Many devices now include displays for presenting visual information. In general, a display has several attributes that affect its suitability for a particular purpose. Among these attributes are size, brightness, resolution, clarity, and energy consumption. Display sizes-can range from between less than an inch to a few inches diagonal viewing area for handheld devices, such as cellular telephones and portable televisions, to between tens or hundreds of feet for stadium displays. Depending on the desired viewing area for a particular display application, various technologies may be more suitable than others.
Active matrix liquid crystal displays are widely used in a variety of applications, including notebook computers, flat panel monitors, handheld computers, cellular phones, and flat panel televisions. Active matrix liquid crystal displays may be fabricated by depositing and patterning various metals, insulators, and semiconductors on substrates. Such displays commonly employ semiconductor devices, such as amorphous silicon (a-Si) thin film transistors. Each pixel in the active matrix liquid crystal display may be coupled to an address transistor, which controls the voltage on each pixel and therefore its transmittance.
A growing application for active matrix liquid crystal displays is in large area televisions, which may have a diagonal size of up to 50 inches or more. However, thin film transistor controlled pixel arrays are difficult to manufacture for this application since a relatively large number of process steps are required to construct the thin film transistors. The total mask count may be 5 or 6 or more, which is burdensome. While the yields for small displays can be quite high, it is difficult to obtain an acceptable yield for large area displays. In addition, the design rules for patterning the various insulator, metal, and semiconductor layers are the same for small and large thin film transistor liquid crystal displays, requiring expensive photo-exposure equipment for large area substrates. This all increases the manufacturing expense of such thin film transistor liquid crystal displays.
Nonlinear resistors can be used in place of transistors in a display circuit. A nonlimiting example of a nonlinear resistor is a thin film diode. Thin film diodes, including those referred to as metal-insulator-metal diodes, can be more economical to fabricate than a-Si thin film transistors. When a single thin film diode is used in series with a liquid crystal pixel, any variation in the thin film diode characteristic across the display area or over time or temperature can lead to a variation in the pixel voltage. This can result in poor gray scale control, poor uniformity, slow response time, and/or image sticking. In addition, it is difficult, if not impossible, to scale up single thin film diode liquid crystal displays to a diagonal size larger than about 10 inches without severe brightness gradients.
However, a differential circuit may mitigate, if not eliminate, the drawbacks of the single thin film diode approach.
The fabrication of a dual select diode matrix array for active matrix liquid crystal displays can be achieved in only two or three mask steps, with relaxed design rules that scale with the display size. When operated in a dual select mode, the pixel circuit can act as an analog switch. The dual select diode circuit is not a two-terminal switching device, but rather a three-terminal switching device similar to a circuit utilizing thin film transistors. A dual select diode circuit can perform comparably to a thin film transistor liquid crystal display as a result of accurate gray scale control, fast response time, and tolerance for variations in thin film diode characteristics over time and across the viewing area. Such a dual select diode liquid crystal display also can be relatively insensitive to RC delays on the select and data lines and can therefore be scaled up to very large area, for example, exceeding 40 inches in diagonal size.
One example of a nonlinear resistor suitable for use in a differentiating module is an SiNx thin film diode, which includes a silicon-rich silicon nitride layer sandwiched between opposing electrodes, such as a transparent electrode (e.g. ITO) and a metal electrode. Although the switching characteristics of SiNx diodes are suitable for use in active matrix liquid crystal displays, they can experience an aging phenomenon over time, i.e. their ON current at a fixed voltage can decrease. Although a dual select diode circuit can limit the effects of aging, such aging may eventually lead to brightness gradients along the direction of the select lines in the display, burn-in of fixed images, and/or other undesirable side effects. Such aging phenomenon can lessen display quality throughout a display's lifetime, which can be at least 30,000 hours to 60,000 hours in television or monitor applications.
A row of pixels can be selected by applying opposite polarity select signals to the select lines associated with that row of pixels. A display can include a scan controller for applying such select signals to the various select rows of a display when a row associated with those select lines is to be selected. Corresponding data signals can be applied by a data controller to data lines, which can take the form of ITO stripes functioning as counter-electrodes of liquid crystal pixels on the color plate. A nonlimiting example of a suitable scan controller includes one or more row driver integrated circuits; and a nonlimiting example of a data controller includes one or more column driver integrated circuits. In some embodiments, scanning and loading data may be performed by the same controller. The dual select diode active matrix liquid crystal display can output an image corresponding to the video signals applied to the data lines.
The aging phenomena in thin film diodes, or other nonlinear resistors, may be accelerated when a peak current flows instantaneously through the diode, significantly exceeding the steady-state current in the pixel circuit. In order to eliminate or reduce the peak current, and therefore the aging, each select line may be addressed with a specially configured select pulse, such as a sloped select pulse. For example, a select pulse characterized by a rise time between approximately 0.2 μsec to 4.0 μsec may suppress the peak current.
A reduction in the peak current can slow decreases to the ON current of a thin film diode over time, thus increasing display effectiveness over a longer period of time. In some embodiments, the select pulse may be increased to its final value in discrete steps. In some embodiments, the select pulse may be sloped according to a continuous, piecewise continuous, or noncontinuous function. The duration over which the select pulse is increased and the function of the slope may be selected to minimize aging affects of a particular display circuit. The examples provided herein are not limiting.
In some embodiments, a select line may be addressed by select pulses with amplitudes that are configured to compensate for aging during the operating lifetime of the display. For example, in some embodiments, the voltage of a select pulse may be increased over the course of a display's lifetime to compensate for the aging phenomenon described above.
Increasing the voltage over time can keep the ON current substantially sufficient to charge the pixels to the desired gray level throughout the lifetime of the display. In other words, the increase in the select pulse amplitudes can compensate for the reduction in the ON current of the diode over time. Such an increase in voltage may be used in addition to or alternative of select pulse sloping.
Characteristics of a select pulse other than voltage amplitude may additionally or alternatively be changed over time to compensate for the aging phenomenon. For example, the function of a select pulse may be changed over time, becoming steeper, less steep, or having a different shape.
The configuration of a select pulse can be changed over time according to a predetermined schedule, such as a schedule that corresponds to the operating time of a display. For example, display behavior may be tested and/or predicted, and a select pulse schedule may be created to, change the character of the select pulse to compensate for and/or limit aging phenomenon based on the tested and/or predicted display behavior. In some embodiments, the configuration of a select pulse may be adjusted based on real-time measured display performance. In other words, changes may be based on measurements taken throughout the life of a display. The configuration of a select pulse may be changed one or more times throughout the course of a display's life. For example, in some embodiments, pulse amplitude may be increased by a predetermined amount upon reaching a triggering event, such as 1,000 hours of operation, 5,000 hours of operation, 10,000 hours of operation, etc. In such cases, the increase in the pulse amplitude can be the same at each triggering event, or a change at a triggering event can be different than a change at another triggering event. The duration between such milestones may also be uniform or different. Similarly, the duration may be selected to be virtually any length in order to effectively compensate for aging.
Although described in the context of dual select diode liquid crystal display arrangements, the above described compensation and prevention mechanisms can be applicable to any arrangement that is susceptible to similar aging phenomenon. Accordingly, the correction methods described herein can be applied to such arrangements to improve performance throughout a device's lifetime.
Although the present disclosure has been provided with reference to the foregoing operational principles and embodiments, it will be apparent to those skilled in the art that various changes in form and detail may be made without departing from the spirit and scope defined in the appended claims. The present disclosure is intended to embrace all such alternatives, modifications and variances. Where the disclosure or claims recite “a,” “a first,” or “another” element, or the equivalent thereof, they should be interpreted to include one or more such elements, neither requiring nor excluding two or more such elements.
This application claims the benefit of U.S. Provisional Application No. 60/512,032, filed Oct. 17, 2003, No. 60/527,128 filed Dec. 5, 2003, and No. 60/560,431, filed Apr. 7, 2004, each of which is incorporated by reference.
Number | Date | Country | |
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60512032 | Oct 2003 | US | |
60527128 | Dec 2003 | US | |
60560431 | Apr 2004 | US |