Dielectric filter and dielectric duplexer including a movable probe

Information

  • Patent Grant
  • 6218914
  • Patent Number
    6,218,914
  • Date Filed
    Wednesday, January 20, 1999
    25 years ago
  • Date Issued
    Tuesday, April 17, 2001
    23 years ago
Abstract
A dielectric filter includes a shielding cavity frame having electric conductivity, a dielectric having electrodes formed on two opposing faces and disposed in the shielding cavity frame, and external coupling means, wherein the external coupling means includes an electric probe at least a part of which is covered with a covering dielectric.
Description




BACKGROUND OF THE INVENTION




1. Field of the Invention




The present invention relates to a dielectric filter and a dielectric duplexer for use in a communication base station or the like.




2. Description of the Related Art




A dielectric filter relating to the present invention is shown in FIG.


7


. Although this dielectric filter is described in copending U.S. patent application Ser. No. 924,040, now U.S. Pat. No. 6,052,041, this dielectric filter was not known yet in the art at the time when the invention, on the basis of which the priority of the present invention is claimed, was filed as Japanese Patent Application No. H-10-8860.





FIG. 7

is a perspective view of the dielectric filter


110


. In this figure, an upper lid


114


is removed so that the internal structure can be seen. The dielectric filter shown herein is, by way of example, of the two-stage band-rejection filter type including two disk-shaped dielectrics


112


disposed side by side in a shielding cavity frame


111


.




The dielectric filter


110


includes a shielding cavity frame


111


formed of metal, a dielectric


112


disposed in the shielding cavity frame


111


, and external coupling means


120


. The dielectric


112


is formed of ceramic in a disk shape and electrodes are formed of silver or the like on two opposite upper and lower surfaces thereof. The lower surface of the dielectric


112


is fixed via solder or the like to the inner bottom surface of the shielding cavity frame


111


thereby achieving electric connection. The external coupling means


120


includes an electric probe


121


made of a metal wire. The electric probe


121


is disposed in such a manner that it extends in a space between the upper surface of the dielectric


112


and the shielding cavity frame


111


without having contact with either the dielectric


112


or the shielding cavity frame


111


. By employing the above structure, it becomes possible to reduce the current flowing through the shielding cavity frame


111


thereby reducing the loss due to such a current thus achieving a TM-mode dielectric filter having a small size in height and having high unloaded Q.




The electric probe


121


is connected via solder to an external connector


113


attached to the shielding cavity frame


111


so that a signal is input and output via the electric probe


121


. That is, a signal is supplied via a cable connected to the external connector


113


and is passed through the electric probe


121


. The electric probe


121


is coupled with the dielectric


112


via capacitance created between the electric probe


121


and the electrode of the dielectric


112


. The dielectric


112


coupled with the electric probe


121


has resonance and thus serves as a band-rejection filter. The resultant signal is output through a cable connected to another external connector


113


.




In the above-described dielectric filter, the coupling between the electric probe and the dielectric is realized via the capacitance between the electric probe and the dielectric. Thus, the strength of the coupling depends on the capacitance between the electric probe and the dielectric. The capacitance is determined by the distance between the electric probe and the dielectric, the areas of surfaces facing each other, and the dielectric constant of a substance existing between them. The attenuation varies with the change in the strength of the coupling, and the characteristic of the dielectric filter vary in such a manner that the filter has a band-rejection or bandpass characteristic with a wide bandwidth when the coupling is strong while the bandwidth becomes narrow when the coupling is weak. Therefore, to achieve a dielectric filter having desired characteristics, it is required to adjust the coupling between the electric probe and the dielectric. That is, it is required to adjust the capacitance between the electric probe and the dielectric.




In the above-described dielectric filter, the electric probe made of a metal wire is used as the external coupling means. The capacitance may be varied, as described above, by varying the distance between the electric probe and the dielectric, the areas of the surfaces, and/or the dielectric constant. However, it is difficult to change the location of the electric probe connected to the external connector because it is difficult to change the location of the external connector attached to the shielding cavity frame. The dielectric constant of air is impossible to change. Thus, a most practical manner of adjusting the capacitance between the electric probe and the dielectric is to change the length of the electric probe thereby changing the areas of the surfaces facing each other.




However, it is a troublesome process to adjust the length of the electric probe by cutting the electric probe for each dielectric or for each dielectric filter including the dielectric. Furthermore, if once the electric probe is cut to a too short length, it is impossible to make a readjustment to increase the capacitance.




Furthermore, an electrical discharge occurs through air existing between the electric probe and the dielectric when the potential difference between them exceeds the dielectric strength of air. Such a discharge can cause a difference in the characteristic of the electrode or the electric probe of the dielectric filter.




In view of the problems described above, it is an object of the present invention to provide a dielectric filter and dielectric duplexer whose characteristics can be more easily adjusted and which have higher reliability.




SUMMARY OF THE INVENTION




According to an aspect of the invention, to achieve the above object, there is provided a dielectric filter including a shielding cavity frame having electric conductivity, a dielectric having electrodes formed on two opposing faces and disposed in the shielding cavity frame, and external coupling means, wherein the external coupling means includes an electric probe at least a part of which is covered with a covering dielectric.




In this dielectric filter, the covering dielectric covering the electric probe is preferably movable.




The movability of the covering dielectric may be achieved by connecting the covering dielectric to the electric probe by means of mating via screw threads.




According to another aspect of the invention, there is provided a dielectric duplexer including a shielding cavity frame having electric conductivity, a dielectric having electrodes formed on two opposing faces and disposed in the shielding cavity frame, external coupling means, input/output connection means and antenna connection means connected to the coupling means, wherein the external coupling means includes an electric probe at least a part of which is covered with a covering dielectric.




In this dielectric duplexer, the covering dielectric covering the electric probe is preferably movable.




The movability of the covering dielectric may be achieved by connecting the covering dielectric to the electric probe by means of mating via screw threads.




In the above-described dielectric filter and the dielectric duplexer according to the invention, it is possible to easily adjust the capacitance between the electric probe and the dielectric. Furthermore, it is possible to increase the dielectric strength between the electric probe and the dielectric.











BRIEF DESCRIPTION OF THE DRAWINGS





FIG. 1

is a perspective view of a dielectric filter according to the present invention;





FIG. 2

is a perspective view of external coupling means according to the present invention;





FIG. 3

is a perspective view of a second embodiment of a dielectric filter according to the present invention;





FIG. 4

is a perspective view of external coupling means of the second embodiment according to the present invention;





FIG. 5

is a perspective view of a third embodiment of a dielectric filter according to the present invention;





FIG. 6

is a perspective view of a dielectric duplexer according to the present invention; and





FIG. 7

is a perspective view of an another type of dielectric filter.











DESCRIPTION OF THE PREFERRED EMBODIMENTS




Referring now to

FIG. 1

, an embodiment of a dielectric filter according to the present invention is described below.

FIG. 1

is a perspective view of the dielectric filter


10


according to the present invention. In the figure, an upper lid


14


is removed so that the internal structure can be seen.




The dielectric filter


10


includes a shielding cavity frame


11


, disk-shaped dielectrics


12


, and external coupling means


20


. The shielding cavity frame


11


is formed of metal and external connectors


13


are attached to it so that a signal is input and output from and to the outside via cables. The external coupling means


20


are connected to the respective external connectors


13


via solder. Each dielectric


12


is formed of ceramic in a disk shape and electrodes are formed on it by means of coating and baking silver paste on two opposing surfaces. The lower surface of each dielectric


12


is fixed via solder or the like to the inner bottom face of the shielding cavity frame


11


thereby achieving electric connection. Alternatively, the dielectric


12


may be soldered to a ground plate or the like and may be placed in the shielding cavity frame


11


. In this embodiment, two dielectrics


12


are placed side by side and these two dielectrics


12


are connected to each other via a ¼-transmission line


15


so that the dielectric filter


10


acts as a two-stage band-rejection filter. The shielding cavity frame


11


may also be produced by forming an electrically conductive layer on the surface of a ceramic material. The dielectric


12


may also be formed into a square shape. The electrodes on the two opposing surfaces of the dielectric


12


may be formed into the structure of a multilayer thin film so as to reduce the loss.




The external coupling means


20


includes an electric probe


21


made up of a metal wire a desired part of which is covered with a resin or the like


22


serving as a covering dielectric. As for the resin


22


, polyprene or a similar resin is employed which can be easily formed into a desired shape and which has elasticity which makes it easy to perform the adjustment which will be described later. The resin


22


is formed into the shape of a cylinder with a diameter greater than the diameter of the electric probe


21


wherein a through-hole is formed such that it extends from one end of the cylinder to the opposite end or a semi-through-hole is formed such that one end of the semi-through-hole is closed with one end of the cylinder. The electric probe


21


is inserted into this hole and the resin


22


is moved to a desired position so that a desired part of the electric probe


21


is covered with the resin


22


as shown in FIG.


2


. Thus, the resin


22


is present between the electric probe


21


and the dielectric


12


. The resin


22


has a higher dielectric strength and a greater dielectric constant than air. Therefore, covering the electric probe


21


with the resin


22


results in a reduction in the probability that a discharge will occur between the electric probe


21


and the dielectric


12


. Furthermore, the capacitance can be varied by varying the dielectric constant between the electric probe


21


and the dielectric


12


using the resin


22


. More specifically, by varying the relative length of the part of the electric probe


21


inserted in the resin


22


, it is possible to vary the capacitance and thus the strength of the coupling between the electric probe


21


and the dielectric


12


. Thus it becomes possible to make an adjustment to obtain desired band characteristics.




Referring now to

FIGS. 3 and 4

, a second embodiment of the present invention is described below. Similar parts to those in the previous embodiment are denoted by similar reference numerals and they are not described in further detail herein.




As illustrated in

FIG. 3

, the dielectric filter of the present embodiment includes two disk-shaped dielectrics


12


each having electrodes formed on two opposing surfaces and disposed side by side in a shielding cavity frame


11


. The two dielectrics


12


are coupled to each other via a capacitive coupling member


16


. The dielectric filter


10




a


having the structure described above acts as a two-stage bandpass filter.





FIG. 4

is a perspective view illustrating an electric probe


21




a


made up of a metal wire and also illustrating a resin


22




a


covering the electric probe


21




a


, according to the present embodiment. As shown in

FIG. 4

, the electric probe


21




a


and the resin


22




a


are threaded such that the electric probe


21




a


serves as a male screw and the resin


22




a


acts as a female screw. The resin


22




a


is screwed onto the electric probe


21




a


thereby connecting them to each other. This allows the resin


22




a


to be easily connected to the electric probe


21




a


in a firm fashion so that the resin


22




a


is not moved by external vibrations or a mechanical shock. That is, the strength of the coupling between the electric probe


21




a


and the dielectric


12


is not changed by an external disturbance.




Referring now to

FIG. 5

, a third embodiment of the present invention is described below. Also in this figure, an upper lid


14


is removed so that the internal structure of a dielectric filter


10




b


can be seen. As in the first embodiment, two disk-shaped dielectrics


12


are connected to each other via a /4-transmission line


15


so that the dielectric filter


10




b


acts as a two-stage band-rejection filter. Similar parts to those in the previous embodiments are denoted by similar reference numerals and they are not described in further detail herein.




In the present embodiment, each external coupling means


20


includes an electric probe


21




b


made up of a metal wire a desired part of which is covered with a resin or the like


22




b


serving as a covering dielectric. As for the resin


22




b


, polyprene or a similar resin is employed which can be easily formed into a desired shape and which has elasticity which makes it easy to perform the adjustment which will be described later. This resin


22




b


has a hole corresponding to the electric probe


21




b


. The electric probe


21




b


is inserted into the hole and the resin


22




b


is moved to a desired position so that a desired part of the electric probe


21




b


is covered with the resin


22




b


. Thus, the resin


22




b


is present between the electric probe


21




b


and the dielectric


12


. The resin


22




b


has a higher dielectric strength and a greater dielectric constant than air. Therefore, covering each electric probe


21




b


with the resin


22




b


results in a reduction in the probability that a discharge will occur between the electric probe


21




b


and the dielectric


12


. Furthermore, the capacitance can be varied by varying the dielectric constant between the electric probe


21




b


and the dielectric


12


using the resin


22




b


. More specifically, by varying the relative length of the part of the electric probe


21




b


inserted in the resin


22




b


, it is possible to vary the capacitance and thus the strength of the coupling between the electric probe


21




b


and the dielectric


12


. Thus, it is possible to make an adjustment such that the dielectric filter has desired characteristics. Because the external coupling means


20


is formed into the shape of a plate, it is easier to obtain desired capacitance than in the first embodiment.




Referring to

FIG. 6

, an embodiment of a dielectric duplexer according to the present invention is described below. Similar parts to those in the previous embodiments are denoted by similar reference numerals and they are not described in further detail herein.




As illustrated in

FIG. 6

, a dielectric duplexer


30


includes a first dielectric filter


31




a


and a second dielectric filter


31




b


wherein the first dielectric filter


31


includes two disk-shaped dielectrics


12




a




1


and


12




a




2


disposed in a shielding cavity frame


11


and the second dielectric filter


31


includes two disk-shaped dielectrics


12




b




1


and


12




b




2


. The two dielectrics


12




a




1


and


12




a




2


of the first dielectric filter


31




a


are coupled to each other via a capacitive coupling member


16




a


so that the first dielectric filter


31




a


serves as a transmitting bandpass filter. The two dielectrics


12




b




1


and


12




b




2


of the second dielectric filter


31




a


have resonant frequencies different from those of the dielectrics


12




a




1


and


12




a




2


of the first dielectric filter


31




a


and are coupled to each other via a capacitive coupling member


16




b


so that the second dielectric filter


31




b


serves as a receiving bandpass filter. The external coupling means


20




a


coupled with the dielectric


12




a




1


of the first dielectric filter


31




a


is connected to an external connector


13




a


which is connected to an external transmitting circuit. The external coupling means


20




d


coupled with the dielectric


12




b




2


of the second dielectric filter


31




b


is connected to an external connector


13




b


which is connected to an external receiving circuit. The external coupling means


20




b


coupled with the dielectric


12




a




2


of the first dielectric filter


31




a


and the external coupling means


20




c


coupled with the dielectric


12




b




1


of the second dielectric filter


31




b


are connected to an external connector


13




c


which is connected to an external antenna.




The external coupling means


20




a


,


20




b


,


20




c


, and


20




d


each include an electric probe


21


made up of a metal wire a desired part of which is covered with a resin or the like


22


serving as a covering dielectric. By covering the electric probes


21


with resins


22


, it becomes possible to reduce the probability that a discharge will occur between the electric probes


21


and the dielectrics


12




a




1


,


12




a




2


,


12




b




1


, and


12




b




2


. Furthermore, the capacitance can be varied by varying the dielectric constant between the electric probe


21




s


and the dielectrics


12




a




1


,


12




a




2


,


12




b




1


, and


12




b




2


, using the resins


22


. More specifically, by varying the relative length of the part of the electric probes


21


inserted in the resins


22


, it is possible to vary the capacitance and thus the strength of the coupling between the electric probes


21


and the dielectrics


12




a




1


,


12




a




2


,


12




b




1


, and


12




b




2


. Thus it becomes possible to make an adjustment to obtain desired band characteristics.




As described above, the present invention has various advantages. That is, in the present invention, the electric probe made of metal and serving as the external coupling means in the dielectric filter or dielectric duplexer is covered with the covering dielectric thereby increasing the dielectric strength between the electric probe and the dielectric thus reducing the probability that a discharge will occur.




The covering dielectric on the electric probe is provided in a movable fashion whereby the part of the electric probe covered with the covering dielectric can be varied. This makes it possible to easily adjust the strength of the coupling between the electric probe and the dielectric without having to cut each electric probe to a shorter length. That is, by varying the coupling strength, it is possible to make an adjustment such that the pass band or the rejection band of the dielectric filter or the dielectric duplexer has a greater or smaller bandwidth as required. Thus, it is possible to easily produce dielectric filters and dielectric duplexers having desired characteristics depending on applications in which they are used.




Furthermore, by connecting the covering dielectric to the electric probe by means of mating via screw threads, it becomes possible to prevent the length of the part of the electric probe covered with the covering dielectric from varying after completion of the characteristic adjustment. That is, after adjusting the characteristics of the dielectric filter, the position of the covering dielectric on the electric probe is not varied by an external shock or vibrations. Thus, it is possible to prevent the dielectric filter and the dielectric duplexer from having a change in characteristics due to an external disturbance.




As described above, the present invention provides a dielectric filter and a dielectric duplexer whose characteristics can be easily adjusted and which have good long-term reliability.



Claims
  • 1. A dielectric filter including a shielding cavity frame having electric conductivity, a dielectric having electrodes formed on opposing faces and disposed in said shielding cavity frame, and an external coupling, said dielectric filter being characterized in that said external coupling includes an electric probe at least a part of which is covered with a covering dielectric which adjusts a capacitive coupling between said electric probe and said dielectric of said filter.
  • 2. A dielectric filter according to claim 1, wherein only a part of said electric probe is covered with said covering dielectric.
  • 3. A dielectric filter according to claim 1, wherein said covering dielectric comprises polyprene resin.
  • 4. A dielectric filter including a shielding cavity frame having electric conductivity, a dielectric having electrodes formed on opposing faces and disposed in said shielding cavity frame, and an external coupling, said dielectric filter being characterized in that said external coupling includes an electric probe at least a part of which is covered with a covering dielectric; wherein the covering dielectric covering said electric probe is movable.
  • 5. A dielectric filter according to claim 4, wherein the movability of said covering dielectric is achieved by connecting said covering dielectric to said electric probe via mating screw threads.
  • 6. A dielectric duplexer including a shielding cavity frame having electric conductivity; a dielectric having electrodes formed on two opposing faces and disposed in said shielding cavity frame, an external coupling, an input/output connection and an antenna connection connected to said external coupling, said dielectric duplexer being characterized in that said external coupling includes an electric probe at least a part of which is covered with a covering dielectric which adjusts a capacitive coupling between said electric probe and said dielectric of said duplexer.
  • 7. A dielectric duplexer according to claim 6, wherein only a part of said electric probe is covered with said covering dielectric.
  • 8. A dielectric duplexer according to claim 6, wherein said covering dielectric comprises polyprene resin.
  • 9. A dielectric duplexer including a shielding cavity frame having electric conductivity; a dielectric having electrodes formed on two opposing faces and disposed in said shielding cavity frame, an external coupling, an input/output connection and an antenna connection connected to said external coupling, said dielectric duplexer being characterized in that said external coupling includes an electric probe at least a part of which is covered with a covering dielectric wherein the covering dielectric covering said electric probe is movable.
  • 10. A dielectric duplexer according to claim 9, wherein the movability of said covering dielectric is achieved by connecting said covering dielectric to said electric probe via mating screw threads.
Priority Claims (1)
Number Date Country Kind
10-008860 Jan 1998 JP
US Referenced Citations (4)
Number Name Date Kind
2431941 Kihn Dec 1947
4727342 Ishikawa et al. Feb 1988
4740764 Gerlack Apr 1988
6016090 Iio et al. Jan 2000
Non-Patent Literature Citations (4)
Entry
A. B. Bereskin: “Multi-Screw Tuner for Any Mismatch”, Microwave Journal, vol. 26, No. 8, Aug. 1983, pp. 133-141.
Patent Abstracts of Japan, vol. 8, No. 70 (E-235), Apr. 3, 1984 & JP 58 218201 A, (Alps Denki KK), Dec. 19, 1983.
Patent Abstracts of Japan, vol. 15, No. 58 (E-1032), Feb. 12, 1991 & JP 02 285702 A (Matsushita Electric Ind. Co. Ltd.), Nov. 26, 1990.
European Search Report dated Apr. 22, 1999.