1. Field of the Invention
The present invention relates to a differential amplifier for amplifying and communicating an analogue signal and a test circuit having the differential amplifier installed therein.
2. Description of the Related Art
In general, a bipolar transistor or BiCMOS transistor is used for a differential amplifier. In recent years, there has been an increasing demand for a system-on-chip configuration and reduction of power consumption, in response to which the CMOS has been widely used. The differential amplifier of the CMOS configuration is expected to satisfy requirements such as low distortion and high-speed operation.
In the differential amplifier, when a resistive load is connected to an output terminal of the amplifier circuit A2, a current flow with respect to the transistor Tr5 decreases, resulting in signal communication at a lower speed. As a result, responses of the differential amplifier tend to be oscillatory.
When the resistive load is connected, a differential amplifier capable of class AB output with a source follower circuit or source ground amplifier circuit additionally installed therein is generally used, an example of which is shown in
In the foregoing configuration, a signal is communicated to both the transistors Tr7 and Tr8. Therefore, one of the transistors responds poorly, a responsiveness of the other transistor can be maintained. As a result, the connection of the resistive load to an output terminal of the amplifier circuit A3 does not deteriorate the response of the differential amplifier.
In
However, the class-AB differential amplifier, because of its number of stages larger than that of the class A differential amplifier, is unsuitable for a high-speed operation. When the output-stage transistors Tr7 and Tr8 are increased in size in order to improve the capacity of the differential amplifier, the output signal DiffOUT becomes an excessive load, thereby decreasing the operation speed. In the case of
The differential amplifier according to the present invention comprises:
According to the foregoing configuration, a drive signal of the first-polar transistor in the output-stage amplifier circuit is buffered by the first source follower circuit, and a drive signal of the second-polar transistor is buffered by the second source follower circuit and source ground amplifier circuit. In brief, those two drive signals are both buffered. Therefore, when the transistors are both increased in size in order to improve the capability thereof, a band represented by the differential amplifier is not narrowed. Further, because the drive signals are both produced from signals of the input-stage differential amplifier circuit, an output signal waveform of the output-stage amplifier circuit can be prevented from deteriorating.
In the differential amplifier having the foregoing configuration, it is preferable for the differential amplifier circuit to comprise:
It is also preferable to configure the differential amplifier circuit in the manner that linear resistances are respectively inserted between the source of the first input transistor and the constant current source, and between the source of the second input transistor and the constant current source. According to the foregoing configuration, a source negative feedback circuit using the linear resistances is connected to a differential pair comprised of the first and second input transistors. As a result, a linearity of the differential pair is enhanced, and the waveform can be further improved.
As a different mode of the source negative feedback circuit using the linear resistances, the following configuration may be employed.
The differential amplifier circuit comprises:
The linear resistance inserted between the sources of the first and second input transistors may be comprised of a parallel connection unit of two transistors, and gates of the parallel connection unit are respectively connected to the first and second input terminals. In such a configuration, it becomes unnecessary to use a resistance element of a high precision.
Further, in the foregoing configuration, the respective first and second load resistances in the differential amplifier circuit may be comprised of diode connectors of transistors. This configuration negates a nonlinear characteristic of the differential pair comprised of the first and second input transistors. In this manner, the linearity of the differential pair can be enhanced, and the waveform can be further improved. Further, it becomes unnecessary to provide a common mode feedback circuit outside the differential amplifier.
In the foregoing configuration, sub load resistances may be respectively connected in parallel to the first and second load resistances in the differential amplifier circuit. This arrangement decreases a current running through the load resistances to thereby improve a differential gain of the input transistors, which consequently enables a drive at a lower voltage. The sub load resistances maybe comprised of the diode connectors of transistors.
A possible configuration of the diode connectors comprising the first and second load resistances is that a gate of one of them is connected to a drain of the other, and a drain of one of them is connected to a gate of the other. According to this configuration, an open gain of the differential amplifier circuit can be prevented from decreasing.
Further, referring to the source ground amplifier circuit, the load resistance included therein may be comprised of a diode connector of the second-polar transistor.
Another possible configuration so as to control the waveform distortion is that linear resistances are respectively inserted between the source of the first-polar transistor in the second source follower circuit and the constant current source, and between the source of the first-polar transistor in the source ground amplifier circuit and the constant current source. This configuration also enhances the linearity of the differential pair and controls the waveform distortion. Further, it is unnecessary to regard the decrease of the open gain of the differential amplifier circuit.
Another possible configuration is that a linear resistance is inserted between a connection point, at which the source of the first-polar transistor in the second source follower circuit and the constant current source are connected to each other, and a connection point, at which the source of the first-polar transistor in the source ground amplifier circuit and the constant current source are connected to each other. The linear resistance is comprised of a parallel connection unit of transistors, wherein gates are respectively connected to the first and second output terminals of the differential amplifier circuit. This configuration also enhances the linearity of the differential pair and controls the waveform distortion. Further, it becomes unnecessary to regard the decrease of the open gain of he differential amplifier circuit and to provide the highly precise resistance element.
An LSI test circuit incorporating the differential amplifier configured in the foregoing manner as an input amplifier or output amplifier for test use is advantageous. In the case of the LSI, an LSI test is implemented without any limitation to a signal amplitude and signal band, and further, an input buffer for shaping an input signal can be reduced.
Additional objects and advantages of the present invention will become apparent from the following detailed description of preferred embodiments thereof, which are best understood with reference to the accompanying drawings.
In all these figures, like components are indicated by the same numerals
Hereinafter, preferred embodiments of a differential amplifier according to the present invention are described referring to the drawings. In the description, a first polarity of a MOS transistor is represented by P channel, and a second polarity thereof by N channel.
As shown in
In the differential amplifier circuit A1, a positive-side input signal INP is applied to a gate of a P-channel input transistor Tr1, wherein a source is connected to a constant current source E1, and a drain of an N-channel transistor Tr3 for load resistance is connected to a drain. A negative-side input signal INM is applied to a gate of a P-channel input transistor Tr2, wherein a source is connected to the constant current source E1, and a drain of an N-channel transistor Tr4 for load resistance is connected to a drain. Sources of the transistors Tr3 and Tr4 are grounded, and bases thereof are biased.
In the first source follower circuit A4, a first output signal DiffOUTP of the differential amplifier circuit A1 is applied to a gate of a P-channel transistor Tr6 for amplification, wherein a source is connected to the constant current source E3, and a drain is grounded.
In the second source follower circuit A6, the first output signal DiffOUTP of the differential amplifier circuit A1 is applied to a gate of a P-channel transistor Tr9 for amplification, wherein a source is connected to a constant current source E4, and a drain is grounded.
In the source ground amplifier circuit A7, a second output signal DiffOUTM of the differential amplifier circuit A1 is applied to a gate of a P-channel transistor Tr10 for amplification, and an output signal OUTM′ of the second source follower circuit A6 is applied to a source thereof. A drain of the transistor Tr10 is connected to a drain of an N-channel transistor Tr11 for load resistance. The transistor Tr11 has a polarity same as that of a transistor Tr8 in the output-stage amplifier circuit A3. The transistor Tr11 has a diode structure, wherein a source is grounded and a gate and a drain thereof are connected to each other.
In the output-stage amplifier circuit A3, a source of aP-channel transistor Tr7 is connected to a high-potential-side power source, a drive signal OUTP is applied from the first source follower circuit A4 to a gate of the P-channel transistor Tr7, and a drain the P-channel transistor Tr7 is connected to a drain of the N-channel transistor Tr8. A drive signal OUTM is applied from the source ground amplifier circuit A7 to a gate of the transistor Tr8, and a source of the transistor Tr8 is grounded. An output signal OUT is outputted from a drain connection point, at which the drains of the transistors Tr7 and Tr8 are connected to each other. The connection point is connected to a terminal for the first output signal DiffOUTP of the differential amplifier circuit A1 via a phase compensation capacity C1.
In the differential amplifier configured as described, the drive signals OUTP and OUTM of the output-stage transistors Tr7 and Tr8 are both buffered. Therefore, when the transistors Tr7 and Tr8 are increased in size in order to improve the capability, a band represented by the differential amplifier is not narrowed.
The drive signal OUTP of the output-stage transistor Tr7 is a signal resulting from buffering the first output signal DiffOUTP in the first source follower circuit A4. In contrast to that, the drive signal OUTM of the output-stage transistor Tr8 is a signal resulting from amplifying a difference between the signal OUTM′, which is the output signal DiffOUTP buffered in the second source follower circuit A6, and the second output signal DiffOUTM, which is an inversion signal of the output signal DiffOUTP, in the source ground amplifier circuit A7. To put it differently, the two drive signals OUTP and OUTM of the output-stage amplifier circuit A3 are both generated from the signals of the differential amplifier circuit A1. As a result, the waveform of the output signal OUT of the amplifier circuit A3 can be prevented from deteriorating.
In an embodiment 2 of the present invention, the waveform distortion can be more effectively controlled compared to the embodiment 1, which is hereinafter described referring specific examples.
Referring to a differential amplifier shown in
The insertion of the linear resistances R1 and R2 enhances a linearity of a differential pair (Tr1 and Tr2), and further improves the waveform compared to the configuration of
Referring to a differential amplifier shown in
The insertion of the linear resistances R3 and R4 enhances a linearity of a differential pair (Tr9 and Tr10), and advantageous in that the decrease of the open gain in the differential amplifier circuit A1 can be disregarded compared to the configuration of
Referring to a differential amplifier shown in
According to the foregoing configuration, the linearity of the differential pair (Tr1 and Tr2) is enhanced, and further, a wider range of an input voltage can be provided compared to the configuration of
Referring to a differential amplifier circuit shown in
The foregoing configuration can achieve an effect similar to that of the configuration in
In the case of a differential amplifier shown in
According to the foregoing configuration, the linearity of the differential pair (Tr9 and Tr10) is enhanced, and further, a wider range of an input voltage can be provided compared to the configuration of
In the case of a differential amplifier shown in
The foregoing configuration can achieve an effect similar to that of the configuration in
For reference, as a possible configuration, the configurations from
An embodiment 3 of the present invention is capable of controlling more effectively the waveform distortion compared to the embodiment 1.
Referring to a differential amplifier shown in
According to the foregoing configuration, a non-linearity of the differential pair (Tr1 and Tr2) is negated by a non-linearity of a differential pair (Tr3′ and Tr4′). In this manner, the linearity of the differential pair can be enhanced to thereby further improve the waveform. Further, it becomes unnecessary to provide a common mode feedback circuit, which is generally necessarily provided outside the differential amplifier.
The configuration of
An embodiment 4 of the present invention achieves an operation with a voltage lower than in the embodiment 1.
Referring to a differential amplifier shown in
According to the foregoing configuration, a resistance value of a load resistance portion is decreased. Therefore, a current of the constant current source E1 can be ensured despite a lowered power-source voltage, and a differential gain of the differential amplifier circuit A1 is increased. As a result, the differential amplifier can be driven with a lower voltage.
A differential amplifier shown in
The foregoing configuration can achieve an effect similar to that of the configuration shown in
The configurations of
According to an embodiment 5 of the present invention, a frequency band of a differential amplifier is improved.
In a differential amplifier shown in
According to the foregoing configuration, a zero point appearing near a home position as a result of the phase compensation performed by a phase compensation capacity C1 is separated from the home position again by means of the zero-point compensation resistance R9. This consequently improves the frequency band.
The configuration of
An embodiment 6 of the present invention relates to an improvement of impedance matching.
In a differential amplifier shown in
According to the foregoing configuration, when the differential amplifier is used as a driver amplifier, it becomes easier to perform the impedance matching, thereby facilitating a design of a transmission passage.
The configuration of
For reference, in the embodiments 1 through 6, the first polarity is represented by the P channel, and the second polarity is represented by the N channel. On the contrary, the first polarity may be represented by the N channel, and the second polarity may be represented by the P channel, in which case a similar effect can be achieved.
As described, a differential amplifier according to the present invention exerts an effect of mitigating a limitation with respect to the amplitude and band of a signal. Based on that, as shown in
In the course of testing a characteristic of the multi-channel ADCs, a test signal inputted from an LSI tester is limited in amplitude when expanded in band. Therefore, it is essential to provide an input buffer having an amplifying function, whereas an ON-resistance of the switches 13 and 14 becomes a disadvantage in expanding the band of the test signal.
In contrast to that, according to the configuration of
This technology is applicable not only to the test for the multi-channel ADC, but also to tests for a multi-channel DAC (D/A converter) and differential ADC and DAC achieving a similar effect.
The present invention is not limited to the foregoing embodiments, and various modifications within the scope of its technical idea can be implemented.
Number | Date | Country | Kind |
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P2003-279707 | Jul 2003 | JP | national |