Dielectric ceramic composition

BACKGROUND OF THE INVENTION
1. Field of the Invention
The present invention relates to a dielectric ceramic composition, and in particular one that may be used for a ceramic capacitor for temperature compensation, for a resonator, and the like.
2. Description of the Prior Art
Ceramic capacitors for temperature compensation have heretofore been used for accomplishing tuning and resonance in a variety of electric devices. It has been desired to develop a capacitor which is small in size, has a small dielectric loss and has stable dielectric properties.
To meet the requirements for realizing a ceramic capacitor in a small size, the dielectric ceramic must have a large dielectric constant, a small dielectric loss (or, in other words, a large Q-value) and a small change in the dielectric constant despite a change in the temperature. In regard to reliability, the dielectric ceramic must be chemically stable, must have a large mechanical strength, and must have a large strength against thermal shock.
As the dielectric ceramic of this type, a material of the system of BaO--RE.sub.2 O.sub.3 --TiO.sub.2 (wherein RE.sub.2 O.sub.3 is an oxide of a rare earth element, the same holds hereinafter) has been extensively used. There has, for instance, been known a BaO--Nd.sub.2 O.sub.3 --TiO.sub.2 system material (see Japanese Patent Publication No. 20280/1975). The material of this system exhibits a dielectric constant of as large as about 55 to 95 and a temperature coefficient of capacitance TCC from -212 to +124 ppm/.degree.C.
There has further been known a BaO--(Nd.sub.2 O.sub.3 Sm.sub.2 O.sub.3)--TiO.sub.2 system material (Japanese Laid-Open Patent Publication No. 21010/1982) having a dielectric constant of from 50 to 95 and a TCC of from -400 to +900 ppm/.degree.C.
However, the BaO--RE.sub.2 O.sub.3 --TiO.sub.2 system material involves a problem in that it is difficult to confine the temperature coefficient of capacitance TCC from -30 to +30 ppm/.degree.C. and at the same time maintain a high dielectric constant. When it is attempted to confine the temperature coefficient of capacitance TCC from -30 to +30 ppm/.degree.C. yet maintain a high dielectric constant, the ceramic composition loses its sintering property. In order to stabilize the sintering property, therefore, a sintering aid such as SiO.sub.2 has heretofore been added. Such addition is accompanied, however, by problems such as a decrease in the dielectric constant .epsilon. r, deterioration in the temperature coefficient of capacitance TCC and loss of dielectric properties.
SUMMARY OF THE INVENTION
The present invention was contrived in view of the above-mentioned defects. An object of the present invention is to provide a stable dielectric ceramic composition which makes it possible to obtain a small capacitor having a large capacitance and improved reliability, and which further exhibits a dielectric constant .epsilon. r of as large as 50 or more, a Q-value of as large as 3000 or more, and a temperature coefficient of capacitance TCC as small as not larger than .+-.30 ppm/.degree.C.
The present inventors have forwarded the study concerning the sintering property and dielectric property of a dielectric composition of the above-mentioned Ba--Nd--Ti system, and have discovered that there can be obtained a dielectric ceramic composition exhibiting stable sintering property, a temperature coefficient of capacitance TCC of not larger than 0.+-.30 ppm/.degree.C. and excellent properties without the need of adding sintering aids such as SiO.sub.2 and the like if the amount of sodium is lowered by using starting materials containing small amounts of sodium and if the amounts of the components are selected to lie within predetermined ranges.
That is, the starting TiO.sub.2 (starting TiO.sub.2 that is obtained by the sulfuric acid method and is widely used in industries) contains sodium in an amount of about 0.05% by weight. Besides, a sodium carboxylate type dispersing agent that is used for dispersing powders in the slurry for preparing a green sheet by the doctor bade method, contains sodium in an amount of about 5.00% by weight. Therefore, the dielectric ceramic contains sodium in a total amount of about 0.20% by weight. When the amount of sodium exceeds 0.1% by weight, the sintering property is deteriorated and the temperature coefficient of capacitance TCC is deteriorated, too. According to the present invention, however, the amount of sodium is suppressed to be not larger than 0.1% by weight, in order to improve sintering property as well as dielectric property.
According to the present invention, there is provided a dielectric ceramic composition comprising a composite oxide containing, as metal elements, main components of (i) barium, (ii) rare earth elements, such as neodymium (Nd) or Nd and Sm in combination, and (iii) elements of Group IV of the periodic table, such as titanium (Ti) or Ti and Zr or Sn in combination, and an assistant component of manganese, wherein the main components comprise from 7.5 to 16.25 mol % of a barium oxide, from 16.75 to 23.75 mol % of an oxide of a rare earth element, and from 67 to 71.66 mol % of an oxide of an element of the Group IV reckoned as a molar composition of the three-component-based oxide, the manganese component is contained in an amount of from 0.01 to 0.5% by weight reckoned as MnC03 with respect to the main components, and sodium component which is an impurity is contained in an amount of not larger than 0.10% by weight with respect to the whole amount.
According to a preferred embodiment of the present invention, the above-mentioned main components have a molar composition represented by the following formula
xBaO.multidot.yNd.sub.2 O.sub.3 .multidot.zTiO.sub.2 ( 1)
wherein x, y and z are numbers satisfying the following relations,
x+y+z=100,
x.gtoreq.7.5,
x.ltoreq.12.5,
y.gtoreq.20.0,
z.gtoreq.67.0,
y.ltoreq.0.4286z-5.7143,
and
z.ltoreq.-0.6667x+76.25,
and, preferably, the crystalline phase contains an Nd.sub.4 Ti.sub.9 O.sub.24 phase and an Nd.sub.2 Ti.sub.2 O.sub.7 phase.
According to another preferred embodiment of the present invention, the above-mentioned main components have a molar composition represented by the following formula
xBaO.multidot.y[(1-b)Nd.sub.2 O.sub.3 +bSm.sub.2 O.sub.3 ].multidot.zTiO.sub.2 ( 2)
wherein x, y and z are numbers satisfying the following relations,
x+y+z=100,
x.gtoreq.7.5,
z.gtoreq.67.0,
z.ltoreq.71.25,
y.gtoreq.0.5x+23.75,
y.ltoreq.0.3333z+0.1667,
and
x.ltoreq.-5y+100,
and b is a number satisfying the following relation,
0.05.ltoreq.b<1.
According to a further preferred embodiment of the present invention, the above-mentioned main components have a molar composition represented by the following formula
xBaO.multidot.yNd.sub.2 O.sub.3 .multidot.z[1-c)TiO.sub.2 +cMeO.sub.2 ](3)
wherein Me is Zr and/or Sn, and x, y and z are numbers satisfying the following relations,
y.gtoreq.7.5,
y.ltoreq.22.5,
z.gtoreq.67.0,
z.ltoreq.-0.495x+76.2312,
and
x.gtoreq.1.006z-62.9217,
and c is a number satisfying the following relation,
0<c<1.

BRIEF DESCRIPTION OF THE DRAWINGS
FIG. 1 is a TERNARY diagram illustrating preferred ranges of a molar composition of the system of BaO--Nd.sub.2 O.sub.3 --TiO.sub.2 according to the present invention;
FIG. 2 is a TERNARY diagram illustrating a relationship between the BaO--Nd.sub.2 O.sub.3 --TiO.sub.2 system composition and the dielectric constant .epsilon. r;
FIG. 3 is a TERNARY diagram illustrating a relationship between the BaO--Nd.sub.2 O.sub.3 --TiO.sub.2 system composition and the temperature coefficient of capacitance TCC;
FIG. 4 is a TERNARY diagram illustrating preferred ranges of a molar composition of the system of BaO--(Nd.sub.2 O.sub.3 .multidot.Sm.sub.2 O.sub.3)--TiO.sub.2 according to the present invention; and
FIG. 5 is a TERNARY diagram illustrating preferred ranges of a molar composition of the system of BaO--Nd.sub.2 O.sub.3 --(TiO.sub.2 +MeO.sub.2) according to the present invention.

DETAILED DESCRIPTION OF PREFERRED EMBODIMENTS
A composite oxide of the present invention contains BaO, Nd.sub.2 O.sub.3 and TiO.sub.2 as main components and contains manganese as an auxiliary component. Here, however, Nd.sub.2 O.sub.3 in the main components may be partly substituted by Sm.sub.2 O.sub.3, and TiO.sub.2 may be partly substituted by ZrO.sub.2 or SnO.sub.2.
In a composition in accordance with the present invention, the amount of sodium which is an impurity is decreased to be not larger than 0.10% by weight with respect to the whole amount. This is because when the amount of sodium is larger than 0.10% by weight with respect to the whole amount, the sintering property is-deteriorated, the dielectric constant decreases, the Q-value decreases, and the temperature coefficient of capacitance is deteriorated. It is particularly desirable that the amount of sodium is not larger than 0.05% by weight with respect to the whole amount.
The amount of sodium can be decreased by using powders of BaO (or BaCO.sub.3), Nd.sub.2 O.sub.3 and TiO.sub.2 of high purity as starting materials, or by using starting materials containing sodium in small amounts, by repeating the calcining to vaporize sodium, and by using a dispersing agent and an organic sticking agent (binder) containing sodium in small amounts at the time of pulverization or molding.
The amount x of BaO is selected to be 7.50.ltoreq.x.ltoreq.16.25 in terms of a three-component-based molar ratio in the main components. This is because when the amount x of BaO is smaller than 7.50, the dielectric constant becomes smaller than 50, and when the amount x is larger than 16.25, the temperature coefficient of capacitance TCC is deteriorated. The dielectric constant increases with an increase in the amount of BaO.
The amount y of a rare earth element oxide (Re.sub.2 O.sub.3 :Re is a rare earth element) including Nd.sub.2 O.sub.3 is selected to be 16.75.ltoreq.y.ltoreq.23.75. This is because when the amount y of Re.sub.2 O.sub.3 is smaller than 16.75 or is larger than 23.75, the temperature coefficient of capacitance TCC is deteriorated.
Furthermore, the amount z of TiO.sub.2 or TiO.sub.2 +MeO.sub.2 (where Me is Zr or Sn) is selected to be 67.00.ltoreq.z.ltoreq.71.66. This is because when the amount z of TiO.sub.2 is smaller than 67.00, the sintering property and temperature coefficient of capacitance TCC are deteriorated and when the amount z is larger than 71.66, the temperature coefficient of capacitance TCC is deteriorated.
Moreover, manganese is contained in an amount of from 0.01 to 0.50% by weight reckoned as MnCO.sub.3 with respect to the main components. This is because when the amount of manganese is smaller than 0.01% by weight or is larger than 0.50% by weight, the Q-value decreases. When manganese is contained in an amount of from 0.05 to 0.50% by weight reckoned as MnCO.sub.3, the Q-value becomes greater than 4000, which is very desirable. When manganese is contained in an amount of from 0.10 to 0.50% by weight reckoned as MnCO.sub.3, the Q-value becomes greater than 5000, which is more desirable.
It is desired that silicon is contained in an amount which is not larger than 0.05% by weight reckoned as SiO.sub.2 with respect to the whole amount. When the amount of silicon becomes greater than 0.05% by weight reckoned as SiO.sub.2, the Q-value tends to decrease. It is particularly preferred that the amount of silicon be not larger than 0.03% by weight, reckoned as SiO.sub.2, with respect to the whole amount.
A preferred ceramic composition (I) of the present invention has a composition represented by the above-mentioned formula (1). The composition range specified by inequalities lies over a region of FIG. 1 surrounded by lines that connect the following points.
______________________________________x y z______________________________________A 12.50 20.00 67.50B 12.50 20.50 67.00C 10.00 23.00 67.00D 7.50 23.75 68.75E 7.50 21.25 71.25F 11.25 20.00 68.75______________________________________
It is desired that the amount of rare earth element (excluding neodymium) which is an impurity is not larger than 2.5% by weight, reckoned as an oxide, with respect to the whole amount. It is further desired that the amount of silicon which is an impurity is not larger than 0.05 % by weight, reckoned as SiO.sub.2, in the whole amount.
The composition comprises BaO (or BaCO.sub.3), Nd.sub.2 O.sub.3 and TiO.sub.2, and chiefly precipitates a crystalline phase BaNd.sub.2 Ti.sub.4 O.sub.12 upon firing and forms Nd.sub.2 Ti.sub.2 O.sub.7 and Nd.sub.4 Ti.sub.9 O.sub.24 to exhibit improved sintering properties and dielectric properties such as temperature coefficient of capacitance TCC.
The composition in which the Nd.sub.2 Ti.sub.2 O.sub.7 phase is formed in the crystalline phase exhibits the temperature coefficient of capacitance TCC that is shifted toward the plus side and is brought close to 0 in contrast with the BaNd.sub.2 Ti.sub.4 O.sub.12 phase that has a minus temperature coefficient of capacitance TCC. Moreover, formation of the Nd.sub.4 Ti.sub.9 O.sub.24 phase is to improve the sintering property. The amount of the Nd.sub.2 Ti.sub.2 O.sub.7 phase and the amount of the Nd.sub.4 TiO.sub.9 O.sub.24 phase can be adjusted by adjusting the mixing amounts of BaO (or BaCO.sub.3), Nd.sub.2 O.sub.3 and TiO.sub.2 which are starting materials.
In this composition, it is desired that the amount of rare earth element (excluding neodymium) which is an impurity is not larger than 2.5% by weight reckoned as an oxide with respect to the whole amount. This is because when the amount of rare earth element is not larger than 2.5% by weight reckoned as an oxide with respect to the whole amount, the dielectric property is not affected. It is desired that the amount of rare earth element is not larger than 1.0% by weight reckoned as an oxide with respect to the whole amount. Rare earth elements which are impurities are in most cases introduced from Nd.sub.2 O.sub.3 which is the starting neodymium material.
In the ceramic composition (I), it is desired that x, y and z lie within a range that satisfies the following inequalities,
x.gtoreq.10.0,
x.ltoreq.12.5,
y.gtoreq.20.0,
z.gtoreq.67.0,
and
z.ltoreq.68.75,
i.e., x, y and z lie within a range surrounded by lines connecting the following points A, B, C, G, F and A in the ternary-component system of FIG. 1,
______________________________________x y z______________________________________A 12.50 20.00 67.50B 12.50 20.50 67.00C 10.00 23.00 67.00G 10.00 21.25 68.75F 11.25 20.00 68.75______________________________________
The ceramic composition (I) of the present invention is prepared as described below. That is, powders of BaCO.sub.3, (BaO), TiO.sub.2, and MnCO.sub.3 having purities of not lower than 99% and a powder of Nd.sub.2 O.sub.3 (which may contain rare earth elements such as Pr, Sm, etc. which are impurities) of a purity of not lower than 95% are weighed and mixed together in a manner that the content of sodium and the content of silicon reckoned as SiO.sub.2 in the composition lie within ranges of the present invention, that the amounts of rare earth elements (Sm, Pr, La, etc. which are impurities) reckoned as oxides lie within ranges of the present invention and that the composition of a sintered product lies within a range of the present invention. The mixture is dried and is then calcined at 1000.degree. to 1200.degree. C. for 1 to 3 hours.
The calcined powder is pulverized using a ball mill, and to which is added an organic sticking agent (binder) containing sodium in a small amount, followed by stirring. The mixture is then formed into a green-sheet by, for example, a doctor blade method. Pieces of the green sheet are stacked one upon the other and the binder is removed therefrom, followed by firing in air at a temperature of 1280.degree. to 1340.degree. C. for 1 to 3 hours to obtain a dielectric ceramic composition of the present invention.
Another preferred ceramic composition (II) of the present invention is represented by the above-mentioned formula (2). The composition range specified by the inequalities is a region of FIG. 4 surrounded by lines that connect the following points:
______________________________________x y z______________________________________A 16.25 16.75 67.00B 10.50 22.50 67.00C 7.50 23.25 69.25D 7.50 21.25 71.25E 10.00 18.75 71.25F 12.50 17.50 70.00______________________________________
In this composition, the amount b of substituting Nd.sub.2 .sub. by Sm.sub.2 O.sub.3 is selected to be 0.05.ltoreq.b.ltoreq.1.00. This is because when the amount b of substitution is smaller than 0.05, the temperature coefficient of capacitance TCC is not almost shifted toward the plus side despite Sm.sub.2 O.sub.3 being added.
It is particularly preferred that the amount b of substitution be from 0.05 to 0.95.
The ceramic composition (II) exhibits the temperature coefficient of capacitance TCC of within 0.+-.30 ppm/.degree.C. (COG property, NPO:MIL spec) and a dielectric constant of not smaller than 60 when x, y and z lie within ranges that satisfy the following inequalities,
z.ltoreq.67.0
y.ltoreq.22.5
x.gtoreq.10.0
y.gtoreq.-1.00667x+31.9167
and
z.ltoreq.-0.8x+80,
i.e., when x, y and z lie within a range surrounded by the following a, b, c, d and e in the ternary-component system.
______________________________________x y z______________________________________a 16.25 16.75 67.00b 10.50 22.50 67.00c 10.00 22.50 67.50d 10.00 21.25 68.75e 13.75 17.25 69.00______________________________________
This composition is prepared in the same manner as the above-mentioned preparation method but partly substituting Nd.sub.2 O.sub.3 by SM.sub.2 O.sub.3.
A further preferred ceramic composition (III) of the present invention is represented by the above-mentioned formula (3). The composition range specified by the inequalities is a region of FIG. 5 surrounded by lines connecting the following points,
______________________________________x y z______________________________________A 15.50 17.50 67.00B 10.50 22.50 67.00C 7.50 22.50 70.00D 9.17 19.17 71.66E 12.50 17.50 70.00______________________________________
In this composition, it is desired that the ratio c of MeO.sub.2 with respect to the total amount of TiO.sub.2 and MeO.sub.2 is 0.01.ltoreq.c.ltoreq.0.10. This is because when the ratio c is smaller than 0.01, the temperature coefficient of capacitance TCC is not almost shifted toward the plus side despite ZrO.sub.2 being added. When the ratio c becomes larger than 0.10, on the other hand, the dielectric constant decreases to a great extent.
The ceramic composition (III) exhibits a temperature coefficient of capacitance TCC of within 0.+-.30 ppm/.degree.C. (COG property, NPO:MIL spec) and a dielectric constant of not smaller than 60 when x, y and z lie within ranges that satisfy the following inequalities,
y.gtoreq.17.5
y.ltoreq.22.5
z.gtoreq.67.0
x.gtoreq.10.0
and
z.ltoreq.-0.5x+75
i.e., when x, y and z lie within a range surrounded by the following a, b, c, d and e in the ternary-component system,
______________________________________x y z______________________________________a 15.50 17.50 67.00b 10.50 22.50 67.00c 10.00 22.50 70.00d 10.00 20.00 70.00e 15.00 17.25 67.50______________________________________
The composition (III) is prepared in the same manner as the above-mentioned method of preparing the composition (I) but partly substituting TiO.sub.2 by ZrO.sub.2 or SnO.sub.2.
As described above, the dielectric ceramic composition of the present invention can be calcined at a temperature of lower than 1340.degree. C. with using a sintering aid such as SiO.sub.2 or the like, exhibits a small change in the capacitance despite a change in temperature, and exhibits a large dielectric constant and a high Q-value. Therefore, the dielectric ceramic composition of the present invention can be desirably used for a ceramic capacitor for temperature compensation having an internal electrode of palladium.
This dielectric ceramic exhibits a dielectric constant which is as high as not smaller than 50 and, particularly, not smaller than 60 and a temperature coefficient of capacitance TCC of within 0.+-.30 ppm/.degree.C. at a measuring frequency of 1 MHz.
The invention will now be described by way of Examples.
EXAMPLE 1
Powders of BaCO.sub.3, TiO.sub.2 and MnCO.sub.3 having purities of not smaller than 99% and a powder of Nd.sub.2 O.sub.3 having a predetermined purity were used as starting materials, and the amounts of impurities in the starting materials were controlled to adjust the contents of rare earth elements such as Na, Si, Pr, Sm and the like in the composition. These powders were weighed at ratios shown in Tables 1, 2 and 3, and were mixed together a whole day and night using resin balls while adding pure water thereto. The mixture was dried and was then calcined at 1180.degree. C. for 2 hours.
The calcined powder was pulverized by using a ball mill for 20 hours, and an organic sticking agent was added thereto, followed by stirring. The mixture was then molded into a green sheet of a thickness of 50 .mu.m by a doctor blade method. 25 Pieces of this green sheet were stacked one upon the other and were hot-pressed to prepare a green molded plate which was then punched into a disk 20 mm in diameter and about 1 mm in thickness. The molded article was then subjected to a treatment at 300.degree. C. for 2 hours to remove the binder, and was then calcined in air at a temperature of 1280.degree. to 1340.degree. C. for 2 hours.
TABLE 1__________________________________________________________________________Composition ratio Impurities (wt %)Sample BaO Nd.sub.2 O.sub.3 TiO.sub.2 MnCO.sub.3 reckoned reckoned reckonedNo. x (mol %) y (mol %) z (mol %) (wt %) as SiO.sub.2 Na as Pr.sub.4 O.sub.11 as Sm.sub.2 O.sub.3__________________________________________________________________________*1 0 18.18 81.82 0.2 <0.01 <0.01 0.58 <0.01*2 0 33.33 66.67 0.2 <0.01 <0.01 0.81 <0.01*3 5.00 25.00 70.00 0.2 <0.01 <0.01 0.61 <0.01*4 7.50 17.50 75.00 0.2 <0.01 <0.01 0.54 <0.01*5 7.50 20.00 72.50 0.2 <0.01 <0.01 0.59 <0.01 6 7.50 21.25 71.25 0.2 <0.01 <0.01 0.61 <0.01 7 7.50 22.50 70.00 0.2 <0.01 <0.01 0.63 <0.01 8 7.50 23.75 68.75 0.2 <0.01 <0.01 0.65 <0.01*9 7.50 25.00 67.50 0.2 <0.01 <0.01 0.67 <0.01*10 7.50 25.83 66.67 0.2 <0.01 <0.01 0.68 <0.01*11 8.75 20.00 71.25 0.2 <0.01 <0.01 0.58 <0.0112 8.75 21.25 70.00 0.2 <0.01 <0.01 0.60 <0.0113 8.75 22.50 68.75 0.2 <0.01 <0.01 0.63 <0.01*14 8.75 23.75 67.50 0.2 <0.01 <0.01 0.65 <0.0115 9.25 23.25 67.50 0.2 <0.01 <0.01 0.64 <0.01*16 9.25 23.75 67.00 0.2 <0.01 <0.01 0.64 <0.01*17 10.00 17.50 72.50 0.2 <0.01 <0.01 0.53 <0.01*18 10.00 20.00 70.00 0.2 <0.01 <0.01 0.58 <0.0119 10.00 21.25 68.75 0.2 <0.01 <0.01 0.60 <0.0120 10.00 22.50 67.50 0.2 <0.01 <0.01 0.63 <0.0121 10.00 23.00 67.00 0.2 <0.01 <0.01 0.64 <0.01*22 10.00 23.33 66.67 0.2 <0.01 <0.01 0.64 <0.01*23 10.00 25.00 65.00 0.2 <0.01 <0.01 0.67 <0.0124 10.63 21.25 68.12 0.2 <0.01 <0.01 0.60 <0.01__________________________________________________________________________ Samples marked with * lie outside the scope of the invention.
TABLE 2__________________________________________________________________________Composition ratio Impurities (wt %)Sample BaO Nd.sub.2 O.sub.3 TiO.sub.2 MnCO.sub.3 reckoned reckoned reckonedNo. x (mol %) y (mol %) z (mol %) (wt %) as SiO.sub.2 Na as Pr.sub.4 O.sub.11 as Sm.sub.2 O.sub.3__________________________________________________________________________25 10.63 21.87 67.50 0.2 <0.01 <0.01 0.61 <0.0126 11.25 20.00 68.75 0.2 <0.01 <0.01 0.58 <0.0127 11.25 20.63 68.12 0.2 <0.01 <0.01 0.59 <0.0128 11.25 21.25 67.50 0.2 <0.01 <0.01 0.60 <0.0129 11.25 21.75 67.00 0.2 <0.01 <0.01 0.61 <0.01*30 11.25 22.08 66.67 0.2 <0.01 <0.01 0.62 <0.0131 11.87 20.63 67.50 0.2 <0.01 <0.01 0.59 <0.01*32 12.50 17.50 70.00 0.2 <0.01 <0.01 0.53 <0.0133 12.50 20.00 67.50 0.2 <0.01 <0.01 0.58 <0.0134 12.50 20.50 67.00 0.2 <0.01 <0.01 0.58 <0.01*35 12.50 20.83 66.67 0.2 <0.01 <0.01 0.59 <0.01*36 13.75 18.75 67.50 0.2 <0.01 <0.01 0.53 <0.01*37 16.67 16.67 66.66 0.2 <0.01 <0.01 0.50 <0.01*38 11.25 21.25 67.50 0 <0.01 <0.01 0.60 <0.0139 11.25 21.25 67.50 0.01 <0.01 <0.01 0.60 <0.0140 11.25 21.25 67.50 0.03 <0.01 <0.01 0.59 <0.0141 11.25 21.25 67.50 0.03 <0.01 <0.01 0.60 <0.0142 11.25 21.25 67.50 0.1 <0.01 <0.01 0.59 <0.0143 11.25 21.25 67.50 0.5 <0.01 <0.01 0.61 <0.01*44 11.25 21.25 67.50 0.7 <0.01 <0.01 0.61 <0.0145 11.25 21.25 67.50 0.2 <0.01 <0.01 0.58 <0.0146 11.25 21.25 67.50 0.2 <0.01 <0.01 0.60 <0.0147 11.25 21.25 67.50 0.2 <0.01 <0.01 0.60 <0.0148 11.25 21.25 67.50 0.2 <0.01 <0.01 0.59 <0.01__________________________________________________________________________ Samples marked with * lie outside the scope of the invention.
TABLE 3__________________________________________________________________________Composition ratio Impurities (wt %)Sample BaO Nd.sub.2 O.sub.3 TiO.sub.2 MnCO.sub.3 reckoned reckoned reckonedNo. x (mol %) y (mol %) z (mol %) (wt %) as SiO.sub.2 Na as Pr.sub.4 O.sub.11 as Sm.sub.2 O.sub.3__________________________________________________________________________49 11.25 21.25 67.50 0.2 <0.01 0.08 0.60 <0.0150 11.25 21.25 67.50 0.2 <0.01 0.10 0.58 <0.01*51 11.25 21.25 67.50 0.2 <0.01 0.17 0.60 <0.01*52 11.25 21.25 67.50 0.2 <0.01 0.50 0.59 <0.0153 11.25 21.25 67.50 0.2 0.03 <0.01 0.61 <0.0154 11.25 21.25 67.50 0.2 0.05 <0.01 0.60 <0.0155 11.25 20.00 67.75 0.2 <0.01 <0.01 0.50 <0.0156 12.25 20.00 67.75 0.2 <0.01 <0.01 2.50 <0.0157 11.25 21.25 67.50 0.2 <0.01 <0.01 0.25 <0.0158 11.25 21.25 67.50 0.2 <0.01 <0.01 0.50 <0.0159 11.25 21.25 67.50 0.2 <0.01 <0.01 1.25 <0.0160 11.25 21.25 67.50 0.2 <0.01 <0.01 2.50 <0.0161 10.00 23.00 67.00 0.2 <0.01 <0.01 <0.01 0.562 10.00 23.00 67.00 0.2 <0.01 <0.01 <0.01 2.5__________________________________________________________________________ Samples marked with * lie outside the scope of the invention.
In the sintered products, the presence of La.sub.2 O.sub.3 and CeO.sub.2 was detected in amounts of not larger than 0.01% by weight in addition to Pr.sub.6 O.sub.11 and Sm.sub.2 O.sub.3. They were, in most cases, introduced from the Nd.sub.2 O.sub.3 that was the starting material.
Silver electrodes were formed on the upper and lower whole surfaces of the obtained ceramic disks to form disk-type capacitors of a single layer, which were then used as samples for evaluation. The samples were measured for their capacitances (C) and quality s (Q-values) at a frequency of 1 MHz and an input power level of 1 Vrms, and were measured for their temperature coefficients of capacitance TCC at a frequency of 1 MHz over a temperature range of from -55.degree. C. to 125.degree. C.
Furthermore, the samples were measured for their diameters (D) and thicknesses (T) to an accuracy of .+-.5 .mu.m and were measured for their weights (m) to an accuracy of .+-.5 mg to calculate their dielectric constants .epsilon. r and densities .rho.. The Nd.sub.4 Ti.sub.9 O.sub.24 phase and the Nd.sub.2 Ti.sub.9 O.sub.7 phase of the obtained ceramics were identified by the X-ray diffraction measurement and X-ray macroanalyzer. The results were as shown in Tables 4, 5 and 6.
TABLE 4__________________________________________________________________________ Dielectric FiringSample Density constant TCC temp. Nd.sub.2 Ti.sub.2 O.sub.7 Nd.sub.4 Ti.sub.9 O.sub.24No. g/cm.sup.3 .epsilon.r Q-value ppm/C C. phase phase__________________________________________________________________________*1 5.00 38.4 10000< -148 1340 not exist exist*2 5.96 37.1 10000< +234 1340 exist exist*3 5.57 46.7 10000< +22 1340 exist exist*4 4.63 48.7 4539 -150 1340 exist exist*5 4.62 49.0 4396 -70 1340 exist exist 6 4.88 50.9 5741 -28 1340 exist exist 7 5.3 52.0 10000< +5 1340 exist exist 8 5.55 53.2 5128 +30 1340 exist exist*9 5.79 54.0 10000< +80 1340 exist exist*10 not sintered 1340 exist not exist*11 5.37 55.7 7116 -51 1340 exist exist12 5.49 57.3 10000< -20 1340 exist exist13 5.60 58.2 6538 +11 1340 exist exist*14 5.61 59.7 8256 +45 1340 exist exist15 5.73 62.1 10000< +30 1340 exist exist*16 5.72 62.7 10000< +47 1340 exist exist*17 5.08 62.2 8203 -175 1340 exist exist*18 5.42 63.5 5602 -45 1340 exist exist19 5.63 64.4 7330 -9 1340 exist exist20 5.74 65.4 8221 +16 1340 exist exist21 5.75 65.8 7968 +27 1340 exist exist*22 not sintered 1340 exist not exist*23 not sintered 1340 exist not exist24 6.65 66.8 9788 -8 1340 exist exist__________________________________________________________________________ Samples marked with * lie outside the scope of the invention.
TABLE 5__________________________________________________________________________ Dielectric FiringSample Density constant TCC temp. Nd.sub.2 Ti.sub.2 O.sub.7 Nd.sub.4 Ti.sub.9 O.sub.24No. g/cm.sup.3 .epsilon.r Q-value ppm/C C. phase phase__________________________________________________________________________25 5.72 66.6 6938 +6 1340 exist exist26 5.58 68.7 6327 -30 1340 exist exist27 5.65 68.7 6840 -19 1340 exist exist28 5.71 69.2 6785 -1 1340 exist exist29 5.73 69.5 6993 +7 1340 exist exist*30 not sintered 1340 exist not exist31 5.69 70.8 7537 -9 1340 exist exist*32 5.42 74.0 10000> -95 1340 exist exist33 5.74 74.3 8466 -22 1340 exist exist34 5.74 74.5 8525 -12 1340 exist exist*35 not sintered 1340 exist not exist*36 5.70 79.5 8126 -71 1340 exist exist*37 5.62 87.9 10000< -156 1340 not exist exist*38 5.66 65.1 763 -2 1340 exist exist39 5.69 67.0 3370 -1 1340 exist exist40 5.69 67.2 3653 -1 1340 exist exist41 5.68 67.5 4348 -1 1340 exist exist42 5.67 67.8 5523 -1 1340 exist exist43 5.67 68.3 6950 0 1340 exist exist*44 5.59 63.3 1854 +2 1340 exist exist45 5.73 68.5 6035 +3 1320 exist exist46 5.72 67.9 4976 +6 1300 exist exist47 5.65 65.9 10000< +9 1280 exist exist48 6.68 69.0 6558 -3 1340 exist exist__________________________________________________________________________ Samples marked with * lie outside the scope of the invention.
TABLE 6__________________________________________________________________________ Dielectric FiringSample Density constant TCC temp. Nd.sub.2 Ti.sub.2 O.sub.7 Nd.sub.4 Ti.sub.9 O.sub.24No. g/cm.sup.3 .epsilon.r Q-value ppm/C C. phase phase__________________________________________________________________________49 5.64 68.5 6654 -10 1340 exist exist50 5.66 67.9 6512 -11 1340 exist exist*51 5.42 65.9 2326 -14 1340 exist exist*52 not sintered 1340 exist exist53 5.70 67.8 6024 -18 1340 exist exist54 5.66 65.7 5953 -28 1340 exist exist55 5.60 68.8 8520 -29 1340 exist exist56 5.61 68.7 6824 -30 1340 exist exist57 5.72 68.8 5905 0 1340 exist exist58 5.72 69.2 10000< -3 1340 exist exist59 5.71 69.0 4750 -6 1340 exist exist60 5.76 69.2 6843 -4 1340 exist exist61 5.74 66.0 7332 +27 1340 exist exist62 5.74 65.7 7120 +29 1340 exist exist__________________________________________________________________________ Samples marked with * lie outside the scope of the invention.
As will be obvious from Tables 4, 5 and 6, porous samples only could be prepared in the region (Nos. 10, 22, 23, 30, 35) without containing the Nd.sub.4 Ti.sub.9 O.sub.24 phase at a temperature of from 1280.degree. to 1340.degree. C., which, however, could not be sintered. In the composition range of the present invention, on the other hand, the Nd.sub.4 Ti.sub.9 O.sub.24 phase was formed in a suitable amount, contributing to improved sintering property without the need of adding sintering aids. By adjusting the formation ratios of the BaNd.sub.2 Ti.sub.4 O.sub.12 phase, Nd.sub.4 Ti.sub.9 O.sub.12 phase and Nd.sub.2 Ti.sub.2 O.sub.7 phase, furthermore, ceramic compositions having stable temperature coefficients and high dielectric constants could be prepared.
It will be understood that the Q-value decreases and the dielectric property deteriorates as the amount of manganese reckoned as MnCO.sub.3 becomes smaller than 0.01% by weight or not smaller than 0.5% by weight.
The sintering property is deteriorated by the introduction of sodium. Accompanying this, the dielectric constant decreases, the Q-value decreases and the temperature coefficient of capacitance TCC is deteriorated.
Moreover, introduction of rare earth elements other than neodymium which are impurities cause the dielectric constant .epsilon. r and the temperature coefficient of capacitance TCC to change.
Furthermore, an increase in the amount of silicon results in a decrease in the dielectric constant, whereby the absolute value of the temperature coefficient of capacitance TCC increases and the Q-value decreases. Preventing the introduction of silicon makes it possible to prepare a ceramic composition having a stable temperature coefficient of capacitance and a large dielectric constant.
EXAMPLE 2
Powders of BaCO.sub.3, TiO.sub.2 and MnCO.sub.3 having purities of not smaller than 99% and powders of Nd.sub.2 O.sub.3 and Sm.sub.2 O.sub.3 (into which may be introduced Pr and the like as impurities of rare earth oxides) having purities of not smaller than 95% were used as starting materials, and the amounts of impurities in the starting materials were controlled to adjust the contents of Na and Si in the composition. These powders were weighed at ratios shown in Tables 7 and 8, and were mixed together a whole day and night using resin balls while adding pure water thereto. The mixture was dried and was then calcined at 1180.degree. C. for 2 hours. The calcined powder was pulverized by using a ball mill for 20 hours, and an organic sticking agent was added thereto, followed by stirring. The mixture was then molded into a green sheet of a thickness of 50 .mu.m by a doctor blade method. 25 Pieces of this green sheet were stacked one upon the other and were hot-pressed to prepare a green molded plate which was then punched into a disk 20 mm in diameter and about 1 mm in thickness. The molded article was then subjected to a treatment at 300.degree. C. for 2 hours to remove the binder, and was then calcined in the air at a temperature of 1280.degree. to 1340.degree. C. for 2 hours.
TABLE 7__________________________________________________________________________ Impurities PropertiesComposition ratio additives (wt %) Di-Sample BaO Re.sub.2 O.sub.3 TiO.sub.2 MnCO.sub.3 reckoned electric TCCNo. x (mol %) y (mol %) z (mol %) b (wt %) as SiO.sub.2 Na const. .epsilon.r Q-value ppm/C__________________________________________________________________________*1 7.50 20.00 72.50 0.05 0.2 <0.01 <0.01 48 4800 -55 2 7.50 21.25 71.25 0.05 0.2 <0.01 <0.01 50 5900 -22 3 7.50 22.50 70.00 0.05 0.2 <0.01 <0.01 51 6100 +10 4 7.50 23.25 69.25 0.05 0.2 <0.01 <0.01 52 5400 +26*5 7.50 23.75 68.75 0.05 0.2 <0.01 <0.01 52 5500 +35 6 8.75 20.00 71.25 0.50 0.2 <0.01 <0.01 51 7700 +3*7 8.75 23.75 67.50 0.05 0.2 <0.01 <0.01 59 10000< +51*8 10.00 17.50 72.50 0.95 0.2 <0.01 <0.01 50 8500 -54 9 10.00 18.75 71.25 0.50 0.2 <0.01 <0.01 56 7800 -2710 10.00 18.75 71.25 0.95 0.2 <0.01 <0.01 50 7200 +2011 10.00 20.00 70.00 0.50 0.2 <0.01 <0.01 58 7200 +5*12 10.00 20.00 70.00 0 0.2 <0.01 <0.01 63 5600 -4513 10.00 21.25 68.75 0.05 0.2 <0.01 <0.01 63 8500 -314 10.00 22.50 67.50 0.05 0.2 <0.01 <0.01 64 8400 +21*15 10.00 23.00 67.00 0.05 0.2 <0.01 <0.01 65 8200 +3516 10.50 22.50 67.00 0.05 0.2 <0.01 <0.01 66 7700 +2117 11.25 21.25 67.50 0.05 0.2 <0.01 <0.01 67 7200 +318 11.25 21.75 6700 0.05 0.2 <0.01 <0.01 68 7500 +1219 12.50 17.50 70.00 0.50 0.2 <0.01 <0.01 58 10000< -2620 12.50 18.75 68.75 0.50 0.2 <0.01 <0.01 66 9100 +4__________________________________________________________________________ Samples marked with * lie outside the scope of the invention.
TABLE 8__________________________________________________________________________ Impurities PropertiesComposition ratio additives (wt %) Di-Sample BaO Re.sub.2 O.sub.3 TiO.sub.2 MnCO.sub.3 reckoned electric TCCNo. x (mol %) y (mol %) z (mol %) b (wt %) as SiO.sub.2 Na const. .epsilon.r Q-value ppm/C__________________________________________________________________________21 12.50 20.50 67.00 0.50 0.2 <0.01 <0.01 74 9000 -722 13.75 18.75 67.50 0.50 0.2 <0.01 <0.01 71 8800 -5*23 15.00 16.87 68.13 0.95 0.2 <0.01 <0.01 77 10000< -3624 15.00 17.50 67.50 0.50 0.2 <0.01 <0.01 77 10000< -2125 15.00 18.00 67.00 0.50 0.2 <0.01 <0.01 76 9100 -1326 16.25 16.75 67.00 0.50 0.2 <0.01 <0.01 82 10000< -24*27 11.25 21.25 67.50 0.05 -- <0.01 <0.01 64 800 +228 11.25 21.25 67.50 0.05 0.01 <0.01 <0.01 65 3500 +229 11.25 21.25 67.50 0.05 0.03 <0.01 <0.01 66 3700 +230 11.25 21.25 67.50 0.05 0.05 <0.01 <0.01 66 4000 +331 11.25 21.25 67.50 0.05 0.10 <0.01 <0.01 67 5900 +332 11.25 21.25 67.50 0.05 0.20 <0.01 <0.01 67 7200 +333 11.25 21.25 67.50 0.05 0.50 <0.01 <0.01 68 7400 +4*34 11.25 21.25 67.50 0.05 0.70 <0.01 <0.01 62 1900 +635 11.25 21.25 67.50 0.05 0.20 <0.01 0.05 68 7000 036 11.25 21.25 67.50 0.05 0.20 <0.01 0.08 67 7000 -1337 11.25 21.25 67.50 0.05 0.20 <0.01 0.10 66 6800 -15*38 11.25 21.25 67.50 0.05 0.20 <0.01 0.17 64 2500 -19*39 11.25 21.25 67.00 0.05 0.20 <0.01 0.50 not sintered40 11.25 21.25 67.50 0.05 0.20 0.03 <0.01 67 6700 -2141 11.25 21.25 67.50 0.05 0.20 0.05 <0.01 64 6300 -30__________________________________________________________________________ Samples marked with * lie outside the scope of the invention.
Silver electrodes were formed on the upper and lower whole surfaces of the obtained ceramic disks to form disk-type capacitors of a single layer, which were then used as samples for evaluation. The samples were measured for their electrostatic capacities (C) and quality s (Q-values) at a frequency of 1 MHz and an input power level of 1 Vrms, and were measured for their temperature coefficients of capacitance TCC at a frequency of 1 MHz over a temperature range of from -55.degree. C. to 125.degree. C. Furthermore, the samples were measured for their diameters (D) and thicknesses (T) to an accuracy of .+-.5 .mu.m and were measured for their weights (m) to an accurancy of .+-.5 .mu.mg to calculate their dielectric constants .epsilon. r. The results were as shown in Tables 7 and 8.
It will be understood from Tables 7 and 8 that in a region .alpha. of FIG. 4, satisfactory properties are not obtained since the temperature coefficient of capacitance is greatly shifted toward the minus side and in a region .gamma., satisfactory properties are not obtained since the temperature coefficient is greatly shifted toward the plus side. In a region .beta., satisfactory properties are not obtained since the dielectric constant is too small and in a region .delta., dense ceramic is not obtained since the sintering property is deteriorated.
It will further be understood that the Q-value decreases and the dielectric property is deteriorated as the amount of manganese becomes smaller than 0.01% by weight or no smaller than 0.5% by weight reckoned as MnCO.sub.3. Furthermore, introduction of sodium deteriorates the sintering property. Accompanying this, the dielectric constant decreases, Q-value decreases and temperature coefficient of capacitance TCC is deteriorated. As the amount of silicon increases, furthermore, the dielectric constant decreases, absolute value of the temperature coefficient of capacitance TCC increases and Q-value decreases. On the other hand, the dielectric ceramic composition of the present invention exhibits excellent properties such as a dielectric constant of as large as not smaller than 50, a Q-value of not smaller than 3000 and a temperature coefficient of within .+-.30 ppm/.degree.C. Moreover, preventing the introduction of silicon makes it possible to prepare a ceramic having a stable temperature coefficient of capacitance and a high dielectric constant.
EXAMPLE 3
Powders of BaCO.sub.3, TiO.sub.2, ZrO.sub.2, SnO.sub.2 and MnCO.sub.3 having purities of not smaller than 99% and a powder of Nd.sub.2 O.sub.3 (into which may be introduced Pr and the like as impurities of rare earth oxides) having purities of not smaller than 95% were used as starting materials, and the amounts of impurities in the starting materials were controlled to adjust the contents of Na and Si in the composition. These powders were weighed at ratios shown in Tables 9, 10 and 11, and were mixed together a whole day and night using resin balls while adding pure water thereto.
The mixture was dried and was then calcined at 1180.degree. C. for 2 hours. The calcined powder was pulverized by using a ball mill for 20 hours, and an organic sticking agent was added thereto, followed by stirring. The mixture was then molded into a green sheet of a thickness of 50 .mu.m by a doctor blade method.
25 Pieces of this green sheet were stacked one upon the other and were hot-pressed to prepare a green molded plate which was then punched into a disk 20 mm in diameter and about 1 mm in thickness. The molded article was then subjected to a treatment at 300.degree. C. for 2 hours to remove the binder, and was then calcined in the air at a temperature of 1280.degree. to 1340.degree. C. for 2 hours.
TABLE 9__________________________________________________________________________ Impurities,Composition ratio additivesSample x y z substituted MnCO.sub.3 reckonedNo. (mol %) (mol %) (mol %) with c (wt %) as SiO.sub.2 Na__________________________________________________________________________*1 7.500 21.250 71.250 Zr 0.05 0.2 <0.01 <0.01 2 7.500 22.500 70.000 Zr 0.01 0.2 <0.01 <0.01*3 7.500 23.750 68.750 Zr 0.01 0.2 <0.01 <0.01 4 8.750 20.000 71.250 Zr 0.05 0.2 <0.01 <0.01 5 8.750 22.500 68.750 Zr 0.01 0.2 <0.01 <0.01*6 8.750 23.750 67.500 Zr 0.01 0.2 <0.01 <0.01 7 9.170 19.170 71.660 Zr 0.05 0.2 <0.01 <0.01*8 10.000 17.500 72.500 Zr 0.10 0.2 <0.01 <0.01 9 10.000 18.750 71.250 Zr 0.10 0.2 <0.01 <0.0110 10.000 20.000 70.000 Zr 0.05 0.2 <0.01 <0.0111 10.000 22.500 67.500 Zr 0.01 0.2 <0.01 <0.01*12 10.000 23.000 67.000 Zr 0.01 0.2 <0.01 <0.0113 10.500 22.500 67.000 Zr 0.01 0.2 <0.01 <0.0114 11.250 20.000 68.750 Zr 0.01 0.2 <0.01 <0.0115 11.250 21.250 67.500 Zr 0.01 0.2 <0.01 <0.0116 11.250 21.750 67.000 Zr 0.01 0.2 <0.01 <0.01*17 11.250 22.083 66.667 Zr 0.05 0.2 <0.01 <0.0118 12.500 17.500 70.000 Zr 0.10 0.2 <0.01 <0.0119 12.500 18.750 68.750 Zr 0.05 0.2 <0.01 <0.0120 12.500 20.000 67.500 Zr 0.01 0.2 <0.01 <0.0121 12.500 20.500 67.000 Zr 0.01 0.2 <0.01 <0.01*22 12.500 20.833 66.667 Zr 0.01 0.2 <0.01 <0.0123 13.750 18.750 67.500 Zr 0.05 0.2 <0.01 <0.01*24 15.000 17.000 68.000 Zr 0.05 0.2 <0.01 <0.0125 15.000 17.500 67.500 Zr 0.10 0.2 <0.01 <0.01__________________________________________________________________________ Samples marked with * lie outside the scope of the invention.
TABLE 10__________________________________________________________________________ Impurities,Composition ratio additivesSample x y z substituted MnCO.sub.3 reckonedNo. (mol %) (mol %) (mol %) with c (wt %) as SiO.sub.2 Na__________________________________________________________________________26 15.000 18.000 87.000 Zr 0.10 0.2 <0.01 <0.0127 15.500 17.500 67.000 Zr 0.10 0.2 <0.01 <0.01*28 16.667 16.666 66.667 Zr 0.10 0.2 <0.01 <0.0129 7.500 22.500 70.000 0.5 Zr + 0.5 Sn 0.01 0.2 <0.01 <0.0130 8.750 20.000 71.250 0.5 Zr + 0.5 Sn 0.05 0.2 <0.01 <0.0131 10.000 20.000 70.000 0.5 Zr + 0.5 Sn 0.05 0.2 <0.01 <0.0132 11.250 21.250 67.500 0.5 Zr + 0.5 Sn 0.01 0.2 <0.01 <0.0133 12.500 17.500 70.000 0.5 Zr + 0.5 Sn 0.10 0.2 <0.01 <0.0134 13.750 18.750 67.500 0.5 Zr + 0.5 Sn 0.05 0.2 <0.01 <0.0135 7.500 22.500 70.000 Sn 0.01 0.2 <0.01 <0.0136 8.750 20.000 71.250 Sn 0.05 0.2 <0.01 <0.0137 10.000 20.000 70.000 Sn 0.05 0.2 <0.01 <0.0138 11.250 21.250 67.500 Sn 0.01 0.2 <0.01 <0.0139 12.500 17.500 70.000 Sn 0.10 0.2 <0.01 <0.0140 13.750 18.750 67.500 Zr 0.01 0 <0.01 <0.01*41 11.250 21.250 67.500 Zr 0.01 0 <0.01 <0.0142 11.250 21.250 67.500 Zr 0.01 0.01 <0.01 <0.0143 11.250 21.250 67.500 Zr 0.01 0.03 <0.01 <0.0144 11.250 21.250 67.500 Zr 0.01 0.05 <0.01 <0.0145 11.250 21.250 67.500 Zr 0.01 0.1 <0.01 <0.0146 11.250 21.250 67.500 Zr 0.01 0.5 <0.01 <0.01*47 11.250 21.250 67.500 Zr 0.01 0.7 <0.01 <0.0148 11.250 21.250 67.500 Zr 0.01 0.2 <0.01 0.0549 11.250 21.250 67.500 Zr 0.01 0.2 <0.01 0.0850 11.250 21.250 67.500 Zr 0.01 0.2 <0.01 0.10__________________________________________________________________________ Samples marked with * lie outside the scope of the invention.
TABLE 11__________________________________________________________________________ Impurities,Composition ratio additivesSample x y z substituted MnCO.sub.3 reckonedNo. (mol %) (mol %) (mol %) with c (wt %) as SiO.sub.2 Na__________________________________________________________________________*51 11.250 21.250 67.500 Zr 0.01 0.2 <0.01 0.17*52 11.250 21.250 67.500 Zr 0.01 0.2 <0.01 0.5053 13.750 18.750 67.500 Zr 0.01 0.2 0.03 <0.0154 13.750 18.750 67.500 Zr 0.01 0.2 0.05 <0.01*55 11.250 21.250 67.500 Sn 0.01 0 <0.01 <0.0156 11.250 21.250 67.500 Sn 0.01 0.01 <0.01 <0.0157 11.250 21.250 67.500 Sn 0.01 0.03 <0.01 <0.0158 11.250 21.250 67.500 Sn 0.01 0.05 <0.01 <0.0159 11.250 21.250 67.500 Sn 0.01 0.1 <0.01 <0.0160 11.250 21.250 67.500 Sn 0.01 0.5 <0.01 <0.01*61 11.250 21.250 67.500 Sn 0.01 0.7 <0.01 <0.0162 11.250 21.250 67.500 Sn 0.01 0.2 <0.01 0.0563 11.250 21.250 67.500 Sn 0.01 0.2 <0.01 0.0864 11.250 21.250 67.500 Sn 0.01 0.2 <0.01 0.10*65 11.250 21.250 67.500 Sn 0.01 0.2 <0.01 0.17*66 11.250 21.250 67.500 Sn 0.01 0.2 <0.01 0.5067 13.750 18.750 67.500 Sn 0.01 0.2 0.03 <0.0168 13.750 18.750 67.500 Sn 0.01 0.2 0.05 <0.01__________________________________________________________________________ Samples marked with * lie outside the scope of the invention.
Silver electrodes were formed on the upper and lower whole surfaces of the obtained ceramic disks to form disk-type capacitors of a single layer, which were then used as samples for evaluation.
The samples were measured for their electrostatic capacities (C) and quality s (Q-values) at a frequency of 1 MHz and an input power level of 1 Vrms, and were measured for their temperature coefficients of capacitance TCC at a frequency of 1 MHz over a temperature range of from <55.degree. C. to 125.degree. C. Furthermore, the samples were measured for their diameters (D) and thicknesses (T) to an accurancy of .+-.5 .mu.m and were measured for their weights (m) to an accurancy of .+-.5 .mu.mg to calculate their dielectric constants .epsilon. r. The results were as shown in Tables 4, 5 and 6.
The sintered products were quantitatively analyzed by means of atomic absorbency and ICP, and it was confirmed that the composition of Ba, Nd, Ti, Zr and Sn was basically the same as the recipe composition.
TABLE 12______________________________________ DielectricSample Constant TCCNo. .epsilon.r (ppm/C) Q-value______________________________________*1 46 21 5700 2 51 14 10000*3 52 39 5100 4 50 -1 7000 5 57 20 6500*6 59 54 8300 7 52 -28 7100*8 50 -39 8100 9 51 3 700010 57 5 550011 64 25 8200*12 64 36 800013 66 28 760014 67 -20 630015 68 9 680016 68 16 7000*17 not sintered18 60 -2 1000019 67 -8 900020 73 -12 850021 73 2 8500*22 not sintered23 72 -20 8200*24 77 -76 900025 69 -24 9200______________________________________ Samples marked with * lie outside the scope of the invention.
TABLE 13______________________________________ DielectricSample Constant TCCNo. .epsilon.r (ppm/C) Q-value______________________________________26 70 -15 900027 70 -30 10000*28 71 -57 1000029 51 14 1000030 50 -1 750031 57 4 560032 68 8 680033 60 -2 1000034 72 -20 770035 51 13 1000036 50 -2 740037 58 4 520038 68 8 750039 60 -2 1000040 72 -21 8200*41 64 -2 75042 66 -1 330043 66 -1 350044 66 -1 450045 66 -1 600046 67 0 7100*47 62 2 180048 68 -2 630049 67 -8 700050 67 -9 6900______________________________________ Samples marked with * lie outside the scope of the invention.
TABLE 14______________________________________ DielectricSample Constant TCCNo. .epsilon.r (ppm/C) Q-value______________________________________*51 64 -11 2200*52 not sintered53 66 -142 600054 64 -22 6000*55 64 -2 68056 66 -2 310057 66 -2 360058 67 -2 500059 67 -2 680060 67 -1 5600*61 62 1 150062 68 -3 670063 68 -9 680064 67 -10 7300*65 64 -12 2500*66 not sintered67 67 -15 630068 65 -23 5800______________________________________ Samples marked with * lie outside the scope of the invention.
It will be understood from Tables 12, 13 and 14 that in a region .alpha. of FIG. 5, satisfactory properties are not obtained since the temperature coefficient of capacitance TCC is greatly shifted toward the minus side and in a region .gamma., satisfactory properties are not obtained since the temperature coefficient of capacitance TCC is greatly shifted toward the plus side. In a region .beta., satisfactory properties are not obtained since the dielectric constant is too small and in a region .delta., dense ceramic is not obtained since the sintering property is deteriorated.
It will further be understood that the Q-value decreases and the dielectric property is deteriorated as the amount of manganese becomes smaller than 0.01% by weight or no smaller than 0.5% by weight reckoned as MnCO.sub.3.
Furthermore, introduction of sodium deteriorates the sintering property. Accompanying this, the dielectric constant decreases, Q-value decreases and temperature coefficient of capacitance TCC is deteriorated.
As the amount of silicon increases, furthermore, the dielectric constant decreases, absolute value of the temperature coefficient of capacitance TCC increases and Q-value decreases.
On the other hand, the dielectric ceramic composition of the present invention exhibits excellent properties such as a dielectric constant of as large as not smaller than 50, a Q-value of not smaller than 3000 and a temperature coefficient of within 0.+-.30 ppm/.degree.C. Moreover, preventing the introduction of silicon makes it possible to prepare a ceramic having a stable temperature coefficient and a high dielectric constant.

Number	Date	Country
5-302781	Dec 1993	JPX
5-335563	Dec 1993	JPX
5-335569	Dec 1993	JPX
6-264787	Oct 1994	JPX

Number	Name	Date
4522927	Kashima et al.	Jun 1985
5116790	Bruno et al.	May 1992
5223462	Okawa	Jun 1993
5244851	Takahashi et al.	Sep 1993

Dielectric ceramic composition

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