Patent Application
20220122538
The following disclosure relates to a display device and a method for manufacturing the same, and more specifically, relates to a display device including an electro-optical element to be driven by a current, such as an organic electro luminescence (EL) display device, and to a method for manufacturing the same.
As a display device provided with features such as thinness, high image quality and low power consumption, an organic EL display device has attracted attention, and at present, development thereof is being actively promoted. A display panel that displays an image in the organic EL display device includes: a display unit in which a plurality of pixel circuits are arranged; and a picture-frame in which a drive circuit that drives the respective pixel circuits is disposed.
The pixel circuit includes a plurality of transistors. If all of these transistors operate normally, then the pixel circuit emits light with a brightness corresponding to a data signal, and displays an image on the display panel. However, the pixel circuit including a transistor that has stopped operating normally becomes a black dot, for example, by an organic EL element turning to a constantly lighting-off state or becomes a bright point by the organic EL element turning to a constantly lighting-on state. Moreover, in some cases, an abnormal tone occurs by the pixel circuit emitting light with a brightness different from the brightness corresponding to the data signal or a line defect is displayed on the display due to occurrence of an abnormal tone in a plurality of continuous pixel circuits.
A display panel in which the pixel circuit having such defect is repaired to be turned to the constantly lighting-off state and is thereby turned to the black dot is not regarded as a problem in practical use, in many cases, if the number of defects is small. Accordingly, if such a repair to turn the pixel circuit having a defect to a black dot can be carried out, then manufacturing yield of the display panel can be improved. Accordingly, it becomes possible to reduce manufacturing cost of the display panel.
The following repair method is disclosed in Patent Document 1. Each pixel circuit is divided into a plurality of regions, and an organic EL element is provided for each of the regions one by one. When the pixel circuit with such a configuration is not normally turned on, the organic EL elements included in the pixel circuit are sequentially turned to an ON state to inspect whether or not they are turned on. As a result, if there is an organic EL element that is not turned on, then a wire connected to the organic EL element is fused by being irradiated with a laser beam and the organic EL element is cut off from the pixel circuit.
[Patent Document 1] Japanese Laid-Open Patent Publication No. 2009-134246
However, it is difficult to divide each pixel circuit into the plurality of regions, to provide the organic EL element for each of the divided regions, and to surely fuse only the organic EL element that does not emit light so as not to affect the organic EL elements which emit light normally. Moreover, when a metal wiring layer is fused by being irradiated with the laser beam, it is necessary to apply a laser beam with a large output. However, when the metal wiring layer is fused, a part of the fused wiring layer adheres to another spot, which may result in a cause of a failure.
In this connection, an object of the following disclosure is to provide a display device capable of being subjected to a repair for easily and surely turning a pixel circuit to a black dot, and to provide a method for manufacturing the same.
A display device according to a first aspect is directed to a display device that displays an image by supplying a data signal individually to a plurality of pixel circuits arranged on a display panel, the display device including:
a plurality of data lines to which the data signal is supplied;
a plurality of scanning lines to which scanning signals for selecting pixel circuits are sequentially supplied;
the plurality of pixel circuits provided so as to correspond to intersections of the plurality of data lines and the plurality of scanning lines;
a scanning line drive circuit configured to sequentially select the plurality of scanning lines; and
a data line drive circuit configured to supply the data signal to the plurality of data lines, wherein
each of the plurality of pixel circuits includes:
an electro-optical element;
a drive transistor for supplying a drive current corresponding to the data signal to the electro-optical element;
compensation transistor for compensating for a threshold voltage of the drive transistor by writing the data signal that is given from a corresponding data line into a node connected to a control terminal of the drive transistor;
an initialization line configured to supply an initialization potential;
a first initialization transistor that has a first conductive terminal connected to the node and a second conductive terminal connected to the initialization line; and
a second initialization transistor that has a first conductive terminal connected to a first electrode of the electro-optical element and a second conductive terminal connected to the initialization line, and
in at least one pixel circuit among the plurality of pixel circuits, the first conductive terminal of the second initialization transistor and the initialization line are electrically connected to each other.
A method for manufacturing a display device according to an eleventh aspect is directed to a method for manufacturing a display device that displays an image by supplying a data signal individually to a plurality of pixel circuits formed on a display panel, wherein
each of the plurality of pixel circuits includes:
an electro-optical element that emits light with a brightness corresponding co a current value of a drive current corresponding to the data signal;
a drive transistor for supplying the drive current to the electro-optical element;
compensation transistor for compensating for a threshold voltage of the drive transistor by writing the data signal that is given from a data line into a node connected to a control terminal of the drive transistor;
initialization line configured to supply an initialization potential;
a first initialization transistor that has a first conductive terminal connected to the node and a second conductive terminal connected to the initialization line; and
a second initialization transistor that has a first conductive terminal connected to a first electrode of the electro-optical element and a second conductive terminal connected to the initialization line, and
the method includes a step of electrically connecting the first conductive terminal of the second initialization transistor and the initialization line to each other by irradiating at least a part of a region where the first conductive terminal of the second initialization transistor is superimposed on the initialization with a laser beam from a back side of the display panel, in at least one pixel circuit among the plurality of pixel circuits.
A method for manufacturing a display device according to a twelfth aspect is directed to a method for manufacturing a display device that displays an image by supplying a data signal individually to a plurality of pixel circuits formed on a display panel, wherein
each of the plurality of pixel circuits includes:
an electro-optical element that emits light with a brightness corresponding to a current value of a drive current corresponding to the data signal;
a drive transistor for supplying the drive current to the electro-optical element;
a compensation transistor for compensating for a threshold voltage of the drive transistor by writing the data signal that is given from a data line into a node connected to a control terminal of the drive transistor;
an initialization line configured to supply an initialization potential;
a first initialization transistor that has first conductive terminal connected to the node and a second conductive terminal connected to the initialization line;
a second initialization transistor that has a first conductive terminal connected to a first electrode of the electro-optical element and a second conductive terminal connected to the initialization line; and
a connection wire electrically connected to the initialization line and formed to be superimposed on a semiconductor layer as the first conductive terminal of the second initialization transistor with an insulating film interposed between the connection wire and the semiconductor layer, and
the method includes a step of, in at least one pixel circuit among the plurality of pixel circuits, electrically connecting the first conductive terminal of the second initialization transistor and the initialization line to each other by electrically connecting the first conductive terminal of the second initialization transistor and the connection wire to each other by irradiating at least a part of a region where the connection wire is superimposed on the semiconductor layer with a laser beam from a back side of the display panel.
According to the first aspect, the semiconductor layer that serves as the first conductive terminal of the initialization transistor and the initialization line are electrically connected to each other. Thus, the initialization potential applied to the first electrode of the electro-optical element, and accordingly, the voltage to be applied to the electro-optical element becomes equal to or less than the threshold voltage. As a result, even if the pixel circuit causes an operation failure, the electro-optical element is constantly in a lighting-off state, and the pixel circuit is constantly kept black.
According to the eleventh aspect, at least a part of the region where the initialization line is superimposed on the semiconductor layer is irradiated with the laser beam, whereby the repair can be performed without fusing the initialization line by the laser beam.
According to the twelfth aspect, the whole of the region where the connection wire connected to the initialization line is superimposed on the semiconductor layer can be irradiated with the laser beam, and accordingly, the repair to connect the initialization line to the semiconductor layer can be surely performed.
Embodiments of the present disclosure will be described below with reference to the accompanying drawings. Note that “connection” in the present description means “electrical connection” unless otherwise noted, and within the scope without departing from the spirit of the present disclosure, includes not only a case of meaning a direct connection but also an indirect connection via another element.
In the display unit 10, m (m is an integer of 2 or more) pieces of data lines D1 to Dm and n (n is an integer of 2 or more) pieces of scanning lines S1 to Sn are arranged. Moreover, in the display unit 10, a pixel circuit 11 is provided for each. of intersections of the respective data lines and the respective scanning lines. More specifically, m×n pieces of the pixel circuits 11 are provided so as to individually correspond to the intersections of the m pieces of data lines D1 to Dm and the n pieces of scanning lines S1 to Sn.
In the display unit 10, emission lines E1 to En as n pieces of light emission control lines are further arranged in parallel to the n pieces of scanning lines S1 to Sn. The m pieces of data lines D1 to Dm are connected to the data line driver 30. The n pieces of scanning lines S1 to Sn are connected to the scanning line driver 50. The n pieces of emission lines E1 to En are connected to the emission line driver 60.
Moreover, in the display unit 10, power supply lines (not illustrated) common to the respective pixel circuits 11 are arranged. More specifically, arranged are: a power supply line (hereinafter, referred to as a “high-level power supply line” or a “first power supply line”, and denoted by reference symbol ELVDD in the same way as a high-level potential ELVDD) configured to supply the high-level potential (also referred to as a “first power supply potential”) ELVDD for driving later-described organic EL elements (also referred to as “electro-optical elements”); and a power supply line (hereinafter, referred to as a “low-level power supply line” or a “second power supply line”, and denoted by reference symbol ELVSS in the same way as a low-level potential ELVSS configured. to supply the low-level potential (also referred to as a “second power supply potential”) ELVSS for driving the organic EL elements. Moreover, arranged is an initialization line Vini (denoted by reference symbol Vini in the same way as an initialization potential) configured to supply the initialization potential Vini for performing initialization operations to be described later. These potentials are supplied from a power supply circuit (not illustrated).
The display control circuit 20 outputs a variety of control signals to the data line driver 30, the scanning line driver 50, and the emission line driver 60. More specifically, the display control circuit 20 outputs a data start pulse DSP, a data clock DCK, display data DA, and a latch pulse LP to the data line driver 30. The display control circuit 20 outputs a scanning start pulse SSP and a scanning clock SCK to the scanning line driver 50. The display control circuit 20 further outputs an emission start pulse ESP and an emission clock ECK to the emission line driver 60.
The data line driver 30 includes an m-bat shift register, a sampling circuit, a latch circuit, m pieces of D/A converters, and the like, all of which are not illustrated. The shift register has m pieces of bistable circuits connected to one another in a cascade fashion, transfers the data start pulse DSP, which is supplied to an initial stage thereof, in synchronization with the data clock DCK, and outputs sampling pulses from respective stages. The display data DA is supplied to the sampling circuit in synchronization with output timing of the sampling pulse. The sampling circuit stores the display data DA in accordance with the sampling pulse. When the display data an for one line is stored in the sampling circuit, the display control circuit 20 outputs the latch pulse LP to the latch circuit. Upon receiving the latch pulse LP, the latch circuit holds the display data DA stored in the sampling circuit. The D/A converters are provided corresponding to the m pieces of data lines D1 to Dm individually connected to m pieces of output terminals (not illustrated) of the data line driver 30, convert the display data DA, which is held in the latch circuit, into data signals which are analog signal voltages, and output the obtained data signals individually to the data lines D1 to Dm.
The scanning line driver 50 drives the n pieces of scanning lines S1 to Sn. More specifically, the scanning line driver 50 includes a shift register, a buffer and the like, all of which are not illustrated. The shift register sequentially transfers the scanning start pulse SSP in synchronization with the scanning clock SCK. Scanning signals which are outputs from respective stages of the shift register are sequentially suppled to the corresponding scanning lines S1 to Sn via buffers. By an active scanning signal (a low-level scanning signal in the present embodiment), m pieces of pixel circuits 11 connected to scanning lines Sj (j=1 to n) are collectively selected.
The emission line driver 60 drives n pieces or emission lines E1 to En. More specifically, the emission line driver 60 includes a shift register, a buffer and the like, all of which are not illustrated. The shift register sequentially transfers the emission start pulse ESP in synchronization with the emission clock ECK. Emission signals which are outputs from respective stages of the shift register are supplied to the corresponding emission lines Ej (j=1 to n) via buffers.
Although
A configuration of the pixel circuit 11 will be described.
The drive transistor T4 includes a gate terminal (control terminal), a first conductive terminal, and a second conductive terminal. The first conductive terminal of the drive transistor T4 is a conductive terminal to be connected to the high-level power supply line ELVDD via the power supply transistor T5, and the second conductive terminal thereof is a conductive terminal to be connected to the organic EL element OLED via the light emission control transistor T6. In the drive transistor T4, in response to a flow of carriers, the first conductive terminal and the second conductive terminal become a source terminal and a drain terminal, respectively, or become the drain germinal and the source terminal, respectively. Specifically, when holes as the carriers flow from the first conductive terminal to the second conductive terminal, the first conductive terminal becomes the source terminal, and the second conductive terminal becomes the drain terminal. On the contrary, when the holes flow from the second conductive terminal to the first conductive terminal, the second conductive terminal becomes the source terminal, and the first conductive terminal becomes the drain terminal.
In the pixel circuit 11, arranged are the scanning lines Sj (j is an integer between 1 and n both inclusive), a previous scanning line Sj−1 (also referred to as a “discharge line”), the emission. line Ej, the data line Di (i is an integer between 1 and m both inclusive), the high-level power supply line ELVDD, the low-level power supply line ELVSS, and the initialization line Vini. The write transistor T3 has the gate terminal, connected to the scanning line Sj, has the first conductive terminal connected to the data line Di, and supplies the data signal, which is supplied to the data line Di, to the first conductive terminal or the drive transistor T4 in response to the selection of the scanning line Sj.
The first conductive terminal of the drive transistor is connected to the second conductive terminal of the write transistor T3, and the gate terminal thereof is connected to a node N. The node N is a nodal point (also referred to as a “node”) at which a second conductive terminal of the compensation transistor T2 to be described later and a first terminal of the storage capacitor Cst are connected to each other, and is charged with a voltage (data voltage) of the data signal to be given to the gate terminal of the drive transistor T4. The drive transistor T4 supplies a drive current, which is determined in response to the data voltage charged to the node N, to the organic EL element OLED.
A gate terminal (control terminal) of the compensation transistor T2 is connected to the scanning line Sj. When the scanning line Sj becomes active (low level), the compensation transistor T2 conducts, and brings the drive transistor T4 into a state of diode connection. Thus, as represented by the following Equation (1), a potential Vn of the node N becomes a voltage lower than a data voltage Vdata by a threshold. voltage Vth of the drive transistor T4. This potential Vn of the node N is given as a gate voltage Vg to the gate terminal of the drive transistor T4.
Vn=Vdata+Vth (1)
Herein, Vdata is a data voltage, and Vth is a threshold voltage of the drive transistor T4.
The first initialization transistor T1 is a transistor with a dual gate structure, which has a gate terminal connected to the previous scanning line Sj−1 and is provided between the gate terminal of the drive transistor T4 and the initialization line Vini. The transistor with the dual gate structure refers to a transistor with a structure in which a common control signal is input to gate terminals (control terminals) of two transistors, a conductive terminal of one of the transistors and a conductive terminal of the other transistor are connected to each other, and a channel layer is continuously formed of the same semiconductor layer. When a potential of the previous scanning line Sj−1 becomes active, the first initialization transistor T1 conducts, and the initialization potential Vini is given to the node N. Thus, the potential of the node N is initialized. Such operations as described above refer to initialization operations, and such a potential that initializes the potential of the node N refers to an “initialization potential.” Note that the first initialization transistor T1 does not need. to be the transistor with. the dual gate structure.
The power supply transistor T5 has a gate terminal connected to the emission line Ej, and is provided between the high-level power supply line ELVDD and the drive transistor T4. The power supply transistor T5 supplies the high-level potential ELVDD to the first conductive terminal of the drive transistor T4 in response to the selection of the emission line Ej.
The light emission control transistor T6 has a gate terminal connected to the emission line Ej, and is provided between. the drive transistor T4 and the organic EL element OLED. The light emission control transistor T6 electrically connects the second conductive terminal of the drive transistor T4 and an anode of the organic EL element PLED to each other in response to the selection of the emission line Ej. As a result, the drive current in which a current value is controlled by the drive transistor T4 flows from the high-level power supply line ELVDD through the drive transistor T4 to the organic EL element OLED.
The second. initialization transistor T7 has a gate terminal (control terminal) connected to the scanning line Sj, and is provided between an anode of the organic EL element OLED and the initialization line Vini. When the scanning line Sj is selected, the second initialization transistor T7 gives the initialization potential Vini to the anode of the organic EL element OLED, and initializes a potential of the anode.
The first terminal of the storage capacitor Cst is connected to the node N, and a second terminal thereof is connected to the high-level power supply line ELVDD. The storage capacitor Cst holds a potential of the node N when the compensation transistor T2 and the first initialization transistor T1 are in the OFF state.
The organic EL element OLED has the anode (one end of the organic EL element OLED, also referred to as a “first electrode”) connected to a second conductive terminal of the light emission control transistor T6, has a cathode (other end of the organic EL element OLED, also referred to as a “second electrode”) connected to the low-level power supply line ELVSS, and emits light with a brightness corresponding to the current value of the drive current when the drive. current to be suppled from the drive transistor T4 flows therethrough.
Next, a description will be given of a normal operation in a case in which the seven transistors included in the pixel circuit 11 are entirely normal.
As illustrated in.
At a time t3, the potential of the previous scanning line Sj−1 changes from the low level to the high level, and the first initialization transistor T1 turns to the OFF state. Moreover, the data signal starts to be supplied from the data line driver 30 to the data line Di. As above, such a period from the time t2 to the time t3 is the initialization period of initializing the storage capacitor Cst and the node N.
At a time t4, the potential of the scanning line Sj changes from the high level to the low level. Moreover, a potential of the data line Di becomes a potential of the data signal. Thus, the write transistor T3 and the compensation transistor T2 turn to the ON state, and the data signal written into the node N via the write transistor T3, the drive transistor T4, and the compensation transistor T2 as illustrated in
At a time t1, the potential of the scanning line Sj changes from the low level to the high level. Thus, the write transistor T3 and the compensation transistor T2 turn to the OFF state, and the writing of the data signal into the node N is stopped. As above, a period from the time t4 to the time t5 is a data writing period of writing the data signal, which is supplied to the data line Di, into the node N.
At a time t6, the emission signal changes from the high level to the low level. Thus, the light emission control transistor T6 turns to the ON state, and the current in which the current value is controlled by the drive transistor T4 flows from the high-level power supply line ELVDD through the power supply transistor T5, the drive transistor T4 and the light emission control transistor T6 to the organic EL element OLED as illustrated in
If the seven transistors included in the pixel circuit 11 operate normally, then the pixel circuit 11 emits light with the brightness corresponding to the data signal. However, in some cases, at least one of the seven transistors turns to the constantly ON state or the constantly OFF state, whereby the pixel circuit 11 stops operating normally.
The pixel circuit 11 that has stopped operating normally becomes a black dot, for example, by the organic EL element OLED turning to a constantly lighting-off state or becomes a bright by the organic EL element OLED turning to a constantly lighting-on state. Moreover, in some cases, a line defect is displayed in such a manner that other pixel circuits 11 connected to the same high-level power supply line ELVDD as that of the pixel circuit 11 concerned cause an operation failure.
A display panel in which pixel circuits 11 which have stopped operating normally are constantly displayed as black dots by being repaired is not regarded as a problem in practical use since the black dots are less conspicuous if the number of such pixel circuits 11 is small. Accordingly, if a display panel that has been heretofore discarded becomes usable by being subjected to such a repair of turning the pixel circuits to black dots, then manufacturing yield of the display panel is improved. Accordingly, it becomes possible to reduce manufacturing cost.
A description will be given of the case where the second initialization transistor T7 is in the constantly OFF state.
A description will be given of a repair to be performed when the second initialization transistor T7 turns to the constantly OFF state.
Next, a description will be given of a repair method for correcting the abnormal tone when the second initialization transistor T7 is in the constantly OFF state.
The semiconductor layer SI formed on an insulating substrate 90 functions as source/drain regions and channel regions of transistors, and functions as wiring regions for connecting to other transistors. Accordingly, in the semiconductor layer SI formed on the pixel circuit 11 composed of the p channel -type transistors, except for regions which serve as the channel regions of the transistors, not only the source/drain regions of the transistors but also the wiring regions are doped with p-type impurities in order to reduce resistance values thereof.
As illustrated in
So as to cover the scanning line SCAN, a first interlayer insulating film (also referred to as “first inorganic insulating film”) 92 made of an inorganic insulating film is formed. On the first interlayer insulating film 92, the initialization line Vini made of a second display wiring layer that is a metal film is formed. In a region opposite to the scanning line SCAN, the initialization line Vini extends in parallel to the scanning line SCAN. So as to cover the initialization line Vini, a second interlayer insulating film (also referred to as a “second inorganic insulating film”) 93 made of an inorganic insulating film is formed.
On the second interlayer insulating film 93 made of the inorganic insulating film formed so as to cover the initialization. line Vini, a connection wire CW is formed of a third display wiring layer that is a metal film. The connection wire CW is connected individually to the initialization line Vini and the semiconductor layer SI via a contact hole CH. Thus, a second conductive terminal of the second initialization transistor T7 and the initialization line Vini are electrically connected to each other via the connection wire CW. Moreover, a planarizing film 94 made of an inorganic insulating film is formed so as to cover the connection wire CW.
As illustrated in
The semiconductor layer SI is doped with p-type impurities, and accordingly, the semiconductor layer SI is brought into ohmic contact with the initialization line Vini in the laser irradiation area LA. Thus, the initialization potential Vini is applied to the anode of the organic EL element OLED, and accordingly, the voltage to be applied to the organic EL element OLED becomes equal to or less than the threshold voltage. As a result, even if the second initialization transistor T7 causes an operation failure, the organic EL element OLED is in the constantly lighting-off state, and the pixel circuit 11 is constantly kept black.
Note that, when the first display wiring layer that constitutes the initialization line Vini is completely broken by being irradiated with the laser beam, the initialization potential Vini stops being supplied to other pixel circuits connected to the initialization line Vini. As a result, the other pixel circuits connected to the initialization line Vini cause an operation failure and a line defect occurs. Accord the initialization line Vini is prevented from being completely broken even if an irradiation position of the laser beam deviates a little from a target. For example, it is preferable that the laser irradiation area LA be set so that at least approximately a half of a line width of the initialization line Vini remains after the irradiation of the laser beam. Moreover, though the laser irradiation area LA is provided at the organic EL element OLED side in
According to the present embodiment, the laser irradiation area LA of the semiconductor layer SI is irradiated with the laser beam from the back side of the insulating substrate 90. Thus, the initialization potential Vini is applied to the anode of the organic EL element OLED, and accordingly, the voltage to be applied to the organic EL element OLED becomes equal to or less than the threshold voltage. Therefore, the organic EL element OLED is in the constantly lighting-off state, and the pixel circuit 11 is constantly kept black. At this time, the drive current that has passed through the light emission control transistor T6 flows to the initialization line Vini through the connection portion CP. Moreover, according to a manufacturing method of the present embodiment, at least a part of the region where the initialization line Vini is superimposed on the semiconductor layer SI is irradiated with the laser beam, whereby the repair can be performed without fusing the initialization line Vini by the laser beam.
Next, a description will be given of another repair method for correcting the operation failure (abnormal tone) when the second initialization transistor T7 is in the constantly OFF state.
As illustrated in
In this case, the repair is performed by irradiating the laser irradiation area LA of the semiconductor layer SI, on which the connection wire M is superimposed, with the laser beam from. the back side of the insulating substrate 90. Thus, the gate insulating film 91, the first interlayer insulating film 92 and the second interlayer insulating film 93, which are sandwiched between the semiconductor layer SI and the connection wire CW, disappear by evaporation, and the laser irradiation area LA. of the semiconductor layer SI is connected to the connection wire CW. As a result, the initialization potential Vini is applied to the anode of the organic EL element OLED, and accordingly, the voltage to be applied to the organic EL element OLED becomes equal to or less than the threshold voltage. As a result, even if the second initialization transistor T7 causes an operation failure, the organic EL element OLED is in the constantly lighting-off state, and the pixel circuit 11 is constantly kept black. At this time, even if the second initialization transistor T7 is in the constantly OFF state, the drive current that has passed through the light emission control transistor T6 flows to the initialization line Vini via the connection wire CW that connects the semiconductor layer SI and the initialization line Vini to each other. In this case, in the circuit diagram illustrated in
In the first embodiment, the drive current that flows from the high-level power supply line ELVDD through the power supply transistor T5, the drive transistor T4, and the light emission. control transistor T6 is not supplied to the organic EL element OLED, but is caused to flow to the initialization line Vini through the connection portion CP of the first conductive terminal of the second initialization transistor T7 and the initialization line Vini. In this case, the pixel circuit 11 can be constantly kept black; however, since ON resistances of these transistors T5, T4 and T6 are small, a current value thereof is increased. Therefore, there has been a problem that power consumption of the pixel circuit 11 is increased. In consideration of the above, in the present embodiment, a description will be given of a repair method capable of not only turning the pixel circuit 11 into the black dot but also reducing the power consumption of the pixel circuit 11 turned into the black dot. Note that, since a configuration of the display device, a configuration of the pixel circuit 11 and an operation of the pixel circuit 11 in the present embodiment are individually the same as those in the case described in the first embodiment, a description thereof will be omitted.
The laser beam is applied to the laser irradiation area LA set on the semiconductor layer SI that constitutes the connection point SP sandwiched between a second conductive terminal of the first compensation transistor T21 and a first conductive terminal of the second compensation transistor T22. Thus, the insulating film sandwiched between the laser irradiation area LA of the semiconductor layer SI and the electrode given the high-level potential ELVDD evaporates, and the laser irradiation area LA of the semiconductor layer SI is connected to the electrode. As a result, from the high-level power supply line ELVDD, the high-level potential ELVDD is given to the connection point SP of the second conductive terminal of the first compensation transistor T21 and the first conductive terminal of the second. compensation transistor T22. Note that, in the circuit diagrams of the pixel circuit 11, which are illustrated in
When the potential of the previous scanning line Sj−1 changes from the high level to the low level, the first initialization transistor T1 turns to the ON state, and the initialization potential Vini is applied to the first terminal of the storage capacitor Cst and the gate terminal of the drive transistor T4. Thus, the potentials of the storage capacitor Cst and the gate terminal of the drive transistor T4 are initialized.
Next, when the potential of the scanning line Sj changes from the high level to the low level, the first and second compensation transistors T21 and T22 turn to the ON state. Thus, as illustrated in
Thereafter, when the potential of the emission line Ej changes from the high level to the low level, the power supply transistor T5 and the light emission control transistor T6 turn to the ON state. At this time, the drive transistor T4 is in the OFF state, the drive current does not flow to the organic EL element OLED as illustrated in
Note that the high-level potential ELVDD to be given to the connection point SP of the first compensation transistor T21 and the second compensation transistor T22 is referred to as an “off-state voltage.” Moreover, the high-level power supply line ELVDD that gives the OFF voltage to the connection point SP of the first compensation transistor T21 and the second compensation transistor T22 is referred to as an off-state voltage supply line OFVDD in some cases.
A description will be given of a repair method for turning the pixel circuit into the black dot and reducing the power consumption thereof.
As illustrated in
The semiconductor layer SI is formed so as to intersect the protrusion SCP of the scanning line SCAN once and the scanning line SCAN once. The first compensation transistor T21 is formed at a position where the scanning line SCAN intersects the semiconductor layer SI, and the second compensation transistor T22 is formed at a position where the protrusion SCP of the scanning line SCAN intersects the semiconductor layer SI. Moreover, one end of the repair wire REP for use at the time of repair is formed so as to be superimposed on the semiconductor layer SI. The other end of the repair wire REP is connected to the high-level power supply line ELVDD of the adjacent pixel circuit via the contact hole CH.
Next, a repair method will be described. As illustrated in
As illustrated in
According to the present embodiment, even if the power supply transistor T5 and the light emission control transistor T6 turn to the ON state, the drive transistor T4 is in the OFF state. Thus, since no currents flow to the organic EL element OLED, not only the pixel circuit 11 is kept black, but also the power consumption of the pixel circuit 11 can be reduced. Note that, as described in the first embodiment, in some cases, the pixel circuit 11 can be constantly kept black by forming the connection portion CP of the first conductive terminal of the second initialization transistor T7 and the initialization line Vini. However, the repair to be performed by the irradiation of the laser beam sometimes fails. Therefore, in order to more surely turn the pixel circuit 11 to the constantly black dot, it is preferable that the repair as described in the first embodiment be combined with the repair described in the present embodiment.
By fusing the wire, the initialization potential Vini stops being given to the node N, and accordingly, the drive transistor T4 stops being subjected to a diode connection. As a result, a large current stops flowing to the drive transistor T4. Thus, it becomes not only possible to turn the pixel circuit 11 into the black dot, but it also becomes possible to further reduce the power consumption thereof.
At least either of such wires which sandwich the light emission control transistor T6 is fused, whereby the drive current stops flowing to the organic EL element OLED even if the drive transistor T4 turns to the ON state. As a result, the organic EL element OLED is in the constantly lighting-off state, and accordingly, the pixel circuit 11 is constantly kept black, and in addition, the power consumption thereof is reduced. Note that, in the present modification example, a settable region of the laser irradiation area indicating a spot to be irradiated with the laser beam for fusing the wire is narrow, and accordingly, there can occur a case where the wire cannot be completely fused. Therefore, it is preferable that the present modification example be combined with such a repair to connect the first conductive terminal of the second initialization transistor T7 and the initialization line Vini to each other to turn the pixel circuit 11 into the black dot as described in the first embodiment.
In order to not only turn the pixel circuit 11 into the black dot but also make it possible to surely reduce the power consumption thereof as described above, not only any of the above-described second embodiment, first modification example and second modification example may be applied, but any two among them or all thereof may also be applied at the same time. In any of the cases, the pixel circuit 11 can be turned. into the black dot, and in addition, the power consumption when the pixel circuit 11 is to into the black dot can be reduced more surely.
A third embodiment of the present disclosure will be described. In the present embodiment, a description will be given of a repair that can surely turn the pixel circuit 11 into the black dot not only in a case where the second initialization transistor T7 causes an operation failure as described in the first embodiment, but also in a case where the write transistor T3 causes an operation failure. Note that, since a configuration. of the display device, a configuration of the pixel circuit 11 and an operation of the pixel circuit 11 in the present embodiment are individually the same as those in the case described in the first embodiment, a description thereof will be omitted.
With regard to a repair in the case where only the second initialization transistor T7 causes an operation failure, as described in the first embodiment, the first conductive terminal of the second initialization transistor T7 and the initialization line Vini are connected to each other by the irradiation of the laser beam, and the initialization potential Vini is applied to the anode of the organic EL element OLED. Thus, the organic EL element OLED is turned to the constantly lighting-off state, and the pixel circuit 11 is turned to the constantly black dot.
However, only the second initialization transistor T7 causes an operation failure, but also the write transistor T3 stops operating normally in some cases. In consideration of the above, a repair to be performed in such a case will be described.
A description will be given of a problem when the write transistor T3 is in the constantly ON state. If the pixel circuit 11 operates normally, after the initialization period ends, the data signal supplied to the data line Di is written into the node N via the compensation transistor T2 and is given to the gate terminal of the drive transistor T4 during the data writing period. Thus, a current with a current value corresponding to the data signal flows from the high-level power supply line ELVDD to the organic EL element OLED, and the organic EL element OLED emits light with a brightness corresponding to the data signal.
A description will be given of a case where, at this time, the write transistor T3 that should be originally in the OFF state is in the ON state due to an operation failure.
However, the current that goes toward the high-level power supply line ELVDD fluctuates the high-level potential ELVDD of the high-level power supply line ELVDD. Thus, in other pixel circuits connected to the high-level power supply line ELVDD, the abnormal tone occurs by being affected by the fluctuation of the high-level potential ELVDD. When the abnormal tone occurs at the same time in the plurality of pixel circuits connected to the same high-level power supply line ELVDD, a viewer recognizes it as a line defect.
In consideration of the above, a description will be given of a method for preventing the line defect from occurring in the adjacent pixel circuits 11.
Moreover, in a case where the write transistor T3 is in the constantly OFF state, the initialization potential Vini written in the initialization period is applied to the gate terminal of the drive transistor T4. Thus, when the potential of the emission line Ej turns to the low level in the light emission period, the drive transistor T4 turns to the ON state, and a drive current with a large current value flows from the g-level power supply line ELVDD via the drive transistor T4 to the organic EL element OLED. Therefore, the organic EL element OLED turns on with a high brightness, and the pixel circuit 11 becomes a bright point that is bright.
In consideration of the above, as described in the first embodiment, the first conductive terminal of the second initialization transistor T7 and the initialization line Vini are connected to each other by the connection portion CP. Thus, as described in the first embodiment, the initialization potential Vini is applied to the anode of the organic EL element OLED, whereby the organic EL element OLED is turned to the constantly lighting-off state, and the pixel circuit 11 can be turned to the constantly black dot. However, as in the case of the first embodiment, there is a problem that the power consumption of the pixel circuit 11 is increased since a drive current with a large current value flows therethrough.
According to the present embodiment, when the write transistor T3 is in the constantly ON state or the constantly OFF state, the first conductive terminal of the second initialization transistor T7 is connected to the initialization line Vini. Thus, the initialization potential Vini is applied to the anode of the organic EL element OLED, and the voltage to be applied to the organic EL element OLED is set equal to or less than the threshold voltage. As a result, the organic EL element OLED turns to the constantly lighting-off state, and accordingly, the pixel circuit 11 can be turned to the constantly black dot.
Moreover, in a case where the write transistor T3 is in the constant ON state, in order to prevent a part of the current to be supplied from the data. line Di from flowing to the high-level power supply line ELVDD, a wire made of a semiconductor layer close to either the first conductive terminal second conductive terminal of the write transistor T3 is fused. Thus, the current to be supplied from the data line Di stops flowing to the high-level power supply line ELVDD, and accordingly, the high-level potential ELVDD stops fluctuating, and the line defect stops being visually recognized in the adjacent pixels.
Also in the case of the third embodiment, as in the case of the second embodiment, the drive current flows through the small ON-resistance power supply transistor T5, drive transistor T4 and light emission control transistor T6, and accordingly, a current value thereof is increased. Therefore, there is a problem that the power consumption of the pixel circuit 11 is increased. Accordingly, in order to reduce the power consumption of the pixel circuit 11, any one, any two or all of the methods described in the second embodiment, the first modification example and the second modification example may be further applied to the pixel circuit 11.
10: DISPLAY UNIT
11: PIXEL CIRCUIT
CH: CONTACT HOLE (OPENING PART)
T1: FIRST INITIALIZATION TRANSISTOR
T2: COMPENSATION TRANSISTOR
T21: FIRST COMPENSATION TRANSISTOR
T22: SECOND COMPENSATION TRANSISTOR
T3: WRITE TRANSISTOR
T4: DRIVE TRANSISTOR
T5: POWER SUPPLY TRANSISTOR
T6: LIGHT EMISSION CONTROL TRANSISTOR
T7: SECOND INITIALIZATION TRANSISTOR
OLED: ORGANIC EL ELEMENT (ELECTRO-OPTICAL ELEMENT)
SI: SEMICONDUCTOR LAYER
CW: CONNECTION WIRE
REP: REPAIR WIRE
Di: DATA LINE
SCAN: SCANNING LINE
Vini: INITIALIZATION POTENTIAL, INITIALIZATION LINE
ELVDD: HIGH-LEVEL POTENTIAL, HIGH-LEVEL POWER SUPPLY LINE (FIRST POWER SUPPLY LINE)
ELVSS: LOW-LEVEL POTENTIAL, LOW-LEVEL POWER SUPPLY LINE (SECOND POWER SUPPLY LINE)
OFVDD: OFF-STATE VOLTAGE SUPPLY LINE
SP: CONNECTION POINT (OF FIRST COMPENSATION TRANSISTOR AND SECOND COMPENSATION TRANSISTOR)
| Filing Document | Filing Date | Country | Kind |
|---|---|---|---|
| PCT/JP2019/016842 | 4/19/2019 | WO | 00 |
