capsule made of a metal having a high melting point such as Ta or Nb, heated in a vacuum and sealed to remove adsorbed gases and air from the non-diamond carbon material. Thereafter, the second to fourth steps are preferably performed.
The present embodiments will be more specifically described with reference to Examples. However, the present embodiments are not limited by these Examples.
For each of Samples 1 to 11, the following non-diamond carbon material was first prepared as a raw material.
Next, the non-diamond carbon material was placed in a Ta capsule, heated in a vacuum, and sealed. Thereafter, the pressure and the temperature was increased from the starting pressure and starting temperature shown in Table 1 to the end-point pressure and the end-point temperature in the first stage shown in Table 1 with using a high-pressure and high-temperature generator. The starting pressure in Table 1, which is written as “0 GPa”, means the atmospheric pressure. The end-point pressure and end-point temperature in the first stage correspond to the graphite stable region as described above.
The pressure was increased from the first stage to reach the end-point pressure and end-point temperature in the second stage shown in Table 1, which was maintained for the holding time in the second stage shown in Table 1. Herein, the end-point pressure and the end-point temperature in the second stage correspond to the pressure P (unit: GPa) and temperature T (unit: ° C.) near the phase boundary described above, respectively, and the relationship represented by the following expression holds.
P=T×0.00286+1.4185
<Fourth Step: Converting into Diamond Particles and Sintering Them>
After performing the third step, the temperature and pressure were increased via the end-point pressure and end-point temperature in the third stage shown in Table 1 to the sintering pressure and sintering temperature of the fourth stage. The non-diamond carbon material was converted into diamond particles and sintered by pressurizing and heating it for the sintering time of the fourth stage shown in Table 1. Polycrystalline diamonds of Samples 1 to 11 were obtained by the above procedure. Neither sintering aid nor binder material was added to the non-diamond carbon material. As Sample 12, a commercially available sintered diamond (trade name: DA1000, available from SUMITOMO ELECTRIC HARDMETAL CORP.) was prepared. Samples 1 to 7 correspond to the “inventive” Examples. Samples 8 to 12 correspond to the Comparative Examples. For the sintered diamond, the median diameter d50 of the diamond particles is 0.5 μm, and the content of the diamond particles is 90 to 95% by volume. Cobalt was used as a binder material in the sintered diamond.
For the obtained polycrystalline diamond, the contents of diamond particles and boron, the content of metal elements, the content of inevitable impurities, the median diameter d50 and particle diameter d90 of the diamond particles, the dislocation density of the diamond particles, the resistivity of the diamond particles and the Knoop hardness of the diamond particles were measured as shown below.
The content of the diamond particles in the polycrystalline diamond was identified by using a combination of both of a method using an EDX equipped with an SEM and an X-ray diffraction method. The content of boron in the polycrystalline diamond was identified by SIMS. The specific measurement method is the same as the method described in the above section [Details of Embodiment of the Present Disclosure], and the description thereof will not therefore be repeated. The results are shown in Table 2 (see columns “Content of diamond” and “Boron content”). For each of Samples 2 and 3, it was confirmed that the remainder was unconverted graphite.
The content of iron group elements in each of the polycrystalline diamond and sintered diamond was identified by an EDX equipped with SEM. Specific measurement conditions are as follows. The results are shown in Table 2 (see the column “Content of iron group elements Fe, Co and Ni”).
The content of inevitable impurities in the polycrystalline diamond was identified by SIMS. The specific measurement method is the same as the method described in the above section [Details of Embodiment of the Present Disclosure], and the description thereof will not therefore be repeated. The results are shown in Table 2 (see the column “Content of inevitable impurities”).
The median diameter d50 and particle diameter d90 of diamond particles contained in each polycrystalline diamond were measured. The specific measurement method is the same as the method described in the above section [Details of Embodiment of the Present Disclosure], and the description thereof will not therefore be repeated. The results are shown in Table 2 (see the columns “Median diameter d50” and “Particle diameter d90”).
The dislocation density of diamond particles in a polycrystalline diamond was measured. The specific measurement method is the same as the method described in the above section [Details of Embodiment of the Present Disclosure], and the description thereof will not therefore be repeated. The results are shown in Table 2 (see the column “Dislocation density”).
The resistivity of diamond particles in the polycrystalline diamond was measured by the four-probe method in accordance with JIS standard JIS K 7194. At this time, the sample size was φ5×1 mm. The results are shown in Table 2 (see the column “Resistivity”). In Table 2, “−” means that the measurement was not able to be performed because the polycrystalline diamond was an insulating material.
The Knoop hardness was measured for the polycrystalline diamond and the sintered diamond. The specific measurement method is the same as the method described in the above section [Details of Embodiment of the Present Disclosure], and the description thereof will not therefore be repeated. The results are shown in Table 2 (see the column “Knoop hardness”).
In order to investigate the wear resistance of a cutting tool comprising the polycrystalline diamond of each of Samples 1 to 11 or the sintered diamond of Sample 12, an insert for turning (tool shape: DNMA150404RH) was prepared using the polycrystalline diamond or the sintered diamond and subjected to cutting under the following cutting conditions, and the wear amount when the cutting distance reached 1,500 m was calculated. The ratio of wear amount was calculated with respect to the wear amount of Sample 1. The results are shown in Table 2. Performing high-speed cutting at a cutting speed of 300 m/min is believed to result in a high temperature at the cutting edge of the cutting tool. Therefore, each Sample can be evaluated as having excellent thermal conductivity and wear resistance, during cutting in which the smaller ratio of wear amount results in a higher temperature at the cutting edge.
It was shown from the results in Table 2 that Samples 1 to 7 (Examples) had a ratio of wear amount of 0.92 to 1.13 and therefore had excellent thermal conductivity and wear resistance. In contrast, Samples 8 to 11 (Comparative Examples) had a ratio of wear amount of 1.3 to 1.9. For Sample 12 (Comparative Example), the wear amount was large when the cutting distance reached 300 m, and the subsequent cutting test was thereby discontinued. It was shown from the above results that the cutting tools according to Examples had excellent thermal conductivity and wear resistance. It was also shown that the polycrystalline diamond used in the cutting tools according to Examples had excellent thermal conductivity.
Although the present embodiments and examples of the present disclosure have been described as above, the features of the above-described embodiments and examples are contemplated from the beginning to be appropriately combined or variously modified.
The embodiments and examples disclosed herein should be understood as exemplary and not as restrictive in all respects. The scope of the present invention is defined by the claims rather than the above description, and is intended to include the meanings equivalent to the claims and all modifications within the scope of the claims.
| Filing Document | Filing Date | Country | Kind |
|---|---|---|---|
| PCT/JP2021/022258 | 6/11/2021 | WO |
