1. Field of the Invention
The present invention relates to a level shifter, and more particularly to a differential type level shifter capable of performing common-mode glitch interference cancellation in a half-bridge or full-bridge high-side driver.
2. Description of the Related Art
To describe the related art of the present invention, the relation between a level shifter and a half-bridge or full-bridge high-side driver shall be introduced first. Please refer to
The pulse generator 101 is used for generating a first clock signal CLK and a second clock signal CLKB, wherein the first clock signal CLK is interleaved with the second clock signal CLKB. The level shifter 102 is used to up shift the first clock signal CLK and the second clock signal CLKB from low side to provide counterpart signals for the pulse filter 103 at high side. The pulse filter 103 is used for cancelling a common-mode glitch interference accompanying the power lines of VBOOT and HB, and generating a set signal VSET and a reset signal VRESET to the latch 104. The latch 104 is used for sending a signal to a driver to switch a high-side power MOSFET During the switching, a glitch is generated due to the capacitive characteristic of a capacitor CBOOT, i.e., the voltage difference hold between the two plates of a capacitor will not change abruptly. As a result, the certain period the capacitor takes to reach a stable state causes a glitch period. The pulse filter 103 is therefore used to deal with the glitch problem to prevent false triggering of the latch 104.
One solution to improve the glitch immunity of the half-bridge or full-bridge high-side driver is to use a level shifter of symmetric structure. Please refer to
By the symmetric structure, the voltage potentials VSET and VRESET at the drain terminals of the first pair of NMOS transistors 203˜204 are supposed to change simultaneously when a glitch is produced in the power line VBOOT so that the voltage difference between the drain terminals of the first pair of NMOS transistors 203˜204 remain unchanged and the latch 210 will not be false triggered. However, if the voltage potentials VSET and VRESET at the drain terminals of the first pair of NMOS transistors 203˜204 fall below a threshold voltage that the first pair of NMOS transistors 203˜204 and the second pair of NMOS transistors 205˜206 are forced to operate in triode region, then the latch 210 may be false triggered.
Therefore, there is a demand to provide a robust level shifter that can reduce the voltage dropt of the set signal and the reset signal in spite of the glitch to guarantee the normal operation of the latch.
One objective of the present invention is to provide an effective and robust means for a level shifter to process an inherent glitch from a power line of a half-bridge or full-bridge high-side driver.
Another objective of the present invention is to provide a concise differential type level shifter capable of reducing an inherent glitch from a power line of a half-bridge or full-bridge high-side driver.
To achieve the foregoing objectives, the present invention provides a differential type level shifter, comprising: a differential type level shifter, used in a half-bridge or full-bridge high-side driver, the differential type level shifter comprising: a differential pair of transistors, having a pair of first terminals, a pair of second terminals and a common terminal, with the pair of first terminals coupled to a first clock signal and a second clock signal; a current source, coupled between the common terminal and a reference ground, used to provide a bias current; and a pair of loading devices, having a common end and a pair of output ends, with the common end coupled to a power line, the pair of output ends coupled to the pair of second terminals; wherein the pair of second terminals are used to generate a set signal and a reset signal in response to the first clock signal and the second clock signal.
To make it easier for our examiner to understand the objective of the invention, its structure, innovative features, and performance, we use a preferred embodiment together with the attached drawings for the detailed description of the invention.
The present invention will be described in more detail hereinafter with reference to the accompanying drawings that show the preferred embodiments of the invention.
Please refer to
In this embodiment, the pair of loading resistors 301˜302 have a common end, a pair of output ends, with the common end coupled to a power line VBOOT, the pair of output ends coupled to the transistor 303, and the transistor 304. The differential pair of transistors 303˜304 have a pair of gate terminals, a pair of drain terminals, and a common source terminal, with the pair of drain terminals coupled to the output ends, the pair of gate terminals coupled to a first clock signal CLK and a second clock signal CLKB, and the common source terminal coupled to the current source transistor 305. The current source transistor 305 has a drain terminal, a gate terminal and a source terminal, with the drain terminal coupled to the common source terminal of the differential pair of transistors 303˜304, the gate terminal coupled to a DC bias voltage VB, and the source terminal coupled to a reference ground, wherein the current source transistor 305 is used to provide a bias current I, and the pair of drain terminals of transistors 303˜304 are used to generate a set signal VSET and a reset signal VRESET in response to the first clock signal CLK and the second clock signal CLKB.
The operation principle of the circuit in
Due to the differential type design of the present invention, the bias current I in the current source transistor 305 is approximately divided into two currents I/2, I/2 for the transistor 303 and the transistor 304 respectively, so the infected negative pulses of the set signal VSET and the reset signal VRESET will have a valley level VL1, which is much higher than the threshold voltage Vth to prevent false triggering of the latch 310. However, in prior art circuits of which the level shifter is not the differential type, a valley level VL2 of the set signal VSET and the reset signal VRESET, lower than the threshold voltage Vth, may false trigger the latch 310.
To further reduce the glitches on the first clock signal CLK and the second clock signal CLKB, a cascaded differential pair is implemented. Please refer to
In this embodiment, the pair of loading resistors 401˜402 have a common end, a pair of output ends, with the common end coupled to a power line VBOOT, the pair of output ends coupled to the first differential pair of transistors 403˜404. The first differential pair of transistors 403˜404 have a first pair of gate terminals, a first pair of drain terminals and a first pair of source terminals, with the first pair of drain terminals coupled to the first end and the second end of the pair of loading resistors 401˜402, the first pair of gate terminals coupled to a reference ground, and the first pair of source terminals coupled to the second pair of transistors 405˜406. The second differential pair of transistors 405˜406 have a second pair of gate terminals, a second pair of drain terminals and a common source terminal, with the second pair of drain terminals coupled to the first pair of source terminals, the second pair of gate terminals coupled to a first clock signal CLK and a second clock signal CLKB, and the common source terminal coupled to the current source transistor 407. The current source transistor 407 has a drain terminal, a gate terminal and a source terminal, with the drain terminal coupled to the common source terminal, the gate terminal coupled to a DC bias voltage VB, and the source terminal coupled to the reference ground, wherein the current source transistor 407 is used to provide a bias current I, and the first pair of drain terminals are used to generate a set signal VSET and a reset signal VRESET in response to the first clock signal CLK and the second clock signal CLKB. It can be seen that the gate-drain parasitic capacitors across the second pair of drain terminals and the second pair of gate terminals are shielded by the first pair of transistors 403˜404, so the first clock signal CLK and the second clock signal CLKB can be less influenced by the interference from the power line VBOOT, and the false triggering of the latch 410 can be further prevented.
Through the implementation of the above preferred embodiments of the present invention, a concise, effective and robust level shifter capable of processing an inherent glitch from a power line of a half-bridge or full-bridge high-side driver is attained.
While the invention has been described by way of examples and in terms of preferred embodiments, it is to be understood that the invention is not limited thereto. To the contrary, it is intended to cover various modifications and similar arrangements and procedures, and the scope of the appended claims therefore should be accorded the broadest interpretation so as to encompass all such modifications and similar arrangements and procedures.
In summation of the above description, the present invention herein enhances the performance than the conventional structure and further complies with the patent application requirements and is submitted to the Patent and Trademark Office for review and granting of the commensurate patent rights.