Disk drives comprise a disk and a head connected to a distal end of an actuator arm which is rotated about a pivot by a voice coil motor (VCM) to position the head radially over the disk. The disk typically comprises a number of concentric data tracks each partitioned into a number of data sectors. Access operations are performed by seeking the head to a target data track, and performing a write/read operation on the data sectors within the data track. The disk typically comprises embedded servo sectors having position information recorded therein, such as coarse position information (e.g., a track address) and fine position information (e.g., servo bursts). A servo controller processes the servo sectors to position the head over the target data track.
Each data sector in a data track is typically assigned a physical block address (PBA) which is accessed indirectly through a logical block address (LBA) to facilitate mapping out defective data sectors. A PBA associated with defective data sectors may simply remain unmapped if found during manufacturing. The process of initially mapping out defective PBAs is referred to as “formatting” the disk.
Scanning for defective data sectors during manufacturing of the disk drive typically involves writing a special test pattern (e.g., a 2T pattern) to each data sector (or each data wedge) and reading the test pattern to identify defects. For example, a drop in the amplitude of the read signal may indicate a defect, or a defect filter matched to a defect signature may indicate a defect, or a number of bit errors exceeding a threshold may indicate a defect, etc.
In the disk drive of
Any suitable head may be employed in the embodiments of the present invention. In one embodiment, the head comprises a magnetoresistive (MR) read element, and a perpendicular magnetic recording (PMR) write element. Certain write element designs may generate varying adjacent track interference (ATI) depending on the radial direction of the write operation. That is, the ATI that manifests when writing data tracks toward the inner diameter of the disk may be different from the ATI that manifests when writing data tracks toward the outer diameter of the disk. The varying effect of ATI can impact the result of a defect scan such that a first set of defects may be detected if the data tracks are written in a first radial direction, whereas a second set of defects (some mutually exclusive from the first set) may be detected if the data tracks are written in a second radial direction. Therefore, if a defect scan is performed by writing the data tracks in only one radial direction, some of the defects may be missed. Accordingly, an embodiment of the present invention performs a defect scan in a first phase wherein data is written to the data tracks in a first radial direction, and in a second phase wherein data is written to the data tracks in a second (opposite) radial direction.
Any suitable data may be written to the data tracks during the defect scan, and any suitable technique may be employed to detect a defect. In one embodiment, a test pattern (e.g., a 2T test pattern) is written to the data tracks and degradation of the resulting read signal (e.g., amplitude degradation, phase degradation, etc.) may then identify a defect. In another embodiment, the data written to the data tracks may comprise pseudo user data (e.g., all zeros or a random pattern), wherein a defect is detected when the number of errors detected by an error correction code (ECC) exceeds a threshold. In another embodiment, a defect may be detected based on the number of retry operations needed to recover a data sector.
In one embodiment, each data track 22 in
In one embodiment, only a subset of the written data tracks are read during at least one phase of the defect scan in order to decrease the time needed to perform the defect scan. When defect scanning a plurality of consecutive data tracks, all of the data tracks are written so that the effective of adjacent track interference during the write operation affects all of the data tracks, including the data tracks that are skipped when reading the consecutive data tracks. Any suitable subset of the consecutive data tracks may be read and the remaining data tracks skipped. For example, in one embodiment every N out of M of the consecutively written data tracks are skipped, such as every 1 out of 3 data tracks as illustrated in the embodiment shown in
In one embodiment, when a defective is detected in one of the data tracks that is read during the defect scan, a predetermined area of the data track (e.g., one or more data sectors or data wedges) may be mapped out as unusable. In addition, all or part of one or more adjacent data tracks may be mapped out as defective. That is, in one embodiment it is assumed a defect detected in one of the data tracks will typically affect one or more of the adjacent data tracks in at least one direction (toward the inner diameter or outer diameter of the disk). Accordingly, in one embodiment all or part of a data track not read during the defect scan may still be mapped out as defective due to detecting a defect in an adjacent (or near adjacent) data track that is read during the defect scan. In yet another embodiment, a data track that would otherwise be skipped during the defect scan may be read and evaluated for defects if a defect is detected while reading an adjacent data track.
During each phase of the defect scan, any suitable number of consecutive data tracks may be written at a time before executing the corresponding read operation. In the example embodiment of
The data may be written to a disk surface in any suitable pattern, wherein the data may be written in a first radial direction during a first phase of the defect scan and in an opposite radial direction during a second phase of the defect scan.
In one embodiment, the technique of skip reading data tracks during the defect scan as described above may not be implemented over the entire disk surface. For example, in one embodiment on or more sections of the disk may comprise a consecutive band of data tracks having significant importance such that every data track in the section should be read and evaluated during the defect scan. For example, a certain number of test tracks may be reserved to calibrate parameters of the disk drive, wherein verifying the integrity of the test tracks helps ensure proper calibration. In other embodiments, a number of consecutive data tracks may be reserved to store the calibrated parameters and/or an operating system for the disk drive, wherein reading the reserved tracks during the defect scan helps ensure proper operation of the disk drive. In another embodiment, at least some of the data tracks for storing the host operating system may be known or assumed (e.g., the data tracks corresponding to low numbered logical block addresses). Reading and evaluating these data tracks during the defect scan may help maintain the integrity of the host operating system. In yet another embodiment, the disk may be divided into a number of refresh zones, wherein each refresh zone may include a number of reserved data tracks that facilitate a refresh operation. For example, the reserved data tracks may be used to temporarily store a backup copy of data being refreshed, wherein reading the reserved tracks during the defect scan helps ensure the backup copy of the data is not lost during the refresh operation.
Any suitable control circuitry may be employed to implement the flow diagrams in the embodiments of the present invention, such as any suitable integrated circuit or circuits. For example, the control circuitry may be implemented within a read channel integrated circuit, or in a component separate from the read channel, such as a disk controller, or certain steps described above may be performed by a read channel and others by a disk controller. In one embodiment, the read channel and disk controller are implemented as separate integrated circuits, and in an alternative embodiment they are fabricated into a single integrated circuit or system on a chip (SOC). In addition, the control circuitry may include a suitable preamp circuit implemented as a separate integrated circuit, integrated into the read channel or disk controller circuit, or integrated into an SOC.
In one embodiment, the control circuitry comprises a microprocessor executing instructions, the instructions being operable to cause the microprocessor to perform the steps of the flow diagrams described herein. The instructions may be stored in any computer-readable medium. In one embodiment, they may be stored on a non-volatile semiconductor memory external to the microprocessor, or integrated with the microprocessor in a SOC. In another embodiment, the instructions are stored on the disk and read into a volatile semiconductor memory when the disk drive is powered on. In yet another embodiment, the control circuitry comprises suitable logic circuitry, such as state machine circuitry.
Number | Name | Date | Kind |
---|---|---|---|
5150050 | Genheimer et al. | Sep 1992 | A |
5195076 | Aoki | Mar 1993 | A |
5216655 | Hearn et al. | Jun 1993 | A |
5280395 | Matsuzaki | Jan 1994 | A |
5895438 | Yomtoubian | Apr 1999 | A |
6057926 | Horai | May 2000 | A |
6104556 | Schaenzer | Aug 2000 | A |
6151180 | Bang | Nov 2000 | A |
6219814 | Coker et al. | Apr 2001 | B1 |
6223303 | Billings et al. | Apr 2001 | B1 |
6239931 | Chung et al. | May 2001 | B1 |
6301679 | Tan | Oct 2001 | B1 |
6304986 | Ma et al. | Oct 2001 | B1 |
6366081 | Tan et al. | Apr 2002 | B1 |
6384999 | Schibilla | May 2002 | B1 |
6405342 | Lee | Jun 2002 | B1 |
6496943 | Belser et al. | Dec 2002 | B1 |
6504662 | Sobey | Jan 2003 | B2 |
6606211 | Lim et al. | Aug 2003 | B1 |
6654904 | Andoh et al. | Nov 2003 | B1 |
6691255 | Rothberg et al. | Feb 2004 | B1 |
6704153 | Rothberg et al. | Mar 2004 | B1 |
6731442 | Jin et al. | May 2004 | B2 |
6850379 | Andoh et al. | Feb 2005 | B2 |
6940669 | Schaenzer et al. | Sep 2005 | B2 |
6947232 | Lim et al. | Sep 2005 | B2 |
6950967 | Brunnett et al. | Sep 2005 | B1 |
6985319 | Yip et al. | Jan 2006 | B2 |
7047438 | Smith et al. | May 2006 | B2 |
7072129 | Cullen et al. | Jul 2006 | B1 |
7139145 | Archibald et al. | Nov 2006 | B1 |
7215494 | Wang et al. | May 2007 | B2 |
7215619 | Van Den Enden | May 2007 | B1 |
7248547 | Ryu et al. | Jul 2007 | B2 |
7389588 | Lau | Jun 2008 | B2 |
7434019 | Chia et al. | Oct 2008 | B2 |
7562270 | Andoh | Jul 2009 | B2 |
7589926 | Richmond et al. | Sep 2009 | B2 |
7626905 | Lai et al. | Dec 2009 | B2 |
7653847 | Liikanen et al. | Jan 2010 | B1 |
7656763 | Jin et al. | Feb 2010 | B1 |
7839588 | Dang et al. | Nov 2010 | B1 |
7957241 | Vaes | Jun 2011 | B2 |
8014094 | Jin | Sep 2011 | B1 |
8023215 | Ghaly et al. | Sep 2011 | B1 |
8493681 | Selvaraj | Jul 2013 | B1 |
8619529 | Liew et al. | Dec 2013 | B1 |
20010046196 | Mckernan | Nov 2001 | A1 |
20010055172 | Yip et al. | Dec 2001 | A1 |
20020048112 | Chu et al. | Apr 2002 | A1 |
20020191319 | Liew et al. | Dec 2002 | A1 |
20040100715 | Smith et al. | May 2004 | A1 |
20040153949 | Ro et al. | Aug 2004 | A1 |
20040233805 | Yoshida et al. | Nov 2004 | A1 |
20050138464 | Chong et al. | Jun 2005 | A1 |
20050180282 | Ouyang et al. | Aug 2005 | A1 |
20060056088 | Kudoh et al. | Mar 2006 | A1 |
20060126204 | Taniguchi et al. | Jun 2006 | A1 |
20070089031 | Huffman et al. | Apr 2007 | A1 |
20070183074 | Smith | Aug 2007 | A1 |
20070279788 | Andersen et al. | Dec 2007 | A1 |
20080239548 | Paul et al. | Oct 2008 | A1 |
20090034109 | Paul et al. | Feb 2009 | A1 |
20090290463 | Kuze et al. | Nov 2009 | A1 |
20100091629 | Tan et al. | Apr 2010 | A1 |
20100177428 | Oberg | Jul 2010 | A1 |
20110158073 | Ishihara et al. | Jun 2011 | A1 |