Dielectric ceramic composition, dielectric ceramic compact and electronic component including the same

Information

  • Patent Grant
  • 6649553
  • Patent Number
    6,649,553
  • Date Filed
    Friday, March 15, 2002
    23 years ago
  • Date Issued
    Tuesday, November 18, 2003
    22 years ago
Abstract
A dielectric ceramic composition for radiofrequency applications has a crystalline primary component having a perovskite crystal structure, and an auxiliary component. The crystalline primary component is represented by the formula:(1−x)MeTiaO1+2a−xLn(Ma1/2Mb1/2)bO(3+3b)/2 wherein Me is at least one of Ca and Sr; Ln is a rare earth element; Ma is at least one of Mg and Zn; Mb is at least one of Sn and Zr; x represents a mole fraction of Ln(Ma1/2Mb1/2)bO(3+3b/2); and a and b represent molar ratios, wherein 0.95≦a≦1.05, 0.9≦b≦1.05, and 0.3≦x≦0.5. The auxiliary component includes B and Si. The composition can be sintered at 1,000° C. or less. An electronic component includes a ceramic element of the dielectric ceramic composition and conductors provided in the interior of the ceramic element.
Description




BACKGROUND OF THE INVENTION




1. Field of the Invention




The present invention relates to dielectric ceramic compositions and dielectric ceramic compacts for radiofrequency applications, for example, dielectric ceramic compacts having high Q values in radiofrequency ranges such as microwave and millimeter-wave ranges and particularly, a dielectric ceramic composition for radiofrequency applications which can be stacked and sintered together with metal electrodes. The present invention also relates to electric components such as a filter and duplexer including the dielectric ceramic compositions or dielectric ceramic compacts.




2. Description of the Related Art




In recent years, dielectric ceramic compacts provided by sintering dielectric ceramic compositions have been widely used in radiofrequency applications, such as filters, duplexers, dielectric resonators and dielectric substrates for monolithic integrated circuits (MICs).




In order to reduce the sizes of the above products, the dielectric ceramic compositions must satisfy the following requirements:




(1) A small dielectric constant;




(2) A small dielectric loss, in other words, a high Q value; and




(3) A small dependence of the dielectric constant on temperature.




For example, Japanese Examined Patent Application Publication No. 4-59267 discloses a dielectric ceramic composition represented by the general formula (Zr,Sn)TiO


4


. Though this ceramic composition exhibits generally satisfactory properties: (εr is at least 38 and the Q value is at least 9,000), the composition must be fired at a high temperature of at least 1,350° C.




Use of inexpensive low-resistance metals such as Ag and Cu in internal electrode materials is required for dielectric resonators and the like in order to reduce material cost.




It is also required for simplifying the production process that the metals used in internal electrodes can be sintered together with dielectric ceramics. In order to achieve cosintering of the dielectric ceramic and the metal internal electrodes, firing must be performed at a temperature that is lower than the melting point of the metal.




The melting point of an electrode composed of Ag or Cu is generally in the range of about 960 to 1,100° C., which is significantly lower than firing temperatures of 1,300° C. or more applied in known firing processes for the dielectric ceramic compositions; hence, Ag and Cu cannot be used as the internal electrode materials.




The above-mentioned ceramic composition disclosed in Japanese Examined Patent Application Publication No. 4-59267 requires a high firing temperature of 1,350° C. or more; hence, the composition cannot be sintered with low-resistance metals such as Ag and Cu.




SUMMARY OF THE INVENTION




An object of the present invention is to provide a dielectric ceramic composition for radiofrequency applications which can be fired at a low temperature and be sintered with a low-resistance metal used in internal electrodes, and a dielectric ceramic compact which exhibits superior dielectric characteristics: a high dielectric constant and a high Q value.




Another object of the present invention is to provide electronic components such as a filter comprising the dielectric ceramic composition.




According to an aspect of the present invention, a dielectric ceramic composition for radiofrequency applications comprises a crystalline primary component having a perovskite crystal structure, and an auxiliary component. The crystalline primary component is represented by the formula:






(1


−x


)MeTi


a


O


1+2a




−x


Ln(Ma


1/2


Mb


1/2


)


b


O


(3+3b)/2








wherein Me is at least one of Ca and Sr; Ln is a rare earth element; Ma is at least one of Mg and Zn; Mb is at least one of Sn and Zr; x represents a mole fraction of Ln(Ma


1/2


Mb


1/2


)


b


O


(3+3b/2)


; and a and b represent molar ratios, wherein a, b, and x are, respectively, within the following ranges: 0.95≦a≦


1.05, 0.9≦b≦1.05


, and 0.3≦x≦0.5. The auxiliary component comprises B and Si for decreasing the sintering temperature of the dielectric ceramic composition to about 1,000° C. or less.




The dielectric ceramic composition satisfying the above requirements has a low sintering temperature; thus, it can be sintered with a low-resistance metal used as internal electrodes.




Furthermore, the dielectric ceramic compact obtained by sintering the dielectric ceramic composition exhibits superior radiofrequency characteristics such as the Q value and dielectric characteristics; hence, electronic components such as a filter and a duplexer using this dielectric ceramic composition exhibit superior characteristics.




Preferably, the auxiliary component comprises: about 10 to 60 percent by weight of SiO


2


; about 5 to 40 percent by weight of B


2


O


3


; 0 to about 30 percent by weight of Al


2


O


3


; about 20 to 70 percent by weight of EO; and 0 to about 15 percent by weight of A


2


O, wherein E is at least one of Zn and alkaline earth metal elements selected from Mg, Ca, Sr and Ba, and A is at least one alkali metal element selected from Li, Na and K. This dielectric ceramic composition can be more readily sintered with the low-resistance metal. Thus, the dielectric ceramic composition exhibits superior dielectric characteristics, for example, a significantly high Q value.




Preferably, the auxiliary component is a glass comprising B and Si. By adding a predetermined proportion of the glass comprising B and Si, the dielectric ceramic composition exhibits further desired characteristics.




Preferably, the content of the primary component is 100 parts by weight and the content of the auxiliary component is in the range of about 1 to 40 parts by weight. The dielectric ceramic composition for radiofrequency applications thereby exhibits desired characteristics.




Preferably, the dielectric ceramic composition further comprises an additive. The additive is more than 0 up to about 5 parts by weight of CuO or more than 0 up to about 15 parts by weight of TiO


2


, or both, with respect to 100 parts by weight of the primary component. The CuO additive within the above range improves sintering ability of the composition. The TiO


2


additive within the above range increases the Q value.




Preferably, the rare earth element is at least one selected from the group consisting of Y, La, Pr, Nd and Sm. These rare earth elements facilitate the formation of perovskite crystals composed of the primary component, resulting in a high Q value.




Preferably, in the above formula, Me is Ca and Ma is Mg. These elements facilitate the formation of the perovskite crystal composed of the primary component, resulting in a high Q value.




According to another aspect of the present invention, an electronic component comprises a ceramic element and conductors provided in the interior of the ceramic element. The ceramic element comprises the above-described dielectric ceramic compact. This electronic component exhibits satisfactory characteristics.




In this electronic component, the ceramic element may be formed by firing a composite of a plurality of green ceramic sheets comprising the dielectric ceramic composition.




Preferably, the conductors are formed by firing respective patterns of a conductive paste applied on the respective green ceramic sheets.




The dielectric ceramic composition according to the present invention can be sintered together with a low-resistance internal electrode material at a low sintering temperature. When this dielectric ceramic composition is used in, for example, a monolithic ceramic electronic component produced through a sintering step of a composite including green ceramic sheets provided with respective internal electrode patterns composed of a conductive paste, the internal conductors can be formed by simultaneously sintering the conductive paste and the green ceramic sheets at a low sintering temperature. Thus, the resulting monolithic ceramic electronic component exhibits superior characteristics.




Preferably, the conductors comprise Ag or Cu as the major component.




Preferably, the electronic component is a filter.











BRIEF DESCRIPTION OF THE DRAWINGS





FIG. 1

is an exploded isometric view of an LC filter as an embodiment of a monolithic ceramic electronic component according to the present invention;





FIG. 2

is an isometric outside view of the LC filter shown in

FIG. 1

; and





FIG. 3

is a circuit diagram of the LC filter shown in FIG.


1


.











DESCRIPTION OF THE PREFERRED EMBODIMENT




The dielectric ceramic composition for radiofrequency applications according to the present invention comprises a crystalline primary component having a perovskite crystal structure, and an auxiliary component. The crystalline primary component is represented by the formula:






(1


−x


)MeTi


a


O


1+2a




−x


Ln(Ma


1/2


Mb


1/2


)


b


O


(3+3b)/2








wherein Me is at least one of Ca and Sr; Ln is a rare earth element; Ma is at least one of Mg and Zn; Mb is at least one of Sn and Zr; x represents a mole fraction of Ln(Ma


1/2


Mb


1/2


)


b


O


(3+3b/2)


; and a and b represent molar ratios, wherein a, b, and x are, respectively, within the following ranges: 0.95≦a≦1.05, 0.9≦b≦1.05, and 0.3≦x≦0.5. The auxiliary component comprises B and Si for decreasing the sintering temperature of the dielectric ceramic composition to about 1,000° C. or less.




If a is outside of the range of 0.95 to 1.05, or if b is outside of the range of 0.9 to 1.05, the Q value is unsatisfactorily low. If x is less than 0.3, the temperature coefficient of the resonant frequency is undesirably large. If x exceeds 0.5, the temperature coefficient of the resonant frequency has a large negative value.




A dielectric ceramic composition satisfying the above requirements has a low sintering temperature; thus, it can be sintered with a low-resistance metal used as internal electrodes. Furthermore, the dielectric ceramic compact made of the dielectric ceramic composition exhibits superior radiofrequency characteristics, such as Q value and dielectric characteristics; hence, electronic components such as a filter and a duplexer using this dielectric ceramic composition exhibit superior characteristics.




Preferably, the auxiliary component comprises: about 10 to 60 percent by weight of SiO


2


; about 5 to 40 percent by weight of B


2


O


3


; 0 to about 30 percent by weight of Al


2


O


3


; about 20 to 70 percent by weight of EO; and 0 to about 15 percent by weight of A


2


O, wherein E is at least one of Zn and alkaline earth metal elements selected from Mg, Ca, Sr and Ba, and A is at least one alkali metal element selected from Li, Na and K.




At an SiO


2


content of less than about 10 percent by weight, the moisture resistance and the Q value decrease. At an SiO


2


content exceeding about 60%, the softening temperature of the auxiliary component such as glass is high, resulting in poor sintering ability, that is, the composition cannot be sintered at about 1,000° C. or less.




At a B


2


O


3


content of less than about 5 percent by weight, the softening temperature of the auxiliary component such as glass is high, resulting in poor sintering ability. At a B


2


O


3


content exceeding about 40 percent by weight, the moisture resistance decreases.




At an Al


2


O


3


content exceeding about 30 percent by weight, the softening temperature of the auxiliary component such as glass is high, resulting in poor sintering ability.




Regarding the alkaline earth metal oxide and zinc oxide, at a content of less than about 20 percent by weight, the softening temperature of the auxiliary component such as glass is high, resulting in poor sintering ability. At a content exceeding about 70 percent by weight, the moisture resistance and the Q value decrease.




Though addition of alkali metal oxide to the auxiliary component such as glass is effective in decreasing the sintering temperature, the moisture resistance and the Q value decrease at an alkali metal oxide content exceeding about 15 percent by weight. Thus, the alkali oxide metal content is preferably in the range of 0 to about 15 percent by weight.




Preferably, the auxiliary component is a glass comprising B and Si. By adding a predetermined proportion of the glass comprising B and Si, the dielectric ceramic composition exhibits further desired characteristics.




Preferably, the content of the primary component is 100 parts by weight and the content of the auxiliary component is in the range of about 1 to 40 parts by weight. The dielectric ceramic composition for radiofrequency applications thereby exhibits desired characteristics.




Preferably, the dielectric ceramic composition further comprises an additive. The additive is 0 to about 5 parts by weight of CuO or 0 to about 15 parts by weight of TiO


2


, or both, with respect to 100 parts by weight of the primary component. The CuO additive improves sintering ability of the composition, but the Q value decreases at a CuO content exceeding about 5 parts by weight. The TiO


2


additive increases the Q value, but the temperature coefficient of the resonant frequency is significantly large at a content exceeding about 15 parts by weight.




Preferably, the rare earth element is at least one selected from the group consisting of Y, La, Pr, Nd and Sm. These rare earth elements facilitate the formation of the perovskite crystals composed of the primary component, resulting in a high Q value.




Preferably, Me is Ca and Ma is Mg in the above formula. These elements facilitate the formation of the perovskite crystal composed of the primary component, resulting in a high Q value.




Using this dielectric ceramic composition for radiofrequency applications, electric components, such as filters and duplexers, having superior characteristics can be readily produced.





FIGS. 1

,


2


and


3


are an exploded isometric view, an isometric outside view and a circuit diagram, respectively, of a monolithic ceramic electronic component according to an embodiment of the present invention.




This monolithic ceramic electronic component


20


in

FIG. 2

is an LC filter. The monolithic ceramic electronic component


20


includes a sintered dielectric ceramic compact


21


having a circuit constituting inductors L and capacitors C therein, as described below. The sintered ceramic compact


21


of the monolithic ceramic electronic component


20


comprises the above-mentioned dielectric ceramic compact made of the dielectric ceramic composition for radiofrequency applications of the present invention. On outer faces of the sintered ceramic compact


21


, external electrodes


23




a


,


23




b


,


24




a


and


24




b


are formed. An LC circuit shown in

FIG. 3

is formed between the external electrodes


23




a


,


23




b


,


24




a


and


24




b.






The configuration of the sintered ceramic compact


21


and a method for making the same will now be described with reference to FIG.


1


.




An organic vehicle is added to the dielectric ceramic composition according to the present invention to prepare a ceramic slurry. This ceramic slurry is shaped into a green ceramic sheet by any known method such as a doctor blade process. The green ceramic sheet is dried and is punched out into a predetermined size to provide rectangular green ceramic sheets


21




a


to


21




m.






Through holes for via holes are provided in predetermined green ceramic sheets among the green ceramic sheets


21




a


to


21




m


. A conductive paste is applied onto predetermined green ceramic sheets by screen printing to form coil conductors


26




a


and


26




b


, internal electrodes for capacitors


27




a


,


27




b


and


27




c


, and coil conductors


26




c


and


26




d


. The through holes are filled with the conductive paste to form via holes


28


.




The green ceramic sheets


21




a


to


21




m


are stacked and the stack is compressed in the stacked direction to form a composite. The resulting composite is fired to form a sintered ceramic compact


21


shown in FIG.


2


.




As shown in

FIG. 2

, external electrodes


23




a


,


23




b


,


24




a


and


24




b


are formed on the sintered ceramic compact


21


to prepare the monolithic ceramic electronic component


20


. The external electrodes


23




a


,


23




b


,


24




a


and


24




b


may be formed by any process, for example, by a thick-film forming process including applying and baking a conductive paste, or a thin-film forming process such as evaporation, plating or sputtering.




In the monolithic ceramic electronic component (LC filter)


20


, the coil conductors


26




a


and


26




b


of

FIG. 1

constitute an inductor unit L


1


in

FIG. 3

, the coil conductors


26




c


and


26




d


of

FIG. 1

constitute another inductor unit L


2


in

FIG. 3

, and the internal electrodes


27




a


,


27




b


, and


27




c


of

FIG. 1

constitute capacitors C in FIG.


3


.




In the monolithic ceramic electronic component (LC filter)


20


according to this embodiment, the sintered ceramic compact


21


is formed of the dielectric ceramic composition for radiofrequency applications of the present invention. Hence, the component can be sintered at a low temperature. When a low-melting point metal, for example, Ag or Cu is used in the coil conductors


26




a


,


26




b


,


26




c


and


26




d


and the internal electrodes


27




a


,


27




b


and


27




c


for capacitors, the metal can be fired together with the green ceramic sheets. Accordingly, the LC filter can be readily produced. The LC filter is suitable for radiofrequency applications requiring a high relative dielectric constant, a high Q value at radiofrequency, and a small temperature coefficient τf of the resonant frequency.




The dielectric ceramic composition for radiofrequency applications according to the present invention can be preferably applied to filters and duplexers, as described above. The dielectric ceramic composition can also be applied to dielectric resonators and dielectric substrates for MICs.




EXAMPLES




The present invention will now be described in further detail with reference to the following examples.




1. As starting materials, calcium carbonate (CaCO


3


), strontium carbonate (SrCO


3


), titanium oxide (TiO


2


), rare earth oxides (La


2


O


3


etc.), magnesium oxide (MgO), zinc oxide (ZnO) and tin oxide (SnO


2


) are prepared.




2. These starting materials were formulated to prepare compositions having the following formula:






(1


−x


)MeTi


a


O


1+2a




−x


Ln(Ma


1/2


Mb


1/2


)


b


O


(3+3b)/2








Additionally, in Sample 39 (Table 4), Samples 66 to 70 (Table 7), Sample 113 (Table 12), Sample 140 (Table 14), and Samples 141 to 144 (Table 15), a CuO or TiO


2


additive was added to formulate raw materials containing the additive.




3. The formulated powders were mixed by a wet process in a ball mill for 16 hours, dehydrated, dried and calcined at 1,100° C. to 1,300° C. for 3 hours. The calcined powdered were pulverized in a ball mill until the particle size became less than 1 μm.




4. Meanwhile, BaCO


3


, SrCO


3


, CaCO


3


, MgCO


3


, ZnO, Al


2


O


3


, Li


2


CO


3


, Na


2


CO


3


, K


2


CO


3


, SiO


2


and B


2


O


3


were formulated according to the compositions shown in Table 16. The formulated mixtures were each placed into a PtRh crucible and melted at 1,200° C. to 1,600° C. Each melt was quenched and pulverized to form a glass material (powdered glass) as an auxiliary component. It should be noted that the composition represented by G26 in Table 16 could not be formed into glass material.




5. Each formulated powder was mixed to form a dielectric ceramic composition, and was compacted under a pressure of 1,000 kgf/cm


2


into a disk so as to have a diameter of 10 mm and a thickness of 5 mm after firing, and the disk was fired at 900° C. to 1,200° C. for 2 hours to form a dielectric ceramic compact.




6. The relative dielectric constant (εr) and the Q value at the resonant frequency (about 1 GHz) of each dielectric ceramic compact were measured by a dielectric resonator method (short-circuited at both ends of a dielectric resonator).




The results are also shown in Tables 1 to 15. In Tables 1 to 15, asterisked samples represent outside of the present invention, and the others represent within the present invention.




Tables 1 to 15 show that the dielectric ceramic compacts according to the present invention have relatively high Q values of 10,000 or more and relative dielectric constants of about 25 or more at about 1 GHz.




Tables 1 to 15 also show that the dielectric ceramic compositions according to the present invention can be sintered at low temperatures of about 1,000° C. or less.




The dielectric ceramic compositions according to the present invention can be sintered with an inexpensive metal having low resistance such as Ag or Cu as the internal electrode, and the size of a radiofrequency resonator can be reduced by stacking sheets composed of the dielectric ceramic composition.




Furthermore, electronic components, such as LC filters and duplexers produced using these dielectric ceramic compositions have satisfactory characteristics. Electronic devices such as communication apparatuses using these electronic components also have satisfactory characteristics.




While the invention has been particularly shown and described with reference to preferred embodiments and examples thereof, it will be understood by those skilled in the art that the foregoing and other changes in form and details can be made therein without departing from the spirit and the scope of the invention.


























TABLE 1

















Type of




Type




Glass




Sintering




Relative




Q Value ×















Auxiliary




of




Content




Temp.




Dielectric




1000




τf






Sample




Me




Ma




Ln




Mb




a




b




x




Component




Glass




(wt %)




(° C.)




Constant




1 GHz




(ppm/° C.)





































 1*




Ca




Mg




La




Sn




1.00




1.00




0.25









G1




10




900




46.3




9.2




51






2




Ca




0.8 Mg




La




Sn




1.00




1.00




0.30









G1




10




900




43.4




10.0




27








0.2 Zn






3




Ca




Mg




La




Sn




1.00




1.00




0.30









G1




10




900




42.6




11.8




33






 4*




Ca




Mg




La




Sn




0.90




1.00




0.35









G1




10




900




38.6




6.2




8






5




Ca




Mg




La




Sn




0.95




1.00




0.35









G1




10




900




38.9




14.3




7






 6*




Ca




Mg




La




Sn




1.00




0.85




0.35









G1




10




900




38.9




6.1




9






7




Ca




Mg




La




Sn




1.00




0.90




0.35









G1




10




900




38.8




16.8




8






8




Ca




Mg




La




Sn




1.00




1.00




0.35









G1




10




900




38.9




16.9




7






9




Ca




Mg




La




Sn




1.00




1.05




0.35









G1




10




900




38.7




15.8




8






10*




Ca




Mg




La




Sn




1.00




1.10




0.35









G1




10




900




38.8




5.9




7









































TABLE 2

















Type of




Type




Glass




Sintering




Relative




Q Value ×















Auxiliary




of




Content




Temp.




Dielectric




1000




τf






Sample




Me




Ma




Ln




Mb




a




b




x




Component




Glass




(wt %)




(° C.)




Constant




1 GHz




(ppm/° C.)





































11




Ca




Mg




La




Sn




1.05




1.00




0.35









G1




10




900




38.9




10.3




7






 12*




Ca




Mg




La




Sn




1.10




1.00




0.35









G1




10




900




38.8




3.9




9






13




Ca




0.8 Mg




La




Sn




1.00




1.00




0.40









G1




10




900




35.7




19.9




−20








0.2 Zn






14




Ca




Mg




La




Sn




1.00




1.00




0.40









G1




10




900




35.1




23.9




−17






15




Ca




Mg




La




Sn




1.00




1.00




0.45









G1




10




900




32.2




21.0




−35






16




Ca




Mg




La




Sn




1.00




1.00




0.50









G1




10




900




27.2




21.6




−50






 17*




Ca




Mg




La




Sn




1.00




1.00




0.55









G1




10




900




23.0




22.2




−70






 18*




0.8 Ca




Mg




La




Sn




0.90




1.00




0.35









G1




10




900




36.5




5.6




10







0.2 Sr






19




0.8 Ca




Mg




La




Sn




0.95




1.00




0.35









G1




10




900




36.3




11.0




8







0.2 Sr






 20*




0.8 Ca




Mg




La




Sn




1.00




0.85




0.35









G1




10




900




36.1




7.3




9







0.2 Sr









































TABLE 3

















Type of




Type




Glass




Sintering




Relative




Q Value ×















Auxiliary




of




Content




Temp.




Dielectric




1000




τf






Sample




Me




Ma




Ln




Mb




a




b




X




Component




Glass




(wt %)




(° C.)




Constant




1 GHz




(ppm/° C.)





































21




0.8 Ca




Mg




La




Sn




1.00




0.90




0.35









G1




10




900




36.3




13.7




11







0.2 Sr






22




0.8 Ca




Mg




La




Sn




1.00




1.00




0.35









G1




10




900




36.5




14.2




11







0.2 Sr






23




0.8 Ca




Mg




La




Sn




1.00




1.05




0.35









G1




10




900




36.2




12.8




10







0.2 Sr






 24*




0.8 Ca




Mg




La




Sn




1.00




1.10




0.35









G1




10




900




36.3




6.6




9







0.2 Sr






25




0.8 Ca




Mg




La




Sn




1.00




1.05




0.35









G1




10




900




36.1




12.4




10







0.2 Sr






 26*




0.8 Ca




Mg




La




Sn




1.00




1.10




0.35









G1




10




900




36.2




4.5




8







0.2 Sr






27




Ca




Mg




Y




Sn




1.00




1.00




0.35









G1




10




900




37.2




16.7




6






28




Ca




Mg




0.1 Y




Sn




1.00




1.00




0.35









G1




10




900




38.6




16.7




7









0.9 La






29




Ca




Mg




0.3 Y




Sn




1.00




1.00




0.35









G1




10




900




38.1




16.7




7









0.7 La






30




Ca




Mg




Pr




Sn




1.00




1.00




0.35









G1




10




900




38.6




17.0




8









































TABLE 4

















Type of




Type




Glass




Sintering




Relative




Q Value ×















Auxiliary




of




Content




Temp.




Dielectric




1000




τf






Sample




Me




Ma




Ln




Mb




a




b




x




Component




Glass




(wt %)




(° C.)




Constant




1 GHz




(ppm/° C.)





































31




Ca




Mg




0.1 Pr




Sn




1.00




1.00




0.35









G1




10




900




38.8




10.9




9









0.9 La






32




Ca




Mg




0.3 Pr




Sn




1.00




1.00




0.35









G1




10




900




38.4




17.0




8









0.7 La






33




Ca




Mg




Nd




Sn




1.00




1.00




0.35









G1




10




900




38.3




17.5




8






34




Ca




Mg




0.1 Nd




Sn




1.00




1.00




0.35









G1




10




900




38.5




16.6




9









0.9 La






35




Ca




Mg




0.3 Nd




Sn




1.00




1.00




0.35









G1




10




900




37.9




16.9




8









0.7 La






36




Ca




Mg




Sm




Sn




1.00




1.00




0.35









G1




10




900




37.2




17.6




11






37




Ca




Mg




0.1 Sm




Sn




1.00




1.00




0.35









G1




10




900




38.3




17.0




10









0.9 La






38




Ca




Mg




0.3 Sm




Sn




1.00




1.00




0.35









G1




10




900




37.9




17.2




9









0.7 La






39




Ca




Mg




La




Sn




1.00




1.00




0.35




TiO


2






G1




10




900




39.0




18.5




14






40




Ca




Mg




La




Sn




1.00




1.00




0.35









G2




10




900




37.9




18.0




9









































TABLE 5

















Type of




Type




Glass




Sintering




Relative




Q Value ×















Auxiliary




of




Content




Temp.




Dielectric




1000




τf






Sample




Me




Ma




Ln




Mb




a




b




x




Component




Glass




(wt %)




(° C.)




Constant




1 GHz




(ppm/° C.)





































 41*




Ca




Mg




La




Sn




1.00




1.00




0.35









G3




10




900




37.8




18.1




11






42




Ca




Mg




La




Sn




1.00




1.00




0.35









G4




10




900




37.9




18.2




4






 43*




Ca




Mg




La




Sn




1.00




1.00




0.35









G5




10




900




38.4




18.1




4






 44*




Ca




Mg




La




Sn




1.00




1.00




0.35









G6




10




900




37.8




16.0




−1






45




Ca




Mg




La




Sn




1.00




1.00




0.35









G7




10




900




39.5




14.0




−6






46




Ca




Mg




La




Sn




1.00




1.00




0.35









G8




10




900




38.5




16.0




3






 47*




Ca




Mg




La




Sn




1.00




1.00




0.35









G9




10




900




38.4




12.0




6






48




Ca




Mg




La




Sn




1.00




1.00




0.35









G10




10




900




38.8




16.0




6






49




Ca




Mg




La




Sn




1.00




1.00




0.35









G11




10




900




38.8




15.5




5






50




Ca




Mg




La




Sn




1.00




1.00




0.35









G12




10




900




39.5




17.0




2









































TABLE 6

















Type of




Type




Glass




Sintering




Relative




Q Value ×















Auxiliary




of




Content




Temp.




Dielectric




1000




τf






Sample




Me




Ma




Ln




Mb




a




b




x




Component




Glass




(wt %)




(° C.)




Constant




1 GHz




(ppm/° C.)





































 51*




Ca




Mg




La




Sn




1.00




1.00




0.35









G13




10




900




38.8




16.5




9






52




Ca




Mg




La




Sn




1.00




1.00




0.35









G14




10




900




40.1




11.1




13






53




Ca




Mg




La




Sn




1.00




1.00




0.35









G15




10




900




39.4




12.4




7






54




Ca




Mg




La




Sn




1.00




1.00




0.35









G16




10




900




39.2




15.2




9






55




Ca




Mg




La




Sn




1.00




1.00




0.35









G17




10




900




38.9




15.9




7






56




Ca




Mg




La




Sn




1.00




1.00




0.35









G18




10




900




36.9




13.9




2






 57*




Ca




Mg




La




Sn




1.00




1.00




0.35









G19




10




900




35.8




13.0




−1






58




Ca




Mg




La




Sn




1.00




1.00




0.35









G20




10




900




39.7




15.2




−2






59




Ca




Mg




La




Sn




1.00




1.00




0.35









G21




10




900




39.0




15.5




2






60




Ca




Mg




La




Sn




1.00




1.00




0.35









G22




10




900




37.5




15.3




4










































TABLE 7


















Auxiliary





Glass




Sintering




Relative




Q Value ×
















Content




Type of




Content




Temp.




Dielectric




1000




τf






Sample




Me




Ma




Ln




Mb




a




b




x




Auxiliary




(wt %)




Glass




(wt %)




(° C.)




Constant




1 GHz




(ppm/° C.)






































61




Ca




Mg




La




Sn




1.00




1.00




0.35














G23




10




900




37.5




16.2




6






 62*




Ca




Mg




La




Sn




1.00




1.00




0.35














G14




0.5




1000 




**




**




**






63




Ca




Mg




La




Sn




1.00




1.00




0.35














G14




1




1000 




45.0




22.0




10






64




Ca




Mg




La




Sn




1.00




1.00




0.35














G12




40




900




30.2




10.0




−10






 65*




Ca




Mg




La




Sn




1.00




1.00




0.35














G12




50




900




26.8




6.2 




−15






66




Ca




Mg




La




Sn




1.00




1.00




0.35




TiO


2






15




G1




10




900




42.0




15.0




35






 67*




Ca




Mg




La




Sn




1.00




1.00




0.35




TiO


2






20




G1




10




900




45.0




14.0




55






68




Ca




Mg




La




Sn




1.00




1.00




0.35




CuO




 5




G1




10




900




40.2




10.1




−15






 69*




Ca




Mg




La




Sn




1.00




1.00




0.35




CuO




10




G1




10




900




43.0




2.0 




−30






70




Ca




Mg




La




Sn




1.00




1.00




0.35




CuO




 1




G1




10




900




39.9




15.0




7











**Unsinterable








































TABLE 8

















Type of




Type




Glass




Sintering




Relative




Q Value ×















Auxiliary




of




Content




Temp.




Dielectric




1000




τf






Sample




Me




Ma




Ln




Mb




a




b




x




Component




Glass




(wt %)




(° C.)




Constant




1 GHz




(ppm/° C.)





































 71*




Ca




Mg




La




Zr




1.00




1.00




0.275









G1




10




900




51.5




8.8




50






72




Ca




0.8 Mg




La




Zr




1.00




1.00




0.30









G1




10




900




49.5




11.3




36








0.2 Zn






73




Ca




Mg




La




Zr




1.00




1.00




0.30









G1




10




900




48.9




12.6




40






74




Ca




Mg




La




Zr




1.00




1.00




0.325









G1




10




900




46.8




14.8




30






75




Ca




Mg




La




Zr




1.00




1.00




0.35









G1




10




900




44.4




16.6




24






76




Ca




Mg




La




Zr




1.00




1.00




0.375









G1




10




900




42.0




17.0




9






 77*




Ca




Mg




La




Zr




0.90




1.00




0.40









G1




10




900




40.3




7.3




−2






78




Ca




Mg




La




Zr




0.95




1.00




0.40









G1




10




900




40.4




16.1




−2






 79*




Ca




Mg




La




Zr




1.00




0.85




0.40









G1




10




900




40.3




8.6




−3






80




Ca




Mg




La




Zr




1.00




0.90




0.40









G1




10




900




40.3




18.1




−1









































TABLE 9

















Type of




Type




Glass




Sintering




Relative




Q Value ×















Auxiliary




of




Content




Temp.




Dielectric




1000




τf






Sample




Me




Ma




Ln




Mb




a




b




x




Component




Glass




(wt %)




(° C.)




Constant




1 GHz




(ppm/° C.)





































81




Ca




Mg




La




Zr




1.00




1.00




0.40









G1




10




900




40.4




17.8




−2






82




Ca




Mg




La




Zr




1.00




1.05




0.40









G1




10




900




40.2




16.6




−1






 83*




Ca




Mg




La




Zr




1.00




1.10




0.40









G1




10




900




40.3




7.0




−3






84




Ca




Mg




La




Zr




1.05




1.00




0.40









G1




10




900




40.3




13.6




−2






 85*




Ca




Mg




La




Zr




1.10




1.00




0.40









G1




10




900




40.2




5.9




−1






86




Ca




Mg




La




Zr




1.00




1.00




0.425









G1




10




900




38.1




18.5




−18






87




Ca




0.8 Mg




La




Zr




1.00




1.00




0.425









G1




10




900




38.8




16.3




−20








0.2 Zn






88




Ca




Mg




La




Zr




1.00




1.00




0.45









G1




10




900




36.5




19.0




−30






89




Ca




Mg




La




Zr




1.00




1.00




0.475









G1




10




900




35.0




19.8




−31






90




Ca




Mg




La




Zr




1.00




1.00




0.50









G1




10




900




32.8




20.9




−50









































TABLE 10

















Type of




Type




Glass




Sintering




Relative




Q Value ×















Auxiliary




of




Content




Temp.




Dielectric




1000




τf






Sample




Me




Ma




Ln




Mb




a




b




x




Component




Glass




(wt %)




(° C.)




Constant




1 GHz




(ppm/° C.)





































 91*




Ca




Mg




La




Zr




1.00




1.00




0.55









G1




10




900




30.9




21.3




−65






 92*




0.8 Ca




Mg




La




Zr




0.90




1.00




0.40









G1




10




900




38.2




7.2




0







0.2 Sr






93




0.8 Ca




Mg




La




Zr




0.95




1.00




0.40









G1




10




900




38.3




11.8




0







0.2 Sr






 94*




0.8 Ca




Mg




La




Zr




1.00




0.85




0.40









G1




10




900




38.2




4.6




1







0.2 Sr






95




0.8 Ca




Mg




La




Zr




1.00




0.90




0.40









G1




10




900




38.2




12.8




0







0.2 Sr






96




0.8 Ca




Mg




La




Zr




1.00




1.00




0.40









G1




10




900




38.3




14.3




1







0.2 Sr






97




0.8 Ca




Mg




La




Zr




1.00




1.05




0.40









G1




10




900




38.3




13.4




0







0.2 Sr






 98*




0.8 Ca




Mg




La




Zr




1.00




1.10




0.40









G1




10




900




38.2




6.4




1







0.2 Sr






99




0.8 Ca




Mg




La




Zr




1.05




1.00




0.40









G1




10




900




38.3




10.2




1







0.2 Sr






100*




0.8 Ca




Mg




La




Zr




1.10




1.00




0.40









G1




10




900




38.2




4.3




2







0.2 Sr









































TABLE 11

















Type of





Glass




Sintering




Relative




Q Value















Auxiliary




Type of




Content




Temp.




Dielectric




× 1000




τf






Sample




Me




Ma




Ln




Mb




a




b




x




Component




Glass




(wt %)




(° C.)




Constant




1 GHz




(ppm/° C.)





































101




Ca




Mg




Y




Zr




1.00




1.00




0.40









G1




10




900




39.4




17.2




−2






102




Ca




Mg




0.1 Y




Zr




1.00




1.00




0.40









G1




10




900




39.4




17.0




−2









0.9 La






103




Ca




Mg




0.3 Y




Zr




1.00




1.00




0.40









G1




10




900




40.2




16.7




−3









0.7 La






104




Ca




Mg




Pr




Zr




1.00




1.00




0.40









G1




10




900




39.8




17.3




−2






105




Ca




Mg




0.1 Pr




Zr




1.00




1.00




0.40









G1




10




900




40.2




17.2




−1









0.9 La






106




Ca




Mg




0.3 Pr




Zr




1.00




1.00




0.40









G1




10




900




39.9




17.0




−2









0.7 La






107




Ca




Mg




Nd




Zr




1.00




1.00




0.40









G1




10




900




39.6




18.1




−3






108




Ca




Mg




0.1 Nd




Zr




1.00




1.00




0.40









G1




10




900




40.1




17.8




−2









0.9 La






109




Ca




Mg




0.3 Nd




Zr




1.00




1.00




0.40









G1




10




900




40.2




17.7




−2









0.7 La






110




Ca




Mg




Sm




Zr




1.00




1.00




0.40









G1




10




900




38.9




17.3




1









































TABLE 12

















Type of





Glass




Sintering




Relative




Q Value















Auxiliary




Type of




Content




Temp.




Dielectric




× 1000




τf






Sample




Me




Ma




Ln




Mb




a




b




x




Component




Glass




(wt %)




(° C.)




Constant




1 GHz




(ppm/° C.)





































111




Ca




Mg




0.1 Sm




Zr




1.00




1.00




0.40









G1




10




900




39.9




17.2




0









0.9 La






112




Ca




Mg




0.3 Sm




Zr




1.00




1.00




0.40









G1




10




900




39.5




17.0




0









0.7 La






113




Ca




Mg




La




Zr




1.00




1.00




0.40




TiO


2






G1




10




900




41.0




19.0




3














(5 wt. %)






114




Ca




Mg




La




Zr




1.00




1.00




0.40









G2




10




900




39.5




18.0




0






115*




Ca




Mg




La




Zr




1.00




1.00




0.40









G3




10




900




39.5




19.8




2






116




Ca




Mg




La




Zr




1.00




1.00




0.40









G4




10




900




39.4




21.1




−5






117*




Ca




Mg




La




Zr




1.00




1.00




0.40









G5




10




900




40.1




20.0




−5






118*




Ca




Mg




La




Zr




1.00




1.00




0.40









G6




10




900




39.8




16.8




−10






119




Ca




Mg




La




Zr




1.00




1.00




0.40









G7




10




900




41.0




13.5




−15






120




Ca




Mg




La




Zr




1.00




1.00




0.40









G8




10




900




40.5




17.0




−5









































TABLE 13

















Type of





Glass




Sintering




Relative




Q Value















Auxiliary




Type of




Content




Temp.




Dielectric




× 1000




τf






Sample




Me




Ma




Ln




Mb




a




b




x




Component




Glass




(wt %)




(° C.)




Constant




1 GHz




(ppm/° C.)





































121*




Ca




Mg




La




Zr




1.00




1.00




0.40









G9




10




900




40.4




12.0




−3






122




Ca




Mg




La




Zr




1.00




1.00




0.40









G10




10




900




40.5




17.2




−3






123




Ca




Mg




La




Zr




1.00




1.00




0.40









G11




10




900




40.3




16.8




−4






124




Ca




Mg




La




Zr




1.00




1.00




0.40









G12




10




900




41.2




18.0




−7






125*




Ca




Mg




La




Zr




1.00




1.00




0.40









G13




10




900




40.5




17.1




0






126




Ca




Mg




La




Zr




1.00




1.00




0.40









G14




10




900




41.6




12.0




4






127




Ca




Mg




La




Zr




1.00




1.00




0.40









G15




10




900




40.4




13.5




−2






128




Ca




Mg




La




Zr




1.00




1.00




0.40









G16




10




900




40.4




15.6




0






129




Ca




Mg




La




Zr




1.00




1.00




0.40









G17




10




900




39.9




16.5




−2






130




Ca




Mg




La




Zr




1.00




1.00




0.40









G18




10




900




38.5




14.8




−7









































TABLE 14



















Glass




Sintering




Relative




Q Value















Auxiliary




Type of




Content




Temp.




Dielectric




× 1000




τf






Sample




Me




Ma




Ln




Mb




a




b




x




Component




Glass




(wt %)




(° C.)




Constant




1 GHz




(ppm/° C.)





































131*




Ca




Mg




La




Zr




1.00




1.00




0.40









G19




10




900




38.0




14.3




−10






132




Ca




Mg




La




Zr




1.00




1.00




0.40









G20




10




900




41.0




16.0




−10






133




Ca




Mg




La




Zr




1.00




1.00




0.40









G21




10




900




40.3




17.0




−7






134




Ca




Mg




La




Zr




1.00




1.00




0.40









G22




10




900




40.0




16.2




−5






135




Ca




Mg




La




Zr




1.00




1.00




0.40









G23




10




900




39.9




17.8




−2






136*




Ca




Mg




La




Zr




1.00




1.00




0.40









G14




0.5




1000




**




**




**






137




Ca




Mg




La




Zr




1.00




1.00




0.40









G14




1




1000




47.0




23.1




2






138




Ca




Mg




La




Zr




1.00




1.00




0.40









G12




40




900




31.1




10.1




−18






139*




Ca




Mg




La




Zr




1.00




1.00




0.40









G12




50




900




27.0




5.8




−25






140




Ca




Mg




La




Zr




1.00




1.00




0.40




TiO


2






G1




10




900




42.5




19.0




30














(15 w %)











**Unsinterable









































TABLE 15


















Auxiliary








Q















Type of




Component




Type




Glass




Sintering




Relative




Value ×














Auxiliary




Content




of




Content




Temp.




Dielectric




1000




τf






Sample




Me




Ma




Ln




Mb




a




b




x




Component




(wt %)




Glass




(wt %)




(° C.)




Constant




1 GHz




(ppm/° C.)






































141*




Ca




Mg




La




Zr




1.00




1.00




0.40




TiO


2






20




G1




10




900




43.2




18.5




55






142




Ca




Mg




La




Zr




1.00




1.00




0.40




CuO




5




G1




10




900




41.2




10.5




−20






143*




Ca




Mg




La




Zr




1.00




1.00




0.40




CuO




10




G1




10




900




44.0




2.4




−30






144




Ca




Mg




La




Zr




1.00




1.00




0.40




CuO




1




G1




10




900




41.8




18.9




0






145




Ca




Mg




La




Zr




1.00




1.00




0.40














G24




10




900




35.0




23.0




−16






146




Ca




Mg




La




Zr




1.00




1.00




0.40














G25




15




900




30.0




15.0




−20







































TABLE 16











SiO


2






B


2


O


3






K


2


O




Li


2


O




Na


2


O




BaO




SrO




MgO




CaO




ZnO




Al


2


O


3





































G1




25




30









10





























35











G2




10




40









10





























40











G3*




5




40









10





























45











G4




50




20









10





























20











G5*




70




10









10





























10











G6*




50




2









15





























33











G7




40




5









15









20



















20











G8




20




50









10





























20











G9*




10




70









10









 5



















10











G10




25




30




10


































35











G11




25




30














10
























35











G12




25




40







































35











G13*




15




30









20





























35











G14




25




35









10









30































G15




25




35









10














30


























G16




25




35









10



















30





















G17




25




35









10
























30
















G18




15




10









 5





























70











G19*




10




5









 5





























80











G20




25




30









10














20














15











G21




25




30









10



















20









15











G22




25




30









10
























15




20











G23




25




30









 5



















10




10




20











G24




24




30









10





























35




 1






G25




10




20









10





























30




30






G26*




5




20









10





























15




50


















Claims
  • 1. A dielectric ceramic composition for radiofrequency applications comprising a crystalline primary component having a perovskite crystal structure and an auxiliary component,wherein the crystalline primary component is represented by the formula: (1−x)MeTiaO1+2a−xLn(Ma1/2Mb1/2)bO(3+3b)/2 in which Me is at least one of Ca and Sr; Ln is a rare earth element; Ma is at least one of Mg and Zn; Mb is at least one of Sn and Zr; x represents a mole fraction of Ln(Ma1/2Mb1/2)bO(3+3b)/2; andand wherein a, b, and x are, respectively, 0.95≦a≦1.05, 0.9≦b≦1.05, and0.3≦x≦0.5, and wherein the auxiliary component comprises B and Si.
  • 2. The dielectric ceramic composition according to claim 1, wherein the auxiliary component is a glass comprising B and Si.
  • 3. The dielectric ceramic composition according to claim 2, wherein the auxiliary component comprises:about 10 to 60 percent by weight of SiO2; about 5 to 40 percent by weight of B2O3; 0 to about 30 percent by weight of Al2O3; about 20 to 70 percent by weight of EO; and 0 to about 15 percent by weight of A2O, wherein E is at least one of Zn or an alkaline earth metal element, and A is at least one alkali metal element.
  • 4. The dielectric ceramic composition according to claim 3, wherein the content of the auxiliary component is in the range of about 1 to 40 parts by weight per 100 parts by weight of the primary component.
  • 5. The dielectric ceramic composition according to claim 4, further comprising an additive which is at least one of CuO and TiO2, in an amount with respect to 100 parts by weight of the primary component of up to about 5 parts by weight of CuO and up to about 15 parts by weight of TiO2.
  • 6. The dielectric ceramic composition according to claim 5, wherein the rare earth element is at least one member selected from the group consisting of Y, La, Pr, Nd and Sm.
  • 7. The dielectric ceramic composition according to claim 6, wherein Me is Ca and Ma is Mg.
  • 8. A dielectric ceramic compact for radiofrequency applications comprising a sintered dielectric ceramic composition according to claim 7.
  • 9. An electronic component comprising a ceramic element having at least one conductor disposed in the interior of the ceramic element, wherein the ceramic element is a sintered composite of a plurality of green ceramic sheets comprising a dielectric ceramic compact according to claim 8.
  • 10. The electronic component according to claim 9, wherein the conductor comprises Ag or Cu.
  • 11. The dielectric ceramic composition according to claim 1, further comprising an additive which is at least one of CuO and TiO2, in an amount with respect to 100 parts by weight of the primary component of up to about 5 parts by weight of CuO and up to about 15 parts by weight of TiO2.
  • 12. The dielectric ceramic composition according to claim 1, wherein the rare earth element is at least one member selected from the group consisting of Y, La, Pr, Nd and Sm.
  • 13. The dielectric ceramic composition according to claim 1, wherein Me is Ca and Ma is Mg.
  • 14. The dielectric ceramic composition according to claim 1, wherein the auxiliary component comprises:about 10 to 60 percent by weight of SiO2; about 5 to 40 percent by weight of B2O3; 0 to about 30 percent by weight of Al2O3; about 20 to 70 percent by weight of EO; and 0 to about 15 percent by weight of A2O, wherein E is at least one of Zn or an alkaline earth metal element, and A is at least one alkali metal element.
  • 15. A dielectric ceramic compact for radiofrequency applications comprising a sintered dielectric ceramic composition according to claim 1.
  • 16. An electronic component comprising a ceramic element having at least one conductor disposed in the interior of the ceramic element, wherein the ceramic element comprises a dielectric ceramic compact according to claim 15.
  • 17. An electronic component according to claim 16, wherein the ceramic element is a sintered composite of a plurality of green ceramic sheets comprising said dielectric ceramic compact.
  • 18. The electronic component according to claim 17, wherein the conductor is a fired pattern of a conductive paste disposed on a sintered green ceramic sheet.
  • 19. The electronic component according to claim 18, wherein the conductor comprises Ag or Cu.
  • 20. The electronic component according to claim 15, wherein the electronic component is a filter.
Priority Claims (1)
Number Date Country Kind
2001-114254 Apr 2001 JP
US Referenced Citations (3)
Number Name Date Kind
5998314 Sugimoto Dec 1999 A
6143680 Okawa Nov 2000 A
6385035 Matoba et al. May 2002 B1
Foreign Referenced Citations (2)
Number Date Country
61-256775 Nov 1986 JP
2001-097770 Apr 2001 JP