Displacement sensor based on photonic crystal waveguides

Abstract

A displacement sensor comprising at least one pair of co-planar photonic crystal waveguide (PCWG) sections aligned along or parallel to a common axis and separated by a gap, one PCWG section of a pair operative to perform a displacement relative to the other section of the pair. In some embodiments, the sensor is linear, comprising two PCWG sections sperated by a gap that forms a cross PCWG, the displacement sensing performed preferrably differentially between two edges of the cross PCWG. In other embodiments, the sensor includes Mach Zehnder Interferometer (MZI) configurations with gaps between fixed and moving PCWG sections. Displacement induced changes in the gap widths are reflected in changes in an output parameter of the MZI.

Description

FIELD OF THE INVENTION

The present invention relates to optical displacement sensors and more specifically to optical displacement sensors based on photonic crystal (PC) waveguides.

BACKGROUND OF THE INVENTION

Displacement sensors are used extensively in a host of applications, from simple, straightforward extensiometers to measurement of acceleration and vibrations.

Optical displacement sensors are known. They rely generally on the precise measurement of the micro-displacement of a sub-millimeter flexible component. The displacement is measured with optical techniques, which can be defined as either intensity- or interferometry-based [T. Wang, S. Zheng, and Z. Yang, Sensors and Actuators A vol. 69, 134 (1998)]. Intensity modulation methods are commonly used, but provide inferior sensitivity relative to interferometry ones. Intensity modulation may be obtained by a relative movement between two optical fiber segments separated by a gap. The overlap area between the two segments determines the amount of energy transferred between the segments [H. Golnabi, Rev. Sci. Instrum, vol. 70, 2875 (1999)]. Such devices can provide a sensitivity of 1/90 [μm⁻¹] [M. Abdelrafik, L. Pierre, M. Jeanine, R. Christine, and F. Pierre, Appl. Optics, vol. 34, 8014 (1995)]. An increased sensitivity may be obtained by placing a ball lens between the two fiber segments or by creating a ball lens on the fiber edge. Integration of such optical sensors in micro-opto-electro-mechanical systems (MOEMS) can be achieved by replacing the optical fibers with dielectric waveguides.

Photonic crystal based displacement sensors are very uncommon. Suh et al in U.S. Patent Application No. 20040080726 disclose a PC displacement sensor that comprises a mechanically tunable photonic crystal structure consisting of coupled photonic crystal slabs. Simulations show that the transmission and reflection coefficients for light normally incident upon such structures can be highly sensitive to nano-scale variations in the spacing between the slabs. Moreover, by specifically configuring the photonic crystal structures, the high sensitivity can be preserved in spite of significant fabrication-related disorders.

Existing MOEMS sensors are limited in the sensitivity that they can provide, and may not be used in applications requiring detection of extremely small absolute displacements. Suh's sensor is not planar and cannot be fabricated on a single chip, a serious deficiency. It would therefore be advantageous to have very sensitive photonic crystal displacement sensors, fully integrable on a single chip.

Photonic crystal waveguides (PCWG) are known, but only in stationary (fixed) configurations. Methods for light coupling into and out of PCWG structures are also well known in the art. The problem of adiabatic coupling from an external light source is also well characterized [se e.g. Y. Xu, R. K. Lee, and A. Yariv, Optics Lett., vol. 25, 755 (2000)].

It would therefore be advatageous to have very sensitive and compact optical displacement sensors that can be fabricated using MEMS techniques on a single chip

SUMMARY OF THE INVENTION

The present invention is of a displacement sensor comprising at least one pair of co-planar photonic crystal waveguide (PCWG) sections aligned along or parallel to a common axis and separated by a gap, one PCWG section of a pair operative to perform a displacement relative to the other section of the pair. The sensor is referred to hereinafter simply as “PCWG sensor”. In one embodiment, light coupled from one PCWG section into the other leaks into the gap, which itself has the properties of a “cross” PCWG, perpendicular to the first two. The amount of leaked energy and its distribution among a right and a left section (or “branch”) of the cross PCWG depend on the relative displacement and may be measured at the exit of each PCWG section. In another embodiment, two pairs of segmented PCWGs are used in a Mach Zehnder Interferometer (MZI) configuration. The segments of each pair are separated by a gap with a width that changes according to a relative displacement of the segments. The width change is reflected in interference patterns changes. The invention also discloses accelerometers using the PCWG displacement sensors for acceleration measurements

According to the present invention there is provided an optical displacement sensor comprising a first photonic crystal waveguide (PCWG), a second PCWG coplanar with and operative to perform a displacement relative to the first PCWG, and an optical detection mechanism operative to provide an optical measurement correlated with the relative displacement between the first and second PCWGs.

According to the present invention there is provided an optical displacement sensor comprising a first MZI PCWG segment, a second MZI PCWG segment coplanar with and operative to perform a displacement relative to the first MZI PCWG segment, and an optical detection mechanism operative to provide a measurement of the relative displacement between the first and second MZI PCWG segments.

According to the present invention there is provided optical displacement sensor comprising at least two co-planar photonic crystal waveguides (PCWG) separated by at least one air gap, the PCWGs operative to perform a relative diplacement movement, and an optical detection mechanism operative to provide a measurement of the relative displacement.

According to one feature in the optical displacement sensor of the present invention, the at least one air gap includes a cross air PCWG, and the optical detection mechanism is operative to provide a differential intensity reading between two edge outputs of the cross air PCWG.

According to another feature in the optical displacement sensor of the present invention, the at least two PCWGs include two pairs of PCWGs in a MZI configuration, the at least one air gap includes two air gaps positioned between a respective PCWG of one pair and a respective PCWG of the other pair, the relative displacement movement includes a decrease in the width of one gap and an equal increase in the width of the other gap, and the measurement is an interferometric MZI measurement correlated with the relative displacement.

According to the present invention there is provided a method for sensing mechanical displacements optically, comprising the steps of providing at least one first PCWG, providing at least one second PCWG coplanar with and operative to perform a displacement relative to the at least one first PCWG, and performing an optical measurement correlated with the relative displacement between first and second PCWGs, thereby obtaining a displacement value.

According to the present invention there is provided an accelerometer comprising a first mass that includes at least one first PCWG, a second mass that includes at least one second PCWG, the first and second masses separated by a gap and operative to perform a movement relative therebetween, and an optical detection mechanism operative to measure a light parameter of light transmitted propagating through the at least one first PCWG, the at least one second PCWG and the gap, the light parameter correlated with an acceleration parameter.

BRIEF DESCRIPTION OF THE DRAWINGS

For a better understanding of the present invention and to show more clearly how it could be applied, reference will now be made, by way of example only, to the accompanying drawings in which:

FIG. 1 shows schematically the layout of a PCWG displacement sensor of the present invention: (a) a sensor comprising two materials, and (b) a sensor comprising three materials;

FIG. 2 shows schematically the PCWG sensor of FIG. 1 in a measurement setup: (a) under zero displacement and (b) after some displacement;

FIG. 3 shows in detail an exemplary process for fabrication of the PCWG sensor of FIG. 1, incorporated in an accelerometer type device;

FIG. 4 shows schematically an embodiment of a PCWG displacement sensor of the present invention in a Mach Zehnder Interferometer (MZI) configuration;

FIG. 5 shows the electric field distribution in a PCWG sensor without and with displacement: (a) no displacement, (b) 0.6 μm displacement and (c) 6 μm displacement;

FIG. 6 shows the intensity detected as function of displacement for each detector;

FIG. 7 shows the normalized intensity difference Δ_BC=(I_B−I_C)/max[(I_B−I_C)] as function of displacement;

FIG. 8 shows the normalized intensity difference Δ_BC=(I_B−I_C)/max[(I_B−I_C)] as function of displacement for several detector positions away from the PCWG edge;

FIG. 9 shows the normalized intensity difference Δ_BC=(I_B−I_C)/max[(I_B−I_C)] for different gaps between PCWGs;

FIG. 10 shows the normalized intensity difference Δ_BC=(I_B−I_C)/max[(I_B−I_C)] for a sensor with 0.075μm error in post location and radius. The dotted line represents a structure with no errors.

DETAILED DESCRIPTION OF THE INVENTION

FIG. 1 a shows a preferred embodiment of a “linear” configuration PCWG sensor 100 of the present invention. The sensor includes two co-planar PCWG segments residing in a X-Y plane, a fixed segment 102 and a mobile segment 104, both parallel to an axis 106 (in the Y direction) and separated by a physical gap 108. In principle, the PC may be any structure possessing a band gap in the frequency domain used for the light signal. The fixed PCWG is rigidly connected to a substrate (mass) 110 and the mobile PCWG is rigidly connected to a moving part, e.g. a suspended micro-electro-mechanical system (MEMS) mass 112, which is operative to move in-plane perpendicular (in the X direction) to axis 106. Moving and fixed MEMS elements and mechanisms for providing relative movements between co-planar MEMS elements are well known in the art. Gap 108 acts essentially as a “cross”air PCWG perpendicular to, and intersects axis 106 at an intersection 114, and will henceforth be referred to as “cross PCWG” 108. Cross PCWG 108 has a left branch (section) 116 and a right branch (section) 118. “Left” and “right” are defined with respect to an input light signal 120 (FIG. 2a).

In the preferred embodiment shown in FIG. 1a, the PC comprises solid elements (e.g. posts) 122 of a first dielectric material surrounded by a second dielectric material (air gaps) 124 (see e.g. O. Levy et al., Appl. Phys. Lett., vol. 86, 104102 (2005)). The waveguides comprise either a fully missing line of rods (also referred to as “W1-type waveguides”) or selectively missing rods in what is known as a “coupled cavity waveguide” or CCW configuration (see e.g. U.S. Patent Application No 20040021193 to Nathan et al). Cross PCWG 108 is an air PCWG. Alternatively, as shown in FIG. 1b, the PCWG sensor may comprise three materials, e.g, at least two different dielectric materials 130 and 132 and air. In this case, the waveguide may be a missing line or be a CCW of either 130 or 132 elements. In yet other alternative configurations in which the PC comprises air rods in a solid dielectric matrix, the waveguide may be a line or CCW of missing air rods (full material).

FIG. 2 shows schematically the PCWG sensor of FIG. 1 in a measurement setup: (a) under zero displacement and (b) after some displacement, i.e. a relative shift δ of axis 106 in segment 104 vs that in segment 102. As shown, PCWG segment 104 extends to the right toward a detector A positioned proximate to an output edge of segment 104. Left branch 116 extends upwards toward a detector B positioned proximate to an output edge of branch 116. Right branch 118 extends downward toward a detector C positioned proximate to an output edge of branch 118. As used herein, “a” detector does not necessarily represent a single detector but is meant to cover any detector arrangement including a plurality of detectors and detector arrays. In this embodiment, sensing is performed differentially by measuring changes in light intensity (energy) resulting from the relative displacement between the fixed and moving PCWGs. Energy exiting fixed PCWG segment 102 is divided at intersection 114, some continuing into moving segment 104 and some split between the left and right PCWG branches 116 and 118. The amount of energy exiting segment 104 and each of branches 116 and 118 (measured respectively by detectors A, B and C) depends on the displacement. A specific differential measurement includes the difference in energies measured by detectors B and C. In contrast with Suh's sensor, the PCWG sensor of the present invention is planar and can therefore be fabricated in integrated form on a single substrate, as shown next in FIG. 3.

FIG. 3 shows in detail an exemplary process for fabrication of the PCWG sensor of FIG. 1, incorporated in an accelerometer type device. The PCWGs comprise SU8 (epoxy photoresist) posts surrounded by air gaps. The entire device is built on a silicon-on-insulator (SOI) substrate (a) comprising a device Si layer 302 separated from a thick Si handle material 304 by a buried SiO₂ layer 306. The layer thicknesses may be chosen according to the application. In (b), the substrate is oxidized to provide top and bottom SiO₂ layers 308 and 310. In (c), a first mask is used to photolithographically define and etch a cross PCWG opening 312 in top SiO₂ layer 308. In (d), a second mask is used to photolithographically define and etch a backside pattern 314 in bottom SiO₂ layer 310. In (e), an SU8 layer is formed on top of the wafer using well known spinning and curing steps, and a third mask is used to photolithographically define and etch a PC structure of SU8 posts 316 surrounded by air gaps 318 on SiO₂ layer 308. In (f), opening 312 is used as a mask for etching Si device layer 302 down to buried oxide 306. In (g), a protective photoresist layer 320 is formed on the PC structure. In (h), backside pattern 314 is used as a mask for a backside etch of Si handle 304 up to buried oxide 306. In (i), the now unprotected (from the back) buried oxide layer is removed by a dry etch. Finally, in (j) the top protective layer 320 is removed in a cleaning step, leaving a fixed PCWG segment 326 on a stationary silicon mass and a “floating” PCWG segment 326 on a movable Si mass attached to a spring 322. FIG. 3(k) shows the structure in (j) from a top view. Segment 326 and the movable Si mass are now free to move laterally in the X direction in the X-Y plane relative to segment 324. Light is coupled into the PCWG sensor from an external waveguide 330. The configuration in (j) may be essentially used to sense acceleration in one direction (X). The acceleration is deduced now from a light parameter (intensity or phase) measurement, in a way similar to the deduction of acceleration from an electrical (capacitance) measurement, which is well known in the art. A full device will include additional signal conditioning and processing modules (not shown), similar to modules used in capacitive accelerometers, as should be clear to one skilled in the art of MEMS accelerometers. A combination of three such devices may be used in a three-axis vibrating mass gyroscope, in which one PCWG segment is attached to a stationary mass and another segment is attached to a movable “proof” mass. Prior art accelerometers that use capacitive sensor plates disposed adjacent to a proof mass and in which the capacitance is converted into electronic signals representative of the acceleration suffer from electronic noise and a host of other problems. The PCWG sensors of the present invention can replace capacitive sensors in any such devices and applications, with all the inherent attendant advantages of optical sensing.

In yet another embodiment, the displacement sensor of the present invention may have a Mach Zehnder Interferometer (MZI) configuration, as shown in FIG. 4. Photonic crystal MZI waveguide devices are disclosed for example in U.S. Patent Application No 20040021193 to Nathan et al. FIG. 4a shows an embodiment in which a PCWG MZI comprises two arms 340 and 342 connected to one port operative to be coupled to a light beam 350 and to another port operative to emit a light beam 352. Arms 340 and 342 have respectively at least one gap 346 and 348, positioned in a section of the arm that is substantially parallel to a sensing direction (X). A movable MZI section (attached to a substrate mass) 344 is operative to move in the X direction relative to a fixed MZI section 354, such that gap sizes Z₁, and Z₂ change by ±δ. The change in gap size affects the phase of light propagating through each MZI arm, and results in changes observable in an intensity pattern at an MZI port (e.g. in beam 352).

FIG. 4 b shows another embodiment of a PC MZI displacement sensor of the present invention. In this embodiment, the sensor comprises a fixed arm 360 and a movable arm 362 separated by gaps 364. Optionally, for symmetry reasons, gaps may also be provided in the fixed arm. Section 362 is connected to a member 370 and operative to move in the X direction, thereby causing to changes in the widths of gaps 364 and in the attendant light output.

In general, any co-planar PCWG configuration that permits relative movement of at least one PCWG segment relative to at least one other PCWG segment so that a property (e.g. intensity or phase) of light passing through these segments changes in response to the relative in-plane displacement of these segments should be considered an integral part of, and covered by, the present invention. Moreover, the waveguides may be implemented in one-dimensional (1D) PCs [I. Jae-Soong et al, J. Lightwave Technol., vol. 22, 509-513 (2004)], as 1D ridge PCWGs [S. Nishikawa et al., Optics Express, 27, 2079-2081 (2002)], two-dimensional (2D) PCs, 2D-in-1D hybrid PCWG structures [C. 0. Cho et al., Current Appl. Phys., vol. 4, 245-249 (2004)] or in three-dimensional (3D) PCs [Z. Y Li and K. M. Ho, Physical Review B, vol. 68 (24), Art. No. 245117 (2003)].

Note that the essential feature in all embodiments is the presence of at least two PC waveguide segments separated by a gap. In principle, as mentioned with reference to accelerometers and gyroscopes above, this feature may appear in various planes and provide sensing capability in two or three directions (e.g. X-Y-Z), simply by combinations of two or three such sensors.

EXAMPLE

Numerical Simulations

A numerical simulation of the field distribution inside a two-dimensional PC structure as in FIG. 1a and FIG. 3 is used to demonstrate the performance of our PCWG displacement sensor. We use a numerical code based on the Multifilament Current Model [Y. Leviatan and A. Boag, IEEE Trans. Antennas Prop., vol. 35, 1119 (1987)] to find the energy distribution and intensity exiting each PCWG for different displacements. Dielectric posts 122 are assumed to be cylinders with diameter 1.2 μm and a relative dielectric constant ε_r =8.41, separated by air and positioned on a square periodic lattice with a unit cell of 4 μm by 4 μm. All waveguides are W1-type. The light used has a 9.02 μm wavelength which can be generated using a CO₂ laser, and which is within the bandgap of this PC structure. The numerical code computes the full solution of the propagation/scattering problem, based on the algorithm provided in Y. Leviatan and A. Boag, above. We use it to compute the fields for displacements between 0 and 6 μm. Detectors A, B and C are placed 6μm away from the respective PCWG output edges. The displacement is correlated with the electric field intensities, specifically with the difference I_B−I_C of the intensities reaching respectively detectors B and C.

FIG. 5 shows the electric field distribution for displacements of: (a) zero, (b) 0.6 μm, and (c) 6 μm. The light pattern and the intensities radiating from the waveguide output edges depend strongly on the displacement. FIG. 6 shows the intensities reaching each detector as a function of the displacement. Each graph is normalized to the total intensity exiting the device. That is, I_A=I_A/(I_A+I_B+I_C), where the bold quantities are the actual electric field intensities (E²) integrated along the detector surface. Similar relations hold for I_B and I_C. The most interesting quantity is the differential intensity between branches B and C.

FIG. 7 shows the normalized difference Δ_BC=(I_B−I_C)/max[(I_B−I_C)] as a function of the displacement, where max [(I_B−I_C)] is the highest value over all displacements. We define sensitivity as the ratio between the normalized difference Δ_BC and the corresponding displacement. This ratio is equal to the curve slope in FIG. 8. One sees that there are two displacement ranges in which the sensitivity is high: region A (0-0.6 μm displacement) with a sensitivity of ˜1[μm⁻¹] and region B (3-5 μm displacement) with a sensitivity of [˜0.4 μm⁻¹]. Region A (relatively small displacements) is the one of interest to us. In this region, small displacements have a profound effect on the waveguide junction (intersection) geometry and hence on the scattering effects that take place therein, while the waveguide output terminals are hardly affected by these small displacements. Therefore, I_B−I_C and Δ_BC reflect differences in the power entering the left and right branches, i.e. are basically determined by the complex scattering effects that take place at the junction. For larger displacements, the intersection shape remains relatively unchanged, and the power reaching each detector is essentially a result of the intensity pattern of the field that radiates from the waveguide terminals.

It is clear that at least in region A, the linear PCWG sensor has excellent sensitivity to small displacements. The sensitivity of ˜1[μm⁻¹] shown above is achieved using a PC structure designed for light signals with a wavelength of 9.02 μm. Similar structures for shorter wavelengths can easily be designed by performing a proper geometry downscale. The sensitivity will increase by a corresponding factor. For example, if the wavelength used is 1.5 μm, the sensitivity is predicted to increase by a factor of 6.

The robustness of such a device in terms of fabrication and dimensional errors is an important factor in actual implementations. FIG. 8 shows results of simulations that check the effects of structural disorder on the device sensitivity in three different cases: (1) for detectors misplaced relative to the PCWG edges; (2) for a changed gap between the two PCWGs; and (3) for effects of random fabrication errors in the PC structure in the range of ±0.075μm. In (1), we checked the device sensitivity starting with the detectors aligned with the PCWG edge (zero distance) and then moved by 2 μm, 4 μm and 6 μm away of the PCWG edges. The effect of the detector location on the sensitivity in region A is very small compared to that in region B. This is so because the energy reaching detectors B and C is essentially due to differences in the power entering the left and right branches at the junction. In contrast, in region B, the energy reaching the detectors is determined by the intensity pattern of the field radiating out of the waveguide terminals.

The results shown so far were obtained with a waveguide width (and PCWG gap size) of 8 μm. We checked the device sensitivity to four other gap sizes: 7.6 μm, 7.8 μm, 8.2 μm and 8.4 μ. As shown in FIG. 9, the gap size change in the range of ±0.4 μm has a negligible effect on the sensitivity, and therefore on predicted sensor performance.

The fabrication of the suggested PC structure may also involve errors in the location and radii of the posts. We performed several simulations with random errors of 0.075 μm (with random distribution) in these two parameters. As shown in FIG. 10, the intensity differences I_B−I_C for several different error patterns show similar behavior to that of the error-free structure over the entire displacement range. In summary, the present invention discloses a highly sensitive, very robust displacement sensor based on photonic crystal waveguides.

All publications, patents and patent applications mentioned in this specification are herein incorporated in their entirety by reference into the specification, to the same extent as if each individual publication, patent or patent application was specifically and individually indicated to be incorporated herein by reference. In addition, citation or identification of any reference in this application shall not be construed as an admission that such reference is available as prior art to the present invention.

While the invention has been described with respect to a limited number of embodiments, it will be appreciated that many variations, modifications and other applications of the invention may be made.

Claims

1. An optical displacement sensor comprising: a. a first photonic crystal waveguide (PCWG); b. a second PCWG co-planar with and operative to perform a displacement relative to the first PCWG, and c. an optical detection mechanism operative to provide an optical measurement correlated with the relative displacement between the first and second PCWGs.

2. The optical displacement sensor of claim 1, wherein the first and second PCWGs are parallel to a common axis and separated by a gap that serves as a cross PCWG.

3. The optical displacement sensor of claim 2, wherein the optical detection mechanism includes a first detector positioned proximate to one end of the cross PCWG and a second detector positioned proximate to another end of the cross PCWG, and wherein the optical measurement includes a differential optical measurement performed by the first and second detectors.

4. The optical displacement sensor of claim 2, wherein the PCWGs are selected from the group consisting of one-dimensional (1D) ridge PCWGs, PCWGs formed in a 1D photonic crystal, PCWGs formed in a 2D photonic crystal and PCWGs formed in a 3D photonic crystal

5. The optical displacement sensor of claim 2, wherein each PCWG segment includes an array of dielectric posts surrounded by air.

6. The optical displacement sensor of claim 2, wherein each PCWG is selected from the group consisting of a W1-type waveguide and a CCW waveguide.

7. The optical displacement sensor of claim 1, implemented in a silicon-on-insulator (SOI) substrate.

8. An optical displacement sensor comprising: a. a first Mach Zehnder Interferometer (MZI) photonic crystal waveguide (PCWG) segment; b. a second MZI PCWG segment coplanar with and operative to perform a displacement relative to the first MZI PCWG segment, and c. an optical detection mechanism operative to provide a measurement of the relative displacement between the first and second MZI PCWG segments.

9. The optical displacement sensor of claim 8, wherein each of the first and second MZI PCWG segments includes two, first and second arms, wherein the first arms of the first and second MZI PCWG segments are separated by a first gap and wherein the second arms of the first and second MZI PCWG segments are separated by a second gap.

10. The optical displacement sensor of claim 9, wherein the relative displacement includes a displacement that changes the first gap in a first direction and changes the second gap in an opposite direction to the first direction, and wherein the optical measurement includes an interference measurement correlated with the gap changes.

11. The optical displacement sensor of claim 9, wherein the MZI PCWG segments are selected from the group consisting of one-dimensional (1D) ridge PCWG segments, PCWG segments formed in a 1D photonic crystal, PCWG segments formed in a 2D photonic crystal and PCWG segments formed in a 3D photonic crystal

12. The optical displacement sensor of claim 11, wherein each MZI PCWG segment includes an array of dielectric posts surrounded by air.

13. The optical displacement sensor of claim 9, implemented in a silicon-on-insulator (SOI) substrate.

14. An optical displacement sensor comprising: a. at least two co-planar photonic crystal waveguides (PCWG) separated by at least one air gap, the PCWGs operative to perform a relative diplacement movement; and b. an optical detection mechanism operative to provide a measurement of the relative displacement.

15. The optical displacement sensor of claim 14, wherein the at least one air gap includes a cross air PCWG, and wherein the optical detection mechanism is operative to provide a differential intensity reading between two edge outputs of the cross air PCWG.

16. The optical displacement sensor of claim 14, wherein the at least two PCWGs include two pairs of PCWGs in a Mach Zehnder Interferometer (MZI) configuration, wherein the at least one air gap includes two air gaps positioned between a respective PCWG of one pair and a respective PCWG of the other pair, wherein the relative displacement movement includes a decrease in the width of one gap and an equal increase in the width of the other gap, and wherein the measurement is an interferometric MZI measurement correlated with the relative displacement.

17. A method for sensing mechanical displacements optically, comprising the steps of: a. providing a first photonic crystal waveguide (PCWG); b. providing a second PCWG coplanar with and operative to perform a displacement relative to the first PCWG, and c. performing an optical measurement correlated with the relative displacement between the first and second PCWGs, thereby obtaining a displacement value.

18. The method of claim 17, wherein the steps of providing first and second PCWGs include providing first and second PCWGs that are parallel to a common axis and separated by a gap that serves as a cross PCWG.

19. The method of claim 17, wherein the steps of providing first and second PCWGs include providing first and second MZI PCWG segments, wherein each MZI PCWG segment includes two, first and second arms, wherein the first arms of the first and second MZI PCWGs are separated by a first gap and wherein the second arms of the first and second MZI PCWGs are separated by a second gap.

20. The method of claim 18, wherein the step of performing an optical measurement correlated with the relative displacement between the first and second PCWGs includes positioning a first detector proximate to one end of the cross PCWG and positioning a second detector proximate to another end of the cross PCWG, and using the first and second detectors to perform a differential optical measurement correlated with the relative displacement.

21. The method of claim 18, wherein the relative displacement includes a displacement that changes the first gap in a first direction and changes the second gap equally in an opposite direction to the first direction, and wherein the step of performing an optical measurement correlated with the relative displacement includes performing an interference measurement that is correlated with the gap changes.

22. An accelerometer comprising: a. a first mass that includes at least one first photonic crystal waveguide (PCWG) b. a second mass that includes at least one second PCWG, the first and second masses separated by a gap and operative to perform a relative movement therebetween; and c. an optical detection mechanism operative to measure a light parameter of light transmitted propagating through the at least one first PCWG, the at least one second PCWG and the gap, the light parameter correlated with an acceleration parameter.

23. The accelerometer of claim 22, wherein the at least one first and second PCWGs invclude one first and one second PCWGs arranged in a co-planar linear configuration, and wherein the measured light parameter includes a differential intensity reading of light exiting two opposite edges of a cross PCWG formed in the gap.

24. The accelerometer of claim 22, wherein the at least one first and second PCWGs include a first Mach Zehnder Interferometer (MZI) PCWG section and a second MZI PCWG section coplanar with the first MZI PCWG section, and wherein the measured light parameter includes an interferometry measurement.