BRIEF DESCRIPTION OF THE SEVERAL VIEWS OF THE DRAWINGS
A general architecture that implements the various feature of the invention will now be described with reference to the drawings. The drawings and the associated descriptions are provided to illustrate embodiments of the invention and not to limit the scope of the invention.
FIG. 1 is a diagram showing the configuration of an evaluation system using a digital oscilloscope 100 to which the present invention is applied;
FIG. 2 is a block diagram schematically showing the configuration of the oscilloscope 100;
FIG. 3 is a diagram of an input signal waveform displayed with a circuit board 30 in FIG. 1 powered off;
FIG. 4 is a diagram of an example in which a repeated signal waveform of binary 7-bit data output as a digital signal is sampled as an input signal Vi;
FIG. 5A is a diagram showing only an initial waveform of the repeated waveform in FIG. 4, with a time axis enlarged, and FIG. 5B is a diagram showing an example of a waveform obtained by a statistical process in accordance with a first embodiment of the present invention on the basis of the waveform in FIG. 5A;
FIG. 6 is a flowchart showing operations of the oscilloscope in accordance with the first embodiment of the present invention;
FIG. 7 is a diagram showing an example of measured values determined by sampling a waveform such as the one shown in FIG. 5A;
FIG. 8 is a diagram illustrating a process for determining a standard deviation;
FIG. 9 is a diagram showing the distribution (normal distribution curve) of sample values obtained at a sample time tn;
FIG. 10 is a diagram showing an example of two statistically processed waveforms W2 and W3 superimposedly displayed by a waveform superimposition circuit 10a; and
FIG. 11 is a diagram showing an example in which a waveform signal such as the one shown in FIG. 4 is displayed in an eye pattern.