The present invention relates to a high-power directly modulated laser, and more particularly to a high-power directly modulated laser into which a directly modulated laser and an optical amplifier are integrated.
A distributed feedback laser (DFB laser) or a distributed Bragg reflector laser (DBR laser), which is a directly modulated laser, has a narrow oscillation linewidth controlled by a diffraction grating and serves as an optical device suitable for high-density wavelength division multiplexing. In recent years, a higher transmission capacity has been desired along with an increase in communication traffic, and therefore the directly modulated laser is required to have an even higher modulation rate. On the other hand, at the same time the directly modulated laser is required to have a longer transmission distance and more branches to reduce costs of communication infrastructure facilities, and is also needed to have higher laser power. For common semiconductor lasers, the output power is dependent on the length of a resonator, and an optical device having a longer resonator is needed in order to increase the power.
However, a longer resonator leads to a higher junction capacitance of a semiconductor, which makes it difficult to achieve high-rate modulation. Thus, there is a trade-off relationship between the output power and the modulation rate. For this reason, an approach having been used to increase the power is to connect a semiconductor optical amplifier (SOA) to the output side of the directly modulated laser in cascade for optical amplification. To increase the power of the EA-DFB laser, into which a DFB laser and an electroabsorption (EA) optical modulator are integrated, a structure having an optical amplifier additionally integrated thereinto has been proposed (for example, see Patent Document 1).
The DFB laser 121 and the SOA 123, which are components of the directly modulated laser 102, are formed on one n-type InP substrate 38. In the waveguide structures, the lower clad is the n-type InP substrate 38, and the upper clad is a p-type InP layer 39. The refractive indexes of the upper and lower clads are designed to be lower than that of the waveguide core portion to achieve light confinement. For the components of the directly modulated laser 102, the positive electrodes are upper electrodes 33 and 35, and the ground is a lower electrode 36. The region of the upper surface of the directly modulated laser 102 excluding the electrodes is protected by an insulating film 37.
Patent Literature 1: Japanese Patent Laid-Open No. 2013-258336
One problem of the directly modulated laser having the DFB laser and the SOA integrated thereinto is laser oscillation (parasitic oscillation) in the SOA unit. A constant current is injected into the upper electrode 33 of the SOA 123, and a biased modulation current is injected into the upper electrode 34 of the DFB laser 121. When the modulation signal has a minimum value, the optical power output from the DFB laser 121 is low so that the stimulated emission in the SOA 123 is weak and carriers are accumulated in the active region. As a result, strong amplified spontaneous emission (ASE) is output from the SOA 123. The ASE emitted to the rearward of the SOA 123, that is in the −Z direction, is incident on the DFB laser 121. Due to the reflection by a diffraction grating in the DFB laser 121, part of the light returns to the SOA 123 again, which causes the SOA 123 to generate a laser oscillation.
To date, there is no optical isolator that can be monolithically formed on a semiconductor substrate together with a directly modulated laser and an SOA. Therefore, it is difficult, in the laser having the directly modulated DFB laser and the SOA integrated thereinto, to limit the light propagation direction to only one direction from the DFB unit to the SOA unit. Since the return of part of the light to the SOA 123 lowers the laser oscillation threshold in the SOA 123, a parasitic oscillation will occur when a current of a certain value or more is injected into the SOA 123.
As shown in
It is an object of the present invention to provide a high-power directly modulated laser in which oscillation of an SOA unit is suppressed.
To achieve the object, an embodiment of the present invention provides a high-power directly modulated laser that includes a directly modulated laser driven by a drive signal to which a modulation signal is applied and a semiconductor optical amplifier (SOA). The high-power directly modulated laser has an optical absorption element between the directly modulated laser and the SOA, and the directly modulated laser, the SOA, and the optical absorption element are monolithically integrated on one substrate.
According to the present invention, the optical absorption element provided between the directly modulated laser and the SOA allows the oscillation of the SOA to be suppressed, and the monolithic integration makes it possible to increase the power while maintaining compactness.
Embodiments of the present invention will be described in detail below with reference to the accompanying drawings.
The LD 111 is a distributed feedback laser (DFB laser) or a distributed Bragg reflector laser (DBR laser) having a strained multi-quantum well (MQW) structure made of an InGaAsP-based or InGaAlAs-based material. The LD 111 outputs a wavelength in the wavelength range of optical communication (for example, a wavelength of 1570 nm). A DFB laser having a uniform diffraction grating is described as an example of the LD 111 according to the embodiment.
To increase the optical power emitted from a front waveguide output end 110, a rear waveguide output end 109 is provided with a highly reflective film 2. When the LD 111 is a DFB laser or a DBR laser in which a ¼λ shift structure is added to the diffraction grating, the highly reflective film 2 is replaced with a non-reflective film.
Although the material and the MQW structure of the active region of the SOA 113 are usually the same as those of the LD 111, the present invention is effective even when they are different.
The LD 111, the EA attenuator 112, and the SOA 113 have respectively waveguide structures including waveguides(20, 21, 22) for light confinement, and main functions of the components are converged into respective waveguide units. The LD waveguide 20, the EA attenuator waveguide 21, and the SOA waveguide 22 are optically connected to each other by connection waveguides 23 and 24. The light having propagated through the waveguides is output from the front waveguide output end 110. The front waveguide output end 110 is provided with a non-reflective film 1 to suppress return light. Although the components in
The LD 111, the EA attenuator 112, and the SOA 113, which are the components of the high-power directly modulated laser 101, are monolithically integrated on one n-type InP substrate 8. The structure of the high-power directly modulated laser 101 in the XY cross section is a Buried Hetero (BH) structure. In the waveguide structures, the lower clad is the n-type InP substrate 8, and the upper clad is a p-type InP layer 9. The lateral clad is a buried and regrown Fe-added Semi-insulating (SI) layer 10 (shown in
The refractive indexes of the upper and lower clads are designed to be lower than that of the waveguide core portion to achieve light confinement. For the components of the high-power directly modulated laser 101, the positive electrodes are upper electrodes 3, 4, and 5, and the ground is a lower electrode 6. The region of the upper surface of the high-power directly modulated laser 101 excluding the electrodes is protected by an insulating film 7.
The EA attenuator 112 serving as an optical absorption element has an MQW structure made of an InGaAsP-based or InGaAlAs-based material as with the LD 111. The amount of optical loss of the EA attenuator can be controlled by short-circuit, opening, or application of a bias voltage between the upper electrode 4 and the lower electrode 6.
According to the structures described above, when the ASE emitted from the SOA 113 to the LD 111 is reflected by the diffraction grating in the LD 111 and returns to the SOA 113 again, it moves back and forth in the EA attenuator 112. Therefore, a large loss can be caused to the light returning to the SOA 113, and the parasitic oscillation of the SOA can be suppressed.
In
According to the embodiment, the EA attenuator 112 is provided between the LD 111 and the SOA 113, and consequently, even if the modulation signal has a minimum value when the injection current or the applied voltage of the LD 111 is directly modulated, the parasitic oscillation that may be caused in the SOA 113 can be suppressed.
1, 31 non-reflective film
2, 32 highly reflective film
3 to 5, 33, 35 upper electrode
6, 36 lower electrode
7, 37 insulating film
8, 38 n-type InP substrate
9, 39 p-type InP layer
10 SI layer
20, 40 LD waveguide
21 EA attenuator waveguide
22, 42 SOA waveguide
23, 24, 43 connection waveguide
101 high-power directly modulated laser
102 directly modulated laser
109, 119 rear waveguide output end
110, 120 front waveguide emission end
111 directly modulated laser (LD)
112 EA attenuator
113, 123 SOA
121 DFB laser
Number | Date | Country | Kind |
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2019-022599 | Feb 2019 | JP | national |
Filing Document | Filing Date | Country | Kind |
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PCT/JP2020/004953 | 2/7/2020 | WO | 00 |