Number | Date | Country | Kind |
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93 13930 | Nov 1993 | FRX |
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5038317 | Callan et al. | Sep 1991 | |
5056060 | Fitch et al. | Oct 1991 | |
5111450 | Cooledge et al. | May 1992 | |
5175536 | Aschliman et al. | Dec 1992 | |
5243273 | McAuliffe et al. | Sep 1993 | |
5257393 | Miller | Oct 1993 | |
5263149 | Winlow | Nov 1993 | |
5349685 | Houlberg | Sep 1994 | |
5410717 | Floro | Apr 1995 | |
5440697 | Boegel et al. | Oct 1995 | |
5479610 | Roll-Mecak et al. | Dec 1995 |
Entry |
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Autotestcon 90. IEEE Systems Readiness Technology Conference, 21 Sep. 1990, San Antonio, TX, USA 269-273, XP 201785 Joe Beat ' ATE digital testing using a programmable microsequencer architecture. |